https://www.patsnap.com/resources/blog/rd-blog/3d-nand-flash-technology-landscape-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Semiconductors & Microelectronics
3D NAND Flash Patents: Who Holds the Vertical Channel Claims
  • Filing has already peaked. Filings rose to 63 in 2020 and have declined since, with the 2022 midpoint at 19 — this is a maturing claim space, not a growing one.
  • Manufacture claims dominate over device claims. H10B (memory device manufacture) appears in 302 of 378 families, well ahead of G11C circuit-level claims at 131 — the fight is over how the stack is built, not just what it does.
  • Momentum has stalled across every major holder. The largest assignees, including Samsung and Intel, show zero filings in the latest tracked year, consistent with the 18-month publication lag rather than a real stop in R&D.
Get a prior-art report on your approach
378
Published Records
80%
Top-5 Share of All Records
-28%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (39 records) with 2024 (28) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 378 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This landscape tracks 378 patent families filed against 3D NAND flash memory, scoped to documents whose claims specifically address channel hole etch, word-line stack, charge trap layer, string stacking or vertical channel construction. The IPC scope centres on H10B41/27 and H10B43/27 (vertical memory device manufacture) alongside G11C16 (non-volatile memory circuits), which keeps the set to fabrication and structural claims rather than general flash-memory controller or interface patents.

Coverage runs from 2015 through the 2026 data cut-off, with United States filings dominating the receiving-office split (233 records), followed by PCT, EPO, China, Taiwan and South Korea. Because publication trails filing by roughly 18 months, the apparent drop-off in the most recent one to two years understates real filing activity rather than reflecting an actual halt.

Filing activity and technology composition, 2017–2026
  1. 1YANGTZE MEMORY TECH CO LTD86
  2. 2MACRONIX INTERNATIONAL CO LTD83
  3. 3SANDISK TECHNOLOGIES LLC75
  4. 4SAMSUNG ELECTRONICS CO LTD35
  5. 5APPLIED MATERIALS INC22
  6. 6INTEL NDTM US LLC18
  7. 7TOKYO ELECTRON LTD10
  8. 8INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW)8
  9. 9AVENI5
  10. 10SK HYNIX INC5
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on 3D NAND Flash Technology Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Data

Filing trend and technology composition

Annual filing counts and IPC subclass distribution across the 378-family dataset, drawn directly from the search scope described above.

Filings rose through 2020, then declined

Filings climbed from 17 in 2017 to a peak of 63 in 2020, then fell back toward the 2022 midpoint of 19. Read the final one to two years with the publication lag in mind: they will understate actual filing volume, but the multi-year decline from the 2020 peak predates that lag and looks like a genuine slowdown in new claim activity.

Filings rose through 2020, then declined020406080172017201820196320202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

Manufacturing claims outweigh circuit claims

H10B (memory device manufacture) covers 302 of 378 families and H01L (semiconductor devices generally) covers 254, both ahead of G11C (memory circuits, 131) and H10D (general semiconductor devices, 98). The smaller C23C (coating and surface deposition, 5) and G06F (data processing, 3) counts mark the edges of the scope rather than active sub-fields — thin film deposition and system-level claims are largely filed elsewhere.

Manufacturing claims outweigh circuit claimsH10B · Memory device manufacture30279.9%H01L · Semiconductor devices25467.2%G11C · Static & digital memories13134.7%H10D · Semiconductor devices (general)9825.9%H10W297.7%H10P205.3%C23C · Coating & surface deposition51.3%G06F · Electric digital data processi…30.8%Other51.3%

Shares are the percentage of the 378 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on 3D NAND Flash Technology Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

Go deeper on 3D NAND Flash Technology Landscape with Eureka

This page is one run against one query. Ask Eureka your own question about 3d nand flash technology landscape and every answer comes back with the patent numbers behind it.

Try Eureka
Key Patents

The most-cited foundational claims

Representative recent filing
US20250212412A12025-06-26

Memory cell for a 3D NAND flash memory (US20250212412A1, IMEC VZW, 2025-06-26)

IMEC VZW

The claim combines a conventional charge-trap memory stack — a charge trap layer and tunneling oxide layer between a gate layer and channel layer — with an insulating piezoelectric gate layer separated from that stack by an air gap. The application covers both the memory cell structure and a method for forming a vertical memory array built on it.The piezoelectric-gate-plus-air-gap element is what differentiates this from the older, more heavily cited vertical NAND stack patents in this dataset.

US20250212412A1 — patent drawing 1US20250212412A1 — patent drawing 2
View full record
Highest-citation records in this dataset
#Publication no.Patent titleCitations
1US20120001249A1Ultrahigh density vertical NAND memory device & method of making thereof417
2US20110286283A13D two-bit-per-cell NAND flash memory368
3US8349681B2Ultrahigh density monolithic, three dimensional vertical NAND memory device303
4US20160204117A1Vertical NAND and method of making thereof using sequential stack etching and self-aligned landing pad290
5US20130264631A1Vertical NAND device with low capacitance and silicided word lines251
6US8878278B2Compact three dimensional vertical NAND and method of making thereof169
7US20160071861A13D semicircular vertical NAND string with self aligned floating gate or charge trap cell memory cells and met…163
8US20160343727A1Vertical NAND flash memory device123
9US9634097B23D NAND with oxide semiconductor channel120
10US9960045B1Charge-trap layer separation and word-line isolation for enhanced 3-D NAND structure118

Citation counts inside this corpus favour older filings that have had more years to accumulate references — treat them as a measure of foundational influence, not of current commercial relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on 3D NAND Flash Technology Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Run it yourself

Put your own technology through the same analysis


  
Where to run it
Fastest

Eureka on the web

When you want the answer in the next five minutes.

The agent works the prompt against patents and technical literature, citing every source.

Run your analysis now →
For builders

MCP server & REST API

When it has to run inside your own pipeline.

Patent search, landscape analysis and assignee resolution as MCP tools. Drop them into any agent framework, or call REST directly.

Browse MCP servers →
Insights

What the numbers say about the field

Three patterns stand out once filing counts, IPC composition and citation concentration are read together.

Filing momentum
63 in 2020 → 19 by 2022
peak-to-midpoint decline

The claim space has already been staked out

A peak in 2020 followed by a decline through the 2022 midpoint indicates the core structural approaches to vertical channel and word-line stack construction were largely claimed in the late 2010s. New filings now more likely refine or design around those positions than open new ground.

Filing trend, 2017–2026
Technology concentration
302 of 378 families in H10B
manufacture-class share

Fabrication process, not circuit design, is where the claims sit

The dominance of H10B manufacture claims over G11C circuit claims (131) shows competitive pressure concentrates on how the vertical stack, channel hole etch and charge trap layer are physically built — the process integration layer — rather than on memory addressing or sensing circuitry.

IPC composition
Citation concentration
417 citations on the top record
highest single-record count

A small set of early filings anchors the whole field

The most-cited records date to the early 2010s and describe the foundational vertical NAND stack and charge-trap architectures. Their citation counts are inflated by age relative to more recent filings, but the concentration still signals which structural approaches later filers had to build around.

Most-cited records
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to 3d nand flash technology landscape, with the prior art for and against each one.

Find the white space →
Co-filing is rare in this dataset
AssigneeCo-assigneeShared families
SanDisk Technologies LLCZHANG YUAN2
SanDisk Technologies LLCSAMACHISA GEORGE2
SanDisk Technologies LLCPURAYATH VINOD2
SanDisk Technologies LLCMATAMIS GEORGE2
SanDisk Technologies LLCLEE YAO SHENG2
SanDisk Technologies LLCKAI JAMES2
SanDisk Technologies LLCCHIEN HENRY2
SanDisk Technologies LLCALSMEIER JOHANN2

Only 10 co-assignee pairs appear across 378 families, with the strongest pairs linking one major assignee to individual named inventors rather than to other companies — this is a field of solo corporate filers, not joint ventures.

Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on 3D NAND Flash Technology Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the claims — and where they've stopped

Filing activity concentrates among a small group of memory manufacturers and equipment suppliers, all of which show no filings in the latest tracked year — a pattern consistent with publication lag rather than a genuine stop.

Momentum check
0 filings, -100% YoY
latest tracked year

Every major holder shows zero in the most recent year

Assignees including Yangtze Memory Technologies, Samsung, SanDisk, Intel, Macronix and Applied Materials all report zero filings in the latest year, several with -100% year-on-year change. Given the 18-month publication lag, this reflects filings still working through the pipeline rather than a real halt in R&D.

Recent-year momentum
Filing base
378 families
total tracked

A concentrated but not monopolised field

The dataset's citation leaders and recent filers overlap only partially — the companies with the most historically influential patents are not always the same ones filing most actively now, pointing to a field where incumbents defend early ground while others, like IMEC, contribute newer structural variants.

Assignee ranking
Co-filing
10 pairs
co-assignee links

Little joint filing activity

With only 10 co-assignee pairs identified, and the strongest ones linking a single company to named individual inventors, cross-company collaboration is not a visible pattern in this landscape — most families are filed by one assignee alone.

Co-assignee pairs
🔍
Under-claimed sub-areas worth checking before filing
Branches where the IPC composition suggests thinner coverage relative to the core stack claims
Piezoelectric gate layer integrationAir-gap isolation in memory stacksThin-film deposition for charge trap layers (C23C)String-stacking alignment methodsLow-capacitance word-line silicidation
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Yangtze Memory Technologies Co., Ltd.0-100%
Macronix International Co., Ltd.0
SanDisk Technologies LLC0
Samsung Electronics Co., Ltd.0-100%
Applied Materials, Inc.0
Intel Corporation0
Tokyo Electron Limited0
Interuniversity Microelectronics Centre (IMEC)0-100%
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on 3D NAND Flash Technology Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to a mature claim space around the core vertical stack, with narrower openings at its structural edges.

Check freedom to operate against the citation leaders

The five most-cited records anchor the foundational vertical NAND and charge-trap architecture claims that later filings had to design around. Any new fabrication approach should be checked against these before further development spend.

Run a freedom-to-operate search in Eureka

Track the assignees still active despite zero recent filings

Zero filings in the latest year across every major holder is consistent with publication lag, not a stop in R&D. Watching for the next wave of publications from these assignees will clarify whether the 2020 peak was a one-off or the field genuinely plateaued.

Set up assignee monitoring in Eureka

Explore the under-claimed structural variants

Piezoelectric gate integration and air-gap isolation, as seen in the IMEC filing, sit outside the dense core of channel-hole and word-line-stack claims. These narrower branches may offer more workable filing room than the core stack architecture.

Explore white space mapping in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on 3D NAND Flash Technology Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on 3D NAND patent activity

Answers are grounded in the same dataset. Derived from a Patsnap search on 3D NAND Flash Technology Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research 3D NAND Flash Technology Landscape in depth with Eureka

Go past this page: query the whole 3d nand flash technology landscape corpus yourself, in your own scope.
Every answer comes back with patent numbers you can open.

Try Eureka

Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company's registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.