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Atomic Layer Deposition Patents: Who Leads, Where the Gaps Are 2026

Atomic Layer Deposition Patents: Who Leads, Where the Gaps Are 2026
https://www.patsnap.com/resources/blog/rd-blog/atomic-layer-deposition-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Semiconductors · Patent Landscape
Atomic Layer Deposition Patents: Filing Trends, Active Assignees and White Space
  • Filing has cooled since its 2019 peak. 207 families that year against 195 in 2017 and a midpoint of 169 in 2022 — the growth phase for this exact claim space is behind it, not ahead.
  • Momentum is draining from the largest holders fastest. Lam Research, Applied Materials, ASM IP, Micron and TSMC all show sharp year-on-year declines in the latest filing year, several down to zero.
  • The US dominates where these applications are filed. 2,382 records sit at the USPTO against 508 at WIPO and 364 at the EPO — enforcement leverage concentrates in one jurisdiction more than the technology itself does.
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3,909
Published Records
71%
Top-5 Share of Top-100 Filers
-25%
3-Yr Growth (lag-adjusted)
US
Leading Jurisdiction
Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this patent landscape covers

This dataset tracks 3,909 patent families filed between 2017 and 2026 that combine atomic layer deposition or atomic layer etching claims with process-level detail — self-limiting reaction chemistry, purge time, conformality, high-k dielectric formation or nucleation delay — under IPC classes covering surface coating (C23C16), semiconductor devices (H01L21) and related etching processes (C23C28). It is a process-claims corpus, not a device corpus: the search string filters specifically for records that describe how a film is deposited, not just that a device contains one.

Because publication lags filing by roughly 18 months, the 2025 and 2026 figures in any trend line are undercounts of eventual filing volume. Read the recent-year drop as a floor, not a final answer — but the multi-year decline from the 2019 peak through 2022 and beyond is real and not an artefact of the lag.

Filing volume by year, 2017-2026
  1. 1ASM IP Holding B.V.367
  2. 2Micron Technology, Inc.339
  3. 3Applied Materials, Inc.293
  4. 4Lam Research Corporation259
  5. 5Taiwan Semiconductor Manufacturing Company (TSMC)201
  6. 6ASM International N.V.173
  7. 7Tokyo Electron Limited140
  8. 8Versum Materials US, LLC124
  9. 9ASM America, Inc.87
  10. 10Air Products and Chemicals, Inc.75
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Atomic Layer Deposition covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The data

Filing trends and technology composition

Two views of the same corpus: how filing volume has moved year over year, and which IPC subclasses carry the claim density.

A peak in 2019, then a plateau and decline

Filings ran at 195 in 2017, rose to a peak of 207 in 2019, then settled near 169 by the 2022 midpoint. The shape is consistent with a technology whose core process claims were staked out early in this window rather than one still building toward a peak.

A peak in 2019, then a plateau and decline06312518825019520172018207201920202021202220232024202572026Most recent year is partial — publication lag means later filings are not yet visible.

Coating and semiconductor-device classes dominate

C23C (coating and surface deposition) and H01L (semiconductor devices) each cover roughly two-thirds of records, with H10P, H10D and C07F organo-metallic precursor claims forming a substantial secondary tier. H10B memory-device manufacture and H01J electron-tube claims are present but thinner, marking them as adjacent rather than core to this filing population.

Coating and semiconductor-device classes dominateC23C · Coating & surface deposition2,54327.3%H01L · Semiconductor devices2,52427.1%H10P1,61017.3%H10D · Semiconductor devices (general)3623.9%C07F · Organo-metallic & non-carbon c…3453.7%H10B · Memory device manufacture2783.0%H01J · Electron & discharge tubes2142.3%H10N · Other electric solid-state dev…1842.0%Other1,25813.5%
Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Atomic Layer Deposition covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key patents

The most-cited records in this corpus

Representative filing
US20190088467A12019-03-21

High-k dielectric layer, fabricating method thereof and multi-function equipment implementing such fabricating method

CHEN, MIIN-JANG

The invention discloses a high-k dielectric layer, a fabricating method thereof and a multi-function equipment implementing such fabricating method. The high-k dielectric layer includes M atomic-layer-deposited films formed in sequence on a material layer of a semiconductor device, where M is an integer larger than 1. Each atomic-layer-deposited film is formed of an oxide by an ALD process, and N of the M films are bombarded by a non-reactive gas plasma during or after the ALD cycles.Filed by CHEN, MIIN-JANG; published 2019-03-21 as US20190088467A1.

US20190088467A1 — patent drawing 1US20190088467A1 — patent drawing 2
View full record
Highest-citation patents
#Publication no.Patent titleCitations
1US6203613B1Atomic layer deposition with nitrate containing precursors1,666
2US6534395B2Method of forming graded thin films using alternating pulses of vapor phase reactants1,323
3US20010041250A1Graded thin films985
4US20020076507A1Process sequence for atomic layer deposition917
5US20020098627A1Surface preparation prior to deposition910
6US6420279B1Methods of using atomic layer deposition to deposit a high dielectric constant material on a substrate897
7US20050271813A1Apparatuses and methods for atomic layer deposition of hafnium-containing high-k dielectric materials867
8US20070119370A1Apparatus and process for plasma-enhanced atomic layer deposition832
9US6428859B1Sequential method for depositing a film by modulated ion-induced atomic layer deposition (MII-ALD)827
10US20060019033A1Plasma treatment of hafnium-containing materials807

Citation counts inside this corpus skew toward older filings simply because they have had longer to accumulate citations; treat the ranking as a map of influence on later claim drafting, not as a list of the most commercially significant patents active today.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Atomic Layer Deposition covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers say about where this field stands

Three readings of the same corpus, each pointing at a decision a reader might need to make about where to file or who to watch.

Filing trajectory
207 → 169
peak year to 2022 midpoint

The growth phase has already happened

Filings peaked in 2019 and had eased to 169 by 2022's midpoint, well below the earlier run rate. New entrants filing broad ALD process claims now are filing into a corpus that has already thinned, not one still expanding.

Peak 2019, 207 families
Assignee momentum
-67% to -100% YoY
largest holders, latest year

The biggest filers are pulling back hardest

Lam Research, Applied Materials, ASM IP, Micron and TSMC all show steep or total year-on-year declines in the most recent filing year. That is consistent with claim space that these firms consider substantially staked out already, though the lag on recent-year data means some of the drop will fill in.

Lam Research -67%, Applied Materials -88%, three at -100%
Jurisdictional concentration
2,382 US filings
vs. 508 WIPO, 364 EPO

Enforcement risk concentrates in the US filing office

Nearly two-thirds of records list the United States as a receiving office, well ahead of the PCT route and Europe. A freedom-to-operate check that stops at the USPTO will miss real but smaller exposure at WIPO, EPO, Taiwan, Singapore and China.

US 2,382, WIPO 508, EPO 364, Taiwan 110, China 105
Precursor chemistry layer
345 C07F records
organo-metallic precursor claims

Precursor chemistry is a distinct, smaller claim layer

C07F organo-metallic and non-carbon compound claims sit at 345 records, well below the core C23C/H01L density. That gap suggests precursor-chemistry claims are less crowded than the process claims built around them, though still a meaningful body of prior art to clear.

345 of 3,909 total families
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Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to atomic layer deposition, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Atomic Layer Deposition covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the activity has gone quiet

The corpus is led by the process-equipment majors, but the latest-year momentum figures show most of them stepping back rather than accelerating.

Process equipment
-67% YoY
Lam Research, latest year

Equipment makers still lead but are slowing

Lam Research and Applied Materials carry the largest recent-year counts among the majors tracked here, at 2 and 1 respectively in the latest year — both down sharply from the year before, which reads as a mature claim position rather than retreat from the technology itself.

Lam Research 2, Applied Materials 1, latest year
IDMs and foundries
0 latest year
Micron and TSMC

Device makers have gone quiet in the most recent window

Micron and TSMC both show zero filings in the latest tracked year, a full reversal from prior activity. Given the publication lag, some of this will resolve upward, but the direction across multiple large device makers at once is a real signal.

Micron -100%, TSMC -100%
Specialty deposition
-100% YoY
ASM IP Holding

ASM's filing entities show a full-stop in the latest year

ASM IP Holding drops to zero in the latest year after a prior filing base, while a related ASM entity shows separate, smaller activity. Co-assignee patterns elsewhere in the corpus, including a Tokyo Electron plus individual-inventor pairing at 17 shared filings, show how some of this activity clusters around specific inventor-company pairs rather than spreading evenly.

10 co-assignee pairs identified; strongest pair at 17 shared filings
🔍
Under-claimed sub-areas worth a closer look
Branches with comparatively thin claim density relative to the core process and equipment claims
Plasma-enhanced ALD film bombardment sequencingOrgano-metallic precursor delivery for high-k oxidesNucleation-delay mitigation on non-native substratesPurge-time optimisation for multi-layer graded stacksAtomic layer etching selectivity control
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Lam Research Corporation2-67%
Applied Materials, Inc.1-88%
ASM IP Holding B.V.0-100%
Micron Technology, Inc.0-100%
Taiwan Semiconductor Manufacturing Company (TSMC)0-100%
ASM International N.V.0
Tokyo Electron Limited0-100%
Versum Materials US, LLC0-100%
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Atomic Layer Deposition covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's next

Where to take this analysis

The trend and assignee data point to a field with its core claims largely staked out; the open questions are about the thinner adjacent layers and about jurisdictions outside the US.

Map freedom-to-operate beyond the US filing office

With over a third of records filed outside the United States, a clearance search limited to USPTO records will understate real exposure, particularly in WIPO, EPO and Taiwan filings.

Explore jurisdictional coverage

Watch whether the pullback among majors is durable

Several large assignees show year-on-year declines approaching or at 100%, but the publication lag on the most recent year means some of this will revise upward once later filings publish.

Track assignee momentum

Test claim strength in the thinner precursor-chemistry layer

Organo-metallic precursor claims sit well below the density of the core process claims, which may leave more room for a defensible position than the crowded C23C/H01L space allows.

Review precursor chemistry claims
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Atomic Layer Deposition covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about ALD patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Atomic Layer Deposition covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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