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Capacitance Measurement Patents: Leaders & Filing Trends 2026

Capacitance Measurement Patents: Leaders & Filing Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/capacitance-measurement-and-dielectric-characterization-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Sensors & Instrumentation · Patent Landscape
Capacitance Measurement and Dielectric Characterization Patents
  • Filing activity peaked in 2019 and has not returned to that level, with the 2022 midpoint sitting below half the peak — this is a mature field, not a growing one.
  • Material analysis (G01N) outweighs pure electrical measurement (G01R) nearly two to one, meaning the sharpest recent claims sit in dielectric sensing applications rather than instrument circuitry itself.
  • The United States receives more than double the filings of any other office, with Europe, China, WIPO, the UK and Canada each drawing a modest but real share.
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144
Published Records
26%
Top-5 Share of All Records
+150%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (2 records) with 2024 (5) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 144 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··8 min readSourced from Patsnap Eureka
Overview

A mature measurement field with a dielectric-sensing centre of gravity

Capacitance measurement and dielectric characterization patents cover the instruments and methods used to determine dissipation factor, permittivity, temperature coefficient and related electrical properties of materials — from lab-grade impedance analyzers to inline sensors monitoring fluids and solids in the field. The dataset spans 144 patent families filed between 2015 and 2026, concentrated most heavily in material analysis and testing rather than in general electrical measurement instrumentation.

Filing activity rose to a peak in 2019 and has since declined, with the most recent full years running well below that high point. Publication lags filing by roughly eighteen months, so the final year or two in any trend chart will always look thinner than it eventually turns out to be — but the multi-year decline visible here predates that lag effect.

Filing activity by year, 2017–2026
  1. 1ROCSOLE10
  2. 2HARRIS CORP9
  3. 3MAYEKAWA MFG CO LTD8
  4. 4TELOFARM INC6
  5. 5PROCESS TOMOGRAPHY5
  6. 6THE OHIO STATES UNIV5
  7. 7MITSUBISHI ELECTRIC CORP4
  8. 8SIEMENS ENERGY GLOBAL GMBH & CO KG4
  9. 9SIEMENS AG4
  10. 10QUANTUM DESIGN INC4
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Capacitance Measurement and Dielectric Characterization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The Data

Filing trend and technology composition

Two views of the same 144-family dataset: how filing volume has moved year over year, and which IPC subclasses carry the claim density.

Filing trend, 2017–2026

Filings rose from 3 in 2017 to a peak of 9 in 2019, then eased back; the 2022 midpoint of 4 sits below half the peak, and 2026 (partial year) shows 2. Read the last one to two years as undercounted given publication lag, not as a hard stop.

Filing trend, 2017–20260358103201720189201920202021202220232024202522026Most recent year is partial — publication lag means later filings are not yet visible.

IPC composition

G01N (material analysis & testing) accounts for 94 of the records and G01R (electric & magnetic measurement) for 55 — the two overlap where a filing claims both a measurement method and a material-testing application. Smaller but non-trivial clusters sit in power conversion (H02M), temperature measurement (G01K), hydrocarbon oil analysis (C10G), dimensional measurement (G01B), power supply systems (H02J) and lab apparatus (B01L), pointing to capacitance sensing being adapted into adjacent domains rather than staying a self-contained instrumentation niche.

IPC compositionG01N · Material analysis & testing9465.3%G01R · Electric & magnetic measurement5538.2%H02M · Power conversion (AC/DC etc.)128.3%G01K · Temperature measurement106.9%C10G · Hydrocarbon oils & refining85.6%G01B · Measuring length & dimensions64.2%H02J · Power supply & grid systems64.2%B01L · Lab apparatus53.5%Other5638.9%

Shares are the percentage of the 144 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Capacitance Measurement and Dielectric Characterization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The foundational filing and the most-cited records

Representative Foundational Patent
US4246534A1981-01-20

US4246534A — Calibration method for lumped capacitance measurement of complex permittivity at HF, VHF and UHF frequencies

THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY

Filed by the US Army, this patent describes a calibration method for an automatic network analyzer measuring reflection coefficient and complex permittivity of unknown dielectric materials using a lumped capacitance approach. Its key insight is that the instrument's air-filled capacitance can be derived purely from reflection-coefficient measurements taken with air and a standard liquid of known permittivity, avoiding the need to calculate capacitance from physical dimensions.Granted 1981-01-20 — decades ahead of the 2015-2026 filing window covered by this dataset, and still a foundational calibration reference for lumped-capacitance permittivity methods.

US4246534A — patent drawing 1US4246534A — patent drawing 2
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Most-cited records in this dataset
#Publication no.Patent titleCitations
1CN101435788B基于介电常数测量的在线油液监测传感器及其系统67
2US20100188111A1Apparatus and method for the measurement of electrical conductivity and dielectric constant of high impedance…55
3US7839282B1Capacitance probe for detection of anomalies in non-metallic plastic pipe46
4US7009409B2Determination of gasket integrity by capacitance measurement44
5US9995778B1Sensor apparatus43
6US20100321038A1Monitoring of the aging of the capacitors in a converter by means of capacitance measurement41
7US5489849AHigh accuracy calibration-free electrical parameter measurements using differential measurement with respect …38
8US4350040ACapacitance-level/density monitor for fluidized-bed combustor38
9CN101435788A基于介电常数测量的在线油液监测传感器及其系统37
10US20160025663A1Method and apparatus for investigating permittivity in a target domain36

Citation counts reward older filings that have had more time to accumulate references within the searched corpus — treat them as a measure of influence on the field's vocabulary, not a ranking of current commercial relevance.

Patent titles are shown in the language they were filed in, not translated, so that each record stays verifiable against the original filing — a translated title will not match in Eureka or in any national register. Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Capacitance Measurement and Dielectric Characterization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers say about where this field stands

Three read-throughs from the filing trend, the citation table and the IPC composition, framed for decisions rather than description.

Filing Momentum
9 → 4 → 2
peak (2019) → midpoint (2022) → latest (2026, partial)

Volume has halved from its peak and kept sliding

The field is not accelerating. A peak of 9 filings in 2019 fell to 4 by the 2022 midpoint, well before the publication-lag discount applies to the most recent years. New entrants should expect established claim territory rather than a race against a growing pack.

Filing trend, 2017-2026
Claim Concentration
94 vs 55
G01N records vs G01R records

Material-analysis claims outnumber pure measurement claims nearly 2:1

The dataset's centre of gravity has shifted from instrumentation-for-its-own-sake toward capacitance and dielectric methods applied to characterising specific materials — fluids, plastics, gaskets. Filers entering with a general-purpose measurement circuit claim alone are filing into the smaller half of the field.

IPC composition
Geographic Filing
55 US filings
vs 25 EPO, 16 China, 11 WIPO

The US is the dominant but not exclusive filing venue

More than double the next office, US filings set the baseline expectation for prior art search here. Europe and China each carry a meaningful but secondary share, and the WIPO PCT count suggests a portion of applicants are still deciding where to pursue national phase.

Receiving offices
Citation Signal
67 citations
top-cited record

The most-cited work is an inline fluid sensor, not a lab instrument

The highest citation count in this corpus belongs to a dielectric-constant-based online oil monitoring sensor, not a bench-top impedance analyzer. Influence in this field has concentrated around field-deployable, application-specific sensing rather than general-purpose lab equipment.

Most-cited records
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to capacitance measurement and dielectric characterization, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Capacitance Measurement and Dielectric Characterization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the field is still open

Recent-year momentum across the tracked assignees shows zero new filings in the latest year across every name checked — a signal that this is a field of established filers holding position rather than one seeing fresh entrants push volume higher.

Filing Pattern
0 in latest year
across all six tracked assignees

Even active historical filers have gone quiet

None of the assignees with recent-year momentum data show any filings in the latest tracked year. That is consistent with the broader decline from the 2019 peak, and suggests current activity — if any — is concentrated among filers not yet visible in this window or is genuinely slowing.

Recent-year momentum
Collaboration
7 pairs
co-assignee pairs identified

Co-filing is rare and mostly internal

Only seven co-assignee pairs appear across the dataset, and the strongest examples pair a single corporate assignee with named individual inventors rather than with another company. Cross-organisation collaboration is not a defining feature of this field's filing behaviour.

Co-assignee pairs
Geographic Spread
6 offices
US, EPO, China, WIPO, UK, Canada

Filers pursue a conventional multi-office strategy

The spread across six receiving offices, led heavily by the US, matches what a mature instrumentation field would look like: applicants protect a home jurisdiction first and extend selectively rather than filing broadly across every available office.

Receiving offices
🔍
Under-claimed sub-areas worth a closer prior-art check
Branches where filing density is thin relative to the core G01N/G01R cluster — worth checking before assuming they are open.
Inline dissipation-factor monitoring for power electronics (H02M overlap)Capacitive sensing for hydrocarbon oil degradation (C10G overlap)Temperature-compensated permittivity sensing (G01K overlap)Lab-on-chip dielectric characterization (B01L overlap)Grid-connected capacitive impedance monitoring (H02J overlap)
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Noxolet Co., Ltd.0
Halliburton0
Siemens0
Mayekawa Mfg. Co., Ltd.0
Telofarm Ltd.0
The Ohio State University0
PROCESS TOMOGRAPHY0
Quantum Design, Inc.0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Capacitance Measurement and Dielectric Characterization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The trend and assignee data point to a field holding steady rather than growing — the open questions are about where remaining claim space sits, not about a race against rising filing volume.

Run a freedom-to-operate check against the top-cited records

The five most-cited patents in this dataset, led by an online dielectric oil-monitoring sensor and a high-impedance fluid conductivity apparatus, define much of the field's working vocabulary. Any new filing in fluid or gasket sensing should be checked against these first.

Explore citation clusters in Eureka

Map the under-claimed adjacent branches before filing

The thinner clusters in H02M, C10G, G01K, G01B, H02J and B01L suggest capacitance sensing is being adapted into other domains faster than dedicated claims are being written there. A first-claim search focused on these overlaps could surface real white space.

Search adjacent IPC branches in Eureka

Track whether the 2026 dip is real or a lag artefact

Publication lag means the last one to two years of any filing trend understate true activity. Re-running this trend in twelve months will show whether the field is genuinely declining from its 2019 peak or whether recent filings simply have not published yet.

Set a filing-trend alert in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Capacitance Measurement and Dielectric Characterization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this field

Answers are grounded in the same dataset. Derived from a Patsnap search on Capacitance Measurement and Dielectric Characterization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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