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CVD Process Patents: Who Leads, Where Filings Are Cooling 2026

CVD Process Patents: Who Leads, Where Filings Are Cooling 2026
https://www.patsnap.com/resources/blog/rd-blog/chemical-vapor-deposition-processes-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Semiconductors · Patent Landscape
Chemical Vapor Deposition Process Patents: Filing Trends and Where the Claim Space Sits
  • Filing has cooled, not grown. Filings ran 323 in 2017, peaked at 413 in 2018, then sat flat through the 2022 midpoint (337) before tapering off.
  • Coating and semiconductor IPC codes dominate. C23C (11,627 records) and H01L (8,001) between them cover most of the corpus; crystal growth and memory-device manufacture are far thinner branches.
  • The largest historical filers have gone quiet. Several of the assignees with the deepest filing history show 0 filings in the latest year, with year-on-year drops of -95% to -100% among the few still active.
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15.5K
Published Records
21%
Top-5 Share of All Records
-24%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (379 records) with 2024 (287) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 15,542 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this dataset covers

This landscape draws on 15,542 patent families published between 2015 and mid-2026, pulled from filings that combine chemical vapor deposition process language — precursor chemistry, step coverage, deposition rate, film uniformity, chamber cleaning — with IPC coverage across coating deposition (C23C16), semiconductor device manufacture (H01L21) and crystal growth (C30B25). It spans the process engineering layer of CVD rather than the tool hardware layer alone, which is why organo-metallic precursor compounds (C07F) and electron-tube deposition (H01J) both show up as secondary clusters.

Because publication typically lags filing by around 18 months, the 2025 and 2026 figures in any trend line understate real filing activity; treat the last one to two years as a floor, not a ceiling.

Filings by year, 2017–2026
  1. 1APPLIED MATERIALS INC1,647
  2. 2MICRON TECHNOLOGY INC512
  3. 3TOKYO ELECTRON LTD417
  4. 4VERSUM MATERIALS US LLC367
  5. 5TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD359
  6. 6LAM RES CORP326
  7. 7INTERNATIONAL BUSINESS MACHINE CORPORATION300
  8. 8SAMSUNG ELECTRONICS CO LTD269
  9. 9AIR PROD & CHEM INC267
  10. 10ADVANCED TECH MATERIALS INC250
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Chemical Vapor Deposition Processes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The numbers

Filing trend and technology composition

Two views of the same corpus: how filing volume has moved year over year, and how that volume splits across IPC subclasses.

A flat-to-declining filing curve

Filings rose from 323 in 2017 to a peak of 413 in 2018, then held roughly level through the 337 recorded at the 2022 midpoint before falling toward 27 in the most recent (partial) year. Read the tail end cautiously given publication lag, but the multi-year plateau before it is real signal: this is a maturing claim space, not one still in a growth phase.

A flat-to-declining filing curve0125250375500323201741320182019202020212022202320242025272026Most recent year is partial — publication lag means later filings are not yet visible.

Coating deposition and device manufacture carry the weight

C23C (coating and surface deposition) accounts for 11,627 of the records and H01L (semiconductor devices) for 8,001, with heavy overlap between the two given how CVD process claims are drafted. Crystal growth (C30B, 1,486), organo-metallic precursor chemistry (C07F, 1,217) and memory-device manufacture (H10B, 644) are considerably thinner, which is where more room to maneuver tends to sit.

Coating deposition and device manufacture carry the weightC23C · Coating & surface deposition11,62774.8%H01L · Semiconductor devices8,00151.5%H10P5,21333.5%C30B · Crystal growth1,4869.6%C07F · Organo-metallic & non-carbon c…1,2177.8%H01J · Electron & discharge tubes8745.6%C01B · Non-metallic elements & inorga…7074.5%H10B · Memory device manufacture6444.1%Other7,47148.1%

Shares are the percentage of the 15,542 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Chemical Vapor Deposition Processes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Prior art

The most-cited records in this corpus

Representative filing
US20030049932A12003-03-13

Technique for high efficiency metalorganic chemical vapor deposition

MICRON TECHNOLOGY, INC.

A technique for more efficiently forming conductive elements, such as conductive layers and electrodes, using chemical vapor deposition. A conductive precursor gas, such as a platinum precursor gas, having organic compounds to improve step coverage is introduced into a chemical vapor deposition chamber. A reactant is also introduced into the chamber that reacts with residue organic compounds on the conductive element so as to remove the organic compounds from the nucleating sites to thereby permit more efficient subsequent chemical vapor deposition of conductive elements.Filed by Micron Technology; illustrates how early-2000s process claims tied precursor chemistry directly to step-coverage outcomes.

US20030049932A1 — patent drawing 1US20030049932A1 — patent drawing 2
View full filing
Highest-citation patents
#Publication no.Patent titleCitations
1US20070172591A1METHOD OF FABRICATING ZnO FILM AND THIN FILM TRANSISTOR ADOPTING THE ZnO FILM4,296
2US7968146B2Hybrid layers for use in coatings on electronic devices or other articles2,406
3US5916365ASequential chemical vapor deposition1,577
4US5278100AChemical vapor deposition technique for depositing titanium silicide on semiconductor wafers1,334
5US5000113AThermal CVD/PECVD reactor and use for thermal chemical vapor deposition of silicon dioxide and in-situ multi-…1,155
6US20030143328A1Apparatus and method for plasma assisted deposition1,037
7US20030019428A1Chemical vapor deposition chamber962
8US5846332AThermally floating pedestal collar in a chemical vapor deposition chamber878
9US6066204AHigh pressure MOCVD reactor system852
10US20030049372A1High rate deposition at low pressures in a small batch reactor848

Citation counts are drawn from the searched corpus itself; older filings accumulate more citations simply by being older, so treat this as a map of influence rather than of current relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Chemical Vapor Deposition Processes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Signal check

What the citation and filing data actually say

Three read-throughs on the numbers above, aimed at where they change a filing or freedom-to-operate decision.

Prior art depth
4,296 citations
on the top-cited record

ZnO film patent anchors the field's oldest prior art

US20070172591A1, on ZnO film and thin-film-transistor fabrication, carries by far the heaviest citation count in the set. That volume reflects age and centrality to downstream thin-film transistor work more than it reflects current commercial relevance.

Cite counts favour older records by construction.
Filing curve
413 → 27
peak (2018) to latest year

The plateau after 2018 is the real story

A single peak year tells you little; the fact that filings held near 300-plus through the 2022 midpoint before falling off says the core claim territory filled up and applicants moved on to adjacent problems.

Latest year is partial; publication lag applies.
Claim density
11,627 records
in C23C alone

Coating deposition is the most crowded subclass

With three-quarters of the corpus touching C23C, generic film-deposition process claims are heavily prior-arted. Differentiated filings increasingly need to anchor in a specific precursor chemistry or a named film-uniformity mechanism rather than the deposition step alone.

Overlap with H01L is substantial.
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to chemical vapor deposition processes, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Chemical Vapor Deposition Processes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Assignees

Who is still filing, and who has stopped

Recent-year momentum separates two groups cleanly: a handful of assignees with deep historical filing counts that have gone to zero in the latest year, and a much smaller set still filing at all.

Momentum
-95% YoY
Applied Materials, latest year

Even the still-active filer is pulling back

Applied Materials shows 1 filing in the latest year against a -95% year-on-year drop, making it the only major historical filer with any recorded activity in the most recent period.

Publication lag likely understates this further.
Momentum
0 filings
latest year, several assignees

Micron, Air Products, IBM, ATMI and TEL have all gone quiet

Micron Technology, Air Products and Chemicals, IBM, Advanced Technology Materials and Tokyo Electron all show zero filings in the latest year, with IBM and Tokyo Electron each down -100% year-on-year from prior activity.

Consistent with a maturing, consolidating field.
Collaboration
66 co-filings
strongest assignee pair

IBM and Tokyo Electron form the densest co-filing link

The IBM plus Tokyo Electron pairing is the strongest of the 10 identified co-assignee relationships, followed by Tokyo Electron with its Arizona affiliate and Air Products with Tokyo Electron — all clustered around chamber and process-tool development.

Only 10 co-assignee pairs total in this corpus.
🔍
Under-claimed branches worth checking before drafting
These sit outside the dense C23C/H01L core and carry noticeably thinner prior art in this corpus.
Selective-area ALD-CVD hybrid precursorsIn-situ chamber-cleaning plasma chemistriesCrystal-growth CVD for wide-bandgap substratesOrgano-metallic precursor stability additivesMemory-device conformal fill for 3D structures
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Applied Materials, Inc.1-95%
Micron Technology, Inc.0
Air Products and Chemicals, Inc.0
International Business Machines Corporation (IBM)0-100%
Advanced Technology Materials, Inc. (ATMI)0
Tokyo Electron Limited0-100%
Taiwan Semiconductor Manufacturing Company (TSMC)0-100%
Lam Research Corporation0-100%
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Chemical Vapor Deposition Processes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Next steps

Where to take this

The dataset points to a field with occupied core claim territory and a shrinking pool of active filers — the practical questions from here are about timing and positioning.

Check freedom-to-operate against the dense clusters

Before drafting in C23C or H01L, map any new precursor or step-coverage claim against the existing density there rather than assuming open space.

Explore CVD prior art in Eureka

Watch for a re-entry, not just an exit

Zero recent filings from historically active assignees can precede a consolidated re-entry with broader claims; monitor rather than assume the space is abandoned.

Track assignee activity in Eureka

Test the under-claimed branches directly

Chamber-cleaning chemistries and crystal-growth CVD for wide-bandgap substrates show thinner filing histories than the core — worth a targeted search before committing claim language.

Run a white-space search in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Chemical Vapor Deposition Processes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on CVD process patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Chemical Vapor Deposition Processes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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