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CMOS Image Sensor Durability Patents: Leaders & White Space 2026

CMOS Image Sensor Durability Patents: Leaders & White Space 2026
https://www.patsnap.com/resources/blog/rd-blog/cmos-image-sensor-environmental-durability-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Sensors & MEMS
CMOS Image Sensor Environmental Durability Patents
  • Filing has cooled, not grown. activity peaked at 6 families in 2018 and the midpoint year 2022 shows zero filings — this is a flat-to-declining space, not a rising one.
  • Packaging, not the pixel, dominates the claim map. H01L (semiconductor devices) appears in 39 of 58 families versus 29 for H04N (imaging/video), meaning durability claims cluster around die and package construction more than signal-chain design.
  • The US carries the filing load. 33 of the tracked records were filed at the USPTO against 11 at the EPO and 6 via PCT, so freedom-to-operate work outside the US rests on a much thinner record.
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58
Published Records
53%
Top-5 Share of All Records
-100%
3-Yr Growth (lag-adjusted)
US
Leading Jurisdiction
Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This dataset tracks patent families at the intersection of CMOS image sensor design and explicit environmental-durability claims: temperature stability, dark current durability, radiation tolerance and environmental reliability language paired with image sensor and imager terminology, filtered to the IPC classes covering pixel arrays, video pictorial communication, and semiconductor packaging. It is a narrow cut of a much larger CMOS imaging corpus, built to isolate the durability-specific claim language rather than general sensor design.

58 published families sit inside the window from 2015 through the 2026-07-31 cut-off, with filings concentrated in the 2017-2020 stretch and no growth since. Because publication typically lags filing by around 18 months, the most recent one or two years in the trend chart are undercounted and should not be read as a real drop-off in R&D activity.

Filing activity, 2017-2026
  1. 1INTEL CORP8
  2. 2FRAUNHOFER GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG EV7
  3. 3AMS INTERNATIONAL AG7
  4. 4OPTOPAC5
  5. 5GOOGLE LLC4
  6. 6ASSADI AZAR3
  7. 7SONY SEMICON SOLUTIONS CORP3
  8. 8LIVE EARTH IMAGING ENTERPRISES L L C3
  9. 9INVISAGE TECHNOLOGIES INC3
  10. 10SUNDAHL ROBERT C3
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on CMOS Image Sensor Environmental Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The Numbers

Filing trend and technology composition

Two views of the same 58 families: when the claims were filed, and which IPC subclasses they sit in. Both point to a mature, packaging-heavy niche rather than an expanding frontier.

A peak in 2018, then a flat line

Filings ran from 3 in 2017 to a peak of 6 in 2018, then declined toward zero by the 2022 midpoint and stayed near it. This is the profile of a technology area that had its land grab early and has since gone quiet, at least in terms of durability-specific claim language surfaced by this search string.

A peak in 2018, then a flat line0235632017620186201920202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

Packaging classes outweigh imaging classes

H01L (semiconductor devices) leads at 39 records, ahead of H04N (pictorial communication/video) at 29 and G02B (optical elements) at 15. H10P and H10W each appear 13 times and G06F, H05K and B41J each contribute single digits — a tail of printer-integration and digital-processing crossover filings rather than a second core cluster.

Packaging classes outweigh imaging classesH01L · Semiconductor devices3967.2%H04N · Pictorial communication (video…2950.0%G02B · Optical elements & systems1525.9%H10P1322.4%H10W1322.4%G06F · Electric digital data processi…813.8%H05K · Printed circuits & assemblies813.8%B41J · Typewriters & printers712.1%Other58100.0%

Shares are the percentage of the 58 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on CMOS Image Sensor Environmental Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The most-cited prior art in this corpus

Representative Filing
US20210175275A12021-06-10

Image sensor, image sensor arrangement and computed tomography apparatus including the same

AMS INTERNATIONAL AG

An image sensor includes a multitude of photodiodes and analog-to-digital converters disposed in adjacent first and second portions of a semiconductor substrate. The photodiodes exhibit X-ray radiation tolerance. An arrangement of several image sensors in adjacent rows can be used for an X-ray detector in a computed tomography apparatus.Filed by AMS International AG, published 2021-06-10 as US20210175275A1.

US20210175275A1 — patent drawing 1US20210175275A1 — patent drawing 2
View full filing
Highest-citation records
#Publication no.Patent titleCitations
1US6566745B1Image sensor ball grid array package and the fabrication thereof432
2US6243131B1Method for directly scanning a rectilinear imaging element using a non-linear scan199
3US7110139B2Printhead controller integrated circuit105
4US7602423B2Integrated circuit for a digital camera system98
5US20040257446A1Image processor for digital camera91
6US5818052ALow light level solid state image sensor88
7US7141869B2Electronic package for image sensor, and the packaging method thereof76
8EP1041628A2An image sensor ball grid array package and the fabrication thereof54
9US20060097335A1Electronic package for image sensor, and the packaging method thereof46
10US20130075593A1Active pixel sensors with variable threshold reset45

Citation counts inside a bounded search corpus reward older filings and should be read as a signal of influence on the surrounding art, not as a measure of current commercial relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on CMOS Image Sensor Environmental Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the data implies for a filing strategy

Three patterns worth acting on before drafting new claims in this space.

Filing Trend
6 → 0
peak (2018) to midpoint (2022)

The claim-space land grab already happened

Filings peaked in 2018 and fell to zero by 2022. New entrants are more likely to be designing around an established base than staking out fresh ground, so prior-art searches should weight 2017-2020 filings heavily.

Filing trend, 2017-2026
IPC Composition
39 vs 29
H01L records vs H04N records

Durability is claimed as a packaging problem

More families sit in H01L (semiconductor devices) than in H04N (video/pictorial communication), indicating that environmental durability in this corpus is predominantly addressed through die construction, encapsulation and substrate design rather than downstream signal processing.

IPC subclass distribution
Jurisdiction
33 US filings
vs 11 EPO, 6 PCT

Thin coverage outside the US record

With 33 of the tracked filings at the USPTO and only 11 at the EPO, teams doing freedom-to-operate work for European or Asian markets are working from a substantially smaller documented record and should not assume US clearance implies clearance elsewhere.

Receiving office breakdown
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to cmos image sensor environmental durability, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on CMOS Image Sensor Environmental Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the durability claims

Assignee activity in this corpus is old rather than dormant-and-returning: the entities with the most co-filed pairs and citation weight show zero filings in the latest tracked year, consistent with a space whose core claims were staked out years ago.

Co-filing density
9 pairs
co-assignee pairs across the corpus

Filing was collaborative, then stopped

The strongest co-assignee links center on one organisation paired repeatedly with individual named inventors, each pairing appearing three times. All of the assignees with visible momentum in earlier years show zero filings in the most recent tracked year.

Co-assignee pairs, full corpus
Momentum
0
latest-year filings across leading assignees

No current filer is actively expanding

Every assignee tracked for recent-year momentum, including the most cited and most collaborative filers, recorded zero filings in the latest year. This is a landscape to monitor for a re-entry rather than one to chase for near-term competitive moves.

Recent-year momentum by assignee
Citation weight
432 citations
top-cited record in the corpus

Packaging patents carry the influence

The most-cited record in the corpus concerns image sensor ball grid array packaging rather than pixel or radiation-tolerance circuitry, reinforcing that durability claim value in this area has historically sat in mechanical and package-level construction.

Most-cited records table
🔍
Under-claimed sub-areas worth a fresh search
Branches with thin representation in this corpus relative to the core packaging and imaging classes.
X-ray photodiode radiation hardeningwafer-level hermetic encapsulationdark-current compensation circuitryhigh-temperature substrate bondingprinthead-adjacent sensor integration
Rank all filers by momentum →
Recent-year filing momentum
AssigneeRecent yearYoY
Intel Corporation0
Silverbrook Research Pty Ltd0
AMS International AG0
阿帕托佩克股份有限公司0
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.0
Interuniversity Microelectronics Centre (IMEC)0
InVisage Technologies, Inc.0
SUNDAHL ROBERT C0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on CMOS Image Sensor Environmental Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The landscape data points to specific next steps depending on whether you are clearing a design or scouting for open claim territory.

Run a freedom-to-operate check outside the US

With 33 of 58 tracked filings at the USPTO, a design cleared against US prior art has not been checked against the thinner EPO and PCT record. Pull the EPO and WIPO subsets specifically before finalising claims intended for those markets.

Check FTO in Eureka

Re-examine the packaging-heavy citation leaders

The highest-cited records in this corpus concern package and die-level construction rather than pixel-array or radiation-tolerance circuitry. Any new filing touching ball grid array packaging or substrate bonding should be checked against these first.

Review cited art in Eureka

Watch for re-entry rather than growth

Every tracked assignee shows zero filings in the latest year, so the near-term signal to watch is any single organisation resuming activity, not aggregate volume growth.

Track assignees in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on CMOS Image Sensor Environmental Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on CMOS Image Sensor Environmental Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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