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CMP Slurries and Pads Patents: Who Leads, Trends 2026

CMP Slurries and Pads Patents: Who Leads, Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/cmp-slurries-and-pads-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Semiconductors
CMP Slurries and Pads Patents: Filing Trends, Leading Assignees and Open Claim Space
  • Filings have cooled since the 2022 peak of 133, with the latest full year running well below that mark — a maturing claim landscape rather than a growing one.
  • Every tracked leading assignee shows 0 filings in the latest year, a pattern consistent with publication lag rather than a sudden exit from the field.
  • B24B (grinding & polishing) covers 2,805 of 3,393 records, while C09G (polishing compositions proper) accounts for under a fifth — slurry chemistry is comparatively less crowded than pad and process hardware.
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3,393
Published Records
50%
Top-5 Share of All Records
-49%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (131 records) with 2024 (67) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 3,393 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··8 min readSourced from Patsnap Eureka
Overview

What this dataset covers

This landscape draws on 3,393 patent families published between 2015 and mid-2026, filtered to documents that combine CMP slurry, polishing pad or chemical mechanical polishing consumable language in the title with claim-level detail on removal rate selectivity, abrasive particles, defectivity, pad grooving or endpoint detection. The IPC scope spans C09G1 (polishing compositions), B24B37 (polishing machines and processes) and H01L21 (semiconductor device processing), which means the corpus captures both the chemistry of slurries and the hardware and process side of planarization together.

Because publication typically lags filing by around 18 months, the most recent one or two years in any trend line will always look thinner than they eventually turn out to be. Read the tail of the filing curve as incomplete data, not as a real drop-off in activity.

Filing activity and technology composition, 2015-2026
  1. 1APPLIED MATERIALS INC674
  2. 2CABOT MICROELECTRONICS CORP321
  3. 3RODEL HLDG INC306
  4. 4DUPONT ELECTRONIC MATERIALS HLDG INC237
  5. 5CMC MATERIALS INC158
  6. 6MICRON TECHNOLOGY INC139
  7. 7EBARA CORP107
  8. 83M INNOVATIVE PROPERTIES CO87
  9. 9TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD86
  10. 10DOW GLOBAL TECHNOLOGIES LLC66
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on CMP Slurries and Pads covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The data

Filing trend and technology composition

Two views of the same 3,393-family corpus: how filing volume has moved year over year, and how activity splits across the IPC subclasses that define the field.

A peak in 2022, then a decline

Filings rose from 85 in 2017 to a peak of 133 in 2022, then fell toward single digits by 2026 — a curve consistent with a technology area where the core claim space filled up mid-decade and new filing has since slowed, on top of the expected reporting lag in the final years shown.

A peak in 2022, then a decline038751131508520172018201920202021133202220232024202522026Most recent year is partial — publication lag means later filings are not yet visible.

Hardware and process claims outnumber slurry chemistry

B24B (grinding & polishing) and H01L (semiconductor devices) together dominate the corpus at 2,805 and 1,938 records respectively, while C09G (polishing compositions, the slurry formulation core) sits at 581 and C09K (materials for miscellaneous applications) at 502. B24D (grinding tools & abrasives, 893) and the smaller G01B and C23F counts round out a corpus weighted toward pad and process engineering rather than pure formulation chemistry.

Hardware and process claims outnumber slurry chemistryB24B · Grinding & polishing2,80582.7%H01L · Semiconductor devices1,93857.1%B24D · Grinding tools & abrasives89326.3%C09G · Polishing compositions58117.1%C09K · Materials for misc. applicatio…50214.8%H10P2858.4%G01B · Measuring length & dimensions1404.1%C23F · Corrosion & metal removal872.6%Other85625.2%

Shares are the percentage of the 3,393 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on CMP Slurries and Pads covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

Go deeper on CMP Slurries and Pads with Eureka

This page is one run against one query. Ask Eureka your own question about cmp slurries and pads and every answer comes back with the patent numbers behind it.

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Key patents

The most-cited prior art in the field

Representative recent filing
US20220143778A12022-05-12

Polishing pad, method for producing the same and method of fabricating semiconductor device using the same (US20220143778A1)

ENPULSE CO., LTD.

The application describes a polishing pad engineered to hold removal rate and polishing profile steady through a CMP process while limiting wafer defects, and to planarize layers of different materials to matching flatness when polished together. It ties pad performance, including removal rate selectivity, to measurable physical properties of the pad itself rather than relying only on direct polishing trials to qualify a design.Filed by ENPULSE CO., LTD., published 2022-05-12.

US20220143778A1 — patent drawing 1US20220143778A1 — patent drawing 2
View full record
Highest-citation records in the corpus
#Publication no.Patent titleCitations
1US5893796AForming a transparent window in a polishing pad for a chemical mechanical polishing apparatus1,113
2US5609511APolishing method694
3US5872633AMethods and apparatus for detecting removal of thin film layers during planarization669
4US5807165AMethod of electrochemical mechanical planarization487
5US5911619AApparatus for electrochemical mechanical planarization425
6JP1990278822AChemical-mechanical polishing of electronic component board396
7US4793895AIn situ conductivity monitoring technique for chemical/mechanical planarization endpoint detection336
8US6039633AMethod and apparatus for mechanical and chemical-mechanical planarization of microelectronic-device substrate…328
9US6126532APolishing pads for a semiconductor substrate296
10US5514245AMethod for chemical mechanical planarization (CMP) of a semiconductor wafer to provide a planar surface free …279

Citation counts are drawn from documents indexed inside this corpus and skew toward older, foundational filings — treat them as a measure of influence on later filers, not of current commercial relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on CMP Slurries and Pads covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers say about the field

Four patterns stand out once filing counts, IPC composition and citation data are put side by side.

Filing trajectory
133 in 2022, down to 2 by 2026
peak year vs. latest year

The core claim space has already been staked out

Filing rose steadily through the late 2010s and peaked in 2022 before declining. Even allowing for publication lag understating the last one to two years, the shape points to a field where the obvious combinations of abrasive chemistry, pad structure and endpoint methods have largely been claimed.

Read alongside the technology composition split below.
Technology split
2,805 vs. 581 records
B24B (polishing hardware) vs. C09G (slurry compositions)

Pad and process claims outweigh formulation claims nearly 5 to 1

The corpus is weighted toward polishing hardware, grooving and process control rather than abrasive chemistry itself. That imbalance is worth checking against any new slurry formulation program — the composition side of the field is comparatively less filed, which can mean either genuine white space or that formulation work is being protected as trade secret rather than patented.

See the gate chips below for specific under-claimed branches.
Filing geography
1,502 US filings vs. 375 EPO, 359 PCT
receiving office distribution

The US is the primary battleground, Asia files close behind

United States filings outnumber the next largest office by roughly four to one, with EPO and WIPO/PCT routes close to each other and Japan, South Korea and Taiwan each in a similar band. A freedom-to-operate check that skips Japanese, Korean or Taiwanese national filings misses a meaningful share of the corpus.

Citation leaders below are almost entirely US filings from the 1990s.
Citation concentration
Top record cited 1,113 times
US5893796A, transparent polishing pad window

Foundational patents from the 1990s still anchor citation counts

The most-cited records in this corpus date to the mid-to-late 1990s and cover pad windows, endpoint detection and electrochemical mechanical planarization. Their citation weight reflects decades of accumulated references, not current filing activity — useful for understanding lineage, less useful for gauging what is being actively claimed today.

Cross-check any freedom-to-operate opinion against filing date, not citation count alone.
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to cmp slurries and pads, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on CMP Slurries and Pads covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the claim positions

Assignee activity in this corpus is concentrated among a small group of established polishing-consumables and semiconductor equipment suppliers, with recent-year filings across that group all showing zero in the latest reported year — a pattern that likely reflects publication lag rather than an actual pause across the entire field simultaneously.

Momentum
0 in latest year across leading assignees
recent-year filing count

Reported momentum has flattened for every major filer

Applied Materials, Rohm and Haas Holdings, Cabot Microelectronics, Micron, Dow Global Technologies and Ebara Corporation all show zero filings in the most recent tracked year, with Applied Materials and Ebara both showing -100% YoY. Given the 18-month publication lag, this is best read as an incomplete latest year rather than a genuine industry-wide stop.

Check the underlying filing-date distribution before drawing conclusions about any single company's strategy.
Co-filing
Strongest pair: 117 shared families
Rohm and Haas Holdings + Dow Global Technologies

One long-standing co-assignee relationship dominates joint filing

Of the 10 identified co-assignee pairs, the Rohm and Haas Holdings and Dow Global Technologies pairing is far stronger than any other, consistent with a shared corporate lineage in polishing pad and slurry chemistry. Applied Materials appears in two of the remaining notable pairs alongside individual named inventors, suggesting inventor-driven joint filings rather than corporate joint ventures.

Co-filing patterns can flag supply or licensing relationships worth checking before partnering.
Geographic reach
1,502 US filings lead all offices
receiving office count

Filing strategy still centres on the US office

The receiving-office split shows the United States well ahead of Europe, PCT, Japan, South Korea and Taiwan, though the latter three Asian offices sit close together in volume. Any assignee filing only through the USPTO and EPO is likely leaving Taiwanese and Korean coverage gaps, both significant manufacturing jurisdictions for CMP consumables.

Cross-reference receiving office against assignee headquarters for FTO scoping.
🔍
Under-claimed technical branches
Sub-areas with comparatively thin filing density relative to the core pad and slurry claims
in-situ defectivity metrology tied to pad wearabrasive particle size grading for selectivity controlendpoint detection algorithms independent of optical methodspad groove pattern optimization for low-k dielectricsslurry recycling and waste stream reclamation
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Applied Materials, Inc.0-100%
Rohm and Haas Holdings0
Cabot Microelectronics Corporation0
Micron Technology, Inc.0
Dow Global Technologies LLC0
Ebara Corporation0-100%
3M Innovative Properties Company0-100%
Taiwan Semiconductor Manufacturing Company (TSMC)0-100%
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on CMP Slurries and Pads covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's next

Where to take this analysis

The filing and citation data point to a field where hardware and process claims are dense and slurry formulation is comparatively open — the next steps depend on which side of that line the reader's own work sits.

Map a specific formulation against the C09G cluster

With only 581 records in the polishing-compositions subclass against thousands in polishing hardware, a targeted novelty search on a specific abrasive chemistry or dispersant system is more likely to surface real white space than a general keyword scan.

Explore in Eureka

Check freedom-to-operate against the 1990s citation anchors

The highest-cited records in this corpus, including the transparent pad window and electrochemical planarization patents, are old enough that core claims may have expired, but their descendants are worth tracing before finalising a design.

Run a citation trace in Eureka

Verify the latest-year drop before reading it as a slowdown

Every major assignee shows zero filings in the final tracked year; before concluding the field is cooling, pull the raw filing dates rather than publication dates to correct for the roughly 18-month lag.

Check filing dates in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on CMP Slurries and Pads covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about CMP slurry and pad patents

Answers are grounded in the same dataset. Derived from a Patsnap search on CMP Slurries and Pads covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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