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CMP Slurry Chemistry Patents: Top Companies & Filing Trends 2026

CMP Slurry Chemistry Patents: Top Companies & Filing Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/cmp-slurry-chemistry-and-selectivity-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Electronic Chemicals
CMP Slurry Chemistry and Selectivity Patents
  • Concentrated at the top. The five leading assignees hold 204 of 496 records in scope (41.1%), and the top ten hold 289 (58.3%) — filing here is dominated by a small group of semiconductor and materials firms.
  • Filing accelerated sharply. Filings rose from 10 in 2021 to 24 in 2024, a 140% increase over three years, with 2022 the peak year so far at 30 records.
  • Claims cluster in two places. 66.1% of records touch H01L (semiconductor devices) and 56.3% touch C09G (polishing compositions), leaving corrosion-and-removal chemistry (C23F, 13.3%) comparatively open.
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496
Published Records
41%
Top-5 Share of All Records
+140%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (10 records) with 2024 (24) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 496 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Overview

What this landscape covers

CMP slurry chemistry sits at the intersection of formulation science and semiconductor process integration: abrasive particle size, oxidizer chemistry, corrosion inhibitors and pH stability together determine removal-rate selectivity between copper, barrier and dielectric layers. This landscape covers 496 published records filed between 2015 and mid-2026 that claim CMP slurry compositions or processes tied to removal-rate selectivity, particle size control, oxidizer or inhibitor chemistry, pH stability, or agglomeration behaviour.

Because publication lags filing by roughly 18 months, the 2025 and 2026 figures in any trend line are undercounts rather than a genuine slowdown; 2024 is the most recent year that can be read as complete.

Records by filing year, 2017–2026
  1. 1TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD60
  2. 2SAMSUNG SDI CO LTD47
  3. 3CHEIL INDUSTRIES INC41
  4. 4CABOT MICROELECTRONICS CORP33
  5. 5SK HYNIX INC23
  6. 6LG CHEM LTD22
  7. 7VERSUM MATERIALS US LLC19
  8. 8APPLIED MATERIALS INC17
  9. 9ARACA INC14
  10. 10SAINT GOBAIN CERAMICS & PLASTICS INC13
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on CMP Slurry Chemistry and Selectivity covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The Numbers

Filing trend and technology composition

The dataset spans 496 records across receiving offices led by the United States, South Korea and WIPO's PCT route, with the IPC composition showing where slurry claims physically sit inside a semiconductor process.

Filing momentum, 2021–2024

Filings climbed from 10 in 2021 to 24 in 2024 — a 140% increase over that three-year span — with the field's peak year so far recorded in 2022 at 30 records. Read 2025 and 2026 as incomplete rather than declining.

Filing momentum, 2021–202408152330242017201820192020202130202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

Where claims sit by IPC subclass

H01L (semiconductor devices) appears on 66.1% of the 496 records and C09G (polishing compositions) on 56.3%, confirming that most slurry claims are drafted as part of a device or process context rather than as standalone chemistry. C23F (corrosion and metal removal, 13.3%) and C11D (detergents and cleaning, 2.8%) are the thinnest classes relative to the same 496-record base.

Where claims sit by IPC subclassH01L · Semiconductor devices32866.1%C09G · Polishing compositions27956.3%C09K · Materials for misc. applicatio…26653.6%B24B · Grinding & polishing15030.2%C23F · Corrosion & metal removal6613.3%H10P6412.9%C11D · Detergents & cleaning composit…142.8%G01N · Material analysis & testing142.8%Other13326.8%

Shares are the percentage of the 496 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on CMP Slurry Chemistry and Selectivity covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

Most-cited prior art in this space

Representative filing
WO2009056491A12009-05-07

WO2009056491A1 — CMP slurry composition for copper/barrier planarization

BASF SE

A CMP slurry composition for planarizing surfaces comprising copper and a diffusion barrier layer, combining an abrasive, an oxidizer, a corrosion inhibitor and a monomeric polyhydroxy compound in a base, with the slurry held at a pH of 7 to 13.Filed by BASF SE; published 2009-05-07.

WO2009056491A1 — patent drawing 1WO2009056491A1 — patent drawing 2
View full record
Highest-cited records in scope
#Publication no.Patent titleCitations
1US6063306AChemical mechanical polishing slurry useful for copper/tantalum substrate397
2US20050090104A1Slurry compositions for chemical mechanical polishing of copper and barrier films243
3US6217416B1Chemical mechanical polishing slurry useful for copper/tantalum substrates218
4US6447563B1Chemical mechanical polishing slurry system having an activator solution155
5US6177026B1CMP slurry containing a solid catalyst114
6US5846398ACMP slurry measurement and control technique114
7US6275290B1Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuri…89
8US5957757AConditioning CMP polishing pad using a high pressure fluid86
9US20080254628A1High throughput chemical mechanical polishing composition for metal film planarization84
10US6046112AChemical mechanical polishing slurry82

Citation counts favour older filings simply because they have had longer to accumulate citations inside the searched corpus — treat this table as a map of influential prior art, not of current filing activity.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on CMP Slurry Chemistry and Selectivity covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three patterns matter more than the raw counts: where citations concentrate, where the technology classes cluster, and how recent the activity actually is.

Citation concentration
397 citations
on the single most-cited record

Copper/tantalum selectivity chemistry is the reference point

The most-cited record in this set, on copper/tantalum substrate polishing, and the next several most-cited records all address copper and barrier-film removal selectivity. Any new filing on copper/barrier selectivity chemistry is filing against decades-deep, heavily cited prior art.

Citation data, most-cited table
Class overlap
66.1% + 56.3%
H01L and C09G co-occurrence

Slurry claims are drafted as device claims, not standalone chemistry

H01L (semiconductor devices) touches two-thirds of the 496 records and C09G (polishing compositions) touches over half; because a record can carry both classes, most slurry chemistry claims are anchored to a specific device or process integration rather than filed as pure formulation.

IPC composition, 496-record base
Filing momentum
+140%
2021 to 2024 filings

Activity is recent, not legacy

Filings nearly tripled between 2021 (10) and 2024 (24), with 2022 the peak year so far at 30. Combined with the concentration among a handful of assignees, this points to active, recent competitive filing rather than a settled field.

Filing trend, 2021-2024
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Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to cmp slurry chemistry and selectivity, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on CMP Slurry Chemistry and Selectivity covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the door is still open

The ranked leaders in this dataset cover 100 companies; concentration at the top leaves a long tail of single- and few-filing entrants below tenth place.

Leader
60 records
leading assignee

One filer sits well ahead of the field

The leading assignee holds 60 records versus 23 at fifth place and 13 at tenth — a steep drop-off that signals one company treating slurry chemistry as core IP rather than a peripheral filing area.

Assignee ranking
Top 5
41.1%
of 496 records

Concentration is real but not total

The five leading assignees combined hold 204 of the 496 records in scope. That leaves close to 60% of the field distributed across the remaining ranked companies and the long tail beyond them.

Concentration figures
Momentum
0 in latest year
for several top-10 assignees

Recent-year activity has gone quiet among the historic leaders

Several of the largest historic filers, including the top-ranked assignee, show 0 records in the latest year with year-on-year drops recorded at -100% for some. Given publication lag, this likely reflects filings still working through the pipeline rather than an actual exit from the space.

Recent-year momentum by assignee
🔍
Under-claimed sub-areas worth a closer look
Relative to the dominant H01L/C09G cluster, these branches carry a thinner claim footprint in this dataset:
Corrosion inhibitor chemistry (C23F)Slurry agglomeration controlpH stability formulationsPost-CMP cleaning/detergent compositions (C11D)In-line slurry analysis and testing (G01N)
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Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Taiwan Semiconductor Manufacturing Co., Ltd. (TSMC)0-100%
Samsung SDI Co., Ltd.0-100%
Cheil Industries Inc.0
Cabot Microelectronics Corp.0
LG Chem Ltd.0
SK Hynix Inc.0
Applied Materials Inc.0
Air Products and Chemicals, Inc.0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on CMP Slurry Chemistry and Selectivity covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this

The numbers point to a field that is concentrated at the top but still open in specific chemistry branches. The next steps depend on whether the goal is freedom-to-operate or new filing.

Check freedom-to-operate against the leading assignees

With 41.1% of records held by five assignees, any new copper/barrier selectivity filing should be checked against their portfolios specifically, not just the general prior art.

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Probe the under-claimed branches

Corrosion inhibitor chemistry and agglomeration control sit well below the H01L/C09G cluster in claim density, making them worth a closer look before drafting.

Explore white space in Eureka

Track the assignees that went quiet

Several top-10 filers show 0 records in the latest year; given the 18-month publication lag, confirm whether this is a pipeline gap or an actual shift in strategy.

Monitor assignee activity in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on CMP Slurry Chemistry and Selectivity covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on CMP slurry chemistry patents

Answers are grounded in the same dataset. Derived from a Patsnap search on CMP Slurry Chemistry and Selectivity covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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