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Complementary FET Wafer Bonding Patents: Who Leads, Gaps 2026

Complementary FET Wafer Bonding Patents: Who Leads, Gaps 2026
https://www.patsnap.com/resources/blog/rd-blog/complementary-fet-wafer-bonding-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Semiconductors & Microelectronics
Complementary FET Wafer Bonding Patents
  • A thin, flat filing record. 15 families total, peaking at 4 in 2019, with the 2022 midpoint back at zero — this is a technology with claims still being staked, not consolidated.
  • No single assignee is currently active. Every tracked assignee, including Intel, shows zero filings in the latest year, some down 100% year-on-year — momentum has stalled across the board, not just for laggards.
  • Filing is split across five receiving offices. US, EPO, WIPO, Germany and the UK each hold filings, meaning defensible positions require a multi-jurisdiction view rather than a single-market read.
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15
Published Records
0%
Filing Growth 2021→2024
US
Leading Jurisdiction
8
Active Filers Ranked

Filing growth compares 2021 (1 records) with 2024 (1) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this patent set covers

Complementary FET (CFET) architectures stack an n-type and p-type transistor vertically to shrink cell footprint beyond what side-by-side finFET or gate-all-around layouts allow. Building that stack requires either monolithic sequential integration — growing the second device tier directly on the first — or wafer-to-wafer bonding and layer transfer, where two separately processed tiers are joined and thinned. This dataset isolates the second route: filings that combine CFET terminology with bonding, sequential-integration, hybrid-bonding, or layer-transfer language in the claims or description, under the semiconductor-device IPC classes that cover wafer processing and bonding.

At 15 published families, the corpus is small enough that individual filings matter more than aggregate trends. Publication lags filing by roughly 18 months, so any apparent drop in the most recent year understates real activity rather than confirming a slowdown.

Filing activity and IPC composition, 2015–2026
  1. 1Soitec5
  2. 2International Business Machines Corporation (IBM)3
  3. 3Tokyo Electron Limited3
  4. 4Intel Corporation2
  5. 5Tokyo Electron U.S. Holdings, Inc.2
  6. 6IBM (China) Co., Ltd.1
  7. 7Taiwan Semiconductor Manufacturing Company, Ltd. (TSMC)1
  8. 8Huawei Technologies Co., Ltd.1
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Complementary FET Wafer Bonding covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The data

Filing trend and technology composition

The two views below track when families were filed and how they are classified. Read the trend as directional rather than exact for 2024–2026, since publication delay hides recent filings that have not yet surfaced.

A peak in 2019, then a flat-to-declining line

Filings rose to 4 in 2019 and have not returned to that level since; the 2022 midpoint sits at zero. That shape is consistent with an early flurry of foundational claims followed by a pause, rather than steady, compounding investment.

A peak in 2019, then a flat-to-declining line01234020172018420192020202120224202320244202502026Most recent year is partial — publication lag means later filings are not yet visible.

Concentrated in general semiconductor-device classes

All 15 records sit under H01L, with 8 also tagged to the newer H10D general semiconductor-device class and 4 to H10P — a narrow classification footprint that reflects how young and unsettled the CFET-bonding intersection still is.

Concentrated in general semiconductor-device classesH01L · Semiconductor devices15100.0%H10D · Semiconductor devices (general)853.3%H10P426.7%

Shares are the percentage of the 15 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Complementary FET Wafer Bonding covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

Go deeper on Complementary FET Wafer Bonding with Eureka

This page is one run against one query. Ask Eureka your own question about complementary fet wafer bonding and every answer comes back with the patent numbers behind it.

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Key patents

Most-cited records and a representative filing

Representative filing
EP4791148A12026-08-12

EP4791148A1 — Complementary field-effect transistor and method of manufacture

HUAWEI TECHNOLOGIES CO., LTD.

In some examples, a complementary field-effect transistor (CFET) comprises a first transistor formed on a first level, and a second transistor formed on a second level, wherein the second level is stacked on the first level, wherein a channel of the first transistor is offset from a channel of the second transistor while maintaining partial overlap between the channels.Filed by Huawei Technologies Co., Ltd.; the offset-channel-with-partial-overlap limitation is the specific geometry to check against before designing a stacked-channel layout.

EP4791148A1 — patent drawing 1EP4791148A1 — patent drawing 2
View full filing
Highest-cited families in this dataset
#Publication no.Patent titleCitations
1US20230377998A1Method of forming confined growth s/d contact with selective deposition of inner spacer for cfet19
2US20210202326A1Method for manufacturing a CFET device6
3WO2020242909A1Compact 3D stacked CFET architecture for complex logic cells3
4US11876020B2Method for manufacturing a CFET device1

Citation counts reward older filings simply because they have had more time to be cited; treat this table as a map of early influence, not of which claims matter most today.

Publication numbers are shown where the record carries one (4 of 4 rows); clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Complementary FET Wafer Bonding covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three patterns stand out once the dataset is this small: the technology's classification is narrow, its filing history is uneven, and its citation record is dominated by a single family.

Filing volume
15 families
total published

A field still being staked, not settled

With only 15 families across more than a decade of coverage, no assignee has built a defensive thicket here. A well-drafted claim on an under-covered bonding step still has room to stand largely alone.

Peak year: 2019 (4 filings)
Citation concentration
19 citations
top-cited record

One family carries most of the influence

US20230377998A1, on confined-growth source/drain contact formation for CFET, is cited far more than any other record in the set. Anything touching selective-deposition inner-spacer or S/D contact confinement should be checked against it first.

Next-highest: 6 citations
Jurisdiction spread
5 offices
US, EPO, WIPO, DE, UK

No single dominant filing venue

The 15 families split across five receiving offices with the US only slightly ahead of Europe and PCT filings. A freedom-to-operate check confined to one jurisdiction will miss live filings elsewhere.

US 5 · EPO 4 · WIPO 3
Recent momentum
0% active
assignees filing in latest year

Activity has paused across every tracked assignee

Every assignee in the momentum data, including Intel at -100% YoY, shows zero filings in the latest year. That is either a genuine pause or a publication-lag artifact — either way, current searches will undercount what is actually in the pipeline.

Publication lag: ~18 months
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to complementary fet wafer bonding, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Complementary FET Wafer Bonding covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the ground, and where it is open

The assignee list is short and no one is currently filing at volume. That combination — low activity, unconsolidated ownership — is the clearest signal in this dataset.

Filer
0 in latest year
no active filings

A roster of large players, all currently quiet

Soitec, International Business Machines Corporation (IBM) (IBM), Tokyo Electron Limited (Tokyo Electron) and Intel Corporation (Intel) all appear in the ranking, and all show zero filings in the latest tracked year. This is a dormant-looking field held by companies with deep process-integration expertise elsewhere.

Momentum data across 6 named assignees
Co-filing
2 pairs
co-assignee links

Corporate-affiliate filing, not cross-company alliance

The two identified co-assignee pairs — Tokyo Electron with its US holding entity, and IBM with IBM China — are internal corporate structures rather than joint ventures between competitors. There is no evidence here of collaborative R&D across independent firms.

Strongest pair: 2 shared families
Citation leader
19 citations
on S/D contact method

Contact and spacer formation is the most-referenced ground

The highest-cited record in the set addresses confined source/drain contact growth with selective inner-spacer deposition for CFET. Later filers in that specific process step will need to design around or license around this claim.

US20230377998A1
🔍
Under-claimed sub-areas worth a closer look
These bonding-adjacent steps show little claim density in this dataset relative to their process importance.
Bonded-interface via alignment for stacked CFET tiersSelective inner-spacer deposition beyond S/D contactThermal budget management across bonded tiersWafer thinning tolerance for offset-channel stacksCross-tier interconnect after layer transfer
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Soitec0
International Business Machines Corporation (IBM)0
Tokyo Electron Limited0
Intel Corporation0-100%
Tokyo Electron U.S. Holdings, Inc.0
IBM (China) Co., Ltd.0
Taiwan Semiconductor Manufacturing Company, Ltd. (TSMC)0-100%
Huawei Technologies Co., Ltd.0-100%
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Complementary FET Wafer Bonding covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's next

Where to take this analysis

This landscape flags the shape of the field; deciding where to file or how to design around specific claims needs a closer read of individual documents.

Check freedom-to-operate on contact formation

Before drafting claims touching source/drain contact or inner-spacer steps for CFET, review the top-cited record's independent claims in detail rather than relying on the abstract.

Explore in Eureka

Map the white space chips against your own roadmap

The under-claimed sub-areas listed above are starting points, not conclusions — run a targeted search against your specific bonding or layer-transfer method to confirm the gap holds.

Run a search in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Complementary FET Wafer Bonding covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about CFET wafer bonding patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Complementary FET Wafer Bonding covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Complementary FET Wafer Bonding in depth with Eureka

Go past this page: query the whole complementary fet wafer bonding corpus yourself, in your own scope.
Every answer comes back with patent numbers you can open.

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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