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CT Metrology Patents: Who Leads, Where the Gaps Are 2026

CT Metrology Patents: Who Leads, Where the Gaps Are 2026
Data to 2026-07-31

Computed Tomography Metrology and Traceability Patents

Filing peaked in 2017 at 10 records and has not returned to that level since, though publication lag understates the most recent years. Filings ran at 10 in 2017, the peak year so far, and have declined toward 0 by 2026. With fewer than four complete years once the roughly 18-month publication lag is accounted for, no growth rate can be stated from this data.

Filing trend, 2017-2026
Complete Incomplete
Filing trend, 2017-20260358101020172018201920202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.
36
Published Records
US
Leading Jurisdiction
13
Active Filers Ranked
2017
Peak Filing Year
Top filers · published records
  1. 1STARNA SCIENTIFIC LTD9
  2. 2CMIC HLDG CO LTD7
  3. 3DIASYS DIAGNOSTIC SYST5
  4. 4IMMUNDIAGNOSTIK AG5
  5. 5MINDS MECHANICAL LLC3
Published by Patsnap Research·

See the full computed tomography metrology and traceability analysis in Eureka

  • The complete ranking, not just the top five
  • Every IPC branch with its share of the corpus
  • The most-cited records, and where claim space is still thin
Read more about this analysis in Eureka
FAQ

Common questions on CT metrology patents

What does metrological traceability mean in a computed tomography patent claim?+

It means the claim ties a CT-derived dimensional measurement back to an international unit standard through an unbroken chain of calibrated references, typically involving a reference artefact of known dimensions. In this dataset that concept shows up alongside measurement uncertainty analysis and coordinate machine comparison claims, since traceability is usually proven by comparing CT results against a coordinate measuring machine reading. A claim that only describes a scanning method without this comparison or calibration chain is not normally considered a traceability claim in the patent sense. Practically, examiners and competitors will look for the specific artefact geometry and calibration procedure named in the claim, not just the phrase itself.

Who are the leading patent filers in computed tomography metrology?+

The ranked field in this dataset covers 13 companies, with the top assignee holding 9 of the 36 records in scope and a steep drop to single-digit counts by fifth place. The filers span corporate, government and academic assignees, including a national metrology institute and a university department, which points to standards work happening alongside commercial product filing. Because the ranking is the complete list the data returns rather than a top-50 cut, a new entrant filing even a handful of families could shift the ordering meaningfully. Anyone assessing freedom to operate should check the leader’s claims first given the concentration at that position.

Why did CT metrology patent filings peak in 2017 and decline afterward?+

The trend data shows 10 filings in 2017, the peak year in this coverage window, declining toward 0 by 2026. Part of that apparent decline is real, but part of it is an artefact of publication lag: patent applications typically publish around 18 months after filing, so the last one to two years in any dataset are always undercounted. With fewer than four complete years of data once that lag is factored in, no reliable growth rate can be calculated from this evidence. Readers should treat the 2024-2026 figures as provisional rather than a confirmed slowdown.

Disclaimer. This analysis is based on Patsnap Eureka data drawn from a limited snapshot of global patent records and is provided for general information and reference only. Patent data carries inherent limitations — recent filings are under-counted because of publication lag, counts may be on a record or family basis, classification and applicant-name data may contain errors or duplicates, and the underlying search query defines the scope shown — so the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing here is an exhaustive prior-art, novelty, freedom-to-operate or validity search, nor does it constitute legal, financial or professional advice, and it should not be relied upon as such. Verify independently and review with qualified patent and legal professionals before acting on it.

Method: Filing trend and technology composition. Derived from a Patsnap search on Computed Tomography Metrology and Traceability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish. Every share divides by all records in scope. Data: Patsnap Eureka. See the full landscape report.

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