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CT Metrology Patents: Who Leads, Where the Gaps Are 2026

CT Metrology Patents: Who Leads, Where the Gaps Are 2026
https://www.patsnap.com/resources/blog/rd-blog/computed-tomography-metrology-and-traceability-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Industrial Radiography
Computed Tomography Metrology and Traceability Patents
  • Filing peaked in 2017 at 10 records and has not returned to that level since, though publication lag understates the most recent years.
  • One assignee leads with 9 records against a ranked field of 13 companies, with a sharp drop to single digits by fifth place.
  • G01N material analysis dominates at 66.7% of the 36 records in scope, leaving force, radiation and data-processing subclasses thinly claimed.
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36
Published Records
US
Leading Jurisdiction
13
Active Filers Ranked
2017
Peak Filing Year

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This landscape tracks patent filings at the intersection of computed tomography metrology and metrological traceability — the claims that let a CT scan’s dimensional output be trusted against a coordinate measuring machine or an international standard. The scope spans reference artefacts, measurement uncertainty analysis, surface determination and multi-material sample handling, pulled from records published between 2015 and 2026.

The dataset is small: 36 published records in total, ranked across 13 companies. That size matters for how the figures should be read — a single well-cited family can shift the picture, and the ranked leaders here are not a top-50 or top-100 cut but the entire ranking the underlying data returns.

Filing activity and technology composition, 2015-2026
  1. 1STARNA SCIENTIFIC LTD9
  2. 2CMIC HLDG CO LTD7
  3. 3DIASYS DIAGNOSTIC SYST5
  4. 4IMMUNDIAGNOSTIK AG5
  5. 5MINDS MECHANICAL LLC3
  6. 6THE GOVERNMENT OF THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY DEPARTMENT OF HEALTH & HUMAN SERVICES2
  7. 7FRIEDRICH ALEXANDER UNIV ERLANGEN NUERNBERG2
  8. 8NATIONAL INSTITUTE OF METROLOGY CHINA2
  9. 9THE BOEING CO2
  10. 10DOKUZ EYLUL UNIVERSITESI2
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Computed Tomography Metrology and Traceability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Data

Filing trend and technology composition

Two views of the same 36-record set: how filings moved year over year, and which IPC subclasses carry the claims.

Filing trend, 2017-2026

Filings ran at 10 in 2017, the peak year so far, and have declined toward 0 by 2026. With fewer than four complete years once the roughly 18-month publication lag is accounted for, no growth rate can be stated from this data.

Filing trend, 2017-20260358101020172018201920202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

IPC subclass composition

G01N (material analysis and testing) appears on 66.7% of the 36 records in scope, far ahead of C07K peptide/protein claims at 13.9% and the C12N, C12P and C12Q life-science subclasses each in the 8-11% range. G01J radiation measurement, G01L force measurement and G06F data processing each sit at 5.6%, the thinnest bands in the set. Because a record can carry more than one class, these shares sum to well over 100% and should not be read as a partition of the 36 records.

IPC subclass compositionG01N · Material analysis & testing2466.7%C07K · Peptides & proteins513.9%C12N · Microorganisms & genetic engin…411.1%C12P · Fermentation & enzymatic synth…38.3%C12Q · Measuring & testing involving …38.3%G01J · Radiation & light measurement25.6%G01L · Force & pressure measurement25.6%G06F · Electric digital data processi…25.6%Other822.2%

Shares are the percentage of the 36 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Computed Tomography Metrology and Traceability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

Most-cited records in this landscape

Representative filing
US20190354915A12019-11-21

Metrology system for measurement uncertainty analysis (US20190354915A1)

MINDS MECHANICAL, LLC

Certain aspects relate to systems and techniques for acquiring metrology inspection data of manufactured physical parts, identifying measurement uncertainty scores at various stages of the process of manufacturing and inspecting the physical parts, and leveraging the measurement uncertainty scores to evaluate manufacturing setups for the capability to make and/or inspect other parts. The scores can be specific to particular geometric features, and manufacturing setups can be identified for new parts based on the geometric features of those parts.Filed by Minds Mechanical, LLC, published 2019-11-21.

US20190354915A1 — patent drawing 1US20190354915A1 — patent drawing 2
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Top-cited records
#Publication no.Patent titleCitations
1WO2018204410A1Metrology system for machine learning-based manufacturing error predictions51
2WO2018090142A1Method and system for data processing for distributed spectrophotometric analyzers15
3WO2018206737A1Method for determination of members of the s100 family of calcium binding proteins by immunoturbidimetry12
4WO2018089252A1Metrology system for measurement uncertainty analysis11
5US20190078945A1Dynamic force contactor, providing a dynamic force, and calibrating a force sensor to be traceable to the int…10
6US20190354915A1Metrology system for measurement uncertainty analysis9
7US20210382044A1Method for determination of members of the s100 family of calcium binding proteins by immunoturbidimetry5
8US10641663B2Dynamic force contactor, providing a dynamic force, and calibrating a force sensor to be traceable to the int…2
9GB201421819D0PCR validation tubes2
10US20150160132A1PCR validation tubes2

Citation counts inside a searched corpus favour older records; read them as a signal of influence, not of current importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Computed Tomography Metrology and Traceability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three findings that would not be obvious without pulling the underlying records.

Concentration at the top
9 records
leader's family count

One assignee sets the pace, but the field is small

The leader holds 9 records against a ranked field of 13 companies, with fifth place already down to 3 and tenth place to 2. That drop-off is steep for a field this size, but with only 36 total records, a single new entrant filing three or four continuations could change the ranking meaningfully.

Ranking basis: 13 companies, all returned by the data endpoint.
Filing trend
10 in 2017
peak year

Activity has cooled since 2017, but the tail is uncertain

The peak year on record is 2017 at 10 filings, with the count trailing toward 0 by 2026. Publication lag of roughly 18 months means the last one to two years are understated rather than genuinely quiet, so treat the recent decline as provisional.

Coverage window: 2015-01-01 to 2026-07-31.
Class distribution
66.7%
of 36 records carry G01N

Claim space is dense in material analysis, thin elsewhere

Two-thirds of the 36 records in scope sit under G01N (material analysis and testing), while G01J radiation measurement, G01L force measurement and G06F data processing each account for only 5.6%. Dense G01N filing means that claim space is occupied, not that the underlying measurement problem is solved.

Shares sum above 100% because records can carry multiple IPC classes.
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Co-assignee activity
AssigneeCo-assigneeShared families
Diasys Diagnostic SystemsImmundiagnostik AG5

The strongest co-assignee pairing in this dataset appears 5 times, linking Diasys Diagnostic Systems and Immundiagnostik AG — evidence of a joint filing programme rather than isolated collaboration.

Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Computed Tomography Metrology and Traceability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the gaps sit

The ranked field spans corporate, government and university assignees, with filing activity thin at every recent-year checkpoint in the data.

Leader
9 records
family count

The largest filer by family count

The top-ranked assignee holds 9 of the 36 records in scope, the clearest concentration point in an otherwise flat ranking. Recent-year momentum data shows 0 filings in the latest year across the assignees checked, consistent with the overall trend decline.

Ranked 1 of 13.
Mid-field
3 records
fifth-place count

A sharp step down after the leader

Fifth place in the ranking holds 3 records, and tenth place holds 2 — a compressed mid-field rather than a long gradual tail. This shape suggests the technology has not yet attracted a broad base of repeat filers.

Ranking spans 13 companies total.
Institutional filers
Government & university
assignee types present

Public and academic assignees sit alongside corporates

The ranking includes a national metrology institute, a university, and a government health agency alongside corporate filers such as Boeing and Minds Mechanical. That mix points to standards-development activity running in parallel with product-oriented filing.

Assignee types drawn from the ranked list of 13.
🔍
Under-claimed sub-areas worth watching
Thin IPC bands suggest room to file before the space fills in.
Radiation dose calibration for CT metrologyDynamic force sensor traceabilityML-assisted uncertainty scoring pipelinesMulti-material surface determination algorithmsCoordinate machine comparison protocols
Rank all filers by momentum →
Recent-year filing momentum
AssigneeRecent yearYoY
STARNA SCIENTIFIC LTD0
CMIC Holdings Co., Ltd.0
Diasys Diagnostic Systems0
Immundiagnostik AG0
MINDS MECHANICAL LLC0
The Government of the United States of America as represented by the Secretary, Department of Health & Human Services0
The Boeing Company0
Friedrich-Alexander-Universität Erlangen-Nürnberg0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Computed Tomography Metrology and Traceability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to a small, concentrated field with thin coverage outside its core material-analysis claims.

Map the leader's claim scope

With 9 of 36 records, the top assignee's claim boundaries are the first thing to check before drafting in this space.

Explore assignee claims in Eureka

Test the thin IPC bands

G01J, G01L and G06F each sit at 5.6% of records — worth a freedom-to-operate check before assuming the space is open.

Run a white space search in Eureka

Track the co-filing pair

The Diasys/Immundiagnostik pairing recurs 5 times; understanding what they jointly protect clarifies one corner of the landscape.

Analyse co-assignee patterns in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Computed Tomography Metrology and Traceability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on CT metrology patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Computed Tomography Metrology and Traceability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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