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Run your analysis now →Filing growth compares 2021 (6 records) with 2024 (2) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 1,789 records in scope (CR5), not by the ranked leaders only.
Deep ultraviolet immersion lithography extends optical lithography's resolution by placing a fluid between the final lens element and the wafer, raising numerical aperture beyond what a dry system can reach. The patent record for this topic runs from 2015 through the 2026 cut-off and covers 1,789 patent families, concentrated overwhelmingly in G03F photolithography classifications with secondary claim activity in semiconductor-device integration (H01L) and photographic/optical apparatus (G03B, G02B).
Filing activity peaked in 2017 and has trended down since, with the 2022 midpoint at just 2 filings against a peak of 45 — consistent with a field whose foundational immersion-fluid, resolution-enhancement and multiple-patterning claims were filed early and have not needed heavy follow-on protection. Because publication typically lags filing by around 18 months, the most recent years in this trend will read lower than eventual filings will show, but the multi-year decline predates that lag effect.
Pick a task. Every answer cites the patents behind it.
Two views of the same 1,789-family dataset: how filing volume has moved year over year, and which IPC subclasses carry the claim density.
The 2017 peak of 45 filings sits well above the 2022 midpoint of 2, and the curve runs to 0 by the 2026 cut-off (a partial year). That shape points to a technology where the core patentable ground — immersion fluid composition, resolution-enhancement techniques, multiple-patterning schemes — was claimed during an earlier filing wave, with recent years showing consolidation rather than expansion.
1,788 of 1,789 records classify under G03F (photolithography and photomechanics), meaning virtually every filing in this search touches core lithographic method or apparatus claims. H01L (527 records) and G03B (473) show where those claims connect to semiconductor device manufacture and imaging apparatus respectively, while G02B (247), C08F (123) and G03C (86) mark smaller but distinct claim territories in optics, resist polymer chemistry and photosensitive materials.
Shares are the percentage of the 1,789 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.
This page is one run against one query. Ask Eureka your own question about deep ultraviolet (duv) immersion lithography and every answer comes back with the patent numbers behind it.
Try EurekaAn immersion fluid for use in liquid immersion lithography in which a resist film is exposed to light via a fluid. The fluid is transparent to the exposure light used in the liquid immersion lithography and comprises a fluorine-based liquid having a boiling point of 70 to 270°C. A method of forming resist pattern includes a step of placing the immersion fluid directly on the resist film or a protective film deposited on the resist film. The invention aims to prevent alteration of resist film and other films as well as alteration of the fluid during liquid immersion lithography and enables high resolution resist patterning.Filed by Tokyo Ohka Kogyo, published 2006-07-13 — one of the fluid-composition filings that sits directly in the claim path of any immersion fluid formulated with a fluorine-based liquid in this boiling-point window.


| # | Publication no. | Patent title | Citations |
|---|---|---|---|
| 1 | US20040075895A1 | Apparatus for method for immersion lithography | 1,382 |
| 2 | US20040165159A1 | Lithographic apparatus and device manufacturing method | 1,360 |
| 3 | US20040114117A1 | Lithographic apparatus and device manufacturing method | 1,013 |
| 4 | US20030174408A1 | Refractive projection objective for immersion lithography | 990 |
| 5 | US20050046934A1 | Method and system for drying a substrate | 989 |
| 6 | US20050094116A1 | Gradient immersion lithography | 880 |
| 7 | US20050036183A1 | Immersion fluid for immersion Lithography, and method of performing immersion lithography | 758 |
| 8 | US20050037269A1 | Method and apparatus for monitoring and controlling imaging in immersion lithography systems | 726 |
| 9 | WO2005024517A2 | Apparatus and method for providing fluid for immersion lithography | 724 |
| 10 | WO2004093130A2 | Cleanup method for optics in immersion lithography | 716 |
Citation counts inside a searched corpus favour older filings simply because they have had more years to accumulate citations — read this as a map of influence on subsequent claim drafting, not a ranking of present-day importance.
Each row carries its publication number; clicking a row searches Eureka by that number.
When you want the answer in the next five minutes.
The agent works the prompt against patents and technical literature, citing every source.
Run your analysis now →When it has to run inside your own pipeline.
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Browse MCP servers →Three signals worth weighing before drafting into this space: where the claim density sits, who filed the founding art, and how filing offices split.
With 1,788 of 1,789 records classified under G03F, this dataset is not a diffuse technology touching many unrelated fields — it is a tightly bounded claim territory. Overlap with H01L and G03B shows where lithography method claims connect to device fabrication and apparatus design, but the centre of gravity never leaves photolithography.
The receiving-office split — 735 United States, 299 Europe, 156 Japan, 113 Taiwan, 104 WIPO, 95 China — shows where applicants have historically sought enforceable rights for this technology, with Taiwan's 113 filings reflecting the concentration of leading-edge fabrication capacity there.
A drop from a 2017 peak of 45 to a 2022 midpoint of 2, continuing to 0 at the 2026 cut-off, is a decline pattern rather than normal year-to-year noise. New entrants filing now are working against a densely claimed and largely closed body of prior art rather than an emerging one.
Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to deep ultraviolet (duv) immersion lithography, with the prior art for and against each one.
Recent-year momentum across the named assignees below reads as flat or negative across the board — every tracked assignee shows 0 filings in the latest year, and ASML shows a -100% year-on-year change. That pattern is consistent with the dataset's overall decline: the incumbents that built the foundational immersion-lithography portfolio are not filing heavily against it now, whether because the core ground is already covered or because activity has shifted to trade-secret or downstream integration work outside this search's IPC scope.
The strongest co-assignee link in the dataset (14 shared filings) pairs ASML with Carl Zeiss SMT, reflecting the tight coupling between exposure-tool systems and the projection optics inside them — a structural collaboration rather than a one-off.
Rohm and Haas Electronic Materials, Tokyo Ohka Kogyo and JSR all sit in the materials layer of this landscape (resist films, immersion fluids, protective coatings) but register 0 filings in the latest tracked year alongside the equipment makers.
ASML's -100% year-on-year change, alongside 0 latest-year filings from Nikon, TSMC and IBM, indicates the named leaders are not currently adding to this specific claim set, consistent with a technology whose active filing window has closed rather than one still being contested.
| Assignee | Recent year | YoY |
|---|---|---|
| Nikon Corporation | 0 | — |
| Rohm and Haas Electronic Materials LLC | 0 | — |
| ASML Netherlands B.V. | 0 | -100% |
| Taiwan Semiconductor Manufacturing Company (TSMC) | 0 | — |
| Tokyo Ohka Kogyo Co., Ltd. | 0 | — |
| International Business Machines Corporation (IBM) | 0 | — |
| Carl Zeiss SMT GmbH | 0 | — |
| JSR Corporation | 0 | — |
The filing curve and classification data point to a mature, tightly claimed field. Two directions make sense from here.
Before drafting into fluid composition, resolution enhancement or multiple-patterning claims, the five most-cited records in this dataset are the ones to read claim-by-claim — they set the boundaries everything since has had to work around.
Explore in EurekaThin coverage in adjacent branches like fluid recovery or overlay correction could mean open claim space, or it could mean those techniques are protected under different IPC codes or trade secret. Verify before committing R&D budget.
Run a deeper search in EurekaThe dataset shows filings rising to a peak of 45 in 2017, then falling to just 2 by the 2022 midpoint and trending to 0 at the 2026 cut-off. This pattern typically means the foundational technical problems — how to keep an immersion fluid stable and transparent, how to raise numerical aperture without introducing defects, how to pattern at higher resolution using multiple exposures — were solved and claimed during an earlier wave, most visibly the 2003-2005 priority filings that still carry the highest citation counts. Later filers had less new ground to stake out, so filing volume naturally thinned. It is worth remembering that publication lags filing by around 18 months, so the very last one or two years in any such chart will always look lower than they eventually turn out to be, but a multi-year decline like this one is a real signal, not just a lag artifact.
The recent-year momentum data names a consistent group of assignees spanning equipment makers, optics suppliers and materials companies, but every one of them shows 0 filings in the latest tracked year, and the equipment leader shows a -100% year-on-year change. The strongest documented collaboration is a co-assignee link between an equipment maker and a projection-optics supplier, filing together 14 times, which reflects how tightly exposure-tool and lens development are coupled in this field. Rather than an active filing race, the current picture is one of established incumbents whose portfolios were built earlier and are not being heavily added to now.
Of 1,789 total records, 1,788 fall under G03F (photolithography and photomechanics), meaning virtually every filing in this space touches core lithographic method or apparatus claims. Secondary classification volume appears in H01L (527, semiconductor devices), G03B (473, photographic apparatus) and G02B (247, optical elements), showing how lithography claims connect outward into device fabrication and imaging systems. Smaller subclasses like C08F (123, resist polymer chemistry) and G03C (86, photosensitive materials) mark narrower but distinct pockets of claim activity in materials rather than optics or apparatus.
US20060154188A1, filed by Tokyo Ohka Kogyo and published 2006-07-13, claims an immersion fluid for liquid immersion lithography that is transparent to the exposure wavelength and comprises a fluorine-based liquid with a boiling point between 70 and 270 degrees Celsius, along with a method of applying that fluid directly onto a resist film or a protective film over it. Anyone formulating an immersion fluid that falls inside that fluorine-based, boiling-point-defined composition and applying it in that manner should review this filing's claim scope closely. Designing around it generally means moving outside that specific boiling-point window, using a non-fluorine-based fluid chemistry, or applying the fluid through a materially different method than direct placement on the resist or protective film.
The dataset shows comparatively thin direct coverage in areas like immersion fluid recovery and recycling systems, defect inspection performed under immersion conditions, multiple-patterning overlay correction techniques, and protective topcoat chemistry tailored to immersion resist stacks. These sit adjacent to the dense core of fluid composition and exposure apparatus claims rather than replacing it. Before committing to any of these branches, it is worth checking whether the apparent gap reflects genuinely open claim space or simply reflects that related work is filed under a different IPC classification or held as a trade secret rather than patented.
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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.
Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.
Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.
Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company's registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.