https://www.patsnap.com/resources/blog/rd-blog/deep-ultraviolet-duv-immersion-lithography-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Lithography
Deep Ultraviolet (DUV) Immersion Lithography Patents
  • Filing already peaked. Filings crested at 45 in 2017 and have declined since, with the 2022 midpoint down to 2 — a signature of a technology whose core claim space was staked out early.
  • One classification dominates almost entirely. 1,788 of 1,789 records sit in G03F (photolithography), with H01L semiconductor-device claims and G03B optical-apparatus claims layered on top rather than forming separate centres of activity.
  • The founding filings still carry the citation weight. The five most-cited records date to the 2003–2005 immersion-lithography priority wave and each carry citation counts near or above 1,000 — a strong signal of which claims later filers had to design around.
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1,789
Published Records
62%
Top-5 Share of All Records
-67%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (6 records) with 2024 (2) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 1,789 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··8 min readSourced from Patsnap Eureka
Overview

What the DUV immersion lithography patent record shows

Deep ultraviolet immersion lithography extends optical lithography's resolution by placing a fluid between the final lens element and the wafer, raising numerical aperture beyond what a dry system can reach. The patent record for this topic runs from 2015 through the 2026 cut-off and covers 1,789 patent families, concentrated overwhelmingly in G03F photolithography classifications with secondary claim activity in semiconductor-device integration (H01L) and photographic/optical apparatus (G03B, G02B).

Filing activity peaked in 2017 and has trended down since, with the 2022 midpoint at just 2 filings against a peak of 45 — consistent with a field whose foundational immersion-fluid, resolution-enhancement and multiple-patterning claims were filed early and have not needed heavy follow-on protection. Because publication typically lags filing by around 18 months, the most recent years in this trend will read lower than eventual filings will show, but the multi-year decline predates that lag effect.

Filing activity by year, 2017–2026
  1. 1NIKON CORP466
  2. 2ASML NETHERLANDS BV210
  3. 3DUPONT ELECTRONIC MATERIALS INT LLC184
  4. 4TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD153
  5. 5TOKYO OHKA KOGYO CO LTD96
  6. 6CARL ZEISS SMT GMBH78
  7. 7JSR CORPORATION74
  8. 8INTERNATIONAL BUSINESS MACHINE CORPORATION52
  9. 9ASML HLDG NV50
  10. 10SHIN ETSU CHEMICAL CO LTD35
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Deep Ultraviolet (DUV) Immersion Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The Data

Filing trend and technology composition

Two views of the same 1,789-family dataset: how filing volume has moved year over year, and which IPC subclasses carry the claim density.

A peak-and-decline filing curve

The 2017 peak of 45 filings sits well above the 2022 midpoint of 2, and the curve runs to 0 by the 2026 cut-off (a partial year). That shape points to a technology where the core patentable ground — immersion fluid composition, resolution-enhancement techniques, multiple-patterning schemes — was claimed during an earlier filing wave, with recent years showing consolidation rather than expansion.

A peak-and-decline filing curve0132538504520172018201920202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

G03F carries almost the entire dataset

1,788 of 1,789 records classify under G03F (photolithography and photomechanics), meaning virtually every filing in this search touches core lithographic method or apparatus claims. H01L (527 records) and G03B (473) show where those claims connect to semiconductor device manufacture and imaging apparatus respectively, while G02B (247), C08F (123) and G03C (86) mark smaller but distinct claim territories in optics, resist polymer chemistry and photosensitive materials.

G03F carries almost the entire datasetG03F · Photolithography & photomechan…1,78899.9%H01L · Semiconductor devices52729.5%G03B · Photographic apparatus47326.4%H10P26915.0%G02B · Optical elements & systems24713.8%C08F · Addition polymers (vinyl etc.)1236.9%G03C · Photosensitive materials864.8%B08B · Cleaning (general)452.5%Other27915.6%

Shares are the percentage of the 1,789 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Deep Ultraviolet (DUV) Immersion Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The filings other applicants had to design around

Representative Filing
US20060154188A12006-07-13

Immersion fluid for use in liquid immersion lithography and method of forming resist pattern using the immersion fluid

TOKYO OHKA KOGYO CO., LTD.

An immersion fluid for use in liquid immersion lithography in which a resist film is exposed to light via a fluid. The fluid is transparent to the exposure light used in the liquid immersion lithography and comprises a fluorine-based liquid having a boiling point of 70 to 270°C. A method of forming resist pattern includes a step of placing the immersion fluid directly on the resist film or a protective film deposited on the resist film. The invention aims to prevent alteration of resist film and other films as well as alteration of the fluid during liquid immersion lithography and enables high resolution resist patterning.Filed by Tokyo Ohka Kogyo, published 2006-07-13 — one of the fluid-composition filings that sits directly in the claim path of any immersion fluid formulated with a fluorine-based liquid in this boiling-point window.

US20060154188A1 — patent drawing 1US20060154188A1 — patent drawing 2
View full filing
Most-cited records in the DUV immersion lithography corpus
#Publication no.Patent titleCitations
1US20040075895A1Apparatus for method for immersion lithography1,382
2US20040165159A1Lithographic apparatus and device manufacturing method1,360
3US20040114117A1Lithographic apparatus and device manufacturing method1,013
4US20030174408A1Refractive projection objective for immersion lithography990
5US20050046934A1Method and system for drying a substrate989
6US20050094116A1Gradient immersion lithography880
7US20050036183A1Immersion fluid for immersion Lithography, and method of performing immersion lithography758
8US20050037269A1Method and apparatus for monitoring and controlling imaging in immersion lithography systems726
9WO2005024517A2Apparatus and method for providing fluid for immersion lithography724
10WO2004093130A2Cleanup method for optics in immersion lithography716

Citation counts inside a searched corpus favour older filings simply because they have had more years to accumulate citations — read this as a map of influence on subsequent claim drafting, not a ranking of present-day importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Deep Ultraviolet (DUV) Immersion Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three signals worth weighing before drafting into this space: where the claim density sits, who filed the founding art, and how filing offices split.

Classification concentration
1,788 / 1,789
records in G03F

Almost no filing in this search sits outside core photolithography claims

With 1,788 of 1,789 records classified under G03F, this dataset is not a diffuse technology touching many unrelated fields — it is a tightly bounded claim territory. Overlap with H01L and G03B shows where lithography method claims connect to device fabrication and apparatus design, but the centre of gravity never leaves photolithography.

IPC composition, G03F vs. H01L/G03B/G02B
Filing office split
735 US filings
vs. 299 EPO, 156 JP

US filings lead by a wide margin, with EPO and Japan as secondary venues

The receiving-office split — 735 United States, 299 Europe, 156 Japan, 113 Taiwan, 104 WIPO, 95 China — shows where applicants have historically sought enforceable rights for this technology, with Taiwan's 113 filings reflecting the concentration of leading-edge fabrication capacity there.

Receiving offices, 2015–2026
Filing trajectory
45 → 0
peak (2017) to latest year

The filing curve has run its course, not merely slowed

A drop from a 2017 peak of 45 to a 2022 midpoint of 2, continuing to 0 at the 2026 cut-off, is a decline pattern rather than normal year-to-year noise. New entrants filing now are working against a densely claimed and largely closed body of prior art rather than an emerging one.

Filing trend, 2017–2026
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Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to deep ultraviolet (duv) immersion lithography, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Deep Ultraviolet (DUV) Immersion Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the claim positions

Recent-year momentum across the named assignees below reads as flat or negative across the board — every tracked assignee shows 0 filings in the latest year, and ASML shows a -100% year-on-year change. That pattern is consistent with the dataset's overall decline: the incumbents that built the foundational immersion-lithography portfolio are not filing heavily against it now, whether because the core ground is already covered or because activity has shifted to trade-secret or downstream integration work outside this search's IPC scope.

Equipment & optics
14
co-assignee filings, ASML + Zeiss SMT

ASML and Carl Zeiss SMT co-file as a lens-and-system pair

The strongest co-assignee link in the dataset (14 shared filings) pairs ASML with Carl Zeiss SMT, reflecting the tight coupling between exposure-tool systems and the projection optics inside them — a structural collaboration rather than a one-off.

Co-assignee pairs, strongest link
Materials
0
latest-year filings

Resist and immersion-fluid chemistry suppliers show no recent filing activity

Rohm and Haas Electronic Materials, Tokyo Ohka Kogyo and JSR all sit in the materials layer of this landscape (resist films, immersion fluids, protective coatings) but register 0 filings in the latest tracked year alongside the equipment makers.

Recent-year momentum by assignee
Device manufacturers
0%, -100% YoY (ASML)
latest-year momentum

Even the leading equipment assignee shows a full year-on-year drop

ASML's -100% year-on-year change, alongside 0 latest-year filings from Nikon, TSMC and IBM, indicates the named leaders are not currently adding to this specific claim set, consistent with a technology whose active filing window has closed rather than one still being contested.

Recent-year momentum by assignee
🔍
Under-claimed adjacent branches
Sub-areas with comparatively thin direct coverage in this dataset relative to the core immersion and resolution-enhancement claims
Immersion fluid recovery and recycling systemsDefect inspection under immersion conditionsMultiple-patterning overlay correctionFluorine-based fluid boiling-point tuningProtective topcoat chemistry for immersion resist
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Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Nikon Corporation0
Rohm and Haas Electronic Materials LLC0
ASML Netherlands B.V.0-100%
Taiwan Semiconductor Manufacturing Company (TSMC)0
Tokyo Ohka Kogyo Co., Ltd.0
International Business Machines Corporation (IBM)0
Carl Zeiss SMT GmbH0
JSR Corporation0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Deep Ultraviolet (DUV) Immersion Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this

The filing curve and classification data point to a mature, tightly claimed field. Two directions make sense from here.

Map the exact claim boundaries of the founding filings

Before drafting into fluid composition, resolution enhancement or multiple-patterning claims, the five most-cited records in this dataset are the ones to read claim-by-claim — they set the boundaries everything since has had to work around.

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Check whether the gap is real or just under-searched

Thin coverage in adjacent branches like fluid recovery or overlay correction could mean open claim space, or it could mean those techniques are protected under different IPC codes or trade secret. Verify before committing R&D budget.

Run a deeper search in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Deep Ultraviolet (DUV) Immersion Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on DUV immersion lithography patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Deep Ultraviolet (DUV) Immersion Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company's registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.