https://www.patsnap.com/resources/blog/rd-blog/diamond-and-aluminium-nitride-wafers-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Compound Semiconductor Substrates
Diamond and Aluminium Nitride Wafer Patents: Leaders, Filing Trends and Open Ground
  • 48.8% concentration. The five leading assignees hold 600 of the 1,230 records in scope — the field is a concentrated race, not a fragmented one.
  • Filing plateau, not decline. The complete-year window shows 2021 at 38 filings against 2024 at 36, a -5% move — flat, given publication lag on the most recent years.
  • Crystal growth dominates the claim map. C30B (crystal growth) covers 58.3% of records, more than H01L device claims and C23C coating claims combined for many filers.
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1,230
Published Records
49%
Top-5 Share of All Records
-5%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (38 records) with 2024 (36) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 1,230 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This dataset tracks 1,230 published records filed between 2015 and mid-2026 that combine single-crystal diamond or aluminium nitride substrate claims with heteroepitaxial growth, thermal spreading, nitrogen impurity control, wafer-size scaling, surface preparation or device bonding. It spans crystal growth, semiconductor device integration and coating chemistry — the three IPC subclasses that together account for most of the filing activity in the field. Patent families, not raw document counts, are used throughout the ranking so that continuation filings and multi-jurisdiction duplicates do not distort who is actually ahead.

Coverage runs to a 2026-07-31 cut-off. Because publication typically lags filing by around 18 months, the last one to two years in any trend chart will understate real filing activity — a fact worth keeping in mind before reading the most recent years as a slowdown.

Filing activity and technology composition, 2015-2026
  1. 1ELEMENT SIX LTD167
  2. 2ELEMENT SIX TECH LTD166
  3. 3SUMITOMO ELECTRIC INDUSTRIES LTD140
  4. 4SHIN ETSU CHEMICAL CO LTD77
  5. 5NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE & TECHNOLOGY50
  6. 6RFHIC CORP37
  7. 7CANON KK33
  8. 8KANAZAWA UNIV31
  9. 9SCIO DIAMOND TECHNOLOGY CORP30
  10. 10NORTH CAROLINA STATE UNIV24
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Diamond and Aluminium Nitride Wafers covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Data

Filing trends and technology composition

Two views of the same 1,230 records: how filing volume has moved year over year, and how those records distribute across IPC subclasses.

Filing trend, 2017-2026

Filings peaked at 75 in 2017 and have since settled into a lower, comparatively flat band; the most defensible recent comparison is 2021 (38) against 2024 (36), a -5% move over three complete years. Years after 2024 are still filling in under the publication lag and should not be read as a further decline.

Filing trend, 2017-20260204060807520172018201920202021202220232024202532026Most recent year is partial — publication lag means later filings are not yet visible.

IPC subclass composition

C30B (crystal growth) leads at 58.3% of the 1,230 records, followed by H01L (semiconductor devices) at 32.2% and C23C (coating and surface deposition) at 27.2%. Because a single record can carry several IPC codes, these shares sum to well over 100% and should be read as claim-space overlap, not as a partition of the field.

IPC subclass compositionC30B · Crystal growth71758.3%H01L · Semiconductor devices39632.2%C23C · Coating & surface deposition33527.2%H10P13410.9%C01B · Non-metallic elements & inorga…12610.2%H10D · Semiconductor devices (general)937.6%H10W604.9%G01N · Material analysis & testing504.1%Other62550.8%

Shares are the percentage of the 1,230 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Diamond and Aluminium Nitride Wafers covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

Representative filing and most-cited prior art

Representative Record
US20130220214A12013-08-29

Base material for growing single crystal diamond and method for producing single crystal diamond substrate

SHIN-ETSU CHEMICAL CO., LTD.

A base material for growing single-crystal diamond built from a single-crystal silicon substrate with a heteroepitaxially grown MgO film, topped with a heteroepitaxially grown iridium or rhodium film. The stack is claimed to grow single-crystal diamond over a larger area with improved crystallinity, producing a higher-quality diamond substrate at lower cost.Filed by Shin-Etsu Chemical, published 2013-08-29 — a template for the buffer-stack approach that recurs across later heteroepitaxial diamond growth filings in this dataset.

US20130220214A1 — patent drawing 1US20130220214A1 — patent drawing 2
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Most-cited records in this landscape
#Publication no.Patent titleCitations
1US6579833B1A process for converting a metal carbide to carbon on the surface of the metal carbide by etching in halogens602
2US20030119279A1Three dimensional device integration method and integrated device312
3US7126212B2Three dimensional device integration method and integrated device300
4US8921473B1Image making medium272
5US6381022B1Light modulating device272
6US9431368B2Three dimensional device integration method and integrated device233
7US5951543ADelivery system and method for surgical laser217
8US6864585B2Three dimensional device integration method and integrated device199
9US6582513B1System and method for producing synthetic diamond180
10US6500694B1Three dimensional device integration method and integrated device168

Citation counts accumulate over time inside this corpus, so older records are structurally favoured — treat the ranking as a signal of influence on later filers, not of current commercial relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Diamond and Aluminium Nitride Wafers covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three patterns stand out once the ranking, the trend and the IPC composition are read together.

Concentration
48.8% of 1,230
held by top 5 assignees

The lead group is narrow

The five leading assignees combined account for 600 of the 1,230 records in scope, and the top ten extend that to 61.4% (755 records). A gap this wide between the leader (167 records) and fifth place (50) signals that any new entrant is filing into ground already staked out by a small group, not a fragmented field.

Assignee ranking, 100 companies
Momentum
-5% (2021→2024)
three-year filing change

A plateau, not a retreat

Filings held close to flat between 2021 (38) and 2024 (36), the last window unaffected by publication lag. Several of the largest assignees show zero filings in the latest recorded year, but that pattern is consistent with lag rather than a genuine pullback from the technology.

Complete-year filing counts
Claim density
58.3% of records
carry a C30B crystal-growth class

Growth-process claims crowd the centre

C30B crystal growth claims sit on well over half of all 1,230 records, well ahead of H01L device integration (32.2%) and C23C coating (27.2%). New growth-process claims are entering a dense prior-art field; device-integration and coating claims have comparatively more room.

IPC subclass shares, all records
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Where organisations file together
AssigneeCo-assigneeShared families
Shin-Etsu Chemical Co., Ltd.Kanazawa University31
Shin-Etsu Chemical Co., Ltd.National Institute of Advanced Industrial Science and Technology (AIST)24
Sumitomo Electric Industries, Ltd.Sumitomo Electric Hardmetal Corp.20
SCARSBROOK GEOFFREY ALANFRIEL IAN20
TWITCHEN DANIEL JAMESMARTINEAU PHILIP MAURICE19
National Institute of Advanced Industrial Science and Technology (AIST)Kanazawa University15
TWITCHEN DANIEL JAMESSCARSBROOK GEOFFREY ALAN15
Element Six LtdTWITCHEN DANIEL JAMES11

The strongest co-assignee pairing in this dataset links a chemical materials company with a university partner, and a second links the same company with a national research institute — a pattern consistent with growth-substrate work still running through joint academic-industry programmes rather than purely in-house R&D.

Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Diamond and Aluminium Nitride Wafers covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the claim space

The ranked leaders are drawn from materials companies, electronics manufacturers and national research institutes, with the top of the list dominated by a small number of long-running diamond and compound-semiconductor specialists.

Leader
167 records
single largest filer

A clear front-runner

The leading assignee's 167 records sit well ahead of fifth place at 50, a gap wide enough to suggest an entrenched position built over years rather than a recent surge.

Assignee ranking, 100 companies
Second tier
50 to 24 records
fifth through tenth place

A workable but occupied mid-field

Positions five through ten range from 50 down to 24 records — still substantial filing programmes, but ones a new entrant could realistically outpace with a focused campaign rather than needing decades of prior filings.

Assignee ranking, 100 companies
Momentum
0 filings
latest year, several top assignees

Recent-year figures need the lag caveat

Multiple assignees among the largest filers show zero filings in the most recent recorded year. Given the roughly 18-month publication lag, this reads as pipeline still filling in rather than firms exiting the technology.

Recent-year momentum by assignee
🔍
Under-claimed sub-areas worth a closer look
Branches where filing density is comparatively thin relative to the core growth and device classes.
Wafer-size scaling beyond current diamond boule diametersNitrogen impurity control for optical-grade diamondDirect bonding of diamond to power device substratesSurface preparation for low-defect AlN interfacesThermal spreading layer integration at device level
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Element Six Ltd0
Sumitomo Electric Industries, Ltd.0-100%
Element Six Technologies Ltd0-100%
Shin-Etsu Chemical Co., Ltd.0-100%
National Institute of Advanced Industrial Science and Technology (AIST)0
Apollo Diamond, Inc.0
TWITCHEN DANIEL JAMES0
Canon Inc.0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Diamond and Aluminium Nitride Wafers covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to a concentrated leadership group, a flat-to-plateaued filing trend and several thinner sub-branches. Turning that into a filing or licensing decision means going deeper on specific claims and specific competitors.

Map claims against a specific process route

Compare the crystal-growth claim language in the densest C30B filings against a target process to see which steps are genuinely blocked versus merely adjacent.

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Track the leading assignees' pipeline

Follow filing activity from the top-ranked assignees forward as later years publish, to see whether the 2021-2024 plateau holds or resumes growth.

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Test white-space claim drafts

Draft a first claim around one of the under-claimed sub-areas and check it against the full corpus before committing R&D spend.

Run a novelty check in Eureka →
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Diamond and Aluminium Nitride Wafers covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on diamond and AlN wafer patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Diamond and Aluminium Nitride Wafers covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company's registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.