https://www.patsnap.com/resources/blog/rd-blog/display-module-testing-and-mura-compensation-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Display Module Assembly
Display module testing and mura compensation patents: who holds the compensation-data claims
  • A tight, concentrated field. five ranked assignees account for all 14 records in scope, with the leader alone filing 6 of them.
  • Filing peaked in 2017 at 5 records and has tapered since, though the most recent year is always undercounted because publication lags filing by roughly 18 months.
  • Nearly every record sits in G09G display control circuits, meaning the contest is over compensation-signal handling, not panel hardware.
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14
Published Records
100%
Top-5 Share of All Records
US
Leading Jurisdiction
5
Active Filers Ranked

Top-5 share is the combined record count of the five largest assignees divided by all 14 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Overview

A narrow, control-circuit-heavy field

Display module testing and mura compensation patents cover how manufacturers detect luminance non-uniformity across a panel and correct for it electronically before or during use. The dataset in scope holds 14 published records filed between 2015 and 2026, concentrated almost entirely in G09G display-control-circuit classifications rather than in image-processing or semiconductor-device art.

The receiving-office spread — United States, China and Europe each carrying a meaningful share, with single filings in Germany and via the WIPO PCT route — points to a technology that is filed for global display supply chains rather than one dominated by a single jurisdiction's manufacturing base.

Filing activity and technology composition, 2015-2026
  1. 1TCL China Star Optoelectronics Technology Co., Ltd.6
  2. 2Samsung Display Co., Ltd.5
  3. 3LX Semicon Co., Ltd.1
  4. 4Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.1
  5. 5Kunshan Industrial Technology Research Institute New Display Technology Center Co., Ltd.1
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Display Module Testing and Mura Compensation covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The data

Filing trend and technology composition

Two views of the same 14-record dataset: how filings moved year over year, and which IPC subclasses the claims fall into.

Filing activity, 2017-2026

Filings peaked at 5 records in 2017 and have declined since; the 2026 figure is partial because the dataset cut-off is 2026-07-31 and publication typically lags filing by about 18 months, so recent-year counts understate actual filing activity.

Filing activity, 2017-202601345520172018201920202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

IPC subclass composition

G09G (display control circuits) appears in 100.0% of the 14 records in scope, making it effectively a prerequisite classification for this search string. G06T (image data processing) and H01L (semiconductor devices) each appear in only 7.1% of records, indicating that most inventive activity is claimed at the display-driving level rather than in upstream image processing or panel fabrication.

IPC subclass compositionG09G · Display control circuits14100.0%G06T · Image data processing & genera…17.1%H01L · Semiconductor devices17.1%

Shares are the percentage of the 14 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Display Module Testing and Mura Compensation covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

Go deeper on Display Module Testing and Mura Compensation with Eureka

This page is one run against one query. Ask Eureka your own question about display module testing and mura compensation and every answer comes back with the patent numbers behind it.

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Key patents

Most-cited records in the field

Representative filing
US20250349237A12025-11-13

Mura compensation module, display control apparatus including same, and mura compensation method using the same

LX SEMICON CO., LTD.

A Mura compensation module includes a DBV setting unit for setting one of a plurality of luminance bands as a set luminance band; a memory storing a reference Mura compensation value for each grayscale from a reference luminance band; and a Mura compensation value determination unit for determining an input Mura compensation value of a first input grayscale value in the set luminance band, on the basis of the reference Mura compensation value for each grayscale from the reference luminance band.Filed by LX Semicon, published 2025-11-13 — one of the most recent records in the dataset.

US20250349237A1 — patent drawing 1US20250349237A1 — patent drawing 2
View full filing
Highest-citation records in scope
#Publication no.Patent titleCitations
1US20170206821A1Method of compensating for an excimer laser annealing MURA and display device employing the same42
2CN106328083A一种液晶显示器及其补偿数据存储方法17
3US20180218693A1A liquid crystal display and a compensation data storage method thereof16
4CN111681588A显示面板的驱动装置和驱动方法6
5US20230289942A1Image processing method, optical compensation method, and optical compensation system2
6US10319315B2Liquid crystal display and a compensation data storage method thereof2
7US20250349237A1Mura compensation module, display control apparatus including same, and mura compensation method using the sa…1
8EP3525202A1Liquid crystal display and compensation data storage method therefor1

Citation counts favour older records simply because they have had more time to accumulate citations within the searched corpus; treat them as a signal of influence on subsequent filings, not as a measure of current commercial importance.

Patent titles are shown in the language they were filed in, not translated, so that each record stays verifiable against the original filing — a translated title will not match in Eureka or in any national register. Publication numbers are shown where the record carries one (8 of 8 rows); clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Display Module Testing and Mura Compensation covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three read-outs from the dataset that matter more than the raw counts.

Concentration
14 of 14 records
held by 5 ranked assignees

The field has no long tail

All 14 records in scope trace to just five ranked assignees, with the leader alone holding 6. There is no fragmented population of single-filing entrants here — this is a small, closely held claim set.

Top 5 combined = 100.0% of records
Technology focus
100.0%
of records classified G09G

Claims sit on the driving circuit, not the sensor

Every record in the dataset carries a G09G display-control-circuit classification. Image-processing (G06T) and semiconductor-device (H01L) classes each touch only one record, so the compensation-value logic itself — not the camera or the panel — is where the claim density is.

G06T and H01L each = 7.1% of records
Timing
2017
peak filing year, 5 records

Activity has cooled from an early peak

Filings peaked in 2017 and have not returned to that level. Because publication lags filing by roughly 18 months, the 2026 figure of 0 should not be read as the field going quiet — it more likely reflects records not yet published.

2017 = 5 records, most recent full-year peak
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to display module testing and mura compensation, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Display Module Testing and Mura Compensation covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the claims

Five assignees account for the entire ranked field, with filing activity flat across all of them in the most recent year.

Leader
6 records
of 14 in scope

A single leader holds the largest share

The top-ranked assignee holds 6 of the 14 records in scope, more than any other party, but recent-year momentum for this assignee shows 0 filings in the latest year — consistent with the field-wide slowdown rather than a company-specific pullback.

Leader: 6 of 14 records
Mid-tier
5 assignees
hold the entire ranking

No fragmented tail beyond the five

The ranking returns only five assignees, and together they cover 100.0% of the 14 records in scope. There is no visible long tail of one-off filers behind them in this dataset.

5 ranked assignees = 100% of records
Momentum
0
filings in the latest year, all assignees

Momentum has stalled across the board

Every ranked assignee shows 0 filings in the latest year, and the one assignee with a stated year-over-year figure recorded -100% YoY. Read this alongside the publication lag: some of this is real cooling, some is simply unpublished pipeline.

-100% YoY for one ranked assignee
🔍
Under-claimed sub-areas worth checking before filing
Branches adjacent to the core G09G claim set that show little coverage in this dataset.
camera-based luminance calibration workflowstest-time reduction for gamma uniformity checksdefect classification models for mura patternscompensation-data storage architecturecross-panel calibration transfer methods
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
TCL China Star Optoelectronics Technology Co., Ltd.0—
Samsung Display Co., Ltd.0—
LX Semicon Co., Ltd.0—
Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.0-100%
Kunshan Industrial Technology Research Institute New Display Technology Center Co., Ltd.0—
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Display Module Testing and Mura Compensation covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's next

Where to take this

The dataset points to a narrow, control-circuit-dominated field with a small set of holders — useful starting points for deeper diligence.

Map claim scope on the leader's compensation-value patents

With one assignee holding 6 of 14 records, understanding exactly how its compensation-value determination claims are worded is the fastest way to see where a new filing would or would not overlap.

Explore claim scope in Eureka

Check the under-claimed branches before drafting

Camera calibration, test-time reduction and defect classification each show minimal direct coverage in this dataset relative to the core G09G driving-circuit claims.

Run a white space search in Eureka

Track whether 2025-2026 filings change the concentration picture

Because publication lag means recent years are undercounted, revisit this dataset in six to twelve months to see whether the apparent slowdown holds or reverses.

Set up monitoring in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Display Module Testing and Mura Compensation covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on this field

Answers are grounded in the same dataset. Derived from a Patsnap search on Display Module Testing and Mura Compensation covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Display Module Testing and Mura Compensation in depth with Eureka

Go past this page: query the whole display module testing and mura compensation corpus yourself, in your own scope.
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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company's registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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