Doping Metrology Patents: Top Companies & Filing Trends 2026
Doping Metrology and Junction Profiling Patents: Who Leads and Where the Field Is Still Open
Top 5 filers hold 30.9% of the field. 1,203 of 3,896 records sit with just five assignees, with a long tail of single- and few-filing entrants behind them. Filings rose from 164 in 2017 to a peak of 236 in 2022, then eased to 139 by 2024 — a 29% decline over the 2021-2024 span. 2025 and 2026 figures are still incomplete due to publication lag and should not be read as a continued fall.
- 1SEMICON ENERGY LAB CO LTD10.4%
- 2FUJI ELECTRIC CO LTD7.1%
- 3KK TOSHIBA5.9%
- 4TOSHIBA ELECTRONICS DEVICES & STORAGE CORPORARTION4.6%
- 5MICROMASS UK LTD2.9%
See the full doping metrology and junction profiling analysis in Eureka
- The complete ranking, not just the top five
- Every IPC branch with its share of the corpus
- The most-cited records, and where claim space is still thin
Common questions on doping metrology patents
Who are the leading patent filers in doping metrology and junction profiling?
The dataset ranks 100 assignees, and filing is concentrated at the top: the leading filer alone holds 404 of the 3,896 records in scope, and the top five combined hold 30.9% of all records. Below the tenth-ranked filer at 55 records, the field spreads into a long tail of companies with only a handful of filings each. This means competitive tracking is more useful when focused on the handful of dominant filers than spread evenly across the full ranking.
Is patent filing in this field growing or slowing down?
Filings peaked in 2022 at 236 and eased to 139 by 2024, a 29% decline over that three-year span. However, 2025 and 2026 figures are still incomplete because publication typically lags actual filing by around 18 months, so it is too early to call this a sustained slowdown rather than a plateau after a filing surge. Anyone tracking momentum should watch the 2024-2025 window fill in over the next reporting cycle before drawing conclusions.
What technologies dominate the IPC classification of this patent set?
Semiconductor device claims under H01L appear in 44.3% of the 3,896 records, the single largest class, followed by material analysis and testing under G01N at 25.4% and general semiconductor devices under H10D at 19.2%. Because many records carry multiple IPC codes, these percentages overlap rather than sum to a whole, reflecting that most inventions pair a measurement method with a specific device application rather than claiming a standalone technique.
Disclaimer. This analysis is based on Patsnap Eureka data drawn from a limited snapshot of global patent records and is provided for general information and reference only. Patent data carries inherent limitations — recent filings are under-counted because of publication lag, counts may be on a record or family basis, classification and applicant-name data may contain errors or duplicates, and the underlying search query defines the scope shown — so the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.
Nothing here is an exhaustive prior-art, novelty, freedom-to-operate or validity search, nor does it constitute legal, financial or professional advice, and it should not be relied upon as such. Verify independently and review with qualified patent and legal professionals before acting on it.
Method: Filing trend and technology composition. Derived from a Patsnap search on Doping Metrology and Junction Profiling covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish. Every share divides by all records in scope. Data: Patsnap Eureka. See the full landscape report.