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Design Rule Checking Patents: Leaders, Trends & White Space 2026

Design Rule Checking Patents: Leaders, Trends & White Space 2026
https://www.patsnap.com/resources/blog/rd-blog/eda-and-chip-design-design-rule-checking-patent-landscape-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Semiconductors & Microelectronics · Patent Landscape
Design Rule Checking Patents: Who Holds the Ground in Chip Verification
Get a prior-art report on your approach
786
Published Records
38%
Top-5 Share of All Records
+6%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (32 records) with 2024 (34) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 786 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Overview

What the design rule checking patent record shows

Design rule checking (DRC) sits at the boundary between chip design and manufacturing: it verifies that a layout obeys the geometric constraints a fabrication process can actually build. The 786 records in scope span 2015 through the 2026 cut-off and cluster overwhelmingly under G06F (electric digital data processing), with smaller but persistent overlap into semiconductor devices (H01L) and photolithography (G03F). That split reflects how DRC has historically been claimed: as a software verification method layered on top of a physical process, rather than as a manufacturing step in its own right.

Filing activity has stayed close to flat rather than accelerating: 2021 to 2024 — the most recent year with a complete publication picture — moved from 32 to 34 records, a 6% rise over three years. That is a mature, steadily-tended field rather than a fast-growing one. Ownership is concentrated: the leading assignee alone accounts for 87 of the 786 records, and the top ten combined hold 51.8% of all records in scope, with a long tail of single- or few-filing entrants filling out the rest of the ranking.

Filing trend and technology composition, 2015-2026
  1. 1SYNOPSYS INC87
  2. 2TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD77
  3. 3INTERNATIONAL BUSINESS MACHINE CORPORATION49
  4. 4CADENCE DESIGN SYST INC47
  5. 5GLOBALFOUNDRIES INC40
  6. 6KLA CORP35
  7. 7SIEMENS INDUSTRY SOFTWARE INC23
  8. 8NEC CORP21
  9. 9GLOBALFOUNDRIES US INC15
  10. 10Beijing Huada Jiutian Technology Co., Ltd.13
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on EDA & Chip Design: Design Rule Checking Patent Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Data

Filing trends and technology composition

Publication counts by year and by IPC subclass, drawn from the 786 records in scope. Because a single record can carry more than one IPC class, the composition shares add up to more than 100%.

A steady, not surging, filing line

Annual publications ran from 25 in 2017 to a peak of 34 in 2024, the most recent year that can be treated as complete; 2025 and 2026 figures will continue to fill in as publication catches up with filing, typically an 18-month lag.

A steady, not surging, filing line010203040252017201820192020202120222023342024202552026Most recent year is partial — publication lag means later filings are not yet visible.

Software verification logic dominates the classification mix

G06F covers 87.7% of the 786 records, far ahead of H01L (17.8%) and G03F (10.2%); smaller clusters in H10D, H10W, H05K, G06T and G06N mark where DRC work touches device structure, packaging, imaging and AI-assisted checking respectively.

Software verification logic dominates the classification mixG06F · Electric digital data processi…68987.7%H01L · Semiconductor devices14017.8%G03F · Photolithography & photomechan…8010.2%H10D · Semiconductor devices (general)222.8%H10W212.7%H05K · Printed circuits & assemblies182.3%G06T · Image data processing & genera…172.2%G06N · Computing based on AI models162.0%Other13817.6%

Shares are the percentage of the 786 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on EDA & Chip Design: Design Rule Checking Patent Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The prior art anchoring this field

Representative Filing
US20090187867A12009-07-23

Techniques for Verifying Error Detection of a Design Rule Checking Runset (US20090187867A1)

INTERNATIONAL BUSINESS MACHINES CORPORATION

A technique for verifying error detection of a design rule checking runset includes assigning first shapes for a first layer of an integrated circuit design to a first cell and assigning second shapes for a second layer of the integrated circuit design to a second cell. Design rule checking is then performed on the first and second cells. Whether the design rule checking runset is functioning properly is then determined based on whether an error is detected in the design rule checking of the first and second cells.Filed by International Business Machines Corporation, published 2009-07-23. The claim targets runset self-verification — checking whether the DRC tool itself is correctly flagging errors — rather than the layout being checked.

US20090187867A1 — patent drawing 1US20090187867A1 — patent drawing 2
View full filing
Most-cited design rule checking records
#Publication no.Patent titleCitations
1US6470489B1Design rule checking system and method528
2US6370679B1Data hierarchy layout correction and verification method and apparatus502
3US6009251AMethod and system for layout verification of an integrated circuit design with reusable subdesigns458
4US6415421B2Integrated verification and manufacturability tool384
5US7155689B2Design-manufacturing interface via a unified model358
6US6063132AMethod for verifying design rule checking software355
7US6505327B2Generating an instance-based representation of a design hierarchy350
8US6282696B1Performing optical proximity correction with the aid of design rule checkers282
9US6732338B2Method for comprehensively verifying design rule checking runsets254
10US6745372B2Method and apparatus for facilitating process-compliant layout optimization244

Citation counts are drawn from a searched corpus and skew toward older filings; treat them as a measure of influence on later filers, not of current commercial relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on EDA & Chip Design: Design Rule Checking Patent Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Four read-outs from the ranking, the trend line and the classification mix, aimed at where to file, who to watch and what is already occupied.

Concentration
38.2%
of 786 records held by the top 5

Ownership sits at the very top

The leading assignee alone holds 87 records, and the top five combined take 38.2% of all 786 records in scope. Below tenth place (13 records) the ranking thins into a long tail of occasional filers, which is where freedom-to-operate work should focus rather than on displacing the leaders.

Assignee ranking, 786 records
Filing pace
+6%
growth, 2021 to 2024

A mature field, not a fast-growing one

Publications moved from 32 in 2021 to 34 in 2024, the last year with a reasonably complete count. That is a flat-to-slightly-rising line, consistent with DRC being a settled verification discipline rather than an emerging one.

Filing trend, 2021-2024
Classification mix
87.7%
of records tagged G06F

Software claims dominate over process claims

G06F (digital data processing) appears on 87.7% of the 786 records, versus 17.8% for H01L and 10.2% for G03F. DRC is being claimed chiefly as computational verification logic; process-integration and photolithography framing remain comparatively thin.

IPC composition, 786 records
Filing geography
446
US-filed records

The US is the primary filing venue

United States filings (446) lead by a wide margin ahead of China (109), Japan (61), WIPO PCT filings (59) and the EPO (31), indicating that most applicants still treat the US as the first or primary jurisdiction for DRC protection.

Receiving office counts
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Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to eda & chip design: design rule checking patent landscape, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on EDA & Chip Design: Design Rule Checking Patent Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The ranking, the trend and the classification split each point to a different next step depending on whether the goal is freedom-to-operate, licensing, or identifying open claim space.

Map freedom-to-operate against the leaders

With 51.8% of all 786 records held by the top ten assignees, a new filing in core DRC logic is likely to sit near existing claims from those firms. Run a claim-by-claim comparison before drafting.

Explore assignee claims in Eureka

Test under-claimed branches for white space

G03F, H10D and G06N each cover a small share of the 786 records despite touching adjacent, active problems — photolithography interaction, device-level structure and AI-assisted checking. Each is a candidate for a narrower, more defensible first claim.

Search white space in Eureka

Track the oldest anchor claims

The most-cited records, led by US6470489B1 at 528 citations, are two decades old and still shape how later filings are worded. Confirm their claim scope before assuming a design-around is clean.

Review cited prior art in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on EDA & Chip Design: Design Rule Checking Patent Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on the design rule checking patent landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on EDA & Chip Design: Design Rule Checking Patent Landscape covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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