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EDLC Quality Control Patent Snapshot 2026

EDLC Quality Control Patent Snapshot 2026
Evidence Snapshot
EDLC Quality Control Patent Snapshot in 2026

The EDLC quality control patent space is highly concentrated, with the top five filers accounting for all activity among the hundred largest filers and Korea Kumho Petrochemical leading on patent records. Filing activity peaked around 2019–2020 and has since declined, signaling a mature, slow-moving field with limited new entrants.

6
Patent families in scope
N/A
Concentration not assessed
N/A
Growth trend not assessed
United States
Leading jurisdiction
↗ Tap any metric to explore the underlying patents and uncover deeper insights in Patsnap Eureka
Published byPatsnap Insights Team··5 min readVerified by Patsnap Eureka data
Overview

Korea Kumho Petrochemical leads a tightly held, small-corpus field

Korea Kumho Petrochemical holds the top position in the ranking with 7 patent records, followed by New York University with 6 patent records. The remaining ranked applicants — Marcon Electron, Telcordia Technologies, and Isuzu Motors — each hold a single patent record.

The top five filers account for 100% of the combined total among the ranked applicants visible in this query, indicating extreme concentration with no meaningful second or third tier. The gap between the leader and the rest of the field is proportionally large for such a small corpus.

Leading applicants
#ApplicantPatent recordsShare
1Korea Kumho Petrochemical Co., Ltd.7
2New York University6
3MARCON ELECTRON CO LTD1
4Telcordia Technologies Inc.1
5Isuzu Motors Ltd.1
↗ Hover a row · click a company to ask Eureka

Korea Kumho Petrochemical’s leadership reflects a deliberate focus on measurement and characterization methods (G01R and G06F), while New York University’s near-equal presence suggests academic research has played an unusually prominent role in shaping this niche. This dual corporate–academic structure is atypical and may indicate the field has not yet attracted broad industrial adoption.

The most recent filing periods should be treated as provisional given standard patent publication lag; the apparent absence of activity in 20252026 does not yet represent confirmed inactivity. Longer-window growth, applicant concentration, and technology-route coverage are therefore more reliable signals than the latest-year bar alone.

Source: Patsnap Eureka. Chart shows the top applicants ranked by patent records; the corpus total is measured in patent families. These figures use different units and should not be compared directly. This same dataset is now available on Patsnap Open Platform via MCP.Connect via MCP →
Trends & Structure

Intermittent filing with measurement-focused technology composition

The annual filing trend reveals a sparse, episodic pattern rather than sustained growth, while the technology composition chart shows electric and magnetic measurement methods showing visible activity in the field.

Annual filing trend

Filings first appeared in 2019 and 2020, dropped to zero through 2022–2023, and showed a brief return in 2024. The overall recent-window growth is negative at -50%, consistent with the lifecycle stage. The 2024 uptick and the 2025–2026 zeros should be read cautiously given publication lag.

Annual filing trendAnnual values from 2017 to 2026, peaking at 2 in 2019.02017020182201922020020210202202023220240202502026↗ Hover for values · click a bar to ask Eureka

Technology composition

G01R (Electric and magnetic measurement) is the visible branch, reflecting a field centered on characterization and diagnostic methods. G06F (digital data processing) and H01M (batteries, cells and fuel cells) appear at equal secondary weight, while H01G (Capacitors) — the most directly EDLC-specific class — is the least represented, with only 2 records.

Technology compositionG01R · Electric & magnetic measurement leads with 14; G06F · Electric digital data processing 6.G01R · Electric & magnet…14G06F · Electric digital …6H01M · Batteries, cells …6G01N · Material analysis…5H01G · Capacitors2↗ Hover for values · click a bar to ask Eureka
Source: Patsnap Eureka. Technology-branch counts are measured in patent records; a single patent family can carry several IPC classes, so class totals can exceed the family total in scope.Explore deeper in Eureka →
Key Patents

Highly cited patent families surfaced by the query

Citation-heavy patent families returned by the query. Use this section as citation context, not as a curated list of the most topic-specific patents.

Featured patent
US20190310211A1Published 2019-10-10

System and method for magnetic resonance mapping o…

New York University

A method of diagnosing a conducting structure includes providing the conducting structure in a magnetic field, immersing the conducting structure in a detection medium, or placing a detection medium in the vicinity of the conducting structure, exciting nuclear or electronic spins within the detection medium using a broad-band excitation pulse, receiving an… (excerpt from the patent abstract)

System and method for magnetic resonance mapping o… — patent drawingSystem and method for magnetic resonance mapping o… — patent drawing
Representative drawings from the patent document.
Open this patent in Eureka →
Highly cited patent families surfaced by this query
#PatentCitations
1Method and apparatus for determining Characteristi…213
2Method and apparatus for determining characteristi…36
3Infrared thermographic method for process monitori…29
4Systems and methods for magnetic susceptometry of …10
5Method and apparatus for determining characteristi…7
6System and method for magnetic resonance mapping o…6
7System and method for magnetic resonance mapping o…4
8Electric double-layer capacitor2

Ranked by total forward citations. Citation counts favour older and broadly cited patent families, and broad or adjacent patents may appear when they match the search scope. Treat this section as citation context, not as a curated list of the most topic-specific patents. Some patent titles may be shown in their original, non-English language where an accurate translation could not be guaranteed.

Source: Patsnap Eureka. Citation-ranked patent families surfaced by this query.Open in Eureka →
Visible assignees

Assignee snapshot from the current evidence set

The applicants below are visible in this query result. Because the evidence set is relatively small, read this section as a directional snapshot rather than a full competitive ranking.

Leader · Korea Kumho Petrochemical

Korea Kumho Petrochemical

Korea Kumho Petrochemical holds 7 patent records and concentrates on G01R 31 (electric and magnetic measurement), G06F 17 (digital data processing), and H01M 10 (batteries and fuel cells). This broad IPC footprint suggests the company is protecting a system-level quality-control approach rather than a single measurement technique. No momentum data is available for this applicant in the recent period.

patent records: 7
Challenger · New York University

New York University

New York University holds 6 patent records and focuses on G01R 31 and G01R 33 (electric and magnetic measurement) alongside G01N 24 (material analysis and testing). Its trajectory is marked as a new entrant in the recent filing period, suggesting recent academic research activity is now reaching publication. The overlap with Korea Kumho Petrochemical in G01R 31 makes freedom-to-operate analysis essential for any commercial licensee.

patent records: 6
🔍
More assignee evidence is available in Eureka
Use Eureka to validate whether these visible assignees remain central after refining the query scope and adding related patent classes.
Telcordia TechnologiesIsuzu Motors+ more
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Source: Patsnap Eureka. Assignee evidence is drawn from the current PatSnap Eureka query. In small evidence sets, applicant counts should be treated as directional signals, not a complete competitive ranking.Explore players →
Frequently asked questions

Frequently asked questions

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Built on Patsnap Open Platform

This report’s underlying patent dataset — filings, assignees, technology clusters — is open for developers via MCP and REST API. Free to start, 10,000 credits, no credit card required.

Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

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