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Electron Beam Melting AI Patents: Leaders & White Space 2026

Electron Beam Melting AI Patents: Leaders & White Space 2026
https://www.patsnap.com/resources/blog/rd-blog/electron-beam-melting-ai-and-machine-learning-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Additive Manufacturing · Patent Landscape
Electron Beam Melting Patents: Where AI and Machine Learning Process Control Is Being Claimed
  • Filing peaked in 2021 at 13 families, then fell back to flat-to-declining levels through 2022 and beyond — this looks like an early claiming wave, not a technology still accelerating.
  • B33Y and B22F dominate the IPC mix, but G06T (image data processing) appears in 11 of 26 families, meaning most defect-prediction claims are built on vision and sensor-data pipelines, not generic ML.
  • Europe and the US together receive 21 of the filings, with WIPO PCT filings still limited to 2 — most applicants have not yet gone for broad international coverage.
Get a prior-art report on your approach
26
Published Records
85%
Top-5 Share of All Records
-77%
3-Yr Growth (lag-adjusted)
EP
Leading Jurisdiction
Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This dataset tracks patent families at the intersection of electron beam melting and electron beam powder bed fusion with machine learning process control, defect prediction, and parameter optimization. It spans filings from 2017 through the 2026 cut-off, drawing on 26 published families indexed across Europe, the United States, WIPO, China and Germany.

Because publication lags filing by roughly 18 months, the 2025 and 2026 figures in any trend line understate actual filing activity for those years. The IPC composition below is read at the family level, which is the fairer unit than raw document counts since it removes the effect of continuations and multi-jurisdiction refiling.

Filing activity, 2017–2026
  1. 1SIEMENS ENERGY GLOBAL GMBH & CO KG8
  2. 2RTX CORP8
  3. 3TECH RES ASSOC FOR FUTURE ADDITIVE MFG2
  4. 4GENERAL ELECTRIC CO2
  5. 5JEOL LTD2
  6. 6UNIV OF LIVERPOOL1
  7. 7BEIJING UNIV OF TECH1
  8. 8SIEMENS AG1
  9. 9THE BOEING CO1
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Electron Beam Melting AI and Machine Learning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Data

Filing trend and technology composition

The filing curve and the IPC mix together describe a field that filed hard around one peak year and has not sustained that pace since — while still splitting claims across additive manufacturing, powder metallurgy and image-processing classes.

A single peak year, not a steady climb

Filings rose from a single 2017 family to a peak of 13 in 2021, then dropped back toward the 2022 midpoint of 2 — consistent with an initial wave of process-control and defect-prediction filings rather than a technology still building momentum. The most recent years should be read with the publication lag in mind.

A single peak year, not a steady climb048111512017201820192020132021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

Vision and control classes sit alongside the AM core

B33Y (13) and B22F (12) confirm this is squarely an additive-manufacturing and powder-bed dataset, but G06T (11) shows that image data processing underpins most of the defect-prediction claims. G05B and G06F each appear in 5 families, and G06N — AI-model computing specifically — appears in only 2, suggesting most claims frame the invention around the manufacturing process rather than the underlying model architecture.

Vision and control classes sit alongside the AM coreB33Y · Additive manufacturing (3D pri…1350.0%B22F · Powder metallurgy1246.2%G06T · Image data processing & genera…1142.3%B29C · Shaping of plastics623.1%G05B · Control & regulating systems519.2%G06F · Electric digital data processi…519.2%G06N · Computing based on AI models27.7%B23K · Welding, soldering & brazing13.8%Other13.8%

Shares are the percentage of the 26 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Electron Beam Melting AI and Machine Learning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

Representative and most-cited filings

Representative filing
US20260147952A12026-05-28

Topology optimization for additive manufacturing with integrated defect prediction model

RTX CORPORATION

A controller with processing circuitry breaks a part design into elements, assigns an initial density to each, and determines the likelihood of a defect in each element using received manufacturing parameters and the assigned density. It evaluates defect volume across the elements and updates the part design or the manufacturing parameters in response, tying topology optimization directly to a defect-prediction model rather than treating the two as separate steps.Filed by RTX Corporation, published 2026-05-28.

US20260147952A1 — patent drawing 1US20260147952A1 — patent drawing 2
View full filing
Most-cited records in this dataset
#Publication no.Patent titleCitations
1WO2023111542A1Defect identification in additive manufacturing based on time series in-process parameter data13
2US20230302539A1Tool for scan path visualization and defect distribution prediction12
3CN108446414A一种由3D打印多孔结构随机缺陷的逆向预测方法7
4EP4249153A1Tool for scan path visualization and defect distribution prediction5
5US20230260103A1Computer-implemented, adapted anomaly detection method for powder-bed-based additive manufacturing5
6US11531920B2System and process for verifying powder bed fusion additive manufacturing operation as being defect free5
7US20210334685A1System and process for verifying powder bed fusion additive manufacturing operation as being defect free3
8EP4299290A1Method for developing additive manufacturing technology and 3D additive manufacturing system2
9EP3940630A1Computer-implemented, adapted anomaly detection method for powder-bed-based additive manufacturing2
10EP4467265A1Laser-plume interaction for predictive defect model for multi-laser powder bed fusion additive manufacturing1

Citation counts are drawn from a searched corpus and favour older filings; treat them as a signal of influence rather than of current technical importance.

Patent titles are shown in the language they were filed in, not translated, so that each record stays verifiable against the original filing — a translated title will not match in Eureka or in any national register. Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Electron Beam Melting AI and Machine Learning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three patterns stand out once the filing trend, IPC mix and citation table are read together.

Filing pattern
13 in 2021
peak year

The field front-loaded its claims

A single peak year followed by a drop to 2 filings by the midpoint points to an early land-grab around core defect-prediction and process-control concepts, not a steadily maturing field. New entrants filing broad process-control claims now are more likely to run into prior art from the 2020-2021 wave than into an open field.

Read alongside the 18-month publication lag.
Technology mix
11 of 26
families touch G06T

Defect prediction leans on vision pipelines

Image data processing appears in nearly half the dataset, while dedicated AI-model computing (G06N) appears in only 2 families. Claims tend to be written around applying vision-based analysis to a specific manufacturing step, which leaves the underlying model architecture itself comparatively open.

Useful signal for where to draft narrowly versus broadly.
Jurisdiction
21 of 26
filed in EPO or US

Coverage is concentrated, not global

Europe and the United States account for the large majority of receiving offices, with only 2 PCT filings and single filings in China and Germany. Applicants targeting other manufacturing hubs may find less crowded prior art there.

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Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to electron beam melting ai and machine learning, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Electron Beam Melting AI and Machine Learning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the gate sits

Momentum among the named assignees shows zero activity in the latest tracked year across the group, consistent with the broader flat-to-declining trend after 2021 — this is a field where the earliest filers set the boundaries and later entrants are working around them rather than racing to file first.

Momentum
0 in latest year
across tracked assignees

No assignee is currently accelerating

Every named assignee in the recent-momentum data shows zero filings in the latest tracked year, including entities with a -100% YoY change from a prior filing. This matches the dataset's overall flat-to-declining trend rather than indicating any single company has withdrawn from the space.

Read with the publication lag in mind.
Filing base
26 families
total in dataset

A small, concentrated dataset

With 26 total families, this is a narrow but well-defined niche rather than a broad technology area. That makes individual claim scope more consequential — a handful of well-drafted patents can meaningfully shape the freedom to operate.

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Geography
11 EPO filings
leading receiving office

Europe leads on receiving-office count

The EPO receives more filings in this dataset than the US, with WIPO PCT, China and Germany trailing well behind. Entities building a defensive position should weight European prior art review accordingly.

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Under-claimed branches worth checking before drafting
These sub-areas show thin representation in the current IPC and citation data, suggesting room for narrowly scoped claims.
In-situ melt pool sensor fusionReal-time beam parameter feedback loopsPowder bed anomaly segmentation modelsCross-layer defect propagation predictionModel-based scan path replanning
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Raytheon Technologies0-100%
Siemens Energy Global0
Technology Research Association for Future Additive Manufacturing (TRAFAM)0
General Electric Company0
Siemens AG0
The Boeing Company0
Beijing University of Technology0
University of Liverpool0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Electron Beam Melting AI and Machine Learning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to a few concrete next steps for anyone drafting or reviewing filings in this space.

Check freedom to operate against the 2021 filing wave

Since the peak year concentrated a large share of families, prior-art searches should weight 2020-2022 filings heavily before assuming a claim direction is open.

Explore prior art in Eureka

Map claims against the G06T-heavy vision pipelines

With image data processing present in nearly half the dataset, compare a proposed claim's sensor and vision approach against existing defect-prediction filings before drafting.

Run a claim comparison in Eureka

Watch jurisdictions outside Europe and the US

With only 2 PCT filings and single filings in China and Germany, monitor those offices for new entrants rather than assuming coverage gaps will persist.

Track new filings in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Electron Beam Melting AI and Machine Learning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Electron Beam Melting AI and Machine Learning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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