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Electron Microscopy Patents: Leaders, Trends & White Space 2026

Electron Microscopy Patents: Leaders, Trends & White Space 2026
Data to 2026-07-31

Electron Microscopy for Device Analysis: Patent Trends and Where Claim Space Stays Open

No single owner controls the field. the leading assignee holds 605 of 13,094 records and the top five combined reach just 11.6% of all records in scope — filings are spread across a long tail of entrants. Filings ran from 783 in 2017 to a peak of 824 in 2023. The last complete three-year comparison — 745 in 2021 to 665 in 2024 — shows an 11% pullback, not a collapse; 2025 and 2026 figures (41 for 2026) are undercounts caused by publication lag and should not be read as a falling trend.

Filing trend, 2017–2026
Complete Incomplete
Filing trend, 2017–202602505007501,000783201720182019202020212022824202320242025412026Most recent year is partial — publication lag means later filings are not yet visible.
13.1K
Published Records
12%
Top-5 Share of All Records
-11%
Filing Growth 2021→2024
US
Leading Jurisdiction
Top filers · share of all 13,094 records
  1. 1FEI CO4.6%
  2. 2RGT UNIV OF CALIFORNIA2.9%
  3. 3SAMSUNG ELECTRONICS CO LTD1.6%
  4. 4HITACHI HIGH TECH CORP1.3%
  5. 5CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED1.1%
Published by Patsnap Research·

See the full electron microscopy for device analysis analysis in Eureka

  • The complete ranking, not just the top five
  • Every IPC branch with its share of the corpus
  • The most-cited records, and where claim space is still thin
Read more about this analysis in Eureka
FAQ

Frequently asked questions

Who holds the most patents in electron microscopy for device analysis?+

The leading assignee in this dataset holds 605 of the 13,094 records in scope, and it is an electron-microscope instrument maker rather than a device manufacturer. The top five assignees combined account for 11.6% of all records, and the top ten reach 16.6%, which means the field is far from consolidated. Most of the remaining filings sit with a long tail of semiconductor makers, battery manufacturers and universities, so a full competitive picture requires looking well beyond the leading names.

Are electron microscopy patent filings for device analysis declining?+

Not on the evidence available. Complete-year filings dropped from 745 in 2021 to 665 in 2024, an 11% pullback, after peaking at 824 in 2023. Filing counts for 2025 and 2026 look much lower still, but that is expected: publication typically lags filing by around 18 months, so the most recent years are always undercounted at the time of measurement. The honest read is a modest cooling from a 2023 peak, not a technology in retreat.

Which patent classes dominate electron microscopy device-analysis filings?+

H01M, covering batteries, cells and fuel cells, is the largest single IPC subclass at 15.9% of the 13,094 records in scope. H01L (semiconductor devices, 12.5%) and H01J (electron and discharge tubes, 11.9%) follow closely, with G01N (material analysis and testing), B01J (catalysis and chemical processes) and C01B (inorganic compounds) each above 10%. Because a single patent can carry several IPC codes, these percentages add up to more than 100% and should be read as overlapping technique combinations rather than a strict breakdown.

Disclaimer. This analysis is based on Patsnap Eureka data drawn from a limited snapshot of global patent records and is provided for general information and reference only. Patent data carries inherent limitations — recent filings are under-counted because of publication lag, counts may be on a record or family basis, classification and applicant-name data may contain errors or duplicates, and the underlying search query defines the scope shown — so the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing here is an exhaustive prior-art, novelty, freedom-to-operate or validity search, nor does it constitute legal, financial or professional advice, and it should not be relied upon as such. Verify independently and review with qualified patent and legal professionals before acting on it.

Method: Filing trend and technology composition. Derived from a Patsnap search on Electron Microscopy for Device Analysis covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish. Every share divides by all records in scope. Data: Patsnap Eureka. See the full landscape report.

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