https://www.patsnap.com/resources/blog/rd-blog/embedded-trace-and-fine-line-substrates-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Packaging Substrates
Embedded Trace and Fine Line Substrate Patents: Who Leads and Where the Gaps Sit
  • Concentrated at the top. Five assignees hold 64.6% of the 158 records in scope, and the ranked leaders extend to 26 companies with a long tail beyond them.
  • Filings cooled after 2021. Annual filings fell from 16 in 2021 to 11 in 2024, a 31% decline over that span, after peaking at 24 in 2022.
  • Semiconductor and printed-circuit classes overlap heavily. H05K and H01L each cover roughly half of all 158 records, showing most filings sit at the substrate-semiconductor boundary rather than in a single discipline.
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158
Published Records
65%
Top-5 Share of All Records
-31%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (16 records) with 2024 (11) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 158 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

Embedded trace substrates and fine line substrates sit at the intersection of semiconductor packaging and printed-circuit manufacturing, where line width, seed layer etching and copper adhesion determine yield at the finest pitches. This landscape draws on 158 published records filed between 2015 and 2026 that reference semi-additive processing, dry film resist or related fine-line techniques alongside packaging-substrate claims. Publication lags filing by roughly 18 months, so the most recent filing years in the trend are understated and should not be read as a slowdown on their own.

The picture that emerges is a field where a handful of large electronics and packaging firms hold most of the claim space, IPC classes overlap substantially between circuit-board and semiconductor-device categories, and filing activity has settled below its 2022 peak without disappearing.

Filing activity and technology composition, 2015-2026
  1. 1QUALCOMM INC30
  2. 2ATOTECH DEUT GMBH & CO KG27
  3. 3PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD16
  4. 4MURATA MFG CO LTD16
  5. 5SHINKO ELECTRIC IND CO LTD13
  6. 6SAMSUNG ELECTRO MECHANICS CO LTD11
  7. 7LG INNOTEK CO LTD8
  8. 8INTEL CORP8
  9. 9Stemco Co., Ltd.5
  10. 10AMKOR TECH SINGAPORE HLDG PTE LTD4
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Embedded Trace and Fine Line Substrates covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The Data

Filing trend and technology composition

Two views of the same 158 records: how filing activity moved year over year, and which IPC subclasses the claims fall under.

Annual filings, 2017-2026

Filings rose from 6 in 2017 to a peak of 24 in 2022, then declined to 11 by 2024, a 31% drop over the 2021-2024 window. 2025 and 2026 figures are still filling in due to publication lag and should not be read as a continued decline.

Annual filings, 2017-20260613192562017201820192020202124202220232024202522026Most recent year is partial — publication lag means later filings are not yet visible.

IPC subclass distribution

H05K (printed circuits & assemblies) and H01L (semiconductor devices) each appear in roughly half of the 158 records, confirming that most embedded trace substrate filings straddle both disciplines. Narrower classes such as C23C (coating & surface deposition) and H10N (other solid-state devices) appear in under 5% of records, marking them as comparatively under-claimed relative to the core classes.

IPC subclass distributionH05K · Printed circuits & assemblies8453.2%H01L · Semiconductor devices8251.9%H10W3320.9%H01F · Magnets, inductors & transform…2515.8%C23F · Corrosion & metal removal2314.6%H10P1610.1%C23C · Coating & surface deposition74.4%H10N · Other electric solid-state dev…53.2%Other1912.0%

Shares are the percentage of the 158 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Embedded Trace and Fine Line Substrates covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

Representative filing and most-cited records

Representative Filing
US20150208517A12015-07-23

US20150208517A1 — Embedded trace substrate and method of forming the same

AMKOR TECHNOLOGY SINGAPORE HOLDING PTE.LTD.

In one embodiment, a method for forming an embedded trace substrate includes forming a conductive layer on a carrier. A dielectric film is provided on the conductive layer. Vias are formed in the dielectric film and extend to portions of the conductive layer. A conductive pattern is formed on the dielectric layer and is electrically connected to the conductive layer through the vias. The carrier is removed and portions of the conductive layer are selectively removed to provide a plurality of bumps pads configured to protrude outwardly from the dielectric layer.Filed by Amkor Technology Singapore Holding Pte. Ltd., 2015-07-23.

US20150208517A1 — patent drawing 1US20150208517A1 — patent drawing 2
View full record
Most-cited records in this landscape
#Publication no.Patent titleCitations
1US20130249075A1Semiconductor package, semiconductor apparatus and method for manufacturing semiconductor package71
2US20190244743A1Inductor component and method of manufacturing same44
3JP2016225611AChip inductor31
4US7589398B1Embedded metal features structure30
5US9171739B1Integrated circuit packaging system with coreless substrate and method of manufacture thereof26
6US20070232050A1Embedding device in substrate cavity19
7US8115307B2Embedding device in substrate cavity18
8US20150130021A1Solonoid inductor in a substrate17
9US9565774B2Embedded trace substrate and method of forming the same13
10US20120125667A1Printed circuit board and method of manufacturing the same12

Citation counts favour older records inside this corpus and should be read as a signal of influence, not current relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Embedded Trace and Fine Line Substrates covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for filing strategy

The dataset points to a field with heavy concentration at the top, a class structure split between two large IPC groups, and a filing curve that peaked several years before the cut-off.

Concentration
64.6% of 158 records
Top 5 combined share

Claim space is held by a small group

Five assignees account for 64.6% of all 158 records in scope, and the top 10 extend that to 87.3%. A new entrant is filing into a field where the leader alone holds 30 records against a fifth-place count of 13 — the gap between the top of the ranking and the middle is wide.

Based on the 26-company ranked list returned for this dataset.
Filing momentum
-31% (2021→2024)
Three-year filing change

Activity has cooled from its 2022 peak

Filings peaked at 24 in 2022, then fell from 16 in 2021 to 11 in 2024 — a 31% decline over that span. Because publication lags filing by around 18 months, the 2025-2026 counts are still incomplete and should not be read as confirming a continued fall.

2024 is the most recent year treated as complete.
Technology overlap
53.2% / 51.9%
H05K / H01L record share

Two IPC classes dominate, almost equally

H05K (printed circuits) covers 53.2% of the 158 records and H01L (semiconductor devices) covers 51.9% — since a record can carry both classes, this overlap confirms embedded trace substrate work is filed at the packaging-semiconductor boundary rather than as a standalone circuit-board technology.

Shares are of the 158-record total, not mutually exclusive.
Filing geography
90 US filings
Leading receiving office

US filings dominate the receiving-office mix

The United States receives 90 of the filings tracked here, well ahead of Europe (EPO) at 23 and WIPO/PCT at 12. Japan, Germany and Austria each account for single-digit counts, suggesting protection strategies concentrate on the US market with selective international filing.

Counts are by receiving office, not by applicant nationality.
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Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to embedded trace and fine line substrates, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Embedded Trace and Fine Line Substrates covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the field is open

The ranked leaders span large electronics manufacturers and specialist packaging suppliers, with co-filing activity limited to a handful of pairs.

Leader
30 records
Top-ranked assignee

A single leader well ahead of the field

The top-ranked assignee holds 30 of the 158 records, more than double the fifth-place count of 13. That gap suggests a filer with a sustained, multi-year programme rather than opportunistic filing.

Ranking covers 26 companies total.
Mid-field
13 records
Fifth place

A cluster of established filers

Positions two through five each hold double-digit record counts, forming a second tier of large electronics and packaging firms that between them account for most of the 64.6% top-5 share.

Combined top-5 share: 64.6% of 158 records.
Long tail
4 records
Tenth place

Activity thins out quickly past the top ten

By tenth place, record counts drop to 4, and the ranking runs to 26 companies overall — most of the field files only a handful of times, leaving room for smaller entrants to build a defensible position in narrower claim areas.

Top 10 combined: 87.3% of 158 records.
🔍
Under-claimed sub-areas
Branches where filing density is comparatively thin relative to the core H05K/H01L classes
Seed layer etch selectivity controlCopper adhesion promoter chemistryImpedance-controlled fine line routingCoating-based surface deposition (C23C)Solid-state device integration (H10N)
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Qualcomm Inc.10%
Murata Manufacturing Co., Ltd.1—
Atotech Deutschland GmbH0—
Panasonic Intellectual Property Management Co., Ltd.0-100%
Shinko Electric Industries Co., Ltd.0—
Intel Corp.0—
Samsung Electro-Mechanics Co., Ltd.0—
LG Innotek Co., Ltd.0—
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Embedded Trace and Fine Line Substrates covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to specific next steps depending on whether the goal is freedom-to-operate, portfolio benchmarking or identifying open claim space.

Check freedom-to-operate against the top holders

With 64.6% of records held by five assignees, any new filing in core embedded trace substrate claims should be checked against their specific claim scope before drafting.

Run a freedom-to-operate check in Eureka

Track filing momentum year over year

Because 2025-2026 counts are still incomplete, monitoring how the leaders' filing rate develops post-2024 will show whether the 2021-2024 decline persists or reverses.

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Explore the under-claimed IPC branches

C23C and H10N sit well below the density of H05K and H01L, suggesting narrower but potentially defensible claim space in coating chemistry and solid-state integration.

Explore white space in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Embedded Trace and Fine Line Substrates covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on embedded trace substrate patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Embedded Trace and Fine Line Substrates covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company's registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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