EUV Lithography Patents: Who Leads, Where the Gaps Are 2026
- Filing has plateaued, not accelerated. activity peaked at 58 families in 2022 and has not exceeded that level since, despite EUV scanners now shipping in volume.
- The core claim territory is narrow. 817 of 829 families sit in G03F alone, meaning almost every filer is contesting the same photolithography subclass rather than spreading into adjacent optics or metrology.
- Collaboration is rare and concentrated. only 10 co-assignee pairs exist across the whole dataset, and the strongest links tie one optics supplier to individual named inventors and to university physics departments.
Filing growth compares 2021 (49 records) with 2024 (36) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 829 records in scope (CR5), not by the ranked leaders only.
What this dataset covers
This landscape draws on 829 patent families published between 2015 and mid-2026 that combine EUV lithography or EUV scanner terminology with specific technical claims around source power, multilayer mirrors, stochastic defects, throughput, or dose control, restricted to the core photolithography and X-ray-technique IPC classes. That search discipline excludes broad semiconductor-manufacturing filings that mention EUV only in passing, and keeps the corpus focused on the optical, source, and mask engineering that actually differentiates one EUV platform from another.
Because publication typically lags filing by around eighteen months, the 2025 and 2026 counts in the trend below are undercounts of true filing activity and should be read as directional rather than final.
Filing trend and technology composition
Two views of the same 829 families: how filing volume has moved year over year, and which IPC subclasses the claims actually sit in.
A peak in 2022, then a plateau
Filings rose from 36 in 2017 to a high of 58 in 2022, then held flat or declined through the most recent complete years. That pattern is consistent with a field where the core optical and source architecture has stabilised around a small number of proven approaches, and where new filings increasingly refine existing designs rather than stake out new ground.
Concentrated in G03F, with H01L and G02B as the main adjacencies
G03F (photolithography and photomechanics) appears in 817 of 829 families, effectively the whole corpus. H01L (semiconductor devices, 206) and G02B (optical elements, 161) are the largest adjacent classes, followed by G21K (particle and radiation handling, 95) and H05G (X-ray technique, 91). The gap between G03F and everything else shows how tightly the claim activity clusters around the scanner and mask itself rather than downstream device integration.
Shares are the percentage of the 829 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.
Go deeper on EUV Lithography Systems with Eureka
This page is one run against one query. Ask Eureka your own question about euv lithography systems and every answer comes back with the patent numbers behind it.
Try EurekaThe most-cited records in this corpus
Multilayer mirror for EUV lithography and process for its production
This 2012 filing from AGC addresses a specific failure mode in EUV multilayer mirrors: reflectivity loss from oxidation of the ruthenium protective layer. The fix is an intermediate nitrogen-silicon layer sitting between the Mo/Si reflective stack and the Ru cap, at defined atomic-percent ranges, to slow that oxidation without degrading reflectivity.Filed by AGC Inc., published 2012-08-02.


| # | Publication no. | Patent title | Citations |
|---|---|---|---|
| 1 | US8828625B2 | Extreme ultraviolet lithography mask and multilayer deposition method for fabricating same | 308 |
| 2 | US8968989B2 | Assist layers for EUV lithography | 297 |
| 3 | US9618846B2 | PECVD films for EUV lithography | 284 |
| 4 | US6498685B1 | Maskless, microlens EUV lithography system | 263 |
| 5 | US6195201B1 | Reflective fly's eye condenser for EUV lithography | 238 |
| 6 | US6033079A | High numerical aperture ring field projection system for extreme ultraviolet lithography | 222 |
| 7 | US6623893B1 | Pellicle for use in EUV lithography and a method of making such a pellicle | 204 |
| 8 | US6377651B1 | Laser plasma source for extreme ultraviolet lithography using a water droplet target | 161 |
| 9 | US6142641A | Four-mirror extreme ultraviolet (EUV) lithography projection system | 137 |
| 10 | US5958605A | Passivating overcoat bilayer for multilayer reflective coatings for extreme ultraviolet lithography | 136 |
Citation counts are drawn from a searched corpus and favour older filings; treat them as evidence of influence on later filers, not of current commercial relevance.
Each row carries its publication number; clicking a row searches Eureka by that number.
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Three read-throughs from the trend, the IPC split, and the citation table, aimed at a reader deciding where to file or where to watch.
The field has stopped accelerating
Filing volume roughly doubled from 2017 to its 2022 peak and has not grown since. That plateau lines up with EUV scanners moving from development into production tools at leading foundries — the architecture is largely settled, and recent filings look more like refinements of source power, dose control and defect mitigation than new platform bets.
Almost everyone is filing in the same subclass
The near-total concentration in G03F means the competitive fight is happening inside one IPC bucket, with H01L and G02B as the only adjacencies carrying meaningful volume. G21K and H05G, the classes closest to source and radiation-handling hardware, carry a fraction of the volume — that gap is worth checking before assuming source-side claim space is crowded.
Co-filing is the exception, not the norm
Only ten co-assignee pairings appear across the dataset, and the strongest ones link a single optics supplier to named individual inventors and to university physics groups rather than to other manufacturers. That suggests most EUV-relevant IP is being built in-house or through narrow, targeted academic partnerships rather than broad industry consortia.
Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to euv lithography systems, with the prior art for and against each one.
Assignee landscape and where the gaps sit
Receiving-office data shows the United States drawing the largest share of filings (500), ahead of the PCT route (101), Europe (99), Taiwan (30), Japan (19) and the Netherlands (14) — a spread that tracks where EUV scanner makers, foundries and mask-supply chains are headquartered rather than where manufacturing volume ultimately runs.
Even the leader has slowed
Recent-year momentum data shows the top optics supplier with a single filing in the latest year, while several other historically active assignees — including a leading foundry and the dominant scanner maker — show zero filings and a -100% year-on-year change. That is consistent with the broader plateau in the trend chart rather than any single company pulling back.
The US is the dominant filing venue
With 500 filings, the United States receives roughly five times the volume of the next-largest single-country office, Taiwan. The PCT and EPO routes each carry around 100 filings, pointing to deliberate multi-jurisdiction strategies for the families assignees consider most defensible.
Ties run through named inventors and universities
The strongest co-assignee link in the dataset pairs one optics-house assignee with a named individual inventor across five families, and two more of the top links pair the leading scanner maker with university research groups. That pattern points to inventor-driven or academic-collaboration IP rather than joint ventures between competing manufacturers.
| Assignee | Recent year | YoY |
|---|---|---|
| Carl Zeiss SMT GmbH | 1 | — |
| Taiwan Semiconductor Manufacturing Company (TSMC) | 0 | -100% |
| ASML Netherlands B.V. | 0 | -100% |
| The Regents of the University of California | 0 | — |
| Intel Corporation | 0 | — |
| AGC Inc. | 0 | — |
| Korea Electronics Technology Institute | 0 | — |
| Nikon Corporation | 0 | — |
Where to take this from here
The trend and IPC data point to a field with settled core claims and thinner coverage at the edges. Two directions are worth pursuing before committing a filing strategy.
Stress-test a claim against the cited core
Before drafting in mirror, mask or source-power territory, check it against the highest-cited records in this corpus — they define the prior art that later filers had to design around.
Explore prior art in EurekaMap the under-claimed branches in detail
G21K and H05G carry a fraction of G03F's volume. Confirm whether that reflects genuine white space or simply different indexing before filing there.
Run a deeper IPC breakdown in EurekaCommon questions on EUV lithography patents
The most-cited records in this corpus include filings on multilayer mirror deposition, assist layers, PECVD films, and maskless microlens systems, with citation counts ranging from roughly 238 to 308 within the searched dataset. These older filings, several dating to the early 2000s, established foundational claims that later entrants had to design around. Current top filers by volume include the leading EUV scanner maker and major optics suppliers, though recent-year momentum data shows most of them with zero new filings in the latest year, reflecting the broader slowdown across the field rather than any single company's retreat.
Filing volume peaked at 58 families in 2022 and has been flat or declining since, based on 829 total families tracked from 2015 through mid-2026. This pattern typically appears once a technology's core architecture stabilises — in this case, EUV scanners moving from development into production deployment at leading foundries. It does not mean innovation has stopped; it means new filings are more likely to refine existing source, mirror and dose-control designs than to stake out entirely new platform approaches. Publication lag of roughly eighteen months also means the final one to two years of any trend are undercounted.
817 of the 829 families in this dataset carry a G03F classification, the core photolithography and photomechanics subclass, making it by far the most contested claim territory. Semiconductor devices (H01L, 206 records) and optical elements (G02B, 161 records) are the largest adjacent areas. Particle and radiation handling (G21K) and X-ray technique (H05G) each carry under 100 records, suggesting source-hardware and radiation-handling claims are comparatively less crowded than mirror and mask claims within the core subclass.
Based on IPC distribution, the classes adjacent to the core G03F cluster — particularly G21K (particle and radiation handling) and H05G (X-ray technique) — carry substantially lower filing volume than the core subclass, at 95 and 91 records respectively against 817 in G03F. That gap points to source-hardware and radiation-handling sub-areas, such as source-power recovery mechanisms and in-situ stochastic defect detection, as places where claim space may be less occupied. Any white-space read should be confirmed against the specific prior art in that sub-area before committing a filing strategy, since thin IPC counts can also reflect indexing practice rather than genuine gaps.
Receiving-office data shows filings concentrated heavily in the United States (500 filings), with the PCT route (101), Europe (99), Taiwan (30), Japan (19) and the Netherlands (14) following well behind. On the assignee side, co-filing is rare — only 10 co-assignee pairs exist across all 829 families, and the strongest links tie a single optics supplier to named inventors and university groups rather than to other manufacturers. That combination of a few dominant filing venues and very limited collaboration suggests IP in this field is built largely in-house within a small number of organisations.
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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.
Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.
Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.
Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.