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EUV Lithography Patents: Who Leads, Where the Gaps Are 2026

EUV Lithography Patents: Who Leads, Where the Gaps Are 2026
https://www.patsnap.com/resources/blog/rd-blog/euv-lithography-systems-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Lithography
EUV Lithography Patents: Mapping the Assignees and Claim Space Behind Extreme Ultraviolet Scanners
  • Filing has plateaued, not accelerated. activity peaked at 58 families in 2022 and has not exceeded that level since, despite EUV scanners now shipping in volume.
  • The core claim territory is narrow. 817 of 829 families sit in G03F alone, meaning almost every filer is contesting the same photolithography subclass rather than spreading into adjacent optics or metrology.
  • Collaboration is rare and concentrated. only 10 co-assignee pairs exist across the whole dataset, and the strongest links tie one optics supplier to individual named inventors and to university physics departments.
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829
Published Records
50%
Top-5 Share of All Records
-27%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (49 records) with 2024 (36) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 829 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this dataset covers

This landscape draws on 829 patent families published between 2015 and mid-2026 that combine EUV lithography or EUV scanner terminology with specific technical claims around source power, multilayer mirrors, stochastic defects, throughput, or dose control, restricted to the core photolithography and X-ray-technique IPC classes. That search discipline excludes broad semiconductor-manufacturing filings that mention EUV only in passing, and keeps the corpus focused on the optical, source, and mask engineering that actually differentiates one EUV platform from another.

Because publication typically lags filing by around eighteen months, the 2025 and 2026 counts in the trend below are undercounts of true filing activity and should be read as directional rather than final.

Filing activity by year, 2017-2026
  1. 1TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD195
  2. 2ASML NETHERLANDS BV76
  3. 3CARL ZEISS SMT GMBH59
  4. 4INTEL CORP45
  5. 5EUV LLC40
  6. 6AGC INC31
  7. 7RGT UNIV OF CALIFORNIA28
  8. 8KOREA ELECTRONICS TECH INST27
  9. 9SHIN ETSU CHEMICAL CO LTD25
  10. 10NIKON CORP25
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on EUV Lithography Systems covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Numbers

Filing trend and technology composition

Two views of the same 829 families: how filing volume has moved year over year, and which IPC subclasses the claims actually sit in.

A peak in 2022, then a plateau

Filings rose from 36 in 2017 to a high of 58 in 2022, then held flat or declined through the most recent complete years. That pattern is consistent with a field where the core optical and source architecture has stabilised around a small number of proven approaches, and where new filings increasingly refine existing designs rather than stake out new ground.

A peak in 2022, then a plateau015304560362017201820192020202158202220232024202522026Most recent year is partial — publication lag means later filings are not yet visible.

Concentrated in G03F, with H01L and G02B as the main adjacencies

G03F (photolithography and photomechanics) appears in 817 of 829 families, effectively the whole corpus. H01L (semiconductor devices, 206) and G02B (optical elements, 161) are the largest adjacent classes, followed by G21K (particle and radiation handling, 95) and H05G (X-ray technique, 91). The gap between G03F and everything else shows how tightly the claim activity clusters around the scanner and mask itself rather than downstream device integration.

Concentrated in G03F, with H01L and G02B as the main adjacenciesG03F · Photolithography & photomechan…81798.6%H01L · Semiconductor devices20624.8%G02B · Optical elements & systems16119.4%G21K · Particle & radiation handling9511.5%H05G · X-ray technique9111.0%H10P536.4%G03B · Photographic apparatus364.3%G01N · Material analysis & testing253.0%Other24129.1%

Shares are the percentage of the 829 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on EUV Lithography Systems covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The most-cited records in this corpus

Representative Filing
US20120196208A12012-08-02

Multilayer mirror for EUV lithography and process for its production

AGC INC.

This 2012 filing from AGC addresses a specific failure mode in EUV multilayer mirrors: reflectivity loss from oxidation of the ruthenium protective layer. The fix is an intermediate nitrogen-silicon layer sitting between the Mo/Si reflective stack and the Ru cap, at defined atomic-percent ranges, to slow that oxidation without degrading reflectivity.Filed by AGC Inc., published 2012-08-02.

US20120196208A1 — patent drawing 1US20120196208A1 — patent drawing 2
View full record
Highest-citation EUV lithography families
#Publication no.Patent titleCitations
1US8828625B2Extreme ultraviolet lithography mask and multilayer deposition method for fabricating same308
2US8968989B2Assist layers for EUV lithography297
3US9618846B2PECVD films for EUV lithography284
4US6498685B1Maskless, microlens EUV lithography system263
5US6195201B1Reflective fly's eye condenser for EUV lithography238
6US6033079AHigh numerical aperture ring field projection system for extreme ultraviolet lithography222
7US6623893B1Pellicle for use in EUV lithography and a method of making such a pellicle204
8US6377651B1Laser plasma source for extreme ultraviolet lithography using a water droplet target161
9US6142641AFour-mirror extreme ultraviolet (EUV) lithography projection system137
10US5958605APassivating overcoat bilayer for multilayer reflective coatings for extreme ultraviolet lithography136

Citation counts are drawn from a searched corpus and favour older filings; treat them as evidence of influence on later filers, not of current commercial relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on EUV Lithography Systems covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the filing pattern signals

Three read-throughs from the trend, the IPC split, and the citation table, aimed at a reader deciding where to file or where to watch.

Filing Momentum
58 in 2022 → flat/declining
peak year vs. recent trend

The field has stopped accelerating

Filing volume roughly doubled from 2017 to its 2022 peak and has not grown since. That plateau lines up with EUV scanners moving from development into production tools at leading foundries — the architecture is largely settled, and recent filings look more like refinements of source power, dose control and defect mitigation than new platform bets.

Read against a roughly 18-month publication lag, the last two data points likely understate true activity.
Claim Concentration
817 of 829 in G03F
share of corpus in the core subclass

Almost everyone is filing in the same subclass

The near-total concentration in G03F means the competitive fight is happening inside one IPC bucket, with H01L and G02B as the only adjacencies carrying meaningful volume. G21K and H05G, the classes closest to source and radiation-handling hardware, carry a fraction of the volume — that gap is worth checking before assuming source-side claim space is crowded.

Composition figures are per-record IPC tags and overlap across classes.
Collaboration Pattern
10 co-assignee pairs
across the full 829-family corpus

Co-filing is the exception, not the norm

Only ten co-assignee pairings appear across the dataset, and the strongest ones link a single optics supplier to named individual inventors and to university physics groups rather than to other manufacturers. That suggests most EUV-relevant IP is being built in-house or through narrow, targeted academic partnerships rather than broad industry consortia.

Pair counts reflect shared assignment on the same family, not general collaboration.
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Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to euv lithography systems, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on EUV Lithography Systems covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Who's Filing

Assignee landscape and where the gaps sit

Receiving-office data shows the United States drawing the largest share of filings (500), ahead of the PCT route (101), Europe (99), Taiwan (30), Japan (19) and the Netherlands (14) — a spread that tracks where EUV scanner makers, foundries and mask-supply chains are headquartered rather than where manufacturing volume ultimately runs.

Momentum Signal
1 filing in latest year
most active assignee in the most recent year

Even the leader has slowed

Recent-year momentum data shows the top optics supplier with a single filing in the latest year, while several other historically active assignees — including a leading foundry and the dominant scanner maker — show zero filings and a -100% year-on-year change. That is consistent with the broader plateau in the trend chart rather than any single company pulling back.

Latest-year counts are partial due to publication lag.
Receiving Office
500 US filings
largest single receiving office

The US is the dominant filing venue

With 500 filings, the United States receives roughly five times the volume of the next-largest single-country office, Taiwan. The PCT and EPO routes each carry around 100 filings, pointing to deliberate multi-jurisdiction strategies for the families assignees consider most defensible.

Receiving-office counts are not mutually exclusive with family counts.
Collaboration Ties
Strongest pair: 5 shared families
top co-assignee link in the dataset

Ties run through named inventors and universities

The strongest co-assignee link in the dataset pairs one optics-house assignee with a named individual inventor across five families, and two more of the top links pair the leading scanner maker with university research groups. That pattern points to inventor-driven or academic-collaboration IP rather than joint ventures between competing manufacturers.

Only 10 co-assignee pairs exist in total across 829 families.
🔍
Under-claimed branches worth checking before filing
Sub-areas with thin representation relative to the core G03F cluster
Ru-cap oxidation barriers beyond nitrogen-silicon interlayersIn-situ stochastic defect detection during exposureSource-power recovery after droplet-generator downtimeDose-control feedback for high-NA pellicle-free masksX-ray-technique (H05G) source hardware outside mirror claims
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Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Carl Zeiss SMT GmbH1
Taiwan Semiconductor Manufacturing Company (TSMC)0-100%
ASML Netherlands B.V.0-100%
The Regents of the University of California0
Intel Corporation0
AGC Inc.0
Korea Electronics Technology Institute0
Nikon Corporation0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on EUV Lithography Systems covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this from here

The trend and IPC data point to a field with settled core claims and thinner coverage at the edges. Two directions are worth pursuing before committing a filing strategy.

Stress-test a claim against the cited core

Before drafting in mirror, mask or source-power territory, check it against the highest-cited records in this corpus — they define the prior art that later filers had to design around.

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Map the under-claimed branches in detail

G21K and H05G carry a fraction of G03F's volume. Confirm whether that reflects genuine white space or simply different indexing before filing there.

Run a deeper IPC breakdown in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on EUV Lithography Systems covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on EUV lithography patents

Answers are grounded in the same dataset. Derived from a Patsnap search on EUV Lithography Systems covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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