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EUV Pellicle Membranes Patents: Who Leads, Where Gaps Are 2026

EUV Pellicle Membranes Patents: Who Leads, Where Gaps Are 2026
https://www.patsnap.com/resources/blog/rd-blog/euv-pellicle-membranes-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Lithography
EUV Pellicle Membranes: Patents Behind the Industry's Thinnest Barrier
  • Filing already peaked. 2022 recorded 28 filings, the high point in the dataset, with no year since matching that level — a maturing rather than accelerating claim space.
  • Momentum has stalled at the top. Several of the most active historic filers, including ASML and TSMC, show zero filings in the latest year and a -100% year-over-year change.
  • The oldest prior art still dominates citations. A 2008 filing on EUV pellicle fabrication remains the most-cited record in the corpus, ahead of everything filed in the last decade.
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153
Published Records
84%
Top-5 Share of All Records
-11%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (19 records) with 2024 (17) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 153 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··8 min readSourced from Patsnap Eureka
Overview

What the EUV pellicle patent record actually shows

EUV pellicle membranes sit at the intersection of extreme ultraviolet optics, thin-film materials science and thermal engineering: a membrane a few tens of nanometres thick has to transmit EUV light, survive hydrogen plasma exposure, and dissipate heat under high-power exposure tools without tearing or contaminating the reticle. The 153 patent families in this dataset span 2015 through the current filing year, concentrated overwhelmingly in G03F photolithography classifications, with secondary clusters in inorganic compound chemistry, nanotechnology and semiconductor device classes. Filing offices skew heavily toward the United States, followed by PCT, European and Israeli filings — a footprint that tracks the geography of EUV tool and fab deployment rather than a broader global filing pattern.

The filing curve rose through the late 2010s, peaked in 2022, and has not returned to that level since. Because publication typically lags filing by around 18 months, the most recent one or two years in any such trend understate real activity — but even allowing for that lag, the plateau after 2022 marks a shift from a build-out phase to a narrower, more contested claim space.

Annual filings, 2017–2026 (most recent year partial)
  1. 1ASML NETHERLANDS BV77
  2. 2TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD25
  3. 3INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW)11
  4. 4INTEL CORP9
  5. 5GLOBALFOUNDRIES US INC6
  6. 6LINTEC OF AMERICA INC5
  7. 7INDUSTRY UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY4
  8. 8GLOBALFOUNDRIES INC4
  9. 9G FORCE NANOTECH LTD3
  10. 10APPLIED MATERIALS INC3
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on EUV Pellicle Membranes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The Numbers

Filing trends and technology composition

Two views of the same 153-family dataset: how filing activity has moved year over year, and how those filings distribute across IPC subclasses.

A peak year behind, not ahead

Annual filings rose from single digits in 2017 to a peak of 28 in 2022, then eased off. With 2026 only partially represented, the near-term trend line reads flat to declining rather than growing — a signal that early broad claims have already been staked and later entrants are filing narrower, more defensive applications.

A peak year behind, not ahead0815233022017201820192020202128202220232024202512026Most recent year is partial — publication lag means later filings are not yet visible.

G03F dominates; secondary classes reveal the supporting chemistry

Every record in the dataset carries a G03F photolithography classification, as expected given the search scope. The next-largest classes — inorganic compounds (C01B), nanotechnology (B82Y) and semiconductor devices (H01L) — point to where the harder materials-science problems live: membrane chemistry, coating structure and integration with the exposure tool, rather than the optical requirement itself.

G03F dominates; secondary classes reveal the supporting chemistryG03F · Photolithography & photomechan…153100.0%C01B · Non-metallic elements & inorga…2315.0%B82Y · Nanotechnology applications149.2%H01L · Semiconductor devices127.8%G02B · Optical elements & systems117.2%H10P85.2%D01F · Chemical filament & fibre feat…63.9%G21K · Particle & radiation handling63.9%Other2415.7%

Shares are the percentage of the 153 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on EUV Pellicle Membranes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The prior art still shaping freedom-to-operate

Representative Filing
US10962876B22021-03-30

EUV pellicle structure and method for manufacturing same

IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) OF HANYANG UNIVERSITY

A method for manufacturing an extreme ultraviolet (EUV) pellicle structure may include preparing a pellicle membrane that includes an intermediate layer structure in which EUV transmission layers and heat dissipation layers are alternately stacked, a first thin layer disposed on a top surface of the intermediate layer structure, and a second thin layer disposed on a bottom surface of the intermediate layer structure and having a heat emissivity lower than that of the first thin layer, and disposing a cooling structure for absorbing heat from the pellicle membrane on an edge sidewall of the pellicle membrane at which the heat dissipation layers are exposed.Filed by IUCF-HYU, the industry-university cooperation arm of Hanyang University, this filing structures the membrane as an alternating stack of transmission and heat-dissipation layers rather than a single homogeneous film.

US10962876B2 — patent drawing 1US10962876B2 — patent drawing 2
View full record →
Most-cited records in the corpus
#Publication no.Patent titleCitations
1US20080152873A1EUV pellicle and method for fabricating semiconductor dies using same91
2US20050048376A1Mounting a pellicle to a frame49
3US7767985B2EUV pellicle and method for fabricating semiconductor dies using same47
4US20050045262A1Attaching a pellicle frame to a reticle45
5WO2021037662A1Pellicle membrane for a lithographic apparatus39
6US20170090278A1EUV pellicle film and manufacturing method thereof38
7US20150168824A1EUV pellicle frame with holes and method of forming34
8WO2008060465A1EUV pellicle with increased EUV light transmittance25
9US20220276553A1Pellicle membrane for a lithographic apparatus20
10US20210191255A1Method for Forming an Extreme Ultraviolet Lithography Pellicle19

Citation counts favour older filings simply because they have had more time to accumulate citations within the searched corpus; treat this table as a map of influence, not of current commercial relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on EUV Pellicle Membranes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the data means for filing strategy

Three patterns in the dataset carry direct implications for anyone deciding where to file, litigate or license.

Filing curve
28 filings in 2022
peak year

The build-out phase is behind, not ahead

Filings climbed steadily from 2017 and topped out at 28 in 2022. No subsequent year has matched it, and the most recent year is only partially captured. That shape is consistent with a technology whose core architectural claims — membrane stack composition, frame attachment, cooling structure — have already been staked out by early movers.

Source: annual filing counts, 2017-2026
Geographic footprint
US 66 · PCT 23 · EPO 21 · IL 20
receiving offices

Filing geography tracks fab and tool deployment

The United States leads by a wide margin, with PCT, European and Israeli filings forming the next tier — Israel's presence reflecting the concentration of pellicle and optics suppliers headquartered there. Japan and Canada trail well behind, suggesting either later entry or a preference for filing through PCT and US routes instead.

Source: receiving office counts
Assignee momentum
-100% YoY
at multiple leading filers

Historic leaders have gone quiet in the latest year

Several assignees with substantial filing histories, including large lithography and foundry players, show zero filings in the most recent year and a full year-over-year drop from their prior activity. That does not necessarily mean disengagement — publication lag means recent filings may not yet be visible — but it does mean the current public record understates whatever those firms are working on now.

Source: recent-year momentum by assignee
Citation concentration
91 citations
on the top-cited record

The oldest filing is still the most-referenced

A 2008 filing on EUV pellicle fabrication for semiconductor dies carries far more citations than any later record, including several from the 2020s. That reflects time-in-corpus more than technical primacy, but it also means any new entrant's freedom-to-operate analysis still has to clear that filing first.

Source: most-cited records table
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Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to euv pellicle membranes, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on EUV Pellicle Membranes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the claim space, and where it is thin

Assignee activity in this dataset is concentrated among a small set of lithography tool makers, foundries, materials suppliers and university research arms, with a long tail of single or low-frequency filers.

Tool and equipment makers
0 filings, -100% YoY
latest year

Leading lithography players show no recent activity in this cut

Assignees associated with EUV exposure tools and pellicle supply appear prominently in the historic filing record but register no filings in the most recent year captured, alongside a full year-over-year decline. Given publication lag, this is more likely a visibility gap than a strategic exit.

Momentum by assignee
Foundries
0 in latest year
momentum

Foundry-side filing has also gone quiet in this window

A major foundry assignee shows the same flat latest-year signal as the tool makers, consistent with pellicle IP maturing into narrower, more defensive filings rather than broad architecture claims.

Momentum by assignee
University and research consortia
2 shared filings
strongest co-assignee pair

Co-assignment clusters around a Belgian research consortium

The strongest co-assignee relationships in the dataset link a microelectronics research centre with a Belgian university's research and development office, appearing together on multiple families. Cross-institutional filing here suggests foundational materials work rather than product-specific claims.

Co-assignee pairs
Materials and film suppliers
1 filing, latest year
active filer

A film and adhesives supplier is still filing

Unlike the tool makers and foundries above, one materials-side assignee registers a filing in the most recent year — a rare sign of continued active prosecution in a dataset otherwise dominated by lapsed momentum.

Recent-year momentum by assignee
🔍
Under-claimed branches worth checking before filing
Sub-areas with comparatively thin representation in this dataset relative to the core membrane-stack and frame-attachment claims.
hydrogen plasma resistance coatingsheat-dissipation layer materialsparticle protection edge sealingmembrane-to-frame bonding methodsin-situ thermal load monitoring
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Lintec of America, Inc.1
ASML Netherlands B.V.0-100%
Taiwan Semiconductor Manufacturing Co., Ltd. (TSMC)0-100%
Interuniversity Microelectronics Centre (IMEC)0
Intel Corporation0
Advanced Micro Devices, Inc. (AMD)0
IUCF-HYU (Industry-University Cooperation Foundation Hanyang University)0
GlobalFoundries Inc.0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on EUV Pellicle Membranes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this next

The filing record raises questions that a static landscape view cannot answer on its own.

Check freedom-to-operate against the 2008 baseline

The most-cited record in this dataset predates most current pellicle chemistry work by over a decade, yet still anchors citation networks for newer filings. Any new membrane stack or frame design should be checked against it directly rather than assumed clear.

Run a freedom-to-operate search in Eureka →

Track the quiet leaders for renewed filing

Several historically active assignees show no filings in the latest year captured. Given normal publication lag, renewed activity from these players may already be in the pipeline and worth monitoring as it surfaces.

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Probe the under-claimed branches before committing R&D

Hydrogen plasma resistance coatings and heat-dissipation layer materials show thinner patent density than core membrane-stack claims. That gap is worth testing against internal roadmaps before assuming it is open.

Explore white space with Eureka →
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on EUV Pellicle Membranes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Frequently asked questions

Answers are grounded in the same dataset. Derived from a Patsnap search on EUV Pellicle Membranes covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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