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GaN HEMT CMP Patents: Who Leads, Where the Gaps Are 2026

GaN HEMT CMP Patents: Who Leads, Where the Gaps Are 2026
https://www.patsnap.com/resources/blog/rd-blog/gallium-nitride-hemt-chemical-mechanical-planarization-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Semiconductors & Microelectronics
Gallium Nitride HEMT Chemical Mechanical Planarization Patents
  • Filing has cooled since its 2019 peak. 58 families that year against 23 in 2017 and a flat-to-declining midpoint of 19 in 2022 — this is not a growth curve, it's a settled claim space.
  • US filings dominate the venue mix. 218 of the tracked records were filed at the USPTO, more than the EPO, WIPO, Israel, Germany and Taiwan combined.
  • No single assignee shows recent-year momentum. Every major name tracked — from large-cap chipmakers to specialist GaN foundries — logged zero filings in the latest year, consistent with publication lag rather than an exited field.
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338
Published Records
55%
Top-5 Share of All Records
-62%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (47 records) with 2024 (18) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 338 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This landscape tracks patent families at the intersection of gallium nitride HEMT device fabrication and chemical mechanical planarization (CMP) — the polishing step that flattens dielectric and metal layers between process stages. The search spans GaN HEMT, GaN transistor and GaN surface planarization language paired against CMP process terminology, across 338 published patent families filed between 2015 and mid-2026.

Because publication typically lags filing by around 18 months, the most recent one or two years in any trend chart will always look thinner than they eventually turn out to be — that softens, but does not erase, the decline visible from the 2019 peak.

Filing activity, 2017–2026
  1. 1INTEL CORP84
  2. 2TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD29
  3. 3INNOSCIENCE (SUZHOU) TECH CO LTD25
  4. 4WOLFSPEED INC25
  5. 5RAYTHEON CO23
  6. 6QUALCOMM INC16
  7. 7KYOCERA SLD LASER INC16
  8. 8VOLTERRA SEMICONDUCTOR CORPORATION14
  9. 9GLOBALFOUNDRIES US INC13
  10. 10HRL LAB7
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Gallium Nitride HEMT Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The data

Filing trend and technology composition

Two views of the same 338 families: how filing volume has moved year over year, and which IPC subclasses carry the claim density.

A peak already behind it

Filings rose from 23 in 2017 to a peak of 58 in 2019, then eased back toward a midpoint of 19 by 2022. The curve reads as a technology that had its land-grab phase and has since settled into maintenance-level filing, rather than one still accelerating.

A peak already behind it015304560232017201858201920202021202220232024202512026Most recent year is partial — publication lag means later filings are not yet visible.

Concentrated in core semiconductor-device classes

H01L (semiconductor devices) accounts for 297 of the 338 records, with H10D close behind at 142 — the modern subclass split-off for general semiconductor device structures. Smaller pockets sit in H10W and H10P (process/packaging-adjacent classes), H10N (other solid-state devices), H01S (lasers), B32B (layered products) and H02M (power conversion), showing CMP-for-GaN claims reaching into optoelectronic and power-conversion applications but not dominating them.

Concentrated in core semiconductor-device classesH01L · Semiconductor devices29787.9%H10D · Semiconductor devices (general)14242.0%H10W4914.5%H10P4212.4%H10N · Other electric solid-state dev…185.3%H01S · Lasers & stimulated emission154.4%B32B · Layered products & laminates144.1%H02M · Power conversion (AC/DC etc.)133.8%Other7321.6%

Shares are the percentage of the 338 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Gallium Nitride HEMT Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key patents

A representative recent filing

Representative record
US20250167041A12025-05-22

BEOL integration solution based on direct CMP to improve intermetal dielectric layer

STMICROELECTRONICS INTERNATIONAL N.V.

A process that helps ensure uniform height of conductive structures formed among intermetal dielectric layers of a wafer. When a metal layer is deposited on a first intermetal dielectric layer, a sealing layer is formed on the metal layer either before or after the metal layer is patterned to form metal interconnect structures. A first interlevel dielectric sub-layer is then formed on the sealing layer. A chemical mechanical planarization (CMP) process is then performed on the first interlevel dielectric sub-layer using the sealing layer as an etch stop. A second interlevel dielectric sub-layer is then formed on the first interlevel dielectric sub-layer.Filed by STMicroelectronics International N.V., published 2025-05-22 — one of the most recent entrants in this dataset, illustrating the back-end-of-line (BEOL) integration angle on CMP rather than front-end device planarization.

US20250167041A1 — patent drawing 1US20250167041A1 — patent drawing 2
View full record
Most-cited records in this landscape
#Publication no.Patent titleCitations
1US9653642B1Manufacturable RGB display based on thin film gallium and nitrogen containing light emitting diodes168
2US6862127B1High performance micromirror arrays and methods of manufacturing the same160
3US9666677B1Manufacturable thin film gallium and nitrogen containing devices137
4US10002928B1Manufacturable RGB display based on thin film gallium and nitrogen containing light emitting diodes119
5US8304271B2Integrated circuit having a bulk acoustic wave device and a transistor116
6US20060284247A1Novel method for integrating silicon CMOS and AlGaN/GaN wideband amplifiers on engineered substrates100
7US20070018198A1High electron mobility electronic device structures comprising native substrates and methods for making the s…88
8US6903860B2Vacuum packaged micromirror arrays and methods of manufacturing the same79
9US20170309676A1Engineered Substrate Including Light Emitting Diode and Power Circuitry78
10US20110248283A1Via structure of a semiconductor device and method for fabricating the same69

Citation counts favour older, more-searched records inside this corpus — read them as a signal of influence on the field, not of current filing priority.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Gallium Nitride HEMT Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three patterns stand out once family counts, venues and IPC composition are read together.

Filing trend
58 → 19
peak (2019) vs. midpoint (2022)

The claim space is settled, not open

A run-up to 58 families in 2019 followed by a decline to 19 by 2022 signals that the foundational CMP-for-GaN-HEMT process moves were staked out early. New entrants now compete for narrower process variants rather than broad method claims.

Filing trend, 2017-2026
Venue concentration
218 of 338
records filed at USPTO

US filing is the default venue

The USPTO share (218) dwarfs EPO (44), WIPO/PCT (42) and the smaller national offices. Freedom-to-operate work that skips a US search misses the bulk of the enforceable art in this field.

Receiving office distribution
IPC composition
297 in H01L
of 338 total records

Device-structure classes carry the density

H01L and its H10D successor account for the large majority of records, meaning most claims are anchored to semiconductor device structure rather than to standalone polishing chemistry or equipment — a clue for where narrower, process-only claims might still clear.

IPC subclass distribution
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Co-filing patterns
AssigneeCo-assigneeShared families
ZUNIGA MARCO AYANG LU10
ZUNIGA MARCO ARUAN JUN10
ZUNIGA MARCO APRASAD JAYASIMHA10
ZUNIGA MARCO APAUL AMIT10
YANG LURUAN JUN10
YANG LUPRASAD JAYASIMHA10
YANG LUPAUL AMIT10
RUAN JUNPRASAD JAYASIMHA10

Only 10 co-assignee pairs were found across the dataset, with the strongest links (each appearing 10 times) centred on a single small cluster of individual inventors — a sign that most filings here are single-assignee efforts rather than joint development.

Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Gallium Nitride HEMT Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the ground

Recent-year filing counts across the tracked assignees — from diversified chipmakers to specialist GaN foundries — all read zero in the latest year, which is expected given publication lag but still means momentum has to be judged on the trend line, not the newest data point.

Momentum check
0
latest-year filings, all tracked assignees

No visible front-runner in the newest data

Every named assignee tracked for recent-year momentum, including large diversified semiconductor firms and dedicated GaN specialists, shows zero filings in the most recent year and one shows a -100% year-over-year drop. This is consistent with the 18-month publication lag rather than an actual pullback from the technology.

Recent-year momentum by assignee
Co-filing
10 pairs
co-assignee relationships found

Filing here is mostly a solo activity

With only 10 co-assignee pairs identified across 338 families, and the strongest links tied to a small inventor cluster rather than cross-company alliances, joint development deals are the exception in this landscape, not the norm.

Co-assignee pair analysis
Venue signal
218 US filings
vs. 44 EPO, 42 WIPO

Watch US prosecution first

Given the US filing skew, competitive monitoring and freedom-to-operate diligence should prioritise USPTO file histories and continuations before extending to EPO or PCT-only families.

Receiving office distribution
🔍
Under-claimed process branches worth checking before filing
Sub-areas where the IPC spread thins out relative to the core H01L/H10D density — worth a freedom-to-operate check before assuming the space is clear.
CMP slurry chemistry for AlGaN/GaN interfacesPost-CMP surface passivation for HEMT gate stacksLaser-assisted planarization for GaN power devicesCMP endpoint detection on non-planar HEMT topographyDielectric-metal co-planarization in GaN-on-Si BEOL
Rank all filers by momentum →
Recent-year filing momentum
AssigneeRecent yearYoY
Intel Corporation0
Taiwan Semiconductor Manufacturing Company (TSMC)0-100%
Vanchip Semiconductor Co., Ltd.0
Raytheon Company0
Innoscience (Suzhou) Technology Co., Ltd.0
Qualcomm Incorporated0
GlobalFoundries U.S. Inc.0
ZUNIGA MARCO A0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Gallium Nitride HEMT Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's next

Where to take this research

The trend and composition data point to a mature but not closed claim landscape. Two directions are worth pursuing depending on your role.

Run a freedom-to-operate check on the under-claimed branches

Slurry chemistry, post-CMP passivation and endpoint detection on non-planar topography show thinner IPC density than the core device-structure classes — worth confirming before committing engineering resources.

Explore in Eureka

Track US prosecution histories, not just grants

With 218 of 338 families filed at the USPTO, continuation and file-wrapper monitoring there will surface competitive moves earlier than watching grant announcements alone.

Set up monitoring in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Gallium Nitride HEMT Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on GaN HEMT CMP patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Gallium Nitride HEMT Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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