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GaN HEMT Gate Dielectric Patents: Who Leads, Filing Trends 2026

GaN HEMT Gate Dielectric Patents: Who Leads, Filing Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/gallium-nitride-hemt-gate-dielectric-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Semiconductors & Microelectronics
Gallium Nitride HEMT Gate Dielectric Patents
  • Filings peaked in 2017 at 191 and have declined since, with the most recent full year sitting well below the midpoint of the range — a maturing rather than an expanding claim space.
  • Every tracked assignee shows 0 filings in the latest year, including firms with -100% year-on-year change, suggesting either a filing lag or a genuine pullback across the field at once.
  • H01L and H10D dominate the IPC mix at 1,563 and 700 records, while power-conversion classes like H02M (97) and H02J (39) remain comparatively thin — a gap between device claims and system-level integration claims.
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1,745
Published Records
30%
Top-5 Share of All Records
0%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (74 records) with 2024 (74) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 1,745 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

Gate dielectric design in gallium nitride high electron mobility transistors sits at the junction of device physics and power electronics: it governs threshold voltage stability, gate leakage and long-term reliability in MIS-HEMT structures. This landscape draws on 1,745 patent families published between 2015 and mid-2026, filtered to records that combine GaN HEMT or GaN transistor language with gate dielectric, gate insulator, or MIS-HEMT dielectric claim language. The set spans device architecture, gate stack materials, and the power and RF circuits that depend on them.

Publication lags filing by roughly eighteen months, so the apparent drop in the last one to two years understates actual filing activity; treat the tail of the trend as provisional rather than a confirmed decline.

Filing activity, 2017-2026
  1. 1INTEL CORP247
  2. 2NAVITAS SEMICON LTD84
  3. 3TRANSPHORM TECHNOLOGY INC72
  4. 4NXP USA INC64
  5. 5HRL LAB61
  6. 6TEXAS INSTRUMENTS INC61
  7. 7INFINEON TECHNOLOGIES AMERICAS CORP49
  8. 8THE BOARD OF TRUSTEES OF THE UNIV OF ILLINOIS48
  9. 9WOLFSPEED INC46
  10. 10MURATA MFG CO LTD37
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Gallium Nitride HEMT Gate Dielectric covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Data

Filing trend and technology composition

Two views of the same 1,745-family dataset: how filing volume has moved year over year, and how those families distribute across IPC subclasses.

A peak in 2017, a decline since

Filings ran at 191 in 2017 and had fallen to 124 by the 2022 midpoint, with 2026 (partial) at 3. The shape reads as flat-to-declining rather than growing, consistent with a technology whose core claim space was staked out early and is now being consolidated rather than expanded.

A peak in 2017, a decline since05010015020019120172018201920202021202220232024202532026Most recent year is partial — publication lag means later filings are not yet visible.

Device claims outweigh system claims

H01L (1,563) and H10D (700) carry the bulk of the filings, covering core semiconductor device structure. H10W (232) and H10P (192) follow at a distance, with H03K pulse-technique claims at 136. Power conversion and power supply classes — H02M at 97 and H02J at 39 — are comparatively under-represented, meaning most of the claimed ground is at the device and stack level rather than in the circuits and systems that use the device.

Device claims outweigh system claimsH01L · Semiconductor devices1,56389.6%H10D · Semiconductor devices (general)70040.1%H10W23213.3%H10P19211.0%H03K · Pulse technique & logic circui…1367.8%H02M · Power conversion (AC/DC etc.)975.6%H10N · Other electric solid-state dev…573.3%H02J · Power supply & grid systems392.2%Other31317.9%

Shares are the percentage of the 1,745 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Gallium Nitride HEMT Gate Dielectric covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

Representative and most-cited records

Representative filing
US20250031402A12025-01-23

HYBRID TYPE AlGaN/GaN HEMT DEVICE

HUANG, CHIH-SHU

The present invention relates to a structure of hybrid type AlGaN/GaN high electron mobility transistor (HEMT) Device, which comprises a silicon substrate structure, and both of a depletion-mode (D-mode) AlGaN/GaN HEMT and a p-GaN gate enhancement-mode (E-mode) AlGaN/GaN HEMT disposed on the silicon substrate structure. By connecting the depletion-mode (D-mode) AlGaN/GaN HEMT to the p-GaN gate structure of the p-GaN gate enhancement-mode (E-mode) AlGaN/GaN HEMT in device design, the p-GaN gate E-mode AlGaN/GaN HEMT may be protected under any gate voltage.Filed by an individual inventor rather than a major assignee, illustrating that cascode-style D-mode/E-mode integration claims remain accessible outside the largest filers.

US20250031402A1 — patent drawing 1US20250031402A1 — patent drawing 2
View full record
Most-cited records in this corpus
#Publication no.Patent titleCitations
1US20170358670A1Diamond on iii-nitride device476
2US7799699B2Printable semiconductor structures and related methods of making and assembling460
3US20080157235A1Controlled buckling structures in semiconductor interconnects and nanomembranes for stretchable electronics447
4US20070032089A1Printable Semiconductor Structures and Related Methods of Making and Assembling347
5US20090267078A1Enhancement Mode III-N HEMTs323
6US20090072272A1Enhancement mode gallium nitride power devices308
7US8039847B2Printable semiconductor structures and related methods of making and assembling300
8US20100025730A1Normally-off Semiconductor Devices and Methods of Fabricating the Same298
9US20090146185A1Insulated gate e-mode transistors283
10US20040124435A1Homoepitaxial gallium-nitride-based electronic devices and method for producing same282

Citation counts favour older records simply because they have had more time to accumulate citations; read them as a signal of influence within this corpus, not as a ranking of current technical importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Gallium Nitride HEMT Gate Dielectric covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three read-throughs from the trend, IPC composition and citation data that matter more for strategy than the raw counts alone.

Filing trend
191 → 3
2017 peak to 2026 partial

The core device claim space was staked out early

The 2017 peak of 191 filings, against a 2022 midpoint of 124, describes a field where the foundational gate-stack and dielectric-interface claims were largely filed in the first half of the tracked period. New entrants now compete against a dense, already-published prior art base for the core structures rather than an open field.

Based on 1,745 total published records
Claim distribution
1,563 vs 97
H01L records vs H02M records

Device-level claims crowd out system-level ones

H01L and H10D together account for the large majority of records, while H02M power-conversion claims sit at 97 and H02J power-supply claims at just 39. That imbalance means dielectric and gate-stack structure is heavily claimed, but the power-circuit context in which the device is deployed is comparatively open.

IPC subclass counts, 2015-2026 corpus
Assignee momentum
0 in latest year
across every tracked assignee

A simultaneous pullback, not a single laggard

Every assignee with recent-year momentum data shows zero filings in the latest year, several logging a -100% year-on-year change. Because publication lags filing by around eighteen months, part of this is a reporting artefact — but the uniformity across otherwise-active filers is still notable and worth revisiting once the 2025-2026 cohort finishes publishing.

Recent-year momentum by assignee
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Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to gallium nitride hemt gate dielectric, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Gallium Nitride HEMT Gate Dielectric covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is active, and where the pairs cluster

Ten co-assignee pairs appear in the dataset, concentrated around a small number of firms working jointly with named inventors — a pattern typical of large device makers that file with named engineering leads rather than pure corporate assignees.

Co-filing pattern
8 shared families
strongest co-assignee pairs

Joint filing concentrated around named inventors

The strongest co-assignee pairs in the dataset link a single corporate assignee to a named individual inventor at 8 shared families each, rather than to another company. This points to internal engineering teams as the practical unit of invention, even where the corporate assignee is what shows up in a landscape search.

10 co-assignee pairs identified in total
Filing geography
941 US filings
vs 217 EPO, 205 PCT, 198 China

US-centric filing with a meaningful PCT and China presence

The United States receives close to twice the filings of the next-largest office. Europe, WIPO/PCT and China each carry a substantial but smaller share, indicating that protection strategy for this technology is built around a US anchor filing with selective international extension.

Receiving office counts, full corpus
Recent activity
0 filings, latest year
across all listed assignees

No visible new activity from tracked leaders

None of the assignees with tracked momentum show filings in the most recent year, and most show a -100% year-on-year drop from the prior year. Given the ~18-month publication lag, this is likely to fill in as later filings publish, but it means recent competitive positioning cannot yet be read from public filings alone.

Momentum data covers the six most-tracked assignees
🔍
Under-claimed sub-areas worth watching
Branches where filing density is thin relative to the core device claims
Power-conversion circuit integration of MIS-HEMT stacksGate dielectric reliability under high-voltage switchingp-GaN/D-mode cascode protection schemesPower-supply system claims (H02J) built on GaN HEMTPulse-technique (H03K) logic paired with gate dielectric design
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Intel Corporation0-100%
Transphorm, Inc.0-100%
Navitas Semiconductor0
Texas Instruments Incorporated0-100%
HRL Laboratories, LLC0
Wolfspeed, Inc.0
International Rectifier Corporation0
The Board of Trustees of the University of Illinois0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Gallium Nitride HEMT Gate Dielectric covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to a maturing core and a thinner system-level layer. These are the practical next steps for a team deciding where to file or where to watch.

Map the white space in power-circuit integration

H02M and H02J claims are thin relative to the device-level H01L and H10D volume. A team building power-conversion systems around GaN HEMT dielectric structures should check whether its integration claims are genuinely novel against this thinner layer before assuming the crowded device space is the only risk.

Explore white space in Eureka

Watch for the 2025-2026 publication catch-up

Every tracked assignee shows zero filings in the latest year, which is more likely a publication-lag artefact than a real halt. Revisit assignee momentum in six to twelve months once the current filing cohort has had time to publish.

Track assignee activity in Eureka

Check freedom-to-operate against high-citation records

The most-cited records in this corpus date from the earlier part of the tracked period and cover foundational device and interconnect structures. Any new gate dielectric filing should be checked against these before assuming an open path.

Run a citation check in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Gallium Nitride HEMT Gate Dielectric covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on GaN HEMT gate dielectric patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Gallium Nitride HEMT Gate Dielectric covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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