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Gallium Oxide Vertical Power FinFET Patents 2026

Gallium Oxide Vertical Power FinFET Patents 2026
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UWBG Semiconductor IP

Gallium Oxide Vertical Power FinFET Patents 2026

Beta-phase Ga₂O₃ FinFETs offer a theoretical breakdown field of 8 MV/cm and a Baliga figure of merit exceeding 3,000 — 10× SiC and 4× GaN. This dataset spans patent and literature records from 2016–2026 across device architectures, thermal management, and application domains.

~50
patent and literature records in this dataset
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~35
Chinese-origin patent records in this dataset
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7+
Xidian University patents in retrieved records
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2016–2026
coverage span of records in this dataset
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Published byPatSnap Insights Team··12 min readVerified by PatSnap Eureka Data
Technology Overview

Why Gallium Oxide Vertical FinFETs Matter for Power Electronics

Beta-phase gallium oxide (β-Ga₂O₃) offers a theoretical breakdown field of 8 MV/cm and a Baliga figure of merit exceeding 3,000 — roughly 10× that of SiC and 4× that of GaN. Melt-grown bulk substrates enable low-cost, large-area wafers unavailable to other ultra-wide-bandgap materials, creating a practical pathway to high-voltage power switching at scale.

The vertical FinFET architecture is the dominant device structure in this dataset because it achieves enhancement-mode (normally-off) operation without p-type doping. By exploiting fin geometry to electrostatically pinch off the accumulation-mode channel, it resolves the fundamental constraint that no reliable p-type doping exists for Ga₂O₃, enabling junctionless normally-off transistors.

Top Assignees by Filing Count — Ga₂O₃ Vertical FinFET (Dataset Snapshot)
Top assignees by filing count in this dataset: Xidian University 7, UESTC 4, Cornell University 3, Fuzhou University 3, Huawei Technologies 2Horizontal bar chart showing top 5 assignees by patent filing count in the Ga₂O₃ vertical FinFET dataset snapshot 2016–2026.Xidian University7UESTC4Cornell University3Fuzhou University3↗ Click bars to explore

Four interconnected innovation clusters define the field: junctionless accumulation-mode vertical FinFETs, heterojunction p-type oxide pinch-off structures using NiOₓ or Cu₂O, heterojunction CMOS platforms and cascode integration with Si or GaN, and thermal co-design approaches including substrate transfer to diamond or SiC and double-sided packaging.

Among the retrieved records, Chinese academic and research institutions account for approximately 35 of the ~50 patent records in this dataset, with Xidian University identified as the most prolific single assignee in retrieved records, holding at least 7 patents. Cornell University holds the most significant foundational US/WO jurisdiction filings, covering both fin-shaped and nanowire-shaped vertical channel architectures.

PatSnap Eureka Data derived from a limited set of patent and literature records retrieved across targeted searches; represents a snapshot of innovation signals within this dataset only.Explore the data ↗
Patent Analytics

Filing Trends and Technology Cluster Distribution

Patent activity in Ga₂O₃ vertical FinFET technology has accelerated sharply since 2021, with the most recent 2024–2026 filings in this dataset pivoting toward system-level integration, thermal management, and gate-all-around architectures. The four technology clusters identified reflect distinct innovation trajectories across device architecture, materials integration, and packaging.

Technology Cluster Distribution — Ga₂O₃ Vertical FinFET (Dataset Snapshot)

Junctionless accumulation-mode vertical FinFETs represent the largest cluster in this dataset, followed by heterojunction p-type oxide gate structures and thermal/packaging innovations.

Technology cluster distribution in dataset: Junctionless Accumulation-Mode FinFET ~18 records, Heterojunction P-Type Oxide Gate ~12 records, Thermal Management and Packaging ~8 records, CMOS Platform and Cascode Integration ~7 recordsHorizontal bar chart showing approximate distribution of patents across four technology clusters in the Ga₂O₃ vertical FinFET dataset snapshot 2016–2026.Junctionless Accumulation FinFET~18Heterojunction P-Type Oxide Gate~12Thermal Management & Packaging~8CMOS Platform & Cascode Integration~7↗ Click bars to explore

Filing Activity by Period — Ga₂O₃ Vertical FinFET (Dataset Snapshot)

Filing activity in this dataset accelerated sharply in the 2021–2023 period, driven by Chinese institutional filings, with the 2024–2026 cohort pivoting toward system-level and thermal integration patents.

Filing activity by period in dataset: 2016 approx 1, 2017-2019 approx 6, 2020 approx 2, 2021-2023 approx 22, 2024-2026 approx 19Vertical bar chart showing approximate patent filing counts by period in the Ga₂O₃ vertical FinFET dataset snapshot 2016–2026.051522201612017–20196202022021–2023222024–2026~19↗ Click bars to explore
PatSnap Eureka Record counts are approximate estimates derived from the retrieved patent and literature snapshot; they do not represent total industry output.Explore the data ↗
Application Domains

Key Application Domains for Ga₂O₃ Vertical Power FinFETs

Retrieved patents and literature in this dataset identify four primary application areas for β-Ga₂O₃ vertical FinFET technology, spanning high-voltage industrial power conversion, electric vehicle systems, renewable energy and data center infrastructure, and UV photodetection.

Vertical FinFET · Drift Layer Engineering

High-Voltage Power Conversion (>600 V)

The primary application target across the entire dataset, with vertical FinFET structures explicitly designed for industrial motor drives, inverters, and railway traction systems. Several patents cite target voltages from 600 V to multi-kV, enabled by thick n⁻-Ga₂O₃ drift layers. Cornell University’s foundational PCT patents (2019) and Fuzhou University’s 2026 filing on high-efficiency large-power devices with comprehensive thermal dissipation both address this domain.

High-Voltage Power
NiOₓ Heterojunction · EV Charging Modules

Electric Vehicles and Automotive Power

Multiple patents explicitly target EV charging modules, onboard chargers, and traction inverters. Xidian University’s 2024 NiOₓ/Ga₂O₃ heterojunction FinFET patent (CN) cites applications in high-voltage transformer circuits and EV charging modules. Anhui University’s 2025 filing on a 28 nm ultra-low-power Ga₂O₃ FinFET device uses TCAD modeling directed at power converter applications including automotive systems.

Automotive Electronics
Schottky Diode Integration · Field Plate Termination

Solar Inverters, 5G, and Data Centers

Fuzhou University’s 2023 filing integrates a Schottky barrier diode with a Ga₂O₃ FinFET for low reverse conduction loss, targeting renewable energy inverters. Quanjia Technology (Fuzhou) Co., Ltd.’s 2026 CN patent on a Ga₂O₃ power diode with junction termination extension and floating field plate composite structure cites 5G communications, AI servers, and renewable energy generation as target markets.

Renewable Energy & ICT
Fin-Channel · Solar-Blind UV Detection

Ultraviolet Photodetection Applications

The Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences filed a 2026 CN patent on a Ga₂O₃-based fin-channel solar-blind UV phototransistor, exploiting Ga₂O₃’s wide bandgap (~4.9 eV) for solar-blind UV detection. This non-power application demonstrates adaptation of the FinFET architecture for sensing in UV-harsh environments relevant to aerospace and defense, extending the technology scope beyond power switching.

UV Photodetection
PatSnap Eureka Application domain descriptions are derived from patent claims and cited use cases within this retrieved dataset only.Explore insights ↗
Assignee Landscape

Key Patent Assignees in Ga₂O₃ Vertical FinFET (Retrieved Records)

In retrieved records, Chinese academic and research institutions account for approximately 35 of the ~50 patent records in this dataset, with Xidian University identified as the most prolific single assignee in this dataset. Cornell University represents the most significant foundational filing presence in the US and WO jurisdictions, with government-funded coverage of both fin-shaped and nanowire-shaped vertical channel architectures.

Top Assignees by Filing Count — Ga₂O₃ Vertical FinFET in Retrieved Records (Dataset Snapshot)

Top assignees in dataset: Xidian University 7, UESTC 4, Cornell University 3, Fuzhou University 3, Huawei Technologies 2Horizontal bar chart of top 5 Ga₂O₃ vertical FinFET patent assignees by filing count in retrieved records dataset snapshot.Xidian University7UESTC4Cornell University3Fuzhou University3Huawei Technologies Co., Ltd.2↗ Click bars to explore
NiOₓ Heterojunction · GAA MOSFET · Thermal Co-Design

Xidian University

The most prolific single assignee in this dataset, with at least 7 CN-jurisdiction patents filed between 2022 and 2025. Technology areas span NiOₓ/Ga₂O₃ heterojunction FinFETs, quad-surround-gate (GAA) MOSFETs on diamond substrates, thermally optimized fin-channel structures, enhancement-mode transistors with high power figure-of-merit, SOG-based diodes, and Ga₂O₃ cascode FETs based on Si MOSFET heterogeneous integration. Several patents are active as of 2025.

China — CN
Vertical Ga₂O₃ Power FETs · Nanowire Channels · US/WO IP

Cornell University

Cornell University holds foundational PCT and US-jurisdiction patents on vertical Ga₂O₃ power FinFETs and nanowire FETs, filed in 2019 (WO) and granted in 2021 (US), with support from AFOSR and NSF government funding. These patents cover both fin-shaped and nanowire-shaped vertical channel architectures on β-Ga₂O₃ bulk substrates, establishing the most significant Western IP position in this dataset for vertical Ga₂O₃ power device architecture.

United States — US
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Unlock Full Assignee Rankings and IP Cluster Analysis
This dataset includes filings from Robert Bosch GmbH (Germany, 2024 DE), Korea Institute of Ceramic Engineering and Technology (2022 US), Huawei Technologies (2 active CN patents), and CETC No. 13 and No. 46 Research Institutes (2026 CN). Full assignee-level FTO signals and IP cluster maps are available in PatSnap Eureka.
Robert Bosch GmbH DE UESTC heterojunction IGBT + more
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PatSnap Eureka Filing counts are derived from retrieved records in this dataset snapshot only and do not represent total industry patent output.Explore players ↗
Emerging Directions

Five Emerging Signals from 2024–2026 Filings

Among 2024–2026 filings in this dataset, five directional signals are evident: gate-all-around geometries, complementary CMOS platform development, cascode heterogeneous integration with Si MOSFETs, diamond substrate and double-sided packaging adoption, and high-quality homoepitaxial substrate development.

Gate-All-Around (GAA) Architectures Emerging

Xidian University’s 2025 CN filing on a ‘quad-surround gate’ Ga₂O₃ MOSFET uses a diamond substrate to combine full gate-surrounding control with substrate-level thermal management, directly analogous to silicon GAA scaling. This moves beyond lateral wrap-gate toward fully surrounding gate geometries. The patent covers both the device structure and fabrication method, signaling near-term process development intent.

CMOS Platform via NiO/Ga₂O₃ Heterojunction

Southeast University’s Wuxi Integrated Circuit Technology Research Institute filed a 2025 CN patent on a fin-channel Ga₂O₃ heterogeneous CMOS platform with low power and high drive capability, integrating NiO-based PMOS with Ga₂O₃ NMOS. This extends the NiO/Ga₂O₃ heterojunction from a gate-control mechanism to a full complementary logic and gate-driver integration platform. It enables inverters and complete power-circuit functionality on a common substrate.

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Access Full Emerging Technology Signal Analysis
Additional emerging signals in this dataset include GaN/Ga₂O₃ integrated power chips from Xiamen Sanan Optoelectronics (2025 CN) and Ga₂O₃ nanowire FinFET structures from the Institute of Semiconductors, Chinese Academy of Sciences (2023 CN). Full signal mapping is available in PatSnap Eureka.
GaN Ga₂O₃ integrated chipNanowire FinFET CAS 2023+ more
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PatSnap Eureka Emerging direction signals are based on 2024–2026 filings within this retrieved dataset snapshot only.Explore emerging trends ↗
Technology Comparison

Ga₂O₃ Vertical FinFET vs. SiC MOSFET: Key Parameters

Click any row to explore further.

Dimensionβ-Ga₂O₃ Vertical FinFETSiC MOSFET (Reference)
Bandgap~4.9 eV (ultra-wide)~3.3 eV (wide)
Theoretical Breakdown Field8 MV/cm~3 MV/cm
Baliga Figure of Merit>3,000 (10× SiC)~300 (reference baseline)
Thermal Conductivity~11–27 W/m·K (low)~370–490 W/m·K (high)
Substrate AvailabilityMelt-grown bulk, low-cost large-area wafers possibleMature SiC boule growth; established supply
P-Type DopingNot reliably available; requires heterojunction substitutes (NiO, Cu₂O)Available; enables conventional VDMOSFET/UMOSFET designs
Dominant Gate Architecture (this dataset)Vertical FinFET with wrap-gate or GAA; junctionless accumulation-modeVertical DMOSFET or UMOSFET with p-well implant
Operating Voltage Target (patents)600 V to multi-kV600 V–1700 V (commercial mainstream)
PatSnap Eureka Ga₂O₃ parameters are drawn from claims and specifications within this retrieved dataset; SiC reference values are cited contextually in patent backgrounds and literature records within the same dataset.Compare in Eureka ↗
Frequently asked questions

Frequently Asked Questions: Gallium Oxide Vertical Power FinFETs

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Data and insights on this page are based on a limited patent and literature dataset and are for reference only. Figures may not represent the complete technology landscape.

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