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GaN HEMT Gate Dielectric Patents: Leaders, Trends & White Space 2026

GaN HEMT Gate Dielectric Patents: Leaders, Trends & White Space 2026
https://www.patsnap.com/resources/blog/rd-blog/gan-hemt-gate-dielectric-patent-landscape-patent-landscape/ · Patsnap · data cut-off 2026-08-31 · downloaded from the live page
Patent Landscape · Semiconductors & Microelectronics
GaN HEMT gate dielectric patents: who holds the ground and where it is still open

A data-backed view of the GaN HEMT gate dielectric patent landscape: who is filing, how concentrated the field is, and where the technology white space sits.

70
Published Records
40%
Top-5 Share of All Records
+75%
Filing Growth 2021→2024
CN
Leading Jurisdiction

Filing growth = 2021 (4 records) → 2024 (7); 2024 is the last year we treat as complete. Top-5 share = the 5 largest assignees ÷ all 70 records in scope (CR5), not the ranked leaders only.

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Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Overview

What this landscape covers

GaN HEMT gate dielectric technology sits at the intersection of high-electron-mobility transistor design and the insulating or passivation layers that control gate leakage, threshold stability and breakdown voltage. This landscape draws on 70 published records classified under semiconductor device IPC codes (H01L, H10D and related subclasses) that reference GaN HEMT structures together with gate dielectric, gate insulation or gate insulator terminology. The scope spans 2015 through the 2026 data cut-off, giving a decade-plus view of how claim activity has built up around non-native dielectric layers, passivation schemes and threshold-control structures on GaN HEMT gates.

Because publication typically lags filing by around 18 months, the most recent one to two years in any trend line will understate real filing activity — a pattern to keep in mind when reading the year-by-year figures below.

Filing activity and technology composition, 2015-2026
  1. 1TAGORE TECHNOLOGY INC7
  2. 2SOUTH CHINA UNIV OF TECH6
  3. 3GUANGDONG INST OF SEMICON MICRO NANO MFG TECH5
  4. 4HUANG CHIH SHU5
  5. 5SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI5
  6. 6ZHONGSHAN INST OF MODERN IND TECH SOUTH CHINA UNIV OF TECH4
  7. 7XIDIAN UNIV4
  8. 8INDIAN INSTITUTE OF SCIENCE4
  9. 9ZHEJIANG XINKE SEMICON CO LTD4
  10. 10SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI3
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on GaN HEMT Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The numbers

Filing trend and technology composition

Two views of the same 70-record dataset: how filing activity has moved year over year, and which IPC subclasses carry the claim weight.

Filing trend

Annual filings climbed from 4 records in 2017 to a peak of 9 in 2023, with the 2021-to-2024 span alone showing a 75% rise (4 to 7 records). The 2025-2026 figures are still filling in as later-filed applications publish, so the recent-year dip is a lag artefact, not a slowdown.

Filing trend0358104201720182019202020212022920232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

Publication lags filing by roughly 18 months, so 2025 onwards are still filling in. Growth rates on this page therefore end at 2024; running them to the last bar would understate the field.

Technology composition

H01L (general semiconductor devices) covers 91.4% of the 70 records, with H10D — the more specific semiconductor-device general subclass — present in 34.3%. Smaller but distinct clusters sit in H10W, pulse/logic circuitry (H03K) and other solid-state device classes (H10N), each around 10% of records, pointing to gate-dielectric work that increasingly touches switching and circuit-level claims rather than device structure alone.

Technology compositionH01L · Semiconductor devices6491.4%H10D · Semiconductor devices (general)2434.3%H10W912.9%H03K · Pulse technique & logic circui…710.0%H10N · Other electric solid-state dev…710.0%H02M · Power conversion (AC/DC etc.)22.9%B82Y · Nanotechnology applications11.4%G01N · Material analysis & testing11.4%

Shares are the percentage of the 70 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on GaN HEMT Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.

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Cited records

The most-cited records in this dataset

Representative record
US20100188069A12010-07-29

Sensors using high electron mobility transistors (US20100188069A1)

UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC.

Embodiments include sensors built from GaN HEMTs carrying capture reagents on the gate region: a thin gold layer with bound antibodies, a thin gold layer with chelating agents, a non-native gate dielectric, or dielectric nanorods with an immobilized enzyme. The claimed methods extend to detecting breast cancer, prostate cancer, kidney injury and glucose using these gate-functionalised HEMT structures.Filed by University of Florida Research Foundation, Inc., published 2010-07-29 — one of the earliest and most-cited records in this dataset at 50 citations.

US20100188069A1 — patent drawing 1US20100188069A1 — patent drawing 2
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Highest-citation records
#Publication no.Patent titleCitations
1US20150255547A1III-Nitride High Electron Mobility Transistor Structures and Methods for Fabrication of Same98
2US20100188069A1Sensors using high electron mobility transistors50
3US20160373106A1High performance radio frequency switch44
4US20200111876A1Algan/gan heterojunction HEMT device compatible with si-CMOS process and manufacturing method therefor36
5CN101916773A一种双沟道MOS-HEMT器件及制作方法34
6CN107316901A基于掺杂HfO<sub>2</sub>铁电栅介质的AlGaN/GaN增强型HEMT器件及制作方法25
7CN108987474A一种增强型高电子迁移率晶体管及其制备方法17
8CN109004029A具有金属氧化物/二氧化硅叠栅的GaN基MOS-HEMT器件及其制备方法15
9CN102184943A一种增强型AlGaN/GaN HEMT器件及其制备方法15
10JP2013074279ASemiconductor device and manufacturing method of the same14

Citation counts are drawn from the searched corpus itself and skew toward older, earlier-filed records — read them as a signal of influence within this dataset, not as a ranking of current technical importance.

Patent titles are shown in the language they were filed in, not translated, so that each record stays verifiable against the original filing — a translated title will not match in Eureka or in any national register. Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on GaN HEMT Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Reading the field

What the concentration and filing pattern imply

Three patterns worth acting on before filing or licensing in this space.

Concentration
40.0%
of 70 records held by top 5 assignees

The top of the field is tight, the tail is long

Five assignees hold 40.0% of all 70 records, and the top ten together hold 67.1%. Below that the ranking runs through 41 companies with modest counts each — a classic concentrated-core-plus-long-tail structure rather than a fragmented field.

Diligence should start with the leader group before scanning the tail for freedom-to-operate risk.
Growth
+75%
filings 2021 → 2024 (4 to 7 records)

Activity is building, not fading

The filing count rose from 4 records in 2021 to 7 in 2024, and 2023 alone produced 9 — the highest single year in the dataset. Treat the flatter 2025-2026 figures as a publication-lag artefact rather than a genuine slowdown.

Expect the true 2025-2026 filing count to rise as later applications publish.
Geography
38 filings
China receiving-office filings, vs 15 in the US

Filing venue is heavily weighted to China

China accounts for 38 of the tracked receiving-office filings, more than double the United States (15), with India, Europe, WIPO and Japan each contributing single-digit counts. Any competitive read of this field has to weight Chinese-language prosecution activity heavily.

Freedom-to-operate work should not stop at US and EPO filings alone.
Claim breadth
91.4%
of 70 records classed under H01L

Claims cluster on device structure, with circuit-level classes as a smaller signal

The overwhelming majority of records sit in the general semiconductor-device class H01L, with a meaningful secondary cluster in H10D. Smaller shares in H03K and H10N mark where gate-dielectric work spills into switching and circuit-level claims — a narrower but potentially less contested space.

The narrower classes are where under-claimed niches are more likely to sit.
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Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to gan hemt gate dielectric patent landscape, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on GaN HEMT Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Next steps

Where to take this analysis

This landscape identifies the pattern; deciding what it means for a specific filing or licensing strategy takes a closer read of the claims themselves.

Map freedom-to-operate against the leader group

Start with the assignees holding the top 40% of records before scanning the long tail — that is where the densest prior art sits and where a new filing is most likely to collide with existing claims.

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Check the narrower IPC clusters for open claim space

H03K and H10N together account for a smaller share of records than H01L or H10D, which can mean either less interest or genuine white space — worth verifying claim-by-claim rather than assuming either.

Run a white-space search in Eureka

Track the 2023-2024 filing surge as it publishes forward

The peak year so far (2023, 9 records) and the 75% rise into 2024 suggest the field is still accelerating; publication lag means 2025-2026 filings are undercounted today.

Set an alert in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on GaN HEMT Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on GaN HEMT Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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