Laser Diode L-I-V Burn-in Testing Patent Snapshot
The laser diode L-I-V and burn-in testing patent space is a small, highly concentrated field in decline, with Jabil Inc holding the largest position among a short list of active filers. Filing activity peaked in 2019 and has remained near zero since, signalling that foundational approaches are mature and that residual activity is sparse.
Jabil leads a tightly held, maturing niche
Jabil Inc holds the top position with 5 patent records, followed by Polaroid Corp, Chroma ATE Inc, and Yama Capital LLC each at 4 patent records — a tight cluster at the front of the ranking that signals limited room for new entrants to establish differentiated positions through volume alone.
The top five filers account for 49% of the combined total of the ranked applicants visible in this query, indicating a concentrated but not monopolised field. The gap between the leader and the next tier is narrow, which means no single player has an overwhelming structural advantage.
| # | Applicant | Patent records | Share |
|---|---|---|---|
| 1 | Jabil Inc. | 5 | |
| 2 | Polaroid Corporation | 4 | |
| 3 | Chroma ATE Inc. | 4 | |
| 4 | Yama Capital LLC | 4 | |
| 5 | Sharp Corporation | 3 | |
| 6 | Fujitsu Limited | 2 | |
| 7 | NECSEL Intellectual Property Inc. | 2 | |
| 8 | Bandwidth9 Inc. | 2 | |
| 9 | Novalux Acquisition Corp | 2 | |
| 10 | Micron Technology Inc. | 2 |
| # | Applicant | Patent records | Share |
|---|---|---|---|
| 11 | Intel Corporation | 2 | |
| 12 | NIPPON TELEGRAPH & TELEPHONE CORP | 2 | |
| 13 | Chroma ATE (Suzhou) Co., Ltd. | 1 | |
| 14 | Zhejiang Eagle Semiconductor Technology Co., Ltd. | 1 | |
| 15 | Lucent Technologies Inc. | 1 | |
| 16 | Industrial Technology Research Institute | 1 | |
| 17 | Xiamen Sanan Optoelectronics Co., Ltd. | 1 | |
| 18 | NEC Corporation | 1 | |
| 19 | Furukawa Electric Co., Ltd. | 1 |
The presence of Yama Capital LLC (a non-practising entity) and NECSEL Intellectual Property Inc in the top ten suggests that IP has been consolidated and monetised, a pattern consistent with a maturing or declining technology cycle rather than active product development.
The most recent filing years are subject to standard patent publication lag and may undercount activity; the overall corpus of 7 patent families should be read as a minimum bound for the current period. Longer-window growth, applicant concentration, and technology-route coverage are therefore more reliable signals than the latest-year bar alone.
A 2019 activity spike has not recurred; H01S dominates the technology mix
The filing trend and technology composition charts together show a field where foundational laser physics claims are visible in and where new filing impetus has been absent since a brief peak in 2019.
Annual filing trend
Annual filings were zero in 2017 and 2018, rose to 5 in 2019, then fell back to near-zero levels through 2026. The -83% recent-period growth figure confirms the sharp decline from that single active year. Treat 2024–2026 values as potentially under-counted due to publication lag, but the multi-year trend is unambiguously downward.
↗ Hover for values · click a bar to ask EurekaTechnology composition
H01S (Lasers and stimulated emission) accounts for the largest share of patent records, reflecting that core laser-structure and operating-mode claims anchor the corpus. H01L (Semiconductor devices) and G01R (Electric and magnetic measurement) are the next largest branches, consistent with semiconductor fabrication and electrical characterisation methods. H10P, H10W, G01M, and G01N are each represented by only a handful of records, marking them as relatively sparse adjacent areas.
↗ Hover for values · click a bar to ask EurekaHighly cited patent families surfaced by the query
Citation-heavy patent families returned by the query. Use this section as citation context, not as a curated list of the most topic-specific patents.
Automated laser diode test system
An automated laser diode testing and burn-in system is disclosed. Initial device data is obtained by applying current to the device at room temperature and measuring the device parameters. The device is then subjected to a burn-in process at higher temperatures. Device performance is monitored throughout the burn-in process. Upon termination of the burn-in… (excerpt from the patent abstract)
| # | Patent | Citations |
|---|---|---|
| 1 | Semiconductor laser structure with an increased ca… | 54 |
| 2 | Wafer-level test structure for edge-emitting semic… | 25 |
| 3 | Semiconductor laser reliability test structure and… | 19 |
| 4 | Automated laser diode test system | 16 |
| 5 | Laser diode with an ion-implanted region | 16 |
| 6 | Laser diode with an ion-implant region | 11 |
| 7 | Fixture assembly for testing edge-emitting laser d… | 10 |
| 8 | Burn-in apparatus, burn-in test method, and contac… | 10 |
Ranked by total forward citations. Citation counts favour older and broadly cited patent families, and broad or adjacent patents may appear when they match the search scope. Treat this section as citation context, not as a curated list of the most topic-specific patents. Some patent titles may be shown in their original, non-English language where an accurate translation could not be guaranteed.
Assignee snapshot from the current evidence set
The applicants below are visible in this query result. Because the evidence set is relatively small, read this section as a directional snapshot rather than a full competitive ranking.
Jabil Inc
Jabil Inc holds 5 patent records, the largest position in the corpus, with technology focus concentrated entirely in H01S 5 (Lasers and stimulated emission). No applicant momentum data is available for the current period, so trajectory cannot be confirmed from evidence alone. Their focus on laser-structure claims rather than test-system claims suggests their IP protects device performance characteristics relevant to manufacturing qualification.
patent records: 5Chroma ATE Inc
Chroma ATE Inc holds 4 patent records and is distinguished from other top filers by a dual focus: H01S 5 (Lasers and stimulated emission) and G01R 31 (Electric and magnetic measurement), making it the only top-tier applicant with explicit measurement-instrument claims alongside laser claims. This positions Chroma ATE as the most direct patent holder in automated test equipment for laser diodes. No momentum data is available to assess recent trajectory.
patent records: 4Frequently asked questions
The corpus covers 7 patent families in scope. The applicant ranking is derived from patent records, which can exceed the family count when a family is filed across multiple offices.
Jabil Inc leads with 5 patent records, followed by Polaroid Corp, Chroma ATE Inc, and Yama Capital LLC each with 4 patent records.
The field is classified as Decline. Annual filings peaked in 2019 at 5 records and have been near zero since, with a recent-period growth rate of -83%.
The United States leads with 19 patent records, making it the visible filing jurisdiction by a wide margin. Japan is second with 5 records and Israel third with 4.
Yes, one co-filing pair is identified in the evidence: Nippon Telegraph and Telephone Corp and Fujitsu Ltd jointly filed 2 patent records. No other collaboration pairs are recorded.
G01M (Testing machine and structure balance) and G01N (Material analysis and testing) each have only 2 patent records in the corpus, representing the lowest-density branches. H10P and H10W have 5 and 4 records respectively and are also relatively sparse compared to the visible H01S class.
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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.
Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.
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