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Micro LED Defect Detection Patents: Who Leads, Where the Gaps Are 2026

Micro LED Defect Detection Patents: Who Leads, Where the Gaps Are 2026
https://www.patsnap.com/resources/blog/rd-blog/micro-led-defect-detection-and-repair-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Display Technology Patent Landscape
Micro LED Defect Detection and Repair Patents
  • 59.1% of all 115 records sit with just five assignees, so most of the claim space around dead-pixel repair and inspection throughput is already staked out by a small group.
  • Filings fell 91% from 11 in 2021 to 1 in 2024, the last year the dataset treats as complete — the field's peak filing activity (26 records) was back in 2018.
  • H01L and F21S dominate at 42.6% and 31.3% of records respectively, while organic-semiconductor overlap (H10K, 7.0%) and lighting-component claims (F21V, 6.1%) stay comparatively open.
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115
Published Records
59%
Top-5 Share of All Records
-91%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (11 records) with 2024 (1) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 115 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Field Overview

What this landscape covers

Micro LED defect detection and repair sits at the intersection of semiconductor process control and display manufacturing. The claims in scope cover identifying dim or dead emitters after mass transfer, laser-based repair and rework, redundancy designs that route around a failed die, and the inspection throughput needed to make micro LED panels viable at volume. Photoluminescence inspection and dead-pixel repair are the two search anchors that define the corpus, alongside detection and scrapping decisions made on the production line.

The 115 records in scope span 2015 through the 2026 cut-off, with United States, European and Chinese filing offices carrying the bulk of activity. Publication lags filing by roughly 18 months, so the most recent one to two years understate real filing volume.

Filing activity and technology composition, 2015–2026
  1. 1ZKW GRP GMBH41
  2. 2PLAYNITRIDE DISPLAY CO LTD8
  3. 3INTEL CORP8
  4. 4APPLE INC6
  5. 5BOE TECHNOLOGY GROUP CO LTD5
  6. 6LUMILEDS LLC5
  7. 7TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTD4
  8. 8HUAWEI TECH CO LTD4
  9. 9META PLATFORMS TECHNOLOGIES LLC3
  10. 10CHONGQING KONKA PHOTOELECTRIC TECH RES INST CO LTD3
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Micro LED Defect Detection and Repair covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Numbers

Filing trend and technology composition

Two views of the same 115 records: how filing activity has moved year over year, and which IPC subclasses carry the claims.

Filing trend, 2017–2026

Filings ran from 17 in 2017 to a peak of 26 in 2018, then declined through the decade to 2 in 2026 (a partial year). The steepest confirmed drop is the -91% move from 11 filings in 2021 to 1 in 2024 — the last year the dataset can treat as complete, since publication lag still fills in 2025 and 2026.

Filing trend, 2017–202608152330172017262018201920202021202220232024202522026Most recent year is partial — publication lag means later filings are not yet visible.

Technology composition by IPC subclass

H01L (semiconductor devices) touches 42.6% of the 115 records and F21S (non-portable lighting devices) touches 31.3%, confirming that most claims frame the problem as a device or luminaire issue rather than a display-control one. G09G (display control circuits, 15.7%) and the smaller H10K, F21V and B60Q classes show where detection and repair logic gets claimed alongside adjacent lighting and vehicle-signalling applications. Because records can carry multiple IPC codes, these shares add up to more than 100% of the record total.

Technology composition by IPC subclassH01L · Semiconductor devices4942.6%F21S · Non-portable lighting devices3631.3%G09G · Display control circuits1815.7%F21Y · Light-source form (index)1714.8%B60Q · Vehicle lighting & signalling1311.3%H05B · Electric heating & lighting ci…108.7%H10K · Organic semiconductors (OLED e…87.0%F21V · Lighting device components76.1%Other5043.5%

Shares are the percentage of the 115 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Micro LED Defect Detection and Repair covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

Go deeper on Micro LED Defect Detection and Repair with Eureka

This page is one run against one query. Ask Eureka your own question about micro led defect detection and repair and every answer comes back with the patent numbers behind it.

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Key Patents

Representative filing and most-cited records

Representative Filing
EP3640990A12020-04-22

EP3640990A1 — Micro LED Display Panel and Manufacturing Method

SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.

A micro LED display panel with alternating first and second electrode contacts on a base substrate, arranged so each contact pair connects to the bottom electrode of one micro LED and the connection electrode of a neighbouring one, which in turn contacts that LED's top electrode. The layout lets detection happen directly after transfer printing, before further processing locks in any transfer defects.Filed by Shenzhen China Star Optoelectronics Technology; published 2020-04-22.

EP3640990A1 — patent drawing 1EP3640990A1 — patent drawing 2
View full record
Most-cited records in this landscape
#Publication no.Patent titleCitations
1US20150364107A1Interactive display panel with IR diodes183
2US20150348504A1Interactive display panel with emitting and sensing diodes118
3US9570002B2Interactive display panel with IR diodes79
4CN107170773A微发光二极管显示面板及其制作方法77
5US20180339644A1Lamp for vehicle and vehicle55
6US20180339643A1Lamp for vehicle and vehicle54
7EP3410002A1Lamp for vehicle and vehicle47
8US20180354406A1Lamp for vehicle and vehicle46
9EP3410003A1Lamp for vehicle and vehicle45
10US20200411491A1Micro light-emitting diode displays having microgrooves or wells26

Citation counts reflect influence within the searched corpus and skew toward older filings; they are not a measure of current commercial importance.

Patent titles are shown in the language they were filed in, not translated, so that each record stays verifiable against the original filing — a translated title will not match in Eureka or in any national register. Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Micro LED Defect Detection and Repair covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the data means for R&D and IP strategy

Three read-outs from the filing pattern that matter for where to file next and who to watch.

Concentration
59.1% / top 5
share of 115 records

Claim space is already crowded at the top

Five assignees hold 68 of the 115 records in scope. A new entrant filing core dead-pixel repair or redundancy-routing claims is filing into territory the leading players have already mapped, which pushes differentiation toward narrower process or throughput claims rather than broad detection methods.

Based on the top-5 concentration figure
Momentum
-91%
2021 to 2024 filings

Filing activity has cooled from its 2018 peak

Filings dropped from 11 in 2021 to 1 in 2024, the last complete year in the dataset. That does not mean the technology stalled — it can mean the core detection and repair methods are settled enough that assignees are filing fewer, more targeted continuations rather than broad new claims.

2024 is the latest year treated as complete; 2025-26 will still fill in
Technology mix
42.6% H01L
of 115 records

Device-level framing outweighs display-control framing

Nearly twice as many records touch H01L (semiconductor devices) as G09G (display control circuits, 15.7%). Detection and repair claims are more often written as device or process patents than as control-circuit or software patents, which shapes where a freedom-to-operate search needs to start.

IPC shares are of the 115-record total; a record can carry multiple classes
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to micro led defect detection and repair, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Micro LED Defect Detection and Repair covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the field is still open

The ranked leaders account for a majority of filings, but the long tail beyond the top ten still holds nearly a quarter of the corpus.

Leader
41 records
single largest filer

One assignee sits well ahead of the field

The leading assignee's 41 records is more than double the fifth-place count of 5, a gap wide enough that it likely reflects a sustained internal programme rather than opportunistic filing around a single product cycle.

Leader vs. fifth place, from the assignee ranking
Mid-field
75.7% / top 10
share of 115 records

The top ten hold three-quarters of the corpus

87 of the 115 records belong to just ten of the 31 ranked assignees. Tenth place holds only 3 records, showing how quickly the ranking thins out below the leading group.

Top-10 concentration figure
Long tail
31 companies
in the ranked assignee list

A wide but shallow field of secondary filers

Beyond the top ten, the remaining 21 ranked assignees split the rest of the corpus in small numbers each. That pattern suits licensing-in or acquisition scouting more than head-on litigation risk, since no single secondary filer holds a defensible block.

Based on the full 31-assignee ranking
🔍
Under-claimed sub-areas worth a closer look
Branches where the IPC composition and filing pattern suggest room to file, not confirmed white space — verify with a full search before committing claims.
OLED/micro LED hybrid repair (H10K overlap)Lighting-component-level rework (F21V)Vehicle-signalling redundancy design (B60Q)PCT-route filing strategy (WIPO share is smallest office)
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
LG Electronics0
PlayNitride Display Co., Ltd.0
Intel Corp.0
Lumileds LLC0
LuxVue Technology0
BOE Technology Group Co., Ltd.0
Huawei Technologies Co., Ltd.0
ZKW Group GmbH0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Micro LED Defect Detection and Repair covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this landscape

Use this page as a starting map, not a final answer — the next steps depend on whether you're scoping freedom-to-operate or looking for a filing gap.

Run a freedom-to-operate check against the leader's portfolio

With 41 records held by a single assignee, any new detection or repair filing should be checked against that portfolio specifically before drafting claims.

Explore assignee portfolios in Eureka

Track the under-claimed branches before they fill in

H10K overlap and F21V component-level claims show low record counts now; that can close quickly once a leading filer moves into them.

Set up a monitoring alert in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Micro LED Defect Detection and Repair covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Micro LED Defect Detection and Repair covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Micro LED Defect Detection and Repair in depth with Eureka

Go past this page: query the whole micro led defect detection and repair corpus yourself, in your own scope.
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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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