Book a demo

Nanomechanical Property Mapping Patents: Top Companies & Trends 2026

Nanomechanical Property Mapping Patents: Top Companies & Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/nanomechanical-and-electrical-property-mapping-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Scanning Probe Characterization
Nanomechanical and Electrical Property Mapping Patents: Who Leads and Where the Gaps Sit
  • One filer accounts for the majority. The leading assignee alone holds 269 of 510 records, and the top 5 combined reach 76.3% of all records in scope.
  • Filing kept climbing through the early 2020s. Volume peaked at 139 records in 2022, and 2021-to-2024 filing rose 14%, from 35 to 40 records a year.
  • Claim activity is split across two dominant classes. C12Q covers 61.4% of records and G01N a further 25.7%, while semiconductor and imaging classes each sit under 7%.
Get a prior-art report on your approach
510
Published Records
76%
Top-5 Share of All Records
+14%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (35 records) with 2024 (40) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 510 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Field Overview

What this landscape covers

Nanomechanical and electrical property mapping brings together scanning-probe techniques — conductive atomic force microscopy, nanoindentation-style modulus quantification, adhesion mapping — with the calibration and sample-preparation work needed to make the readings repeatable. The 510 records in scope span 2015 through mid-2026, with the search string tying core measurement modes to the practical constraints that decide whether a method is usable outside a lab: calibration standards, contact resistance, and current sensitivity.

The record set is dominated by filings that pair genomic and biological assay work with physical-property measurement, which explains why measuring-and-testing classes for enzymes and DNA outrank pure materials-analysis classes in this corpus. Semiconductor, optical and imaging classes appear as smaller, more specialised branches.

Filing volume by year, 2015–2026
  1. 110X GENOMICS INC269
  2. 2THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIV65
  3. 3BRIDGER TECHNOLOGIES INC28
  4. 4UNIVERSITY OF CHICAGO15
  5. 5NORTHWESTERN UNIV12
  6. 6COLGATE PALMOLIVE CO10
  7. 7ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)8
  8. 8SAUDI ARABIAN OIL CO7
  9. 9ROHM & HAAS CO7
  10. 10GIVAUDAN SA6
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Nanomechanical and Electrical Property Mapping covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Numbers

Filing trend and technology composition

Two views of the same 510 records: how filing volume moved year over year, and how records distribute across IPC subclasses.

Filing trend, 2017–2026

Filings rose from 17 in 2017 to a peak of 139 in 2022. The 2021-to-2024 span shows a 14% increase, from 35 to 40 records; 2025 and 2026 figures are undercounted because publication typically lags filing by around 18 months.

Filing trend, 2017–2026038751131501720172018201920202021139202220232024202562026Most recent year is partial — publication lag means later filings are not yet visible.

Technology composition by IPC subclass

C12Q (measuring and testing involving enzymes or DNA) covers 61.4% of the 510 records, and G01N (material analysis and testing) covers 25.7%. Because a single record can carry several IPC classes, these shares sum to more than 100% and should not be added together.

Technology composition by IPC subclassC12Q · Measuring & testing involving …31361.4%G01N · Material analysis & testing13125.7%C12N · Microorganisms & genetic engin…377.3%H01L · Semiconductor devices336.5%G02B · Optical elements & systems244.7%G06T · Image data processing & genera…224.3%A61K · Medicinal preparations203.9%G12B · Instrument details (general)203.9%Other27754.3%

Shares are the percentage of the 510 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Nanomechanical and Electrical Property Mapping covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

Go deeper on Nanomechanical and Electrical Property Mapping with Eureka

This page is one run against one query. Ask Eureka your own question about nanomechanical and electrical property mapping and every answer comes back with the patent numbers behind it.

Try Eureka
Key Patents

Representative and most-cited filings

Representative Filing
US20050127926A12005-06-16

Conductive AFM for contact leakage current measurement

TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.

A method for measuring current leakage of a contact of a semiconductor device formed on or in a substrate, includes scanning the contact with a probe of a conductive atomic force microscope; applying a DC voltage between the substrate and a conductive tip of the probe; and measuring a value of a current passing through the contact to the substrate, in response to the applied DC voltage.Filed by Taiwan Semiconductor Manufacturing Co., Ltd. and published 2005-06-16, this filing predates most of the corpus and anchors the semiconductor-testing branch of the field.

US20050127926A1 — patent drawing 1US20050127926A1 — patent drawing 2
View full filing
Most-cited records in this landscape
#Publication no.Patent titleCitations
1US20210262018A1Methods and compositions for integrated in SITU spatial assay189
2WO2010008672A1Semiconducting polymers168
3WO2019199579A1Method of in SITU gene sequencing160
4US10495554B2Method and system for imaging and analysis of a biological specimen156
5US20210164039A1Method of in situ gene sequencing114
6US10545075B2Methods and compositions for preparing biological specimens for microscopic analysis108
7WO2014025392A1Methods and compositions for preparing biological specimens for microscopic analysis97
8US20170219465A1Methods and Compositions for Preparing Biological Specimens for Microscopic Analysis83
9US20150144490A1Methods and Compositions for Preparing Biological Specimens for Microscopic Analysis81
10US20210238662A1Probes and methods of using same71

Citation counts inside this corpus favour older filings and should be read as a signal of influence, not of current technical importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Nanomechanical and Electrical Property Mapping covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Run it yourself

Put your own technology through the same analysis

 
Where to run it
Fastest

Eureka on the web

When you want the answer in the next five minutes.

The agent works the prompt against patents and technical literature, citing every source.

Run your analysis now →
For builders

MCP server & REST API

When it has to run inside your own pipeline.

Patent search, landscape analysis and assignee resolution as MCP tools. Drop them into any agent framework, or call REST directly.

Browse MCP servers →
Signals

What the filing pattern tells you

Three signals worth acting on before deciding where to file or search for prior art.

Concentration
76.3%
of 510 records held by top 5

The field is not open — it is claimed by a handful of filers

With the top 5 assignees holding 76.3% of all 510 records and the top 10 reaching 83.7%, most of the claim space in this landscape sits with a small number of filers rather than being spread across many independent entrants.

Based on the assignee ranking of 79 companies
Momentum
+14%
growth 2021→2024

Growth held up through the last complete filing years

Filing volume rose from 35 records in 2021 to 40 in 2024, a 14% increase, after peaking at 139 in 2022. The apparent drop in 2025–2026 reflects publication lag rather than a real slowdown.

Peak year: 2022 at 139 records
Composition
61.4% / 25.7%
C12Q vs G01N share

Two classes carry most of the technical weight

C12Q and G01N together dominate the technology composition, while H01L, G02B, G06T, A61K and G12B each account for under 7% of records — pointing to where claim density is lighter, not to where the underlying science is weaker.

Shares of all 510 records; a record may carry multiple classes
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to nanomechanical and electrical property mapping, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Nanomechanical and Electrical Property Mapping covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Who's Filing

Leading assignees and where activity is shifting

The ranked leaders in this landscape are counted by patent family, not raw document volume, which keeps the picture from being skewed by continuation filings.

Leader
269
records held

One assignee holds the majority of the corpus

The top-ranked assignee alone accounts for 269 of the 510 records in scope, far ahead of the rest of the ranked leaders, though its filing pace has slowed sharply in the most recent year.

Latest-year filings down 89% year over year for this assignee
Long tail
79
ranked companies

A long tail sits behind the top 5

Beyond the top 5, which together hold 76.3% of all records, filing volume drops quickly: fifth place holds 12 records and tenth place holds only 6, out of 79 ranked companies total.

Tenth-place assignee: 6 records
Co-filing
10
co-assignee pairs

Collaboration is concentrated around a small cluster

Only 10 co-assignee pairs appear in the data, and the strongest pairs recur around the same handful of individuals and organisations tied to the leading assignee, suggesting joint filings cluster tightly rather than spreading across the field.

Strongest pairs each appear 7 times
🔍
Under-claimed sub-areas
Branches where filing density is comparatively light relative to the core measurement classes
adhesion mapping calibration protocolscurrent-sensitivity standards for C-AFMcontact-resistance test structuresmodulus quantification on soft biological samplessample-preparation methods for in-situ imaging
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
10x Genomics, Inc.4-89%
The Board of Trustees of the Leland Stanford Junior University1-50%
Bridger Technologies, Inc.0
University of Chicago0
Northwestern University0
Colgate-Palmolive Company0
Ecole Polytechnique Federale de Lausanne (EPFL)0
Rohm and Haas Company0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Nanomechanical and Electrical Property Mapping covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Next Steps

Where to take this analysis

The figures here describe the shape of the field. Turning that into a filing or freedom-to-operate decision means going deeper on specific claims and specific assignees.

Check freedom-to-operate against the leader

With one assignee holding more than half the corpus, any new filing in the core measurement classes should be checked against that assignee's claim scope first.

Run a freedom-to-operate search

Track momentum, not just totals

Several leading assignees show sharp year-over-year declines in filing activity; watching who is still filing in the most recent complete year matters more than lifetime totals.

Set up assignee monitoring

Explore the under-claimed branches

Classes like H01L, G02B and A61K each cover under 7% of records, which may reflect either genuine white space or simply a different vocabulary worth searching separately.

Search adjacent IPC classes
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Nanomechanical and Electrical Property Mapping covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Nanomechanical and Electrical Property Mapping covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Nanomechanical and Electrical Property Mapping in depth with Eureka

Go past this page: query the whole nanomechanical and electrical property mapping corpus yourself, in your own scope.
Every answer comes back with patent numbers you can open.

Try Eureka

Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

Help us improve this page

Found incorrect or outdated information? Let us know and we'll get it fixed.