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Nanosheet Transistor CMP Patents: Leaders & White Space 2026

Nanosheet Transistor CMP Patents: Leaders & White Space 2026
https://www.patsnap.com/resources/blog/rd-blog/nanosheet-transistor-chemical-mechanical-planarization-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Semiconductors & Microelectronics · Patent Landscape
Nanosheet Transistor CMP Patents: Who Holds the Claims
  • Filing has already peaked. 2019 was the high point at 8 families; the 2022 midpoint sits at only 2, and the trend line is flat to declining, not accelerating.
  • A small set of foundational filings carries most of the citation weight. The top-cited record has 115 citations versus 30 for the fifth-ranked record — influence is concentrated in a handful of early inner-spacer and gate-formation disclosures.
  • Momentum has stalled across every tracked assignee. Every major filer in this set — logic, memory and equipment names alike — shows zero filings in the latest tracked year, including a -100% YoY drop for one leading foundry.
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35
Published Records
+50%
Filing Growth 2021→2024
US
Leading Jurisdiction
8
Active Filers Ranked

Filing growth compares 2021 (2 records) with 2024 (3) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This dataset tracks patent families at the intersection of nanosheet and gate-all-around (GAA) transistor architectures and chemical mechanical planarization — the polishing step that flattens inner-spacer, gate-metal and channel-release structures between process modules. The search combines architecture terms (nanosheet transistor, gate-all-around, nanosheet FET) with CMP-specific language and IPC codes covering planarization apparatus and semiconductor device fabrication, so it captures claims where CMP is integral to forming the nanosheet stack rather than a generic back-end polish step.

Coverage runs from 2015 through the mid-2026 data cut-off. Because publication typically lags filing by around 18 months, the last one to two years in any chart will look thinner than they eventually turn out to be — a real slowdown is visible well before that lag effect could explain it.

Filing activity, 2017-2026
  1. 1TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD15
  2. 2INTERNATIONAL BUSINESS MACHINE CORPORATION12
  3. 3ADEIA SEMICONDUCTOR SOLUTIONS LLC3
  4. 4ELPIS TECH INC2
  5. 5SEMICON MFG INT (BEIJING) CORP1
  6. 6INTEL CORP1
  7. 7SEMICON MFG INT (SHANGHAI) CORP1
  8. 8APPLIED MATERIALS INC1
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Nanosheet Transistor Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The data

Filing trend and technology composition

Two views of the same 35 families: how filing activity has moved year over year, and which classification codes the claims actually sit under.

Filings by year

Activity opened at 4 families in 2017, rose to a peak of 8 in 2019, and had fallen back to 2 by the 2022 midpoint. No year since has shown a rebound, and the most recent tracked year shows zero filings — read with the usual publication-lag caveat, but consistent across multiple consecutive years rather than a single blip.

Filings by year024684201720188201920202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

IPC subclass distribution

Every record sits under H01L (semiconductor devices generally), with the H10D and H10P subclasses — the newer device-level classifications — covering roughly half and a third of the set respectively. Only 2 records touch memory-device manufacture (H10B) and just 1 touches nanotechnology applications (B82Y), indicating the claims are overwhelmingly logic-process oriented rather than memory- or materials-science oriented.

IPC subclass distributionH01L · Semiconductor devices35100.0%H10D · Semiconductor devices (general)1851.4%H10P1131.4%H10B · Memory device manufacture25.7%B82Y · Nanotechnology applications12.9%

Shares are the percentage of the 35 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Nanosheet Transistor Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key patents

The most-cited filings in this set

Representative filing
US20180323111A12018-11-08

Forming a hybrid channel nanosheet semiconductor structure

ADEIA SEMICONDUCTOR SOLUTIONS LLC

A method for fabricating a nanosheet semiconductor structure includes forming a first nanosheet field effect transistor (FET) structure having a first inner spacer comprised of a first material and a second nanosheet FET structure having second inner spacer comprised of a second material. The first material is different than the second material. The first nanosheet FET structure is formed by creating a first inner spacer formation within a first silicon germanium (SiGe) channel, wherein the first SiGe channel is comprised in a first channel region of a first FET region. The second nanosheet FET structure is formed by creating a second inner spacer formation within a second SiGe channel.Filed by Adeia Semiconductor Solutions LLC, published 2018-11-08.

US20180323111A1 — patent drawing 1US20180323111A1 — patent drawing 2
View full filing
Top-cited records
#Publication no.Patent titleCitations
1US20190181224A1Formation of self-limited inner spacer for gate-all-around nanosheet fet115
2US20200006356A1Gate formation scheme for nanosheet transistors having different work function metals and different nanosheet…61
3US20200043808A1Gate-all-around fets having uniform threshold voltage50
4US9704863B1Forming a hybrid channel nanosheet semiconductor structure46
5US20200373206A1Gate structures for semiconductor devices30
6US10014372B1Vertical gate-all-around transistor with top and bottom source/drain epitaxy on a replacement nanowire, and m…21
7US20210098588A1Gate-All-Around Device with Protective Dielectric Layer and Method of Forming the Same18
8US20190393306A1Formation of self-limited inner spacer for gate-all-around nanosheet fet17
9US10553679B2Formation of self-limited inner spacer for gate-all-around nanosheet FET14
10US20200083221A1Co-integrated channel and gate formation scheme for nanosheet transistors having separately tuned threshold v…9

Citation counts are drawn from the same searched corpus and favour earlier filings; treat them as a signal of influence on later claim drafting, not as a ranking of current commercial importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Nanosheet Transistor Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers say about this field

Three read-outs from the trend and citation data that matter more than the raw family count.

Filing momentum
8 → 2
peak (2019) to midpoint (2022)

Activity peaked early and has not recovered

The peak year of 8 families in 2019 was followed by a steady decline to 2 by 2022, with the latest tracked year showing none at all. This is a mature, front-loaded filing wave rather than an emerging one.

Trend basis: 2017-2026 annual counts
Citation concentration
115 citations
top-cited record

Influence sits with a handful of early disclosures

The leading record on inner-spacer formation carries more than double the citations of the next entries, and the gap widens further down the list. New filers are drafting around a small set of foundational claims, not a broad prior-art field.

Based on most-cited records in this corpus
Classification spread
35 / 18 / 11
H01L / H10D / H10P record counts

Claims cluster on logic-process classifications

Nearly all records fall under general semiconductor-device classes rather than memory or nanotechnology-specific codes, confirming this is a logic-fabrication problem — CMP control at the nanosheet gate and spacer level — rather than a materials or memory play.

IPC subclass distribution, this dataset
Geographic filing
34 of 35
filed via United States receiving office

Filing activity is almost entirely US-routed

Only one record entered via the WIPO/PCT route, meaning nearly all applicants in this set are protecting directly in the US rather than building a multi-jurisdiction family — worth checking before assuming global freedom to operate.

Receiving office breakdown, this dataset
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to nanosheet transistor chemical mechanical planarization, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Nanosheet Transistor Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and who has stopped

A small group of logic foundries, an IDM, and equipment suppliers account for the bulk of this set. What stands out is not who leads, but that none of them have filed in the latest tracked year.

Momentum check
0
latest-year filings

Every tracked assignee shows zero in the latest year

Logic foundries, an IDM and an equipment supplier all report zero filings in the most recent tracked year, with one leading foundry showing a -100% year-over-year drop. Read alongside the 18-month publication lag, but the pattern spans several assignees at once rather than one company's pause.

Recent-year momentum, this dataset
Collaboration
1 pair
strongest co-assignee link

Filing is almost entirely solo

Only one co-assignee pairing appears in this set, linking two affiliated manufacturing entities of the same corporate group. Co-filing across unrelated organisations is essentially absent here.

Co-assignee pairs, this dataset
Concentration
35 families
total tracked

A compact, concentrated filer set

With only 35 families across the entire search window, this is a narrow field compared to broader GAA-transistor searches — the claim space is occupied by relatively few organisations rather than a long tail of small filers.

Total patent families, this dataset
🔍
Under-claimed sub-areas worth checking before filing
Branches with visibly thin coverage in this dataset — worth a freedom-to-operate check before assuming they are open.
Post-CMP defect detection for released nanosheet channelsCMP slurry selectivity for SiGe sacrificial layer removalPlanarization endpoint control at inner-spacer formationCMP integration for stacked forksheet/CFET structuresPolish-induced stress relief in narrow-width nanosheet stacks
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
International Business Machines Corporation (IBM)0
Taiwan Semiconductor Manufacturing Company, Ltd. (TSMC)0-100%
Intel Corporation0
Applied Materials, Inc.0
Semiconductor Manufacturing International (Beijing) Corporation (SMIC Beijing)0
Semiconductor Manufacturing International (Shanghai) Corporation (SMIC Shanghai)0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Nanosheet Transistor Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's next

Where to take this analysis

The trend and assignee patterns raise questions that a static table cannot answer on its own.

Check freedom to operate against the top-cited claims

The citation concentration around a handful of inner-spacer and gate-formation filings means any new process route should be checked against those specific claim sets first.

Explore claims in Eureka

Track whether the filing slowdown reverses

Zero filings in the latest year across every major assignee could mean the technology has settled on standard approaches, or that filings are still working through the publication lag.

Set up monitoring in Eureka

Map the under-claimed branches against your roadmap

Thin coverage in areas like post-CMP defect detection or slurry selectivity for SiGe removal may reflect genuine open space rather than lack of interest.

Run a white space search in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Nanosheet Transistor Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Nanosheet Transistor Chemical Mechanical Planarization covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Nanosheet Transistor Chemical Mechanical Planarization in depth with Eureka

Go past this page: query the whole nanosheet transistor chemical mechanical planarization corpus yourself, in your own scope.
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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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