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Nanosheet Transistor Reliability Patent Landscape 2026

Nanosheet Transistor Reliability Patent Landscape 2026
https://www.patsnap.com/resources/blog/rd-blog/nanosheet-transistor-reliability-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Semiconductors & Microelectronics · Patent Landscape
Nanosheet Transistor Reliability Patent Landscape
  • Filing has already peaked. 2023 was the high point at 17 families; the following years show fewer filings, not a ramp — this is a maturing claim set, not an emerging one.
  • One company owns the reliability core. US10332803B1, the most-cited record in the set at 92 citations, sits well ahead of the next-most-cited filing, meaning the foundational hybrid-GAA structure claim is concentrated rather than contested.
  • Almost nobody is filing jointly. Only two co-assignee pairs appear across 57 families, so reliability IP here is built in-house rather than through joint development agreements — a contrast worth noting before pursuing a partnership route.
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57
Published Records
-44%
Filing Growth 2021→2024
US
Leading Jurisdiction
12
Active Filers Ranked

Filing growth compares 2021 (9 records) with 2024 (5) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field.

Published byPatsnap Research··8 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This landscape tracks patent families at the intersection of nanosheet and gate-all-around (GAA) transistor architectures and the reliability failure modes that determine whether they survive in production: bias temperature instability, time-dependent dielectric breakdown (TDDB), and self-heating. It excludes general GAA process patents that do not make a reliability claim, and general reliability patents that do not name a nanosheet or GAA structure.

57 published families sit inside the window, concentrated overwhelmingly in United States filings, with a much smaller tail of European, Indian and PCT filings. Publication lags filing by roughly 18 months, so the 2025-2026 counts in the trend chart are undercounts, not a real drop-off — the true picture only firms up once those applications clear examination.

Filings by year, 2017-2026
  1. 1TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD30
  2. 2INTERNATIONAL BUSINESS MACHINE CORPORATION11
  3. 3QUALCOMM INC4
  4. 4INTEL CORP3
  5. 5GLOBALFOUNDRIES US INC2
  6. 6VELLORE INSITUTE OF TECH2
  7. 7KATHOLIEKE UNIV LEUVEN2
  8. 8INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW)2
  9. 9IBM DEUTSCHLAND GMBH1
  10. 10DR SUBHA SUBRAMANIAM1
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Nanosheet Transistor Reliability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The data

Filing trend and technology composition

Two views of the same 57 families: when the claims were filed, and which IPC subclasses they sit in.

Filing trend: rise, peak, plateau

Filings moved from 2 in 2017 to a peak of 17 in 2023, with 2022 sitting at the midpoint of 6. That trajectory — flat early years, a sharp run-up, then a fall — reads as a claim space that got crowded fast around 2022-2023 and has since cooled, rather than one still accelerating into 2026.

Filing trend: rise, peak, plateau0510152022017201820192020202120221720232024202512026Most recent year is partial — publication lag means later filings are not yet visible.

IPC composition: reliability sits inside structure claims

All 57 families carry H01L, the core semiconductor-device classification, and 30 also carry H10D, the newer general semiconductor-device subclass — together these dominate the set. B82Y (nanotechnology), G06N (AI-based computing) and H10B (memory manufacture) each appear once or twice, showing that nanosheet reliability claims are still filed as device-structure patents first; cross-over into AI-assisted design or memory-specific reliability is marginal so far.

IPC composition: reliability sits inside structure claimsH01L · Semiconductor devices57100.0%H10D · Semiconductor devices (general)3052.6%H10W58.8%B82Y · Nanotechnology applications23.5%G06N · Computing based on AI models11.8%H10B · Memory device manufacture11.8%

Shares are the percentage of the 57 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Nanosheet Transistor Reliability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key patents

The most-cited reliability filings

Representative filing
US11670692B22023-06-06

Gate-all-around devices having self-aligned capping between channel and backside power rail (US11670692B2)

TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.

A semiconductor device includes power rails in a first interconnect structure on a backside of the device, a gate-all-around transistor with multiple channel layers stacked over that interconnect structure, a gate stack wrapping each channel layer except the bottommost, and a source/drain feature adjoining the channels. A conductive via connects the interconnect structure to the source/drain feature, and a dielectric feature isolates the bottommost channel layer from the backside power delivery path.Filed by Taiwan Semiconductor Manufacturing Co., Ltd., granted 2023-06-06 — this is the backside-power-rail variant of the same family topic that produced the set's second most-cited record, US20210359091A1.

US11670692B2 — patent drawing 1US11670692B2 — patent drawing 2
View full record →
Most-cited records in this landscape
#Publication no.Patent titleCitations
1US10332803B1Hybrid gate-all-around (GAA) field effect transistor (FET) structure and method of forming92
2US20170323949A1Protection of high-k dielectric during reliability anneal on nanosheet structures51
3US20200357931A1Nanosheet transistor having abrupt junctions between the channel nanosheets and the source/drain extension re…35
4US20210359091A1Gate-all-around devices having self-aligned capping between channel and backside power rail31
5US20220165731A1Semiconductor device having nanosheet transistor and methods of fabrication thereof20
6US20210118884A1Structure and Method for Gate-All-Around Metal-Oxide-Semiconductor Devices With Improved Channel Configuratio…12
7US20220384434A1Semiconductor device having nanosheet transistor and methods of fabrication thereof7
8US20220123123A1Formation of gate all around device6
9US11450664B2Semiconductor device having nanosheet transistor and methods of fabrication thereof6
10US20230154996A1Nanosheet replacement metal gate patterning scheme5

Citation counts favour older filings simply because they have had longer to accumulate citations inside this corpus — read them as a signal of influence on subsequent filers, not as a ranking of current technical importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Nanosheet Transistor Reliability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Four read-throughs of the trend, composition and citation data above, translated into what they imply for where to file next.

Filing momentum
17 in 2023
peak year

The claim rush already happened

Filings rose from 2 in 2017 to a peak of 17 in 2023, then eased off. A new entrant filing now is filing into a claim space that has already been picked over by the leaders who moved in 2022-2023, not into a green field.

Filing trend, 2017-2026
Concentration
92 citations
on the top record

One structure claim anchors the field

US10332803B1's hybrid-GAA structure claim carries far more citations than any other record in the set, with the next-highest at 51. Anyone designing a hybrid gate-all-around structure with reliability claims should clear this filing first.

Most-cited records table
Geography
43 of 57 at USPTO
receiving-office share

This is overwhelmingly a US filing story

Germany, EPO, India and WIPO together account for a small fraction of the set. A defensive filer focused only on US risk is covering most, but not all, of the exposure — European and Indian filings are thin enough that a single overlooked family there is easy to miss.

Receiving offices, this dataset
Collaboration
2 co-assignee pairs
across 57 families

Reliability IP is built solo

Only two co-assignee pairings appear in the entire set, the strongest being an inter-university microelectronics centre paired with a research university. Nearly all other reliability claims were filed by a single assignee, suggesting this work is done inside one R&D organisation rather than through joint ventures.

Co-assignee pairs, this dataset
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Collaboration is the exception, not the rule
AssigneeCo-assigneeShared families
Interuniversity Microelectronics Centre (imec)Katholieke Universiteit Leuven (KU Leuven)2
International Business Machines Corporation (IBM)IBM DEUTSCHLAND GMBH1

With only two co-assignee pairs in 57 families, most reliability claims in this set were filed by a single organisation working alone.

Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Nanosheet Transistor Reliability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the ground, and who has stopped moving

Recent-year momentum tells a different story from historical share: several of the largest historical filers show zero filings in the latest year, while a smaller institute is still active.

Momentum leader
1 in latest year
still filing

Vellore Institute of Technology

The only assignee in this set with any recorded filing in the latest year, at 0% YoY — a signal that its filing pace has held steady rather than accelerated, but it has not stopped either.

Recent-year momentum
Historical leader, now quiet
0 in latest year
momentum

Taiwan Semiconductor Manufacturing Co., Ltd. (TSMC) (TSMC)

TSMC's US11670692B2 backside-power-rail record is one of the set's better-known filings, but the assignee shows zero filings in the latest year in this dataset — consistent with the broader post-2023 slowdown, not a company-specific retreat.

Recent-year momentum
IP-heavy incumbent
0 in latest year
momentum

International Business Machines Corporation (IBM) (IBM)

IBM's sole recorded co-assignee pairing in this set is with IBM Deutschland GmbH, its own German subsidiary, rather than an external partner. Like the other large incumbents tracked here, its latest-year filing count is zero.

Co-assignee pairs & momentum
Cross-border research pair
2 co-filings
strongest pair

Interuniversity Microelectronics Centre (imec) + Katholieke Universiteit Leuven (KU Leuven) (imec + KU Leuven)

The strongest co-assignee link in the dataset, at two shared filings, pairs a Belgian inter-university microelectronics research centre with its host university — a research-institute model rather than a commercial joint venture.

Co-assignee pairs, this dataset
🔍
Under-claimed sub-areas worth checking before you file
These combinations of failure mode and structural feature show low filing density in this dataset relative to the core hybrid-GAA and backside-power-rail claims.
Backside-via TDDB at the source/drain interfaceSelf-heating in stacked multi-nanosheet channel countsBTI in inner-spacer dielectric under negative biasAI-assisted reliability screening (G06N overlap)Memory-integrated nanosheet reliability (H10B overlap)
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
VELLORE INSITUTE OF TECH10%
Taiwan Semiconductor Manufacturing Co., Ltd. (TSMC)0
International Business Machines Corporation (IBM)0
Qualcomm Incorporated0
Intel Corporation0
Interuniversity Microelectronics Centre (imec)0
Katholieke Universiteit Leuven (KU Leuven)0
GlobalFoundries U.S. Inc.0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Nanosheet Transistor Reliability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's next

Where to take this from here

The landscape data points to specific next steps rather than a general conclusion.

Clear the hybrid-GAA structure claim first

Before filing any hybrid gate-all-around reliability claim, check exposure against US10332803B1 — its 92 citations make it the anchor prior art for this entire set.

Run a freedom-to-operate check in Eureka →

Watch the backside-power-rail cluster

US20210359091A1 and US11670692B2 both sit on the backside power delivery variant of GAA reliability claims; this sub-cluster is where the set's second- and later-cited records concentrate.

Explore the citation network in Eureka →

Treat 2025-2026 counts as provisional

Publication lag means the apparent decline after 2023 is partly a reporting artefact. Re-run this trend query in twelve months before concluding the field has genuinely contracted.

Set a monitoring alert in Eureka →
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Nanosheet Transistor Reliability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Questions practitioners ask about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Nanosheet Transistor Reliability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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