Book a demo

Digital X-Ray Inspection Patents: Top Companies & Filing Trends 2026

Digital X-Ray Inspection Patents: Top Companies & Filing Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/nondestructive-testing-digital-x-ray-nondestructive-inspection-patent-landscape-patent-landscape/ · Patsnap · data cut-off 2026-08-31 · downloaded from the live page
Patent Landscape · Sensors, MEMS, Metrology & Instrumentation
Digital X-Ray Nondestructive Inspection Patents: Who's Filing and Where the Gaps Sit

A data-driven look at digital X-ray and computed radiography nondestructive inspection patents: 229 records, filing trends through 2024, IPC technology mix and the leading assignees.

229
Published Records
34%
Top-5 Share of All Records
-29%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth = 2021 (7 records) → 2024 (5); 2024 is the last year we treat as complete. Top-5 share = the 5 largest assignees ÷ all 229 records in scope (CR5), not the ranked leaders only.

Check your own idea
Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This landscape draws on 229 published records filed between 2015 and the 2026 data cut-off that claim digital radiographic, computed radiographic, digital X-ray or flat-panel X-ray detector methods applied to nondestructive testing, inspection or defect detection. The scope spans hardware — detector arrays, source geometry, scanner frameworks — and the software layers built on top of them, including image processing and automated defect classification. Patent families, not raw document counts, are the fairer unit for comparing filers, since families neutralise aggressive continuation practice and multi-jurisdiction filing by any single applicant.

Coverage is strongest in material-analysis-and-testing claims (IPC G01N), with meaningful secondary activity in image processing, diagnostic imaging and semiconductor-adjacent detector work. Filing offices span the United States, China, Europe, the WIPO/PCT route, South Korea and Canada, indicating protection strategies built for multiple markets rather than a single home jurisdiction.

Records in scope by year and IPC subclass
  1. 1GENERAL ELECTRIC CO31
  2. 2NUCTECH CO LTD15
  3. 3BAKER HUGHES CO14
  4. 4G RAY SWITZERLAND SA10
  5. 5PHYSICAL OPTICS CORP8
  6. 6PRATT & WHITNEY CANADA CORP7
  7. 7THE BOEING CO7
  8. 8LOCKHEED MARTIN CORP6
  9. 9TSINGHUA UNIVERSITY6
  10. 10SKF AEROSPACE FRANCE SAS6
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Nondestructive Testing: Digital X-Ray Nondestructive Inspection Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Filing Data

Filing trends and technology composition

The dataset covers 229 published records dated 2015-01-01 through 2026-08-31, drawn from filings that claim digital radiographic, computed radiographic, digital X-ray or flat-panel X-ray detector methods applied to nondestructive testing and defect inspection.

Filing activity, 2017-2026

Annual filings rose from 6 in 2017 to a peak of 14 in 2022, then eased to 5 by 2024 — a -29% change over that three-year span. 2025 and 2026 figures are still incomplete because publication lags filing by roughly 18 months, so the recent-year dip should not be read as a slowdown in research activity.

Filing activity, 2017-2026048111562017201820192020202114202220232024202512026Most recent year is partial — publication lag means later filings are not yet visible.

Publication lags filing by roughly 18 months, so 2025 onwards are still filling in. Growth rates on this page therefore end at 2024; running them to the last bar would understate the field.

Technology composition by IPC subclass

G01N (material analysis and testing) anchors 55.0% of the 229 records, far ahead of any other subclass. Image processing (G06T) and diagnostic imaging (A61B) each sit at 13.5%, with semiconductor devices (H01L), digital data processing (G06F), X-radiation measurement (G01T), pictorial communication (H04N) and geophysics (G01V) trailing behind — records can carry more than one class, so these shares sum above 100%.

Technology composition by IPC subclassG01N · Material analysis & testing12655.0%A61B · Diagnosis & surgery3113.5%G06T · Image data processing & genera…3113.5%H01L · Semiconductor devices219.2%G06F · Electric digital data processi…208.7%G01T · Nuclear & X-radiation measurem…177.4%H04N · Pictorial communication (video…167.0%G01V · Geophysics & gravity surveying135.7%Other14362.4%

Shares are the percentage of the 229 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Nondestructive Testing: Digital X-Ray Nondestructive Inspection Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.

Go deeper on Nondestructive Testing: Digital X-Ray Nondestructive Inspection Patent Landscape with Eureka

This page is one run against one query. Ask Eureka your own question about nondestructive testing: digital x-ray nondestructive inspection patent landscape and every answer comes back with the patent numbers behind it.

Try Eureka
Key Patents

Representative filing and most-cited prior art

Representative Record
GB2368764B2004-02-18

GB2368764B — Digital radiography inspection apparatus for large object

TSINGHUA UNIVERSITY

The detection system uses a detector including a high-specific-activity isotopic gamma ray source and its shielded container, a chamber for radiating, collimators and a detector array, a signal processing system and a carrying mechanism for translation. The system also uses a rotary scanner framework of ring type on which the detector is mounted, allowing projective images from any designated direction and cross-sectional images at a designated position using only one set of ray sources.Filed by Tsinghua University; illustrates the apparatus-level claim style typical of large-object inspection systems in this field.

GB2368764B — patent drawing 1GB2368764B — patent drawing 2
View full record
Most-cited records in the digital X-ray inspection field
#Publication no.Patent titleCitations
1US6839403B1Generation and distribution of annotation overlays of digital X-ray images for security systems246
2US20030167616A1Inspection and sorting system and method for part repair116
3US6529622B1Method and apparatus for identifying defective regions in a discrete pixel detector89
4US20070025512A1Lobster eye X-ray imaging system and method of fabrication thereof83
5US6701615B2Inspection and sorting system and method for part repair80
6US7236564B2Linear array detector system and inspection method70
7US7231017B2Lobster eye X-ray imaging system and method of fabrication thereof52
8US6658089B1System and method for image identification and quality indication for radiographic inspection44
9US6618465B2X-ray shielding system and shielded digital radiographic inspection system and method43
10US20140207874A1Systems and methods for collaborating in a non-destructive testing system35

Citation counts reflect influence within the searched corpus and skew toward older records; they are not a measure of current commercial importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Nondestructive Testing: Digital X-Ray Nondestructive Inspection Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Run it yourself

Put your own technology through the same analysis

 
Where to run it
Fastest

Eureka on the web

When you want the answer in the next five minutes.

The agent works the prompt against patents and technical literature, citing every source.

Run your analysis now →
For builders

MCP server & REST API

When it has to run inside your own pipeline.

Patent search, landscape analysis and assignee resolution as MCP tools. Drop them into any agent framework, or call REST directly.

Browse MCP servers →
Analysis

What the filing pattern tells you

These figures come directly from the 229 records in scope; they point to where claim space is crowded, where it is thin, and which routes have proven commercially durable.

Concentration
34.1%
of 229 records held by top 5 assignees

A small group sets the claim structure

The five leading assignees together account for 78 of the 229 records in scope. With 89 companies in the ranked list overall, most filers hold only one or a few records, meaning the practical competitive question is less about a crowded field and more about how tightly the leaders have staked out the core detector-and-signal-processing claims.

Source: assignee ranking, 229 records
Technology mix
55.0%
of records classed under G01N

Material testing is the anchor claim

G01N (material analysis and testing) appears in 55.0% of records, dwarfing the next tier of image processing and diagnostic imaging at 13.5% each. New filers building on image-processing or AI-classification layers are adding to a much thinner claim base than the underlying detector-and-defect-testing art.

Source: IPC subclass distribution, 229 records
Filing momentum
-29%
change, 2021 to 2024 filings

Growth peaked in 2022, not accelerating now

Filings rose from 6 in 2017 to a peak of 14 in 2022 before easing to 5 by 2024, a -29% change across that window. Because publication lags filing by roughly 18 months, 2025-2026 counts are still filling in and should not be read as a continued decline.

Source: filing trend, 2017-2024
Jurisdiction spread
84 vs 26
US filings vs China filings

Protection is multi-market, not single-market

The United States leads with 84 filings, with China and the EPO each near 26, WIPO/PCT at 24, South Korea at 16 and Canada at 11. Freedom-to-operate work in this field needs to clear at least these six offices rather than assuming US-only exposure.

Source: receiving office data
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to nondestructive testing: digital x-ray nondestructive inspection patent landscape, with the prior art for and against each one.

Find the white space →
Collaboration is rare, not routine
AssigneeCo-assigneeShared families
SKF Aerospace France SASSKF Group6
Tsinghua UniversityXIANG XINCHENG2
Tsinghua UniversityWU ZHIFANG2
Tsinghua UniversityWANG LIQIANG2
Tsinghua UniversityLIU YISI2
Tsinghua UniversityAN JIGANG2
Nuctech Company LimitedTsinghua University1

Only 7 co-assignee pairs exist across the dataset, and the strongest pairing (6 shared records) is a single aerospace-supplier relationship — most filers, including the leading research institutions, file solo rather than through joint-applicant structures.

Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Nondestructive Testing: Digital X-Ray Nondestructive Inspection Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Next Steps

Where to take this analysis

The figures above establish the shape of the field. The next layer of decisions — which specific claims block a design, where a first-filer advantage still exists — needs claim-level reading rather than aggregate counts.

Check freedom to operate against the leading claim holders

With the top 10 assignees holding 48.0% of all 229 records, a new filing in the G01N-heavy detector or signal-processing space should be checked against those specific claim sets before drafting.

Run a clearance search in Eureka

Watch the under-claimed adjacent branches

Geophysics-adjacent (G01V, 5.7%) and pictorial-communication (H04N, 7.0%) claims are thin relative to the G01N core, suggesting room for a first claim that ties detector output directly to those use cases.

Explore white space in Eureka

Re-run the trend once 2025-2026 filings publish

Because publication lags filing by roughly 18 months, the post-2022 dip in filings is not yet a reliable signal; revisit the growth figure once another year of data lands.

Track filing trends in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Nondestructive Testing: Digital X-Ray Nondestructive Inspection Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Frequently asked questions

Answers are grounded in the same dataset. Derived from a Patsnap search on Nondestructive Testing: Digital X-Ray Nondestructive Inspection Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Nondestructive Testing: Digital X-Ray Nondestructive Inspection Patent Landscape in depth with Eureka

Go past this page: query the whole nondestructive testing: digital x-ray nondestructive inspection patent landscape corpus yourself, in your own scope.
Every answer comes back with patent numbers you can open.

Try Eureka

Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

Help us improve this page

Found incorrect or outdated information? Let us know and we'll get it fixed.