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OPC & Computational Lithography Patents: Leaders & Trends 2026

OPC & Computational Lithography Patents: Leaders & Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/optical-proximity-correction-and-computational-lithography-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Lithography · Patent Landscape
Optical Proximity Correction and Computational Lithography Patents
  • Filing has flattened, not grown. annual filings peaked at 72 in 2022 and have since declined toward single digits in the partial 2026 count — a maturing claim space, not an expanding one.
  • The US and China dominate filing location. 403 US and 212 China receiving-office records together account for the large majority of the 806 families tracked, with Europe, Taiwan and Japan trailing well behind.
  • Momentum has gone quiet across nearly every major filer. recent-year filings from ASML, Samsung and SMIC show flat or -100% YoY activity, with only TSMC and Shanghai Huali showing any residual filing.
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806
Published Records
54%
Top-5 Share of All Records
+45%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (38 records) with 2024 (55) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 806 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Field Overview

What this patent set covers

Optical proximity correction (OPC) and computational lithography cover the software and modelling techniques used to pre-distort mask patterns so that printed features on a wafer match the intended design despite diffraction and process variation. This landscape tracks 806 patent families filed between 2015 and mid-2026 that combine OPC, computational lithography or source mask optimization claims with process-window, model-calibration, mask-rule-check, runtime or inverse-lithography language in their title or claims — a filter designed to isolate substantive method and system claims rather than incidental mentions.

The IPC composition confirms the field's centre of gravity: G03F (photolithography and photomechanics) appears in 784 of the 806 records, with G06F (digital data processing) present in 258 — evidence that this is fundamentally a computational discipline layered onto a physical patterning process, not a pure optics field.

Filing activity by year, 2017–2026
  1. 1ASML NETHERLANDS BV187
  2. 2TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD78
  3. 3SAMSUNG ELECTRONICS CO LTD74
  4. 4SEMICON MFG INT (SHANGHAI) CORP64
  5. 5D2S INC29
  6. 6UNITED MICROELECTRONICS CORP28
  7. 7SYNOPSYS INC28
  8. 8ASML MASKTOOLS BV26
  9. 9SIEMENS INDUSTRY SOFTWARE INC23
  10. 10SHANGHAI HUALI INTEGRATED CIRCUIT CORP21
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Optical Proximity Correction and Computational Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Filing Data

Trend and technology composition

Two views of the same dataset: how filing volume has moved year over year, and which IPC subclasses the claims actually sit in.

A peak in 2022, then decline

Filings rose from 27 in 2017 to a peak of 72 in 2022, then declined toward 7 in the most recent (partial) year. Because publication typically lags filing by around 18 months, the last one to two years understate true filing activity — but the pre-2022 trajectory and the post-peak drop are both large enough to read as a genuine plateau rather than a data artefact.

A peak in 2022, then decline020406080272017201820192020202172202220232024202572026Most recent year is partial — publication lag means later filings are not yet visible.

G03F carries the claims; G06F and H01L support them

G03F (photolithography) covers 784 of 806 records, confirming this is squarely a lithography-process filing set. G06F (258) and G06N (44, AI-based computing) show the computational and machine-learning layer growing inside that core, while H01L (119) reflects downstream semiconductor-device claims tied to the corrected mask output.

G03F carries the claims; G06F and H01L support themG03F · Photolithography & photomechan…78497.3%G06F · Electric digital data processi…25832.0%H01L · Semiconductor devices11914.8%G06N · Computing based on AI models445.5%H10P415.1%G06T · Image data processing & genera…141.7%G06K · Data recognition & presentation131.6%H01J · Electron & discharge tubes131.6%Other597.3%

Shares are the percentage of the 806 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Optical Proximity Correction and Computational Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The most-cited foundations in this set

Representative Recent Filing
US20230095028A12023-03-30

Optical proximity correction based on combining inverse lithography technology with pattern classification

SIEMENS INDUSTRY SOFTWARE INC.

A layout design is received, then a machine-learning-based clustering process separates layout features into groups. Preliminary corrections are determined for each group using inverse lithography technology, applied to produce a pre-processed layout, and a further inverse lithography technology process refines the result.Filed by Siemens Industry Software, published 2023-03-30 — illustrates how pattern classification is now used to reduce the search space before inverse lithography runs, targeting the runtime problem that has dogged full-chip ILT for years.

US20230095028A1 — patent drawing 1US20230095028A1 — patent drawing 2
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Highest-cited records in the corpus
#Publication no.Patent titleCitations
1US7175940B2Method of two dimensional feature model calibration and optimization367
2US6194104B1Optical proximity correction (OPC) method for improving lithography process window329
3US20080309897A1Multivariable solver for optical proximity correction313
4US6578190B2Process window based optical proximity correction of lithographic images297
5US6749972B2Optical proximity correction common process window maximization over varying feature pitch218
6US6426269B1Dummy feature reduction using optical proximity effect correction211
7US7123356B1Methods and systems for inspecting reticles using aerial imaging and die-to-database detection138
8US6881523B2Optical proximity correction method utilizing ruled ladder bars as sub-resolution assist features121
9US20030082463A1Method of two dimensional feature model calibration and optimization110
10US9588438B2Optimization flows of source, mask and projection optics96

Citation counts favour older filings by construction — a patent published in 2000 has had two decades longer to accumulate citations than one published in 2023. Read this table as a map of foundational method claims, not as a ranking of current relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Optical Proximity Correction and Computational Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Signals

What the numbers say about direction

Three read-outs from the filing and citation data that matter for anyone deciding where to file next.

Filing Trajectory
72 → 7
peak (2022) vs. latest partial year

Volume has plateaued since 2022

The filing count rose steadily through the late 2010s, peaked at 72 families in 2022, and has fallen since. Some of the recent drop is the normal 18-month publication lag, but the shape of the decline starts well before the most recent year, suggesting genuine cooling in new filing activity rather than a reporting gap alone.

Source: filing-year counts, 2017–2026
Geographic Split
403 vs. 212
US vs. China receiving-office filings

US and China together hold the bulk of filings

Of 806 families, 403 were filed at the US receiving office and 212 at China's, with WIPO, Europe, Taiwan and Japan each taking a smaller share. That split reflects where the fabs and EDA vendors that write these claims are actually headquartered or litigating.

Source: receiving-office breakdown
Foundational Citations
367 citations
top-cited record, US7175940B2

The oldest core methods still anchor the field

The five most-cited records in this set are all pre-2010 US filings covering model calibration, process-window optimization and multivariable OPC solvers. Their citation counts are a legacy effect of age, but the claim language they established — process-window-based correction, common-window maximization — still frames how newer filings describe their improvements.

Source: citation counts across 806 families
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to optical proximity correction and computational lithography, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Optical Proximity Correction and Computational Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Assignee Landscape

Who is still active, and who has gone quiet

Recent-year momentum is a better signal than cumulative filing counts here, because it shows who is still investing versus who is coasting on an established portfolio.

Momentum Watch
-100% YoY
ASML, Samsung

Two of the historically largest filers show zero recent activity

ASML and Samsung both show 0 filings in the latest year against a prior year of activity, a -100% YoY reading. That does not mean these firms have exited the field — publication lag means recent internal filings may not yet be visible — but it does mean their public claim activity has gone quiet for now.

Source: recent-year momentum by assignee
Residual Activity
1 filing
TSMC, Shanghai Huali — latest year

Foundries are the only segment still filing, thinly

TSMC shows 1 filing in the latest year, down 50% YoY, and Shanghai Huali shows 1 filing, flat YoY. Both are foundries with direct manufacturing exposure to OPC accuracy, which likely explains why they are the last segment still adding to the record while EDA and equipment vendors have paused.

Source: recent-year momentum by assignee
Portfolio Linkage
15 co-filings
strongest co-assignee pair

SMIC's Shanghai and Beijing entities file jointly at scale

The strongest co-assignee pair in the dataset links SMIC's Shanghai and Beijing manufacturing entities across 15 shared families, far ahead of the next pairs (ASML's Netherlands and holding entities at 4; D2S and its named inventor at 4). That concentration suggests centralized IP strategy across SMIC's fab sites rather than independent local filing.

Source: co-assignee pair analysis, 9 pairs identified
🔍
Under-claimed branches worth checking before filing
These sub-areas show thinner claim density relative to core OPC correction methods — worth a freedom-to-operate check before assuming the space is open.
Machine-learning-driven mask rule check automationRuntime reduction for full-chip inverse lithographyMulti-patterning-aware source mask optimizationEUV-specific stochastic OPC modellingPattern-classification pre-processing for ILT
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Taiwan Semiconductor Manufacturing Company (TSMC)1-50%
Shanghai Huali Microelectronics Corporation10%
ASML Netherlands B.V.0-100%
Samsung Electronics Co., Ltd. (South Korea)0-100%
Semiconductor Manufacturing International (Shanghai) Corporation (SMIC)0
ASML Mask Tools B.V.0
D2S, Inc.0
United Microelectronics Corporation (UMC)0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Optical Proximity Correction and Computational Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Next Steps

Where to take this analysis

The dataset points to a field with occupied core claims and a few specific gaps. Deciding whether to file, license or design around requires going deeper than this summary.

Run a freedom-to-operate check on the gate chips

The under-claimed branches identified here — runtime reduction for full-chip ILT, EUV-specific stochastic modelling — are candidates for new filing, but confirming they are genuinely open requires a full claim-by-claim search, not just a family count.

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Track the quiet majors for re-emergence

ASML and Samsung show -100% YoY momentum, which given publication lag could mean filings already exist but have not published yet. Set up ongoing monitoring rather than treating the quiet period as final.

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Map the foundational citation cluster against your own claims

The top five cited patents anchor process-window and multivariable-solver language used across the field. Any new filing in this space should be checked against that cluster specifically, not just against the most recent filings.

Explore in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Optical Proximity Correction and Computational Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Optical Proximity Correction and Computational Lithography covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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