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Photoresist Strip & Wafer Cleaning Patents: Leaders & Trends 2026

Photoresist Strip & Wafer Cleaning Patents: Leaders & Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/photoresist-strip-and-wafer-cleaning-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Semiconductors · Patent Landscape
Photoresist Strip and Wafer Cleaning Patents: Who Files, What They Claim
  • Filing has plateaued, not grown. The midpoint year (2022) sat at 7 families and the peak came only in 2024 at 12 — a flat-to-declining curve, not a boom.
  • Megasonic cleaning claims dominate the citation graph. The five most-cited records in this corpus are almost all megasonic or wet-cleaning system patents, some dating back to the 1990s, still shaping freedom-to-operate today.
  • Chemistry claims are the thin slice. C11D (detergents & cleaning compositions) accounts for only 20 of 217 records against 155 in H01L and 149 in B08B — most of the claim space is equipment and process, not formulation.
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217
Published Records
44%
Top-5 Share of All Records
+300%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (3 records) with 2024 (12) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 217 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··8 min readSourced from Patsnap Eureka
Field Overview

What this patent set covers

Photoresist strip and wafer cleaning sits at the intersection of semiconductor device fabrication (H01L21) and general cleaning engineering (B08B3, C11D7). The search pulls records that combine process language — particle removal efficiency, megasonic cleaning, watermark control, chemistry consumption — with these classification codes, isolating the wet-clean and dry-strip steps that sit between etch and the next deposition or implant.

Two hundred and seventeen families span 2015 through the partial 2026 year, filed through the USPTO, CNIPA, WIPO, EPO, KIPO and JPO in that order of volume. The technology composition leans heavily toward equipment and system claims rather than chemical formulation, which shapes where the open claim territory actually sits.

Filing activity by year and technology subclass
  1. 1APPLIED MATERIALS INC37
  2. 2AKRION SYSTEMS LLC15
  3. 3TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD15
  4. 4HANGZHOU ZHONGGUI ELECTRONICS TECH CO LTD15
  5. 5TRUMAN J KELLY13
  6. 6VERHAVERBEKE STEVEN13
  7. 7ENDO RICK R11
  8. 8KO ALEXANDER11
  9. 9INTERNATIONAL BUSINESS MACHINE CORPORATION10
  10. 10SAMSUNG ELECTRONICS CO LTD6
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Photoresist Strip and Wafer Cleaning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Numbers

Filing trend and technology mix

Publication counts understate the most recent one to two years because of the typical 18-month lag between filing and publication; treat the tail of any trend chart as a floor, not a ceiling.

A flat curve with one late peak

Filings were effectively zero in 2017, climbed toward a midpoint of 7 families in 2022, and peaked at 12 in 2024 — the most recent complete year on record. That shape reads as a mature, incrementally-filed field rather than one attracting a new wave of entrants.

A flat curve with one late peak03691202017201820192020202120222023122024202502026Most recent year is partial — publication lag means later filings are not yet visible.

Equipment and process outweigh chemistry

H01L (155 records) and B08B (149) dominate the classification mix, with H10P appearing in 133 — together pointing to system, tool and integration claims. C11D, the detergent/cleaning-composition class, carries only 20 records, and B06B (mechanical vibration generation, relevant to megasonic/ultrasonic cleaning) sits at 14. B24B (grinding/polishing) and C23G (metal surface cleaning) are the smallest slices at 5 each.

Equipment and process outweigh chemistryH01L · Semiconductor devices15571.4%B08B · Cleaning (general)14968.7%H10P13361.3%C11D · Detergents & cleaning composit…209.2%B06B · Generating mechanical vibratio…146.5%H10N · Other electric solid-state dev…136.0%B24B · Grinding & polishing52.3%C23G · Cleaning of metal surfaces52.3%Other3114.3%

Shares are the percentage of the 217 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Photoresist Strip and Wafer Cleaning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The records everyone in this field cites

Representative Filing
US20010013355A12001-08-16

Fast single-article megasonic cleaning process for single-sided or dual-sided cleaning

BUSNAINA, AHMED A.

A fast single-article megasonic cleaning system is used to clean substrates such as semiconductor wafers and flat panel display glass at frequencies of 400 kHz to 20,000 kHz or higher. The technique delivers a single-wafer cleaning process that cuts cleaning time from the 10-20 minutes typical of earlier systems to 15-60 seconds by concentrating megasonic energy on one wafer via a transducer, or a pair of transducers, positioned parallel to the substrate and covering more than roughly 40% of the substrate area.Filed by Busnaina, Ahmed A. — published 2001-08-16.

US20010013355A1 — patent drawing 1US20010013355A1 — patent drawing 2
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Most-cited records in the corpus
#Publication no.Patent titleCitations
1US5656097ASemiconductor wafer cleaning system274
2US6039059AWafer cleaning system189
3US20020029788A1Method and apparatus for wafer cleaning162
4US20090130849A1Chemical mechanical polishing and wafer cleaning composition comprising amidoxime compounds and associated me…156
5US5800626AControl of gas content in process liquids for improved megasonic cleaning of semiconductor wafers and microel…150
6US20030083214A1Semiconductor wafer cleaning agent and cleaning method109
7US5908509ASemiconductor wafer cleaning system106
8US5520205AApparatus for wafer cleaning with rotation92
9US5980647AMetal removal cleaning process and apparatus81
10US6070284AWafer cleaning method and system79

Citation counts favour older filings simply because they have had longer to accumulate references within a searched corpus; treat this table as a map of foundational claims, not of current market importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Photoresist Strip and Wafer Cleaning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the filing pattern tells you

Three read-throughs matter for anyone deciding where to file or where to license in this space.

Filing Momentum
12 in 2024
peak year filings

The field peaked recently but is not accelerating

Filings rose from near zero in 2017 to a midpoint of 7 in 2022 and a peak of 12 in 2024. That is growth, but slow growth relative to a 217-family total spread across eleven years — this is an incrementally-refreshed field, not one seeing a surge of new capital or new entrants.

Based on annual filing counts 2015-2026.
Classification Mix
20 of 217
C11D chemistry records

Chemistry claims are the underweight branch

Detergent and cleaning-composition claims (C11D7) make up less than a tenth of the corpus against 155 H01L and 149 B08B records. Most protected ground is equipment design, process sequencing and system integration rather than the cleaning chemistry itself.

IPC subclass counts, this search.
Citation Concentration
274 citations
top-cited record

Old megasonic system patents still anchor freedom-to-operate

The most-cited record in the set, a semiconductor wafer cleaning system patent, carries 274 citations, and three of the top five most-cited records are megasonic or wet-clean system claims. New filers in single-wafer or megasonic cleaning should check against this older core before assuming clear ground.

Most-cited records, this search.
Collaboration Pattern
13 co-filings
strongest inventor pair

A small inventor cluster drives the megasonic sub-area

Only 10 co-assignee pairs appear in the whole set, and the strongest pairing — Verhaverbeke Steven with Truman J Kelly — recurs at 13 shared filings, with two further pairings involving the same lead inventor at 11 each. Megasonic cleaning IP here traces back to a tight, identifiable group rather than a broad industry base.

Co-assignee pair counts, this search.
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to photoresist strip and wafer cleaning, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Photoresist Strip and Wafer Cleaning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the ground

Recent-year momentum across the leading assignees is flat: every name tracked in the latest-year momentum view shows zero filings in the most recent year, consistent with the overall plateau in the trend chart and with publication lag masking filings still working through the pipeline.

Equipment Incumbents
0 in latest year
recent-year filings

Large tool makers hold historical volume, not recent momentum

Assignees with the deepest historical filing counts in this set — spanning materials and equipment suppliers, foundries and diversified electronics manufacturers — show no filings in the latest tracked year, though this likely reflects publication lag as much as a real pullback.

Recent-year momentum, this search.
Independent Inventor Cluster
13 shared filings
top co-assignee pair

A named inventor group anchors the megasonic sub-field

Steven Verhaverbeke appears across the strongest co-assignee pairings in the dataset, alongside Truman J Kelly, Alexander Ko and Rick R Endo. This points to a durable, individually-attributable body of megasonic and single-wafer cleaning claims rather than one filed under a single corporate umbrella.

Co-assignee pair analysis, this search.
Regional Filing Base
106 US filings
leading receiving office

Filing is US-centred with a rising China share

The United States receives the largest share of filings at 106, with China second at 39 and WIPO PCT filings at 19. Europe, South Korea and Japan trail behind, suggesting most applicants still treat the US as the primary jurisdiction for this technology before extending coverage elsewhere.

Receiving office counts, this search.
🔍
Under-claimed sub-areas worth checking before you file
These sit outside the dense H01L/B08B core and carry comparatively few records in this corpus.
Watermark-free rinse sequencingPost-etch residue removal chemistryMetal-surface cleaning integration (C23G)Mechanical-vibration transducer design (B06B)Chemistry consumption reduction methods
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Applied Materials, Inc.0
VERTEQ INC0
Hangzhou Zhongxi Electronic Technology Co., Ltd.0
Taiwan Semiconductor Manufacturing Company (TSMC)0
International Business Machines Corporation (IBM)0
VERHAVERBEKE STEVEN0
TRUMAN J KELLY0
KO ALEXANDER0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Photoresist Strip and Wafer Cleaning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to specific next steps depending on whether you are filing, licensing or clearing a design.

Map your process step against the classification mix

If your work sits in cleaning chemistry rather than equipment, you are filing into the thinnest slice of this corpus (20 C11D records) — a search that starts from the composition angle rather than the system angle will surface different prior art.

Explore the IPC breakdown

Check freedom-to-operate against the oldest, most-cited records

The top-cited megasonic and wet-clean system patents in this set predate most current filings by two decades and still anchor the citation graph; any single-wafer or megasonic cleaning claim should be checked against them first.

Review the key patents table

Watch the Verhaverbeke co-filing cluster

A small, named inventor group holds the densest co-assignee pairings in megasonic cleaning; tracking their continuation filings is a more targeted signal than watching corporate assignees alone.

See collaboration patterns
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Photoresist Strip and Wafer Cleaning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this patent landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Photoresist Strip and Wafer Cleaning covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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