Book a demo

Reactive Sputter Control Patents: Leaders & Filing Trends 2026

Reactive Sputter Control Patents: Leaders & Filing Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/physical-vapor-deposition-reactive-sputter-control-patent-landscape-patent-landscape/ · Patsnap · data cut-off 2026-08-31 · downloaded from the live page
Patent Landscape · Surface Engineering, Coatings & Adhesives
Reactive sputter control patents in physical vapor deposition

A data-backed look at reactive sputter control patents in physical vapor deposition: who leads filings, how concentrated the field is, and where filing activity is heading through 2026.

576
Published Records
20%
Top-5 Share of All Records
-57%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth = 2021 (7 records) → 2024 (3); 2024 is the last year we treat as complete. Top-5 share = the 5 largest assignees ÷ all 576 records in scope (CR5), not the ranked leaders only.

Check your own idea
Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Field Overview

What reactive sputter control covers, and why the claim map looks the way it does

Reactive sputter control sits at the intersection of coating deposition and plasma process control: it covers the hardware and control loops that keep a reactive gas — typically oxygen or nitrogen — in balance with a metal target during sputtering, so the deposited film lands at the intended stoichiometry rather than drifting toward a fully poisoned or fully metallic target state. Almost every record in this dataset carries a C23C coating classification, which is expected given the search scope, but the more informative split is which records also touch H01J electron and discharge-tube classes versus which stay purely in coatings chemistry. That split roughly separates hardware-and-plasma-control claims from film-composition claims.

The assignee list is dominated by equipment makers and glass coaters rather than end-product manufacturers, which tracks with the underlying technology: control of the reactive gas ratio is a tooling problem before it is a materials problem, so the companies that patent it are the ones building the sputtering chambers and power supplies, not the ones buying coated glass or coated wafers downstream.

Filing activity and technology composition, 2015–2026
  1. 1APPLIED MATERIALS INC31
  2. 2CARDINAL CG CO22
  3. 3FRAUNHOFER GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG EV22
  4. 4OERLIKON SURFACE SOLUTIONS AG PFAFFIKON20
  5. 5EVATEC AG18
  6. 6PANASONIC HOLDINGS CORP15
  7. 7TRIPLEX SAFETY GLASS CO LTD11
  8. 8PLASMA QUEST LTD11
  9. 9BORGWARNER INC10
  10. 10CANON KK10
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Physical Vapor Deposition: Reactive Sputter Control Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Numbers

Filing concentration, technology mix and where applications get filed

Three views of the same 576-record set: who files, what they claim, and where they seek protection.

Filing trend: a 2018 peak followed by a real decline

Filings rose to a peak of 14 records in 2018, then fell; the 2021-to-2024 window alone shows a 57% drop, from 7 records to 3. Because publication lags filing by roughly 18 months, 2025 and 2026 figures are still incomplete and should not be read as confirmation of further decline — but the 2018-to-2024 pattern itself is not an artefact of that lag.

Filing trend: a 2018 peak followed by a real decline048111582017142018201920202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

Publication lags filing by roughly 18 months, so 2025 onwards are still filling in. Growth rates on this page therefore end at 2024; running them to the last bar would understate the field.

Technology composition: coating claims dominate, discharge-tube control is the second axis

C23C coating and surface deposition classifications appear in 97.9% of the 576 records, essentially defining the search scope. The next largest group, H01J electron and discharge tubes, appears in 41.8% of records and marks the plasma-hardware side of reactive sputter control. Smaller shares in H01L semiconductor devices (13.4%), C03C glass compositions (8.3%) and G02B optics (3.8%) show where the technology gets applied downstream.

Technology composition: coating claims dominate, discharge-tube control is the second axisC23C · Coating & surface deposition56497.9%H01J · Electron & discharge tubes24141.8%H01L · Semiconductor devices7713.4%H10P7613.2%C03C · Glass & enamel compositions488.3%G02B · Optical elements & systems223.8%B32B · Layered products & laminates203.5%G11B · Information storage (magnetic/…203.5%Other21537.3%

Shares are the percentage of the 576 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Physical Vapor Deposition: Reactive Sputter Control Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.

Go deeper on Physical Vapor Deposition: Reactive Sputter Control Patent Landscape with Eureka

This page is one run against one query. Ask Eureka your own question about physical vapor deposition: reactive sputter control patent landscape and every answer comes back with the patent numbers behind it.

Try Eureka
Prior Art

The patents setting the citation baseline

Representative Filing
US6197165B12001-03-06

US6197165B1 — Method and apparatus for ionized physical vapor deposition

TOKYO ELECTRON LIMITED

Ionized physical vapor deposition (IPVD) is provided by a method of apparatus for sputtering coating material from a compound sputtering source formed of an annular ring-shaped target with a circular target at its center, increasing deposition rate and coating uniformity. Each target is separately energized to facilitate control of the distribution of material sputtered into the chamber and the uniformity of the deposited film. The sputtered material from the targets is ionized in a processing space between the target and a substrate by generating a dense plasma in the space with energy coupled from a coil located outside of the vacuum chamber behind an annular dielectric window in the chamber.Filed by Tokyo Electron Limited; granted 2001-03-06.

US6197165B1 — patent drawing 1US6197165B1 — patent drawing 2
View full filing →
Most-cited records in the reactive sputter control set
#Publication no.Patent titleCitations
1US6365010B1Sputtering apparatus and process for high rate coatings311
2US6488824B1Sputtering apparatus and process for high rate coatings298
3US4465575AMethod for forming photovoltaic cells employing multinary semiconductor films268
4US7628897B2Reactive ion etching for semiconductor device feature topography modification231
5US4793908AMultiple ion source method and apparatus for fabricating multilayer optical films138
6US6197165B1Method and apparatus for ionized physical vapor deposition123
7US5429730AMethod of repairing defect of structure120
8US4976839AMethod of forming a barrier layer between a silicon substrate and an aluminum electrode of a semiconductor de…110
9US4842704AMagnetron deposition of ceramic oxide-superconductor thin films110
10US6537428B1Stable high rate reactive sputtering101

Citation counts inside a searched corpus favour older filings that have had more years to accumulate citations — treat these as markers of influence on the field's vocabulary and claim structure, not as evidence that the underlying technology is still the current state of the art.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Physical Vapor Deposition: Reactive Sputter Control Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Run it yourself

Put your own technology through the same analysis

 
Where to run it
Fastest

Eureka on the web

When you want the answer in the next five minutes.

The agent works the prompt against patents and technical literature, citing every source.

Run your analysis now →
For builders

MCP server & REST API

When it has to run inside your own pipeline.

Patent search, landscape analysis and assignee resolution as MCP tools. Drop them into any agent framework, or call REST directly.

Browse MCP servers →
Signal Read

What the numbers mean for a filing decision

Four readings of the same dataset, aimed at where to file, who to watch, and where the claim space is still open.

Concentration
19.6%
top 5 of 576 records

The top of the field is thin, not dominant

The five most active filers hold 19.6% of the 576 records in scope, and the ten most active hold 29.5%. That leaves roughly seventy per cent of the field to companies filing in smaller numbers — a structure closer to a long tail than a monopoly, so a new entrant is not filing into a space one company already owns.

Based on the 576-record assignee ranking.
Filing trend
-57%
2021 to 2024, 7 → 3 records

Activity has genuinely cooled since the 2018 peak

Filings peaked at 14 records in 2018 and the 2021-to-2024 window shows a 57% decline. This is a completed-year comparison, not one skewed by publication lag, so it reflects a real pullback in new filing rather than reporting delay.

2025 and 2026 figures are still filling in and are excluded from this comparison.
Technology split
41.8%
H01J share of 576 records

Plasma-hardware claims are the second axis, not a footnote

Where C23C coating classifications are close to universal in this scope, H01J discharge-tube classifications mark the subset of filings actually claiming plasma or ion-source hardware rather than just the resulting film. That 41.8% share is the more useful cut for distinguishing equipment claims from composition claims.

IPC shares are of the 576-record total; a record can carry multiple classes.
Filing geography
199
US receiving-office records

The US and Europe carry the bulk of filing activity

The United States receives the largest single share of filings at 199 records, with Europe (EPO) second at 112 and WIPO PCT filings at 50. South Korea, Japan and Australia each carry meaningfully smaller counts, which should inform where freedom-to-operate searches get prioritised.

Receiving-office counts, not family-adjusted.
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to physical vapor deposition: reactive sputter control patent landscape, with the prior art for and against each one.

Find the white space →
Co-filing is rare and narrow
AssigneeCo-assigneeShared families
Cardinal CG CompanyHARTIG KLAUS3
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.2
iFire TechnologyKOSYACHKOV ALEXANDER2
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.1
Cardinal CG CompanySTEBBINS DAVID1
Cardinal CG CompanySTANEK ROGER1
Oerlikon Surface Solutions AG PfaffikonOerlikon Surface Solutions AG Pfaffikon1
Triplex Safety Glass Co LtdMOLINEAU P1

Only 9 co-assignee pairs appear in the dataset, and the strongest pairs link a single company to a small number of named individual inventors rather than to another corporate assignee — a sign that this technology is mostly developed and filed in-house rather than through joint ventures.

Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Physical Vapor Deposition: Reactive Sputter Control Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Next Steps

Where to take this analysis

The dataset points to specific next questions rather than a single conclusion.

Map the white space inside H01J overlap

The gap between the 97.9% C23C share and the 41.8% H01J share is where hardware-control claims are thinnest relative to coating claims — worth a closer look before drafting new claims in that zone.

Explore white space in Eureka →

Track the long tail, not just the leader

With 19.6% concentration at the top five filers, most competitive signal sits in the remaining ranked companies rather than in a single dominant player.

Run a competitor watch in Eureka →

Re-check 2025–2026 filings once they settle

Publication lag means the most recent two years understate real filing activity; revisit the trend once those years are closer to complete.

Set a filing alert in Eureka →
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Physical Vapor Deposition: Reactive Sputter Control Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on reactive sputter control patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Physical Vapor Deposition: Reactive Sputter Control Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Physical Vapor Deposition: Reactive Sputter Control Patent Landscape in depth with Eureka

Go past this page: query the whole physical vapor deposition: reactive sputter control patent landscape corpus yourself, in your own scope.
Every answer comes back with patent numbers you can open.

Try Eureka

Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

Help us improve this page

Found incorrect or outdated information? Let us know and we'll get it fixed.