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Reticle & Wafer Carrier Cleanliness Patents: Top Companies 2026

Reticle & Wafer Carrier Cleanliness Patents: Top Companies 2026
https://www.patsnap.com/resources/blog/rd-blog/reticle-and-wafer-carrier-cleanliness-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Cleanroom & Contamination Control
Reticle and Wafer Carrier Cleanliness Patents: Who Leads and Where the Gaps Sit
  • Concentrated at the top. the five leading assignees together hold 53.2% of all 333 records in scope, and the leading ten hold 72.4%.
  • Filing has plateaued, not grown. activity ran flat from 17 filings in 2021 to 17 in 2024, a 0% span after a 2022 peak of 23.
  • Litigation-grade prior art is old. the most-cited record in the set, cited 393 times, published back in 2015 — a reminder that citation counts reward age, not current relevance.
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333
Published Records
53%
Top-5 Share of All Records
0%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (17 records) with 2024 (17) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 333 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Field Overview

What this landscape covers

This landscape tracks patent activity at the intersection of reticle pod and wafer carrier design and the cleanliness mechanisms built into them: purge routines, outgassing control, particle adders, electrostatic attraction effects, seal integrity and pod cleaning methods. It spans 333 published records filed between 2015 and mid-2026, with the most recent year necessarily incomplete because publication trails filing by roughly eighteen months.

The scope sits squarely in semiconductor front-end tooling: carriers and pods that move reticles and wafers between process steps without introducing particles, outgassed polymers or static charge onto the surfaces they protect. That places it at the boundary of lithography equipment makers, wafer-fab equipment suppliers and materials specialists who each patent a different layer of the same handling problem.

Filing activity and technology mix, 2015–2026
  1. 1TOKYO ELECTRON LTD51
  2. 2APPLIED MATERIALS INC39
  3. 3CANON KK31
  4. 4FEI CO29
  5. 5ASML NETHERLANDS BV27
  6. 6ASML HLDG NV20
  7. 7NIKON CORP13
  8. 8TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD11
  9. 9PLASMA THERM LLC10
  10. 10ENTEGRIS INC10
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Reticle and Wafer Carrier Cleanliness covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Data & Trends

Filing trend and technology composition

The dataset spans 333 published records across ten years of continuous filing, with IPC classification showing where cleanliness-specific claims cluster inside the broader semiconductor equipment stack.

A decade of flat-to-cyclical filing

Filings rose from zero in 2017 to a peak of 23 in 2022, then settled back to 17 in 2024 — the same level as 2021, for a measured 0% change across that three-year span. Treat 2025 and 2026 figures as still filling in rather than as a genuine slowdown.

A decade of flat-to-cyclical filing0613192502017201820192020202123202220232024202522026Most recent year is partial — publication lag means later filings are not yet visible.

Where the claims sit

H01L (semiconductor devices) touches 54.4% of the 333 records, with H10P close behind at 40.8% and G03F (photolithography and photomechanics) at 22.5% — evidence that cleanliness mechanisms are claimed mostly as features of device and lithography hardware rather than as standalone containers. B65D (containers and packaging) and B24B (grinding and polishing) sit at the edges of the field, each near 5%, marking the packaging and post-process angles as comparatively thin.

Where the claims sitH01L · Semiconductor devices18154.4%H10P13640.8%G03F · Photolithography & photomechan…7522.5%H01J · Electron & discharge tubes5817.4%G01N · Material analysis & testing298.7%B65D · Containers & packaging185.4%C23C · Coating & surface deposition185.4%B24B · Grinding & polishing175.1%Other23971.8%

Shares are the percentage of the 333 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Reticle and Wafer Carrier Cleanliness covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

A foundational filing worth reading first

Representative Filing
US9159595B22015-10-13

US9159595B2 — Thin wafer carrier (Suss MicroTec Lithography)

SUSS MICROTEC LITHOGRAPHY, GMBH

An improved wafer carrier device for carrying and holding semiconductor wafers that have a thickness of below 100 micrometers includes a transportable wafer chuck having an enclosed vacuum reservoir and a top surface configured to support a wafer. The top surface has one or more through-openings extending from the top surface to the vacuum reservoir and the wafer is held onto the top surface via vacuum from the vacuum reservoir drawn through the through-openings.Filed 2015-10-13 — anchors a vacuum-chuck approach to thin-wafer handling that later filings in this set build against.

US9159595B2 — patent drawing 1US9159595B2 — patent drawing 2
View full filing
Most-cited records in this landscape
#Publication no.Patent titleCitations
1US20150064923A1Plasma processing device and plasma processing method393
2US5565034AApparatus for processing substrates having a film formed on a surface of the substrate228
3US20040033639A1Integrated method for release and passivation of MEMS structures183
4US20020196421A1Stage device, exposure apparatus and method150
5US6190237B1pH-buffered slurry and use thereof for polishing109
6US6054181AMethod of substrate processing to form a film on multiple target objects106
7US6902947B2Integrated method for release and passivation of MEMS structures90
8US6788385B2Stage device, exposure apparatus and method89
9US5725664ASemiconductor wafer processing apparatus including localized humidification between coating and heat treatmen…89
10US5373806AParticulate-free epitaxial process75

Citation counts inside a searched corpus favour older filings; use them as a signal of influence on later art, not of current commercial weight.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Reticle and Wafer Carrier Cleanliness covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three patterns stand out once concentration, technology mix and receiving offices are read together.

Concentration
53.2% / top 5
of 333 records

The field is led, not crowded

Five assignees account for 53.2% of all 333 records, and the leading ten reach 72.4%. That leaves a long tail of single- and few-filing entrants competing for the remaining claim space rather than a fragmented open field.

Ranking covers 94 companies total.
Technology mix
40.8% H10P
of records

Cleanliness claims ride on device and lithography IPC codes

H01L and H10P between them touch a majority of records, meaning cleanliness mechanisms are usually claimed as part of a device or process rather than as an independent carrier invention. G03F's 22.5% share confirms lithography tooling as the second-largest home for these claims.

Classes overlap; shares sum above 100% by design.
Filing office
172 US filings
of receiving offices tracked

US filing dominates, PCT and EPO trail evenly

United States receiving-office filings (172) outnumber the next largest routes — EPO and WIPO PCT, each at 43 — by a wide margin, with Japan close behind at 42. Any freedom-to-operate check should start with US prosecution history before widening to PCT and EPO family members.

Germany (7) and Singapore (6) are minor routes in this set.
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Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to reticle and wafer carrier cleanliness, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Reticle and Wafer Carrier Cleanliness covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Who's Filing

Assignee landscape and recent momentum

The ranking covers 94 companies drawn from the 333 records in scope, with filing activity concentrated among lithography and wafer-fab equipment makers.

Leader
51 records
leading assignee

One filer sits well ahead of the field

The leading assignee holds 51 records against a fifth-place figure of 27 and a tenth-place figure of 10 — a steep drop-off that marks this as a leader-and-followers field rather than several evenly matched rivals.

Leader nearly double the fifth-place count.
Momentum
0% YoY
leading assignee, latest year

Recent-year activity has gone quiet across the top names

The current leader logged just 1 filing in the latest year at 0% YoY change, while several other top-ranked assignees show 0 filings in the latest year and a -100% YoY reading. Given publication lag, this reads as data still filling in rather than firms exiting the space.

Based on most recent tracked year, still incomplete.
Collaboration
10 pairs
co-assignee pairs

Co-filing is limited and mostly intra-group

Only 10 co-assignee pairs appear across the dataset, and the strongest link — 16 shared records — sits between two entities inside the same corporate family. Cross-company joint filing is not a meaningful feature of this landscape.

Strongest pair: 16 shared records, same corporate group.
🔍
Under-claimed sub-areas worth checking before filing
These sit outside the dense H01L/H10P/G03F core and show comparatively thin coverage in the current ranking.
pod-level outgassing sensorsstatic-dissipative seal materialsin-situ purge-flow verificationpost-CMP carrier decontaminationpackaging-integrated particle shielding
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Tokyo Electron Ltd10%
ASML Netherlands BV1
Applied Materials Inc0-100%
Canon KK0-100%
FEI Co0
ASML Holding NV0
Nikon Corp0
Taiwan Semiconductor Manufacturing Co Ltd0-100%
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Reticle and Wafer Carrier Cleanliness covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this from here

The landscape points to a mature, top-heavy filing pattern with specific gaps still open for new claims.

Map freedom-to-operate against the leading assignees

With the top ten holding 72.4% of records, any new carrier or pod cleanliness design should be checked against the leading assignees' active families before committing to a claim strategy.

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Probe the under-claimed sub-areas directly

Sensor-integrated outgassing detection and post-CMP decontamination sit outside the dense IPC core and warrant a dedicated prior-art pull before drafting.

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Track the next 18 months of publications

Because 2025-2026 filings are still publishing, re-running this trend query periodically will sharpen the read on whether the 2022 peak was a one-off or the start of a new cycle.

Set up a monitoring alert in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Reticle and Wafer Carrier Cleanliness covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Reticle and Wafer Carrier Cleanliness covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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