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SEM Materials Patents: Who Leads, Where the Gaps Are 2026

SEM Materials Patents: Who Leads, Where the Gaps Are 2026
https://www.patsnap.com/resources/blog/rd-blog/scanning-electron-microscopy-for-materials-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Electron Microscopy
Scanning Electron Microscopy for Materials: Patents Behind Landing Energy, Charging Control and Detector Selection
  • Filing is broad but not concentrated: the ranked leader holds 538 records and the top 5 combined account for just 7.8% of all 23,073 records in scope.
  • Volume peaked in 2020 at 1,300 filings, and the 2021→2024 complete-year window shows a -10% change, not a collapse — 2025 onward is still filling in behind publication lag.
  • Instrumentation-side claims are a minority slice: H01J (electron & discharge tubes) sits at only 5.8% of records, well behind material-science and analysis classes like G01N at 11.7%.
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23.1K
Published Records
8%
Top-5 Share of All Records
-10%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (1,087 records) with 2024 (975) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 23,073 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Field Overview

What this landscape covers

This dataset tracks patent families that combine core SEM and electron-diffraction imaging terms — scanning electron microscopy, electron backscatter diffraction, secondary electron imaging — with the operating parameters that determine image quality and material fidelity: landing energy, charging artifact, sample coating, working distance, detector selection and quantitative analysis. That combination pulls in both instrument-side claims (column and detector design) and application-side claims that use SEM as a characterisation step inside a materials or biological process.

The scope spans 2015 through the July 2026 cut-off, with 23,073 published records tied to 23,073 families in the assignee ranking. Because publication trails filing by roughly 18 months, the final one to two years of the trend line will keep rising as more applications publish — treat the most recent years as a floor, not a ceiling.

Filing volume and technology composition, 2017–2026
  1. 1CELGENE CORP538
  2. 2RGT UNIV OF CALIFORNIA460
  3. 3BOARD OF RGT THE UNIV OF TEXAS SYST276
  4. 4MASSACHUSETTS INST OF TECH270
  5. 5SIGNAL PHARMACEUTICALS LLC259
  6. 6ASML NETHERLANDS BV250
  7. 7DOW GLOBAL TECHNOLOGIES LLC199
  8. 8PRESIDENT & FELLOWS OF HARVARD COLLEGE174
  9. 9FEI CO173
  10. 10KLA CORP151
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Scanning Electron Microscopy for Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The Numbers

Filing trend and technology composition

Two views of the same 23,073-record corpus: how filing volume has moved year over year, and which IPC subclasses carry the claim density.

Filing trend, 2017–2026

Filings rose from 1,097 in 2017 to a peak of 1,300 in 2020, then eased to 975 by 2024 — a -10% change across the 2021-2024 window that is complete enough to compare. 2025 and 2026 figures (116 in 2026) are undercounts still catching up to filing dates, not evidence of a falling field.

Filing trend, 2017–202603757501,1251,5001,0972017201820191,3002020202120222023202420251162026Most recent year is partial — publication lag means later filings are not yet visible.

IPC subclass composition

A61K (medicinal preparations) leads at 26.2% of records, with G01N (material analysis & testing) and A61P (therapeutic activity) following at 11.7% and 11.3%. Instrument-specific classes are thinner: H01J (electron & discharge tubes) sits at 5.8% and B01J (catalysis/chemical processes) at 5.0% — a reminder that most records use SEM as a supporting technique inside a broader materials or life-science claim, not as the primary invention.

IPC subclass compositionA61K · Medicinal preparations6,04926.2%G01N · Material analysis & testing2,70311.7%A61P · Therapeutic activity of compou…2,60911.3%A61L · Sterilising & disinfecting1,9818.6%C07D · Heterocyclic compounds1,8528.0%C12N · Microorganisms & genetic engin…1,6737.3%H01J · Electron & discharge tubes1,3295.8%B01J · Chemical/physical processes & …1,1505.0%Other22,70198.4%

Shares are the percentage of the 23,073 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Scanning Electron Microscopy for Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Representative Filing

A representative claim: multi-landing-energy inspection

Filed by ASML Netherlands
US20220254599A12022-08-11

US20220254599A1 — Multiple landing energy scanning electron microscopy systems and methods

ASML NETHERLANDS B.V.

Inspection systems and methods are disclosed. An inspection system may include a first energy source configured to provide a first landing energy beam and a second energy source configured to provide a second landing energy beam. The inspection system may also include a beam controller configured to selectively deliver one of the first and second landing energy beams towards a same field of view, and to switch between delivery of the first and second landing energy beams according to a mode of operation of the inspection system.Published 2022-08-11.

US20220254599A1 — patent drawing 1US20220254599A1 — patent drawing 2
View full record
Most-cited records in this corpus
#Publication no.Patent titleCitations
1US7431968B1Process and apparatus for organic vapor jet deposition2,569
2US8273404B2Extraction of solvents from drug containing polymer reservoirs1,351
3US6027889ADetection of nucleic acid sequence differences using coupled ligase detection and polymerase chain reactions1,207
4US20030089899A1Nanoscale wires and related devices1,061
5US20050136049A1Binding constructs and methods for use thereof803
6US10085643B2Analytic methods of tissue evaluation799
7US6197575B1Vascularized perfused microtissue/micro-organ arrays776
8US6589548B1Controlled drug delivery system using the conjugation of drug to biodegradable polyester750
9US6214560B1Analyte assay using particulate labels709
10US6309822B1Method for comparing copy number of nucleic acid sequences701

Citation counts favour older filings simply by virtue of longer exposure; read them as a signal of influence within this searched corpus, not as a ranking of current technical importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Scanning Electron Microscopy for Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Reading the Data

What the numbers mean for a filing decision

Three patterns worth acting on before drafting claims or scoping freedom-to-operate in this space.

Concentration
7.8% of 23,073
top 5 combined share

No single assignee controls the field

The leader holds 538 records out of 23,073, and even the combined top 5 only reach 7.8% of all records in scope. Tenth place sits at 151. This is a fragmented landscape rather than one dominated by a handful of blocking portfolios.

Ranked leaders, 100 companies
Timing
1,300 in 2020
peak filing year

Volume has eased, not collapsed

Filings peaked in 2020 and the 2021-2024 complete-year comparison shows a -10% change. Given the roughly 18-month publication lag, current-year figures like 116 in 2026 will keep climbing as later filings publish — they are not proof of a shrinking field yet.

2021 = 1,087 → 2024 = 975
Composition
5.8% H01J
electron & discharge tube class share

Instrument claims are a minority of the corpus

Most records classify under materials, pharmaceutical or analytical subclasses rather than electron-tube hardware. G01N (material analysis & testing) at 11.7% outweighs H01J more than two to one, showing SEM is largely claimed as a process step, not the invention itself.

IPC shares over 23,073 records, sum exceeds 100%
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Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to scanning electron microscopy for materials, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Scanning Electron Microscopy for Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Who's Filing

Assignee landscape and collaboration patterns

The ranking covers 100 companies counted by record; it is the full ranking the data endpoint returns, not a curated top-50 or top-100 cut. Ten co-assignee pairs appear in the data, with the strongest recurring collaborations centred on university systems working together on shared families.

Leader
538
records

A fragmented top of table

The leading assignee holds 538 records, well ahead of fifth place at 259 and tenth at 151 — a steep drop-off rather than a plateau, consistent with a field where no single player has locked up the core claim space.

Leader vs. 10th place: 538 vs. 151
Momentum
-75% to -100% YoY
latest-year change, top movers

Recent-year filings are down across tracked leaders

Every assignee with recent-year momentum data shows a sharp year-over-year drop in the latest year — consistent with publication lag rather than a genuine pullback, since the most recent year is still incomplete for the whole dataset.

Momentum reads should be paired with the 18-month lag caveat
Collaboration
10 pairs
co-assignee pairs identified

Collaboration is concentrated among a few institutions

The strongest co-filing pairs involve university systems filing jointly, with the top pair appearing in 22 shared families — a modest but consistent signal of cross-institution research programmes rather than industry consortia.

Strongest pair: 22 shared families
🔍
Under-claimed sub-areas worth checking before you draft
These sit adjacent to the dense classes above, with comparatively thin direct claim coverage in this corpus.
In-situ charging artifact compensationAdaptive landing-energy switching for mixed materialsAutomated detector selection for low-kV imagingWorking-distance calibration for quantitative EBSDCoating-free sample preparation protocols
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Board of Regents, The University of Texas System2-75%
Celgene Corp1-67%
Massachusetts Institute of Technology1-83%
ASML Netherlands B.V.1-91%
The Regents of the University of California0-100%
Signal Pharmaceuticals LLC0
Mitchell Technologies Inc0
FEI Company0-100%
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Scanning Electron Microscopy for Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Next Steps

Where to take this analysis

The landscape points to fragmented ownership and a filing plateau — the practical next step is narrowing to the sub-claims and assignees that matter for a specific product or freedom-to-operate question.

Map claim scope against a specific instrument design

Run the representative multi-landing-energy claim and its family against your own detector or beam-control architecture to see where overlap actually exists rather than assuming from the class-level data.

Explore claims in Eureka

Track the under-claimed sub-areas as they fill in

Charging artifact compensation and adaptive landing-energy switching are thin today; set alerts on these terms so a first-mover filing does not go unnoticed.

Set up monitoring in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Scanning Electron Microscopy for Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Common Questions

Frequently asked questions

Answers are grounded in the same dataset. Derived from a Patsnap search on Scanning Electron Microscopy for Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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