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Semiconductor Epitaxy Patents: Leaders, Trends & White Space 2026

Semiconductor Epitaxy Patents: Leaders, Trends & White Space 2026
https://www.patsnap.com/resources/blog/rd-blog/semiconductor-epitaxy-advanced-materials-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Semiconductors & Microelectronics
Semiconductor epitaxy patents: where advanced material claims concentrate and where they don't
  • Filing already peaked. 2017 was the high point at 46 families; by the 2022 midpoint annual filing had fallen to 12, and the trend has not recovered since.
  • Crystal growth claims trail device claims by more than 2:1. H01L records (492) outnumber C30B crystal-growth records (223), showing most protection sits on device integration rather than the growth process itself.
  • The US dominates filing venue by a wide margin. 356 US receiving-office records versus 71 in China and 48 at the EPO — a filer betting on Europe or China alone is working a much thinner set of prior art.
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571
Published Records
36%
Top-5 Share of All Records
-16%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (19 records) with 2024 (16) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 571 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This landscape tracks patent families at the intersection of epitaxial growth and deposition with materials claims specific to SiGe source-drain structures, III-V epitaxial materials, and strain engineering. The IPC scope is anchored on H01L29/165, C30B29 and H01L21/02 — device-level strained-layer transistors, bulk and thin-film crystal growth, and semiconductor manufacturing processes generally. It is a materials-and-process view of epitaxy, not a broad device landscape.

The corpus spans 571 published families from 2015 through the mid-2026 data cut-off. Because publication lags filing by roughly 18 months, the final one to two years in any trend chart will always look thinner than the filing activity that eventually lands there.

Filing activity and technology composition, 2015–2026
  1. 1INTERNATIONAL BUSINESS MACHINE CORPORATION69
  2. 2TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD65
  3. 3APPLIED MATERIALS INC35
  4. 4INTEL CORP19
  5. 5NO 55 INST CHINA ELECTRONIC SCI & TECHNOLOGYGROUP CO LTD17
  6. 6QROMIS INC15
  7. 7ELPIS TECH INC12
  8. 8WOLFSPEED INC11
  9. 9MICRON TECHNOLOGY INC10
  10. 10PILEGROWTH TECH SRL9
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Semiconductor Epitaxy Advanced Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The data

Filing trends and technology composition

Two views of the same 571 families: how filing activity moved year over year, and how those families distribute across the IPC subclasses that make up the epitaxy stack.

A peak in 2017, then a plateau below it

Annual filings hit 46 in 2017 and had fallen to 12 by 2022, the midpoint of the window. That is a declining-to-flat pattern rather than a technology still building momentum — new entrants are filing against a base that is no longer expanding.

A peak in 2017, then a plateau below it0132538504620172018201920202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

Device claims outweigh crystal-growth claims

H01L (semiconductor devices) covers 492 records and C30B (crystal growth) covers 223, with H10P and H10D each contributing over 150. C23C surface deposition, H01S lasers, and B82B nanostructures are minor branches by comparison — most of the drafting effort protects how epitaxial material is integrated into a device, not the growth chemistry itself.

Device claims outweigh crystal-growth claimsH01L · Semiconductor devices49286.2%C30B · Crystal growth22339.1%H10P17430.5%H10D · Semiconductor devices (general)15026.3%C23C · Coating & surface deposition488.4%H10W295.1%H01S · Lasers & stimulated emission152.6%B82B · Nanostructures71.2%Other7813.7%

Shares are the percentage of the 571 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Semiconductor Epitaxy Advanced Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key patents

The most-cited prior art in this space

Representative filing
US20150108600A12015-04-23

Method providing an epitaxial growth having a reduction in defects and resulting structure

MICRON TECHNOLOGY, INC.

The filing discloses an opening for epitaxial growth with an associated projection that reduces the contact-area size on the substrate where growth begins. Epitaxial material grows vertically from the contact area and laterally over the projection, which acts as a stress-relaxation region that reduces dislocations and stacking faults at the side edges of the grown material.Filed by Micron Technology in 2015, this record illustrates a defect-reduction approach built around substrate geometry rather than a new epitaxial material — a common pattern in this dataset.

US20150108600A1 — patent drawing 1US20150108600A1 — patent drawing 2
View full filing
Highest-citation records in the corpus
#Publication no.Patent titleCitations
1US9093514B2Strained and uniform doping technique for FINFETs524
2US20160133628A1Semiconductor structure and device and methods of forming same using selective epitaxial process484
3US10361201B2Semiconductor structure and device formed using selective epitaxial process411
4US6447604B1Method for achieving improved epitaxy quality (surface texture and defect density) on free-standing (aluminum…353
5US5308788ATemperature controlled process for the epitaxial growth of a film of material332
6US9929055B2Method to grow thin epitaxial films at low temperature313
7US6146457AThermal mismatch compensation to produce free standing substrates by epitaxial deposition254
8US20140252412A1Strained and Uniform Doping Technique for FINFETs244
9US6218280B1Method and apparatus for producing group-III nitrides240
10US6037202AMethod for growing an epitaxial layer of material using a high temperature initial growth phase and a low tem…153

Citation counts accumulate over time, so older filings are structurally favoured. Treat this table as a map of foundational, frequently-referenced claims rather than a ranking of current relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Semiconductor Epitaxy Advanced Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers mean for a filing decision

Three patterns stand out once the raw counts are read against filing venue and technology split.

Filing venue
356 US vs 71 China
receiving-office records

Protection is concentrated in the US

The US receiving office accounts for 356 of the records tracked here, roughly five times the 71 filed in China and well ahead of the 48 at the EPO. A defensive filing strategy built only around China or Europe is working against a materially smaller set of prior art than one built around the US.

Receiving office data, 2015-2026
Filing momentum
46 (2017) → 12 (2022)
annual family count

The peak has already passed

Filing peaked at 46 families in 2017 and had roughly halved twice over by the 2022 midpoint. That decline, combined with several major assignees showing 0 filings and -100% year-over-year in the most recent complete year, suggests the core claim space around today's dominant approaches is largely staked out.

Filing trend, 2017-2026
Technology split
492 H01L vs 223 C30B
IPC subclass records

Device integration outweighs growth chemistry

Device-level claims (H01L) outnumber crystal-growth claims (C30B) by more than 2:1, and secondary device subclasses H10P and H10D each carry over 150 records. Laser applications (H01S, 15 records) and nanostructures (B82B, 7 records) remain thin branches relative to the mainstream device work.

IPC composition, full corpus
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to semiconductor epitaxy advanced materials, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Semiconductor Epitaxy Advanced Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the ground, and where the field is thinning

The named assignees with the largest recent-year momentum are, almost without exception, showing zero filings in the most recent complete year — a sign that even leading holders are consolidating existing claims rather than expanding them.

Momentum signal
0 filings, latest year
across multiple leading assignees

Leaders have gone quiet on new filing

IBM, TSMC, Applied Materials, Intel, and China Electronics Technology Group's 55th Research Institute all show zero filings in the latest tracked year, with several posting a -100% year-over-year drop. This does not mean these organisations have exited the field — it means their claim positions are largely set and current activity is elsewhere in the portfolio.

Recent-year momentum by assignee
Co-filing
7 co-assignee pairs
across the full corpus

Joint filing is rare and mostly single-instance

Only seven co-assignee pairs appear across 571 families, and the strongest pair recorded just three joint filings. Most collaboration signal in this dataset is a single instance rather than a sustained partnership, which limits what can be inferred about formal technology-sharing arrangements.

Co-assignee pairs, full corpus
Citation base
524 citations
top-cited record

Foundational patents skew toward FinFET-era strain work

The most-cited record in the corpus concerns strained and uniform doping for FinFETs, filed well before the most recent filing window. High citation counts here mark historical influence on subsequent drafting, not necessarily where current commercial activity sits.

Most-cited records table
🔍
Under-claimed branches worth checking before filing
These sub-areas carry comparatively few records relative to the mainstream H01L device claims, based on the IPC composition in this corpus.
Laser-integrated epitaxial structures (H01S)Nanostructure-scale epitaxial growth (B82B)Surface deposition coating chemistry (C23C)Substrate-geometry defect reductionIII-V-on-silicon strain relaxation layers
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
International Business Machines Corporation (IBM)0
Taiwan Semiconductor Manufacturing Company (TSMC)0
Applied Materials, Inc.0-100%
Intel Corporation0
China Electronics Technology Group Corporation 55th Research Institute0-100%
Kromis, Inc.0-100%
CBL Technology Co., Ltd.0
Micron Technology, Inc.0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Semiconductor Epitaxy Advanced Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's next

Where to take this analysis

The landscape points to a mature, US-concentrated claim base with declining new filing. Two lines of follow-up make sense before committing a filing budget.

Check the under-claimed IPC branches against your own roadmap

H01S, B82B and C23C carry a fraction of the records that H01L does. If your work touches laser-integrated epitaxial structures or nanostructure-scale growth, that thinner prior art base may leave room to claim.

Explore white space in Eureka

Verify freedom-to-operate against the most-cited records

The five most-cited patents in this corpus, several tied to FinFET-era strain and selective epitaxial process claims, are the ones most likely to have descendant continuations still in force.

Run a citation check in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Semiconductor Epitaxy Advanced Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Semiconductor Epitaxy Advanced Materials covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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