SiC MOSFET Gate Dielectric Patents: Leaders & White Space 2026
A patent landscape analysis of silicon carbide MOSFET gate dielectric technology: filing trends, leading assignees, IPC composition, most-cited records and open claim space, based on 83 records published 2015-2026.
Filing growth = 2021 (7 records) → 2024 (20); 2024 is the last year we treat as complete. Top-5 share = the 5 largest assignees ÷ all 83 records in scope (CR5), not the ranked leaders only.
What this landscape covers
Silicon carbide MOSFETs depend on the quality of the gate dielectric more than almost any other layer in the device: the interface between the SiC surface and the gate oxide governs threshold voltage stability, channel mobility and long-term reliability under high-field switching. This landscape tracks 83 patent records published between 2015 and the 2026 data cut-off that claim gate dielectric or gate insulation structures specific to silicon carbide MOSFETs, drawn from IPC classes centred on H01L and H10D semiconductor device families. Because publication lags filing by roughly 18 months, the most recent one to two years in any trend chart are undercounts, not a real slowdown.
The scope spans trench and planar gate architectures, oxide growth and passivation approaches, and post-oxidation treatments intended to reduce interface trap density — the recurring technical obstacle in SiC gate stacks. Records are counted as patent families in the assignee ranking so that continuation filings and multi-jurisdiction refiling of the same invention do not inflate any single applicant's position.
Filing trend and technology composition
Two views of the same 83-record dataset: how filing activity has moved year over year, and which IPC subclasses the claims sit in.
Filing trend: a threefold jump into 2024
Annual filings rose from 2 records in 2017 to a peak of 20 in 2024, with the 2021-to-2024 span alone showing +186% growth. 2025 and 2026 figures will continue to fill in as publication catches up with filing.
Publication lags filing by roughly 18 months, so 2025 onwards are still filling in. Growth rates on this page therefore end at 2024; running them to the last bar would understate the field.
IPC composition: concentrated in core semiconductor-device classes
H01L accounts for 89.2% of the 83 records in scope, with H10D present in 20.5% and H10P in 12.0%; smaller shares in H10W, A61K and H02M point to peripheral applications rather than separate technical tracks. Records can carry multiple IPC codes, so these shares add up to more than 100%.
Shares are the percentage of the 83 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.
Go deeper on Silicon Carbide MOSFET Gate Dielectric Patent Landscape with Eureka
This page is one run against one query. Ask Eureka your own question about silicon carbide mosfet gate dielectric patent landscape and every answer comes back with the patent numbers behind it.
Try EurekaThe most-cited records and a representative recent grant
EP3753052B1 — SiC power device with MOS structure and stressor
Granted to Hitachi Energy Switzerland (as Hitachi ABB Power Grids at filing) with a priority date of 2021-07-28, this record claims a silicon carbide power device combining a MOS gate structure with a stressor element intended to manage mechanical stress at the gate interface — a structural route to interface stability that sits alongside the more common oxide-treatment approaches.Abstract translated and condensed from the original filing.
| # | Publication no. | Patent title | Citations |
|---|---|---|---|
| 1 | DE19900171A1 | Silicon carbide semiconductor structure especially a vertical power MOSFET has stable FET characteristics and… | 66 |
| 2 | US5661312A | Silicon carbide MOSFET | 55 |
| 3 | US20080146004A1 | Silicon carbide devices and method of making | 31 |
| 4 | CN105047542A | 一种沟槽型碳化硅MOSFET功率器件的制造方法 | 23 |
| 5 | CN113690321A | 一种碳化硅沟槽栅MOSFET及其制造方法 | 21 |
| 6 | JP2015056644A | Silicon carbide semiconductor device and silicon carbide semiconductor device manufacturing method | 19 |
| 7 | JP2012039127A | Manufacturing method of silicon carbide semiconductor device | 18 |
| 8 | CN111081778A | 一种碳化硅沟槽型MOSFET器件及其制造方法 | 16 |
| 9 | US20130234163A1 | Silicon carbide semiconductor device | 14 |
| 10 | JP2015159235A | Semiconductor device | 13 |
Citation counts favour older, foundational filings — DE19900171A1 and US5661312A predate most of the recent Chinese filing surge and remain the most-cited records in the corpus, a sign of durable influence rather than current filing activity.
Patent titles are shown in the language they were filed in, not translated, so that each record stays verifiable against the original filing — a translated title will not match in Eureka or in any national register. Each row carries its publication number; clicking a row searches Eureka by that number.
Put your own technology through the same analysis
Eureka on the web
When you want the answer in the next five minutes.
The agent works the prompt against patents and technical literature, citing every source.
Run your analysis now →MCP server & REST API
When it has to run inside your own pipeline.
Patent search, landscape analysis and assignee resolution as MCP tools. Drop them into any agent framework, or call REST directly.
Browse MCP servers →What the concentration and citation data imply
Three read-outs from the ranking, receiving-office and citation data that matter for a filing decision, not just for describing the field.
The top is dense, the tail is long
Top 5 assignees combined hold 47.0% of all 83 records, and the top 10 extend that to 69.9%. But the ranking drops from 6 records at fifth place to just 2 at tenth, across 45 ranked companies — most of the field is single- or double-digit filers.
Filing activity is now centred on China
China accounts for 39 of the tracked records, against 15 for Japan and 8 for the United States. Several of the strongest co-assignee pairings in the dataset are Chinese research-institute and industry partnerships, suggesting coordinated rather than purely competitive filing.
The surge is recent and still under-counted
Annual filings rose from 7 in 2021 to 20 in 2024. Because publication trails filing by around 18 months, the true 2025-2026 filing rate is not yet visible in this data — treat any apparent flattening in the latest years as an artefact of the lag, not a real trend.
The oldest records still anchor the citation graph
The five most-cited records include filings from the late 1990s and 2000s alongside two more recent Chinese trench-MOSFET filings. High citation counts on older records reflect their foundational role in a searched corpus, not that they represent the current state of the art.
Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to silicon carbide mosfet gate dielectric patent landscape, with the prior art for and against each one.
Where to take this analysis
The dataset points to specific next steps depending on whether the goal is freedom-to-operate, a filing strategy, or tracking a competitor.
Map claim scope on the most-cited records
DE19900171A1 and US5661312A anchor the citation graph; understanding exactly what their claims cover is the starting point for any freedom-to-operate check in this space.
Explore claims in EurekaWatch the co-assignee clusters
The strongest co-assignee pairings sit within Chinese research-institute and industry partnerships — a signal of where coordinated filing programmes are being built out.
Track assignees in EurekaRevisit the trend once 2025-2026 data lands
Publication lag means the last two years of the filing trend will keep filling in; a follow-up pull in a few quarters will show whether the 2024 peak held or kept climbing.
Set up monitoring in EurekaCommon questions about this landscape
The assignee ranking covers 45 companies across the 83 records in scope, and it is led by a single company with 11 records, with the field concentrating further so that the top 5 assignees together hold 47.0% of all records. Below fifth place the count drops quickly, to 6 records at fifth place and just 2 at tenth, meaning most of the ranked companies hold only one or two filings. That shape — a dense top and a long single-filing tail — is typical of a technology area that is still attracting new entrants rather than having consolidated around a handful of dominant players.
The interface between the silicon carbide surface and the gate oxide governs threshold voltage stability, channel mobility and long-term reliability under the high electric fields SiC devices are designed to operate at. Interface trap density at this boundary has historically been higher in SiC than in silicon, which depresses channel mobility and can shift threshold voltage under stress. That is why the bulk of the patent activity in this dataset — 89.2% of the 83 records carrying an H01L classification — sits on oxide growth, passivation and post-oxidation treatment claims rather than on the broader device architecture.
Filing activity grew sharply through the period covered, rising from 7 records in 2021 to a peak of 20 in 2024, a +186% increase over that span. Because patent publication typically lags filing by around 18 months, the apparent figures for 2025 and 2026 are still incomplete and should not be read as a slowdown. Treat 2024 as the most recent year with a reasonably complete count.
China leads by receiving office with 39 of the 83 tracked records, ahead of Japan at 15 and the United States at 8, with Europe, India and Sweden each contributing single-digit counts. Several of the closest co-assignee pairings in the dataset link Chinese research institutes with industry partners, which points to coordinated national-level filing programmes rather than purely independent competitive activity. This geographic skew is worth checking against where a company actually intends to manufacture or sell, since receiving-office counts do not equal enforceable coverage in every market.
EP3753052B1 is a granted European patent held by Hitachi Energy Switzerland, with a priority date of 2021-07-28, claiming a silicon carbide power device that combines a MOS gate structure with a stressor element to manage mechanical stress at the gate interface. It represents a structural approach to interface stability, distinct from the oxide-treatment and passivation routes that make up most of the dataset. Anyone designing a gate stack that manages interface stress mechanically, rather than purely chemically, should review this claim set closely before finalising an architecture.
Research Silicon Carbide MOSFET Gate Dielectric Patent Landscape in depth with Eureka
Go past this page: query the whole silicon carbide mosfet gate dielectric patent landscape corpus yourself, in your own scope.
Every answer comes back with patent numbers you can open.
Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.
Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.
Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.
Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.