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SiC MOSFET Gate Dielectric Patents: Leaders & White Space 2026

SiC MOSFET Gate Dielectric Patents: Leaders & White Space 2026
https://www.patsnap.com/resources/blog/rd-blog/silicon-carbide-mosfet-gate-dielectric-patent-landscape-patent-landscape/ · Patsnap · data cut-off 2026-08-31 · downloaded from the live page
Patent Landscape · Semiconductors & Microelectronics
Silicon Carbide MOSFET Gate Dielectric Patents: Who Leads and Where the Field Is Still Open

A patent landscape analysis of silicon carbide MOSFET gate dielectric technology: filing trends, leading assignees, IPC composition, most-cited records and open claim space, based on 83 records published 2015-2026.

83
Published Records
47%
Top-5 Share of All Records
+186%
Filing Growth 2021→2024
CN
Leading Jurisdiction

Filing growth = 2021 (7 records) → 2024 (20); 2024 is the last year we treat as complete. Top-5 share = the 5 largest assignees ÷ all 83 records in scope (CR5), not the ranked leaders only.

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Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Overview

What this landscape covers

Silicon carbide MOSFETs depend on the quality of the gate dielectric more than almost any other layer in the device: the interface between the SiC surface and the gate oxide governs threshold voltage stability, channel mobility and long-term reliability under high-field switching. This landscape tracks 83 patent records published between 2015 and the 2026 data cut-off that claim gate dielectric or gate insulation structures specific to silicon carbide MOSFETs, drawn from IPC classes centred on H01L and H10D semiconductor device families. Because publication lags filing by roughly 18 months, the most recent one to two years in any trend chart are undercounts, not a real slowdown.

The scope spans trench and planar gate architectures, oxide growth and passivation approaches, and post-oxidation treatments intended to reduce interface trap density — the recurring technical obstacle in SiC gate stacks. Records are counted as patent families in the assignee ranking so that continuation filings and multi-jurisdiction refiling of the same invention do not inflate any single applicant's position.

Filing activity and technology composition, 2015-2026
  1. 1GLOBAL POWER TECH CO LTD11
  2. 2NANJING THIRD GENERATION SEMICON TECH INNOVATION CENT CO LTD8
  3. 3NO 55 INST CHINA ELECTRONIC SCI & TECHNOLOGYGROUP CO LTD7
  4. 4NANJING THIRD GENERATION SEMICON TECH INNOVATION CENT7
  5. 5WOLFSPEED INC6
  6. 6FUJI ELECTRIC CO LTD5
  7. 7HITACHI ENERGY SWITZERLAND AG5
  8. 8DENSO CORP4
  9. 9MITSUBISHI ELECTRIC CORP3
  10. 10Jieping Fang Semiconductor (Shanghai) Co., Ltd.2
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Silicon Carbide MOSFET Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Numbers

Filing trend and technology composition

Two views of the same 83-record dataset: how filing activity has moved year over year, and which IPC subclasses the claims sit in.

Filing trend: a threefold jump into 2024

Annual filings rose from 2 records in 2017 to a peak of 20 in 2024, with the 2021-to-2024 span alone showing +186% growth. 2025 and 2026 figures will continue to fill in as publication catches up with filing.

Filing trend: a threefold jump into 20240510152022017201820192020202120222023202024202522026Most recent year is partial — publication lag means later filings are not yet visible.

Publication lags filing by roughly 18 months, so 2025 onwards are still filling in. Growth rates on this page therefore end at 2024; running them to the last bar would understate the field.

IPC composition: concentrated in core semiconductor-device classes

H01L accounts for 89.2% of the 83 records in scope, with H10D present in 20.5% and H10P in 12.0%; smaller shares in H10W, A61K and H02M point to peripheral applications rather than separate technical tracks. Records can carry multiple IPC codes, so these shares add up to more than 100%.

IPC composition: concentrated in core semiconductor-device classesH01L · Semiconductor devices7489.2%H10D · Semiconductor devices (general)1720.5%H10P1012.0%H10W33.6%A61K · Medicinal preparations22.4%H02M · Power conversion (AC/DC etc.)22.4%

Shares are the percentage of the 83 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Silicon Carbide MOSFET Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The most-cited records and a representative recent grant

Representative Grant
EP3753052B12021-07-28

EP3753052B1 — SiC power device with MOS structure and stressor

HITACHI ENERGY SWITZERLAND AG

Granted to Hitachi Energy Switzerland (as Hitachi ABB Power Grids at filing) with a priority date of 2021-07-28, this record claims a silicon carbide power device combining a MOS gate structure with a stressor element intended to manage mechanical stress at the gate interface — a structural route to interface stability that sits alongside the more common oxide-treatment approaches.Abstract translated and condensed from the original filing.

EP3753052B1 — patent drawing 1EP3753052B1 — patent drawing 2
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Most-cited records in the dataset
#Publication no.Patent titleCitations
1DE19900171A1Silicon carbide semiconductor structure especially a vertical power MOSFET has stable FET characteristics and…66
2US5661312ASilicon carbide MOSFET55
3US20080146004A1Silicon carbide devices and method of making31
4CN105047542A一种沟槽型碳化硅MOSFET功率器件的制造方法23
5CN113690321A一种碳化硅沟槽栅MOSFET及其制造方法21
6JP2015056644ASilicon carbide semiconductor device and silicon carbide semiconductor device manufacturing method19
7JP2012039127AManufacturing method of silicon carbide semiconductor device18
8CN111081778A一种碳化硅沟槽型MOSFET器件及其制造方法16
9US20130234163A1Silicon carbide semiconductor device14
10JP2015159235ASemiconductor device13

Citation counts favour older, foundational filings — DE19900171A1 and US5661312A predate most of the recent Chinese filing surge and remain the most-cited records in the corpus, a sign of durable influence rather than current filing activity.

Patent titles are shown in the language they were filed in, not translated, so that each record stays verifiable against the original filing — a translated title will not match in Eureka or in any national register. Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Silicon Carbide MOSFET Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the concentration and citation data imply

Three read-outs from the ranking, receiving-office and citation data that matter for a filing decision, not just for describing the field.

Concentration
47.0%
of 83 records held by top 5 assignees

The top is dense, the tail is long

Top 5 assignees combined hold 47.0% of all 83 records, and the top 10 extend that to 69.9%. But the ranking drops from 6 records at fifth place to just 2 at tenth, across 45 ranked companies — most of the field is single- or double-digit filers.

Ranking covers 45 companies, not a top-50 or top-100 list.
Geography
39 of 83
records via China receiving office

Filing activity is now centred on China

China accounts for 39 of the tracked records, against 15 for Japan and 8 for the United States. Several of the strongest co-assignee pairings in the dataset are Chinese research-institute and industry partnerships, suggesting coordinated rather than purely competitive filing.

Receiving-office counts, not family jurisdiction coverage.
Growth
+186%
filings, 2021 to 2024

The surge is recent and still under-counted

Annual filings rose from 7 in 2021 to 20 in 2024. Because publication trails filing by around 18 months, the true 2025-2026 filing rate is not yet visible in this data — treat any apparent flattening in the latest years as an artefact of the lag, not a real trend.

2024 is the last year treatable as complete.
Influence
66 citations
on the most-cited record, DE19900171A1

The oldest records still anchor the citation graph

The five most-cited records include filings from the late 1990s and 2000s alongside two more recent Chinese trench-MOSFET filings. High citation counts on older records reflect their foundational role in a searched corpus, not that they represent the current state of the art.

Citation counts favour age; read them as influence, not currency.
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Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to silicon carbide mosfet gate dielectric patent landscape, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Silicon Carbide MOSFET Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to specific next steps depending on whether the goal is freedom-to-operate, a filing strategy, or tracking a competitor.

Map claim scope on the most-cited records

DE19900171A1 and US5661312A anchor the citation graph; understanding exactly what their claims cover is the starting point for any freedom-to-operate check in this space.

Explore claims in Eureka

Watch the co-assignee clusters

The strongest co-assignee pairings sit within Chinese research-institute and industry partnerships — a signal of where coordinated filing programmes are being built out.

Track assignees in Eureka

Revisit the trend once 2025-2026 data lands

Publication lag means the last two years of the filing trend will keep filling in; a follow-up pull in a few quarters will show whether the 2024 peak held or kept climbing.

Set up monitoring in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Silicon Carbide MOSFET Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Silicon Carbide MOSFET Gate Dielectric Patent Landscape covering 2015–2026, data cut-off 2026-08-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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