Book a demo

Static Control & ESD Protection Patents: Leaders & Trends 2026

Static Control & ESD Protection Patents: Leaders & Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/static-control-and-esd-protection-in-fabs-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Cleanroom & Contamination Control
Static Control and ESD Protection in Fabs: Patents, Leaders and Filing Trends
  • 24.0% concentration at the top. The five leading assignees hold 1,585 of 6,609 records in scope — a meaningful cluster, but with 76% of filings spread across a long tail.
  • Filing activity has cooled from its 2021 peak. 221 records in 2021 fell to 78 in 2024, a 65% decline over that three-year span, well before the most recent lag-affected years are excluded.
  • Semiconductor devices dominate the claim space. H01L accounts for 34.4% of all 6,609 records, more than double the next largest class, protective circuit arrangements at 12.5%.
Get a prior-art report on your approach
6,609
Published Records
24%
Top-5 Share of All Records
-65%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (221 records) with 2024 (78) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 6,609 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··8 min readSourced from Patsnap Eureka
Overview

What this landscape covers

Static control and ESD protection filings span two very different engineering problems that happen to share vocabulary: keeping charge off wafers and tools inside a fab, and keeping charge off sensitive read/write or sensor components once they leave it. The search string used here pulls both, which is why semiconductor device claims (H01L) sit alongside a large block of diagnosis and surgery filings (A61B) tied to transcutaneous sensor hardware that also needs ESD-safe handling during manufacture.

The dataset covers 6,609 published records filed or published between 2015 and mid-2026, with assignee, IPC and filing-year data drawn from the same corpus used throughout this page.

Filing activity and technology composition, 2015–2026
  1. 1DEXCOM INC646
  2. 2TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD329
  3. 3MEDTRONIC MINIMED INC257
  4. 4TEXAS INSTRUMENTS INC178
  5. 5INTERNATIONAL BUSINESS MACHINE CORPORATION175
  6. 6QUALCOMM INC126
  7. 7NXP BV87
  8. 8EXAR CORP78
  9. 9INFINEON TECHNOLOGIES AG77
  10. 10FYRESTORM INC67
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Static Control and ESD Protection in Fabs covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The data

Filing trends and technology composition

Two views of the same 6,609 records: how filing volume has moved year over year, and how those records distribute across IPC subclasses. Because a single record can carry several IPC codes, the class shares below add up to more than the record total — that is expected, not an error.

Filing trend: rise, peak, and pullback

Annual filings rose from 184 in 2017 to a peak of 221 in 2021, then fell to 78 by 2024 — a 65% decline over that span. Treat 2025 and 2026 as understated: publication typically lags filing by around 18 months, so the most recent bars will fill in as later data arrives.

Filing trend: rise, peak, and pullback06312518825018420172018201920202212021202220232024202562026Most recent year is partial — publication lag means later filings are not yet visible.

Where the claims sit

H01L (semiconductor devices) leads at 34.4% of records, with A61B (diagnosis and surgery) and H02H (protective circuit arrangements) forming the next tier at 14.8% and 12.5%. Measurement (G01R) and general semiconductor devices (H10D) round out the mid tier, each in the 7-9% range.

Where the claims sitH01L · Semiconductor devices2,27634.4%A61B · Diagnosis & surgery97714.8%H02H · Protective circuit arrangements82512.5%H10W6509.8%G01R · Electric & magnetic measurement5528.4%H10D · Semiconductor devices (general)5197.9%H03K · Pulse technique & logic circui…4256.4%G06F · Electric digital data processi…3595.4%Other5,54883.9%

Shares are the percentage of the 6,609 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Static Control and ESD Protection in Fabs covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

Go deeper on Static Control and ESD Protection in Fabs with Eureka

This page is one run against one query. Ask Eureka your own question about static control and esd protection in fabs and every answer comes back with the patent numbers behind it.

Try Eureka
Key patents

A representative filing and the most-cited records

Representative record
US7291279B22007-11-06

Method of making a read sensor while protecting it from electrostatic discharge (ESD) damage

HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A method of making a read sensor while protecting it from electrostatic discharge (ESD) damage involves forming a severable shunt during the formation of the read sensor. The method may include forming a resist layer over a plurality of read sensor layers; performing lithography with use of a mask to form the resist layer into a patterned resist which exposes left and right side regions over the read sensor layers as well as a shunt region; etching, with the patterned resist in place, to remove materials in the left and right side regions and in the shunt region; and depositing, with the patterned resist in place, left and right hard bias and lead layers in the left and right side regions.Filed by Hitachi Global Storage Technologies Netherlands B.V., granted 2007-11-06 — an early example of building ESD protection directly into the sensor fabrication sequence rather than adding it as a downstream process step.

US7291279B2 — patent drawing 1US7291279B2 — patent drawing 2
View full record
Most-cited records in this corpus
#Publication no.Patent titleCitations
1US20070016381A1Systems and methods for processing analyte sensor data1,796
2US20060020187A1Transcutaneous analyte sensor1,788
3US20060016700A1Transcutaneous analyte sensor1,715
4US7310544B2Methods and systems for inserting a transcutaneous analyte sensor1,640
5US20060020192A1Transcutaneous analyte sensor1,618
6US20060020186A1Transcutaneous analyte sensor1,618
7US20060222566A1Transcutaneous analyte sensor1,617
8US20060020191A1Transcutaneous analyte sensor1,595
9US20070203966A1Transcutaneous analyte sensor1,563
10US20060020188A1Transcutaneous analyte sensor1,551

Citation counts favour older filings simply because they have had longer to accumulate them — read this as a signal of influence within the searched corpus, not as a ranking of current technical importance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Static Control and ESD Protection in Fabs covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Run it yourself

Put your own technology through the same analysis

 
Where to run it
Fastest

Eureka on the web

When you want the answer in the next five minutes.

The agent works the prompt against patents and technical literature, citing every source.

Run your analysis now →
For builders

MCP server & REST API

When it has to run inside your own pipeline.

Patent search, landscape analysis and assignee resolution as MCP tools. Drop them into any agent framework, or call REST directly.

Browse MCP servers →
Insights

What the numbers mean for a filing decision

Three patterns stand out once the raw counts are set against each other: where claim density is highest, how fast the field has cooled, and how concentrated ownership actually is.

Concentration
24.0% / 1,585 of 6,609
share held by the top 5 assignees

A moderate cluster, not a lock-out

The five leading assignees hold roughly a quarter of all records in scope, which leaves the majority of filing activity spread across a long tail of single- or few-filing entrants. That is not a field where one or two players control the claim space outright.

Top 10 combined reach 30.6% of 6,609 records.
Momentum
221 → 78
peak-year filings vs. 2024

Activity has pulled back from its 2021 peak

Filings fell 65% between the 2021 peak of 221 and the last complete year, 2024, at 78. That decline predates any publication-lag effect, so it reflects an actual reduction in new filings rather than a reporting artefact.

2025-2026 figures are still filling in and should not be read as a continued fall.
Technology mix
34.4% H01L
share of records tagged to semiconductor devices

Claims cluster hardest on-chip

Semiconductor device claims (H01L) cover more than a third of all records, well ahead of protective circuit arrangements and measurement classes. That density signals occupied claim space around device-level ESD protection, not that the underlying problem is solved.

H02H and G01R together still cover a meaningful secondary tier of the field.
Ownership pattern
10 co-assignee pairs
cross-filing relationships identified

Collaboration filings are rare and concentrated

Only ten co-assignee pairings appear across the corpus, and the strongest of them link a single corporate parent to its own subsidiary or to named inventors, rather than independent companies filing jointly.

This points to mostly solo filing strategies rather than joint-venture patenting.
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to static control and esd protection in fabs, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Static Control and ESD Protection in Fabs covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the activity has gone quiet

The ranked leaders span semiconductor manufacturing, analog and mixed-signal IC makers, and medical sensor companies — a mix that reflects the dual nature of the search scope. Recent-year momentum across the leaders is uniformly weak, with several showing no filings at all in the latest tracked year.

Leader
646 records
records from the top-ranked assignee

A single leader well ahead of the field

The top-ranked assignee holds 646 records, more than three and a half times the fifth-place total of 175 — a wide gap that thins out quickly further down the ranking.

Fifth place: 175 records. Tenth place: 67 records.
Momentum
-100% YoY
typical latest-year change among leaders

Recent-year filing has gone quiet across leaders

Several of the most active historical filers show zero filings in the latest tracked year, a pattern consistent across companies working in semiconductors, medical sensors and analog ICs alike. This likely reflects publication lag as much as any real pullback.

One leader still shows a single filing in the latest year, down 50% year over year.
Long tail
69.4% of 6,609
share outside the top 10 combined

Most of the field sits outside the ranked leaders

With the top 10 combined holding 30.6% of all records, the remaining 69.4% is distributed across the rest of the ranking and unranked filers — evidence of a fragmented ownership structure rather than a settled oligopoly.

Useful context for freedom-to-operate work: no single portfolio blocks the whole field.
🔍
Under-claimed sub-areas worth a closer look
Branches where filing density is comparatively thin relative to the core semiconductor and circuit-protection classes.
ionizer maintenance schedulingcharge decay time measurement methodsequipment grounding verification systemselectrostatic field meter calibrationoffset voltage compensation circuits
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Qualcomm Inc1-50%
Dexcom Inc0-100%
Taiwan Semiconductor Manufacturing Co., Ltd. (TSMC)0-100%
Medtronic MiniMed Inc0-100%
International Business Machines Corporation0
Texas Instruments Inc0-100%
FyreStorm Inc0
Hitachi Global Storage Technologies Netherlands B.V.0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Static Control and ESD Protection in Fabs covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's next

Turning this landscape into a filing decision

The counts above answer where activity has concentrated. Deciding whether to file, license or design around still requires reading individual claim scope against your own technical approach.

Check freedom-to-operate against the leader's portfolio

With one assignee holding 646 records against a fifth-place figure of 175, any new filing in the core semiconductor classes should be checked against that leader's claim scope first.

Run a freedom-to-operate search in Eureka

Track the under-claimed branches before they fill in

Charge decay time measurement and ionizer maintenance methods show thinner filing density than the core device classes — a narrower window to establish position before it closes.

Explore white space with Eureka

Watch for the 2025-2026 publication catch-up

Filings recorded in 2025 and 2026 are still incomplete due to publication lag; re-check the trend once later data arrives before concluding the field has slowed further.

Set up monitoring in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Static Control and ESD Protection in Fabs covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions about this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Static Control and ESD Protection in Fabs covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Static Control and ESD Protection in Fabs in depth with Eureka

Go past this page: query the whole static control and esd protection in fabs corpus yourself, in your own scope.
Every answer comes back with patent numbers you can open.

Try Eureka

Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

Help us improve this page

Found incorrect or outdated information? Let us know and we'll get it fixed.