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Stereolithography Testing Patents: Leaders & White Space 2026

Stereolithography Testing Patents: Leaders & White Space 2026
https://www.patsnap.com/resources/blog/rd-blog/stereolithography-testing-and-inspection-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Additive Manufacturing · Patent Landscape
Stereolithography Testing and Inspection Patents
  • Small, concentrated field. Only 18 patent families match this search, with filings peaking in 2020 at five and dropping toward flat by 2022 — this is a niche, not a race.
  • One document carries outsized weight. US20210229364A1, on micron-scale property control during stereolithography, holds 20 citations — more than double the next most-cited record.
  • Filing sits almost entirely in the US. Thirteen of the tracked filings came through the United States receiving office, with India and Canada trailing far behind.
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18
Published Records
89%
Top-5 Share of All Records
0%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (2 records) with 2024 (2) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 18 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This review tracks patent families at the intersection of stereolithography and vat photopolymerization with testing and inspection methods — dimensional inspection, mechanical testing, CT scanning and cure-degree measurement — filed under additive manufacturing, acoustic/ultrasonic testing and photopolymer-shaping IPC classes. It is a narrow cross-section rather than the whole of stereolithography patenting: it isolates the quality-control and characterization layer that sits on top of the printing process itself.

Eighteen families are enough to see structure but not enough to support fine-grained ranking. Treat single-digit differences between assignees as noise, and read the trend line knowing that publication typically lags filing by around 18 months, so the most recent year is always undercounted.

Filing activity, 2017-2026
  1. 1Poly Medical Inc.8
  2. 2Virginia Tech Intellectual Properties, Inc.4
  3. 3The Regents of the University of Colorado2
  4. 4Loctite Corporation1
  5. 5BASF SE1
  6. 6RESTOR3D INC1
  7. 7RAMACHANDRA COLLEGE OF ENG1
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Stereolithography Testing and Inspection covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Data

Filing trend and technology composition

The dataset is small enough that every subclass and every year carries visible weight — read the composition chart as a map of where claim density already sits, not as a measure of market size.

Filings rose to a peak, then flattened

Activity was zero in 2017, climbed to a peak of five families in 2020, and had fallen back to two by the 2022 midpoint. There is no second wave visible yet in the published record, though the most recent years are still understated due to publication lag.

Filings rose to a peak, then flattened013450201720182019520202021202220232024202502026Most recent year is partial — publication lag means later filings are not yet visible.

Claims cluster around printing and polymer chemistry

Every one of the 18 families touches B33Y (additive manufacturing), and 17 touch B29C (shaping of plastics) — confirming this is fundamentally a 3D-printing dataset. Condensation polymer chemistry (C08G, 10 records) and plastics moulding materials (B29K, 8) form a secondary cluster around resin formulation, while addition polymers, additives and polymer compositions (C08F, C08K, C08L) each sit at 5. Sterilising and disinfecting (A61L) appears in only 2 records, marking it as the thinnest-claimed adjacent branch.

Claims cluster around printing and polymer chemistryB33Y · Additive manufacturing (3D pri…18100.0%B29C · Shaping of plastics1794.4%C08G · Condensation polymers1055.6%B29K · Plastics moulding materials (i…844.4%C08F · Addition polymers (vinyl etc.)527.8%C08K · Use of additives in polymers527.8%C08L · Polymer compositions527.8%A61L · Sterilising & disinfecting211.1%Other844.4%

Shares are the percentage of the 18 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Stereolithography Testing and Inspection covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The most-cited records

Representative filing
US20210229364A12021-07-29

Stereolithography with micron scale control of properties

THE REGENTS OF THE UNIVERSITY OF COLORADO

Stereolithography with micron scale control of properties is described herein. In one aspect, a computer-implemented method for 3-D printing of a material can include generating a functional relation predicting one or more physical properties of the material resulting from printing parameters; algebraically or numerically solving the functional relation to generate a second functional relation predicting expected printing parameters resulting in the one or more physical properties; and printing the material via a photopolymerization printer according to the set of printing parameters determined by the second functional relation.Filed by The Regents of the University of Colorado; published 2021-07-29. With 20 citations, this is the single most-referenced document in the dataset.

US20210229364A1 — patent drawing 1US20210229364A1 — patent drawing 2
View full filing
Highest-citation families in the dataset
#Publication no.Patent titleCitations
1US20210229364A1Stereolithography with micron scale control of properties20
2US20220088851A1Synthesis and 3D printing of photocurable colloids9
3US10889053B1Custom surgical devices and method for manufacturing the same5
4US11639416B2Macromers and compositions for photocuring processes4
5US12065539B2Macromers and compositions for photocuring processes2
6US20230038063A1Synthesis and 3D printing of photocurable colloids1

Citation counts reflect influence within this searched corpus and skew toward older filings; a low count on a recent family does not mean it is weak.

Publication numbers are shown where the record carries one (6 of 6 rows); clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Stereolithography Testing and Inspection covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers say about this niche

With only 18 families in scope, the signal here is about where claim density already exists rather than about market scale.

Filing pattern
Peak 2020 at 5, midpoint 2022 at 2
families per year

Momentum has cooled, not accelerated

Filing activity built to a peak in 2020 and had halved by 2022. That is a small enough sample that a handful of new filings could reverse the trend, but nothing in the published record yet shows a rebound.

Based on 18 tracked families, 2017-2026
Citation concentration
20 citations vs 9 for the next record
top citation gap

One filing anchors the field's prior art

US20210229364A1's citation count is more than double the second-placed record, US20220088851A1 on photocurable colloid synthesis and printing. Anyone filing on property prediction or process-parameter control in stereolithography should expect examiners to cite it.

Citation counts favour older filings within this corpus
Geographic filing
US 13, India 3, Canada 2
receiving offices

Filing is heavily US-centred

Thirteen of 18 records entered through the US receiving office. India and Canada each account for a small minority, which suggests this quality-control layer of stereolithography IP has not yet been pursued broadly outside the US.

Receiving office data across all tracked records
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to stereolithography testing and inspection, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Stereolithography Testing and Inspection covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who holds the claims

Assignee activity in this dataset shows no recent-year momentum for any tracked entity — every named assignee logged zero filings in the latest year, consistent with the broader flattening trend.

Academic filer
Top-cited family
citations: 20

University research anchors the prior art

The Regents of the University of Colorado hold the most-cited document in the set, on predictive control of physical properties during photopolymerization printing — a foundational reference for property-prediction claims.

0 filings in latest tracked year
Materials specialist
Macromer chemistry
2 related families

Resin chemistry filers cluster around macromers

Filings on macromers and compositions for photocuring processes appear twice in the most-cited list, pointing to sustained interest in resin formulation rather than in the testing hardware itself.

0 filings in latest tracked year
Medical device angle
Custom surgical devices
5 citations

Medical applications form a distinct sub-cluster

A filing on custom surgical devices manufactured via stereolithography shows this dataset is not purely industrial — medical-device customization is a recurring, if smaller, thread.

0 filings in latest tracked year
🔍
Under-claimed branches worth a closer look
These sit adjacent to the core dataset but carry noticeably thinner claim density.
In-line cure-degree sensing during vat photopolymerizationCT-based void detection for printed lattice structuresSterilisation-compatible resin testing (A61L overlap)Real-time ultrasonic inspection of green-state partsClosed-loop dimensional feedback control
Rank all filers by momentum →
Recent-year filing momentum
AssigneeRecent yearYoY
Poly Medical Inc.0-100%
Virginia Tech Intellectual Properties, Inc.0
The Regents of the University of Colorado0
Loctite Corporation0
BASF SE0
RESTOR3D INC0
RAMACHANDRA COLLEGE OF ENG0-100%
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Stereolithography Testing and Inspection covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to a narrow, US-heavy field with one dominant reference and several thinly claimed adjacent branches.

Map the property-prediction claim boundary

Before filing anything on predictive control of print parameters, understand exactly what US20210229364A1 covers and where its claims stop.

Explore claim scope in Eureka

Watch the resin-chemistry cluster

Macromer and photocuring composition filings recur across the most-cited records — track new entrants in this sub-area as formulation work continues.

Track assignees in Eureka

Assess the under-claimed branches

Cure-degree sensing, CT void detection and sterilisation-compatible resin testing all show thin claim density relative to the core printing classes.

Run a white space search in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Stereolithography Testing and Inspection covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions

Answers are grounded in the same dataset. Derived from a Patsnap search on Stereolithography Testing and Inspection covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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