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Through-Silicon Via Patents: Top Companies & Filing Trends 2026

Through-Silicon Via Patents: Top Companies & Filing Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/through-silicon-via-formation-and-reveal-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Semiconductor Packaging & Test
Through-Silicon Via Formation and Reveal: Patent Landscape 2026
  • 32.8% sits with five companies. The top five assignees combine for 290 of 884 records in scope, a concentration that narrows where new filers can safely stake claims.
  • Filings cooled after a 2022 peak. Activity hit 58 records in 2022 and growth ran -21% from 2021 (38) to 2024 (30) — the last year with a complete count.
  • H01L dominates, but reveal-specific classes trail far behind. 91.1% of records touch H01L, while electroplating (C25D, 3.6%) and polishing chemistry (C09G, 2.3%) remain comparatively open.
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884
Published Records
33%
Top-5 Share of All Records
-21%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (38 records) with 2024 (30) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 884 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··7 min readSourced from Patsnap Eureka
Field Overview

What this landscape covers

Through-silicon via (TSV) formation and reveal spans the sequence of steps that turn a blind via etched into silicon into a working vertical interconnect: barrier and seed deposition, copper fill, and the reveal step — grinding, etching or polishing the wafer backside until the via is exposed without excessive copper protrusion. The search scope here combines core TSV terminology with claim-language anchors like via etch profile, keep out zone and reveal grinding, which pulls in the process-integration and packaging-level filings rather than generic 3D-IC prose.

884 published records fall inside this scope between 2015 and the 2026-07-31 cut-off. Because publication trails filing by roughly 18 months, the last one to two years of the trend will keep filling in after this snapshot and should not be read as a decline.

Filing activity and technology composition, 2015–2026
  1. 1TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD111
  2. 2SAMSUNG ELECTRONICS CO LTD64
  3. 3UNITED MICROELECTRONICS CORP41
  4. 4SK HYNIX INC40
  5. 5NAN YA TECH34
  6. 6INTERNATIONAL BUSINESS MACHINE CORPORATION31
  7. 7CHANGXIN MEMORY TECH INC29
  8. 8GLOBALFOUNDRIES US INC28
  9. 9GLOBALFOUNDRIES SINGAPORE PTE LTD23
  10. 10ADVANCED MICRO DEVICES INC22
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Through-Silicon Via Formation and Reveal covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Numbers

Filing trend and technology composition

Two views of the same 884 records: how filings moved year over year, and which IPC subclasses carry the claim density.

A 2022 peak followed by a cooling three-year span

Filings rose from 32 in 2017 to a peak of 58 in 2022, then eased to 30 by 2024 — a -21% move from 2021's 38, the most recent span that can be read as a complete trend given publication lag.

A 2022 peak followed by a cooling three-year span015304560322017201820192020202158202220232024202522026Most recent year is partial — publication lag means later filings are not yet visible.

H01L carries the field; reveal-specific chemistry is thinner

H01L (semiconductor devices) appears on 91.1% of the 884 records, with H10W (22.5%) and H10P (16.0%) as secondary structural classes. Process-specific classes — C25D electroplating (3.6%), C09G polishing compositions (2.3%) and C23C coating (1.8%) — cover far fewer records, which is where reveal-step chemistry claims sit.

H01L carries the field; reveal-specific chemistry is thinnerH01L · Semiconductor devices80591.1%H10W19922.5%H10P14116.0%H10D · Semiconductor devices (general)10411.8%C25D · Electroplating & electroforming323.6%C09G · Polishing compositions202.3%H10N · Other electric solid-state dev…202.3%C23C · Coating & surface deposition161.8%Other16718.9%

Shares are the percentage of the 884 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Through-Silicon Via Formation and Reveal covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

The most-cited prior art in this scope

Representative Filing
US10199315B22019-02-05

US10199315B2 — Post zero via layer keep out zone over through silicon via reducing BEOL pumping effects

GLOBALFOUNDRIES U.S. INC.

An IC structure and related method are provided. The IC structure includes a semiconductor substrate and a TSV disposed within it. A first interconnect layer includes V0 vias positioned laterally within the upper surface area of the TSV, while at least one second interconnect layer places its vias outside a keep-out zone positioned over the TSV. The method covers forming the first interconnect layer with V0 vias laterally within the TSV's upper surface area.Filed by GlobalFoundries U.S. Inc., published 2019-02-05.

US10199315B2 — patent drawing 1US10199315B2 — patent drawing 2
View full filing
Highest-citation records
#Publication no.Patent titleCitations
1US9048233B2Package systems having interposers1,068
2US20110291288A1Package systems having interposers685
3US7317256B2Electronic packaging including die with through silicon via444
4US20100193964A1Method of making 3D integrated circuits and structures formed thereby355
5US20090032951A1Small Area, Robust Silicon Via Structure and Process325
6US20150021785A1Hybrid bonding with through substrate via (TSV)291
7US8158515B2Method of making 3D integrated circuits282
8US20120025388A1Three-dimensional integrated circuit structure having improved power and thermal management272
9US8153520B1Thinning tungsten layer after through silicon via filling222
10US20100297844A1Integrated circuit system with through silicon via and method of manufacture thereof217

Citation counts inside this corpus favour older filings and signal influence on later drafting, not current commercial weight.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Through-Silicon Via Formation and Reveal covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the data means for filing strategy

Three patterns worth acting on before drafting claims in this space.

Concentration
32.8% of 884
held by top 5 assignees

The top of the field is crowded, not the whole field

Five companies combine for 290 of the 884 records in scope. That concentration sits mostly in core via-etch and barrier/seed claims tied to H01L — new entrants competing head-on there face dense prior art from established fabs and memory makers.

Ranking covers 100 companies, counted by record.
Momentum
-21%
2021 (38) to 2024 (30)

Growth cooled after the 2022 peak, but the field isn't shrinking to zero

Filings peaked at 58 in 2022 before settling to 30 by 2024, the last year with a complete count. Several leading assignees show 0 filings in the latest tracked year, which is consistent with the ~18-month publication lag rather than an exit from the space.

2025-2026 counts will keep revising upward.
Technology mix
3.6% / 2.3%
C25D / C09G share of 884

Reveal chemistry is thinly claimed relative to structure

Structural classes H01L, H10W and H10P dominate the record set, but electroplating (C25D) and polishing compositions (C09G) each cover a small fraction of records. That gap is where reveal-step process chemistry — seed repair, protrusion control, slurry formulation — remains comparatively open.

Shares sum above 100% because records carry multiple IPC classes.
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Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to through-silicon via formation and reveal, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Through-Silicon Via Formation and Reveal covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and who has slowed

The ranked leaders span logic foundries, memory makers and IDMs, but recent-year momentum tells a different story from the cumulative count.

Leader
111 records
top-ranked assignee

One filer well ahead of the field

The leading assignee holds 111 records, well clear of fifth place at 34 and tenth place at 22 — a steep drop-off that marks this as a field with one dominant filer and a long tail behind it.

Based on the 884-record assignee ranking.
Momentum shift
0 in latest year
across several top-10 filers

Several leading assignees show zero latest-year filings

Multiple top-ranked assignees, including some of the largest cumulative filers, register zero records in the latest tracked year. Given the ~18-month publication lag, this reads as a reporting gap rather than a confirmed pullback — but it's worth re-checking against fresh publications before drawing conclusions.

YoY figures shown are -100% for two of these filers versus their prior year.
Collaboration
10 pairs
co-assignee pairs identified

Co-filing is limited and concentrated on one relationship

Only 10 co-assignee pairs appear in the dataset, and the strongest of them recur around a single organisation paired with different named inventors — suggesting most TSV reveal work is filed solo rather than through joint ventures.

Strongest pairs recur at 4-5 shared filings.
🔍
Under-claimed sub-areas worth screening
Branches with thinner IPC coverage relative to the structural core of the field.
Copper protrusion control chemistrySeed-layer repair post-revealReveal-grinding slurry formulationBarrier coverage on high-aspect-ratio viasVia-last keep-out-zone layout rules
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Taiwan Semiconductor Manufacturing Co., Ltd. (TSMC)0-100%
International Business Machines Corporation (IBM)0
Samsung Electronics Co., Ltd.0-100%
SK Hynix Inc.0
Nanya Technology Corporation0
United Microelectronics Corporation (UMC)0
ChangXin Memory Technologies, Inc.0
Advanced Micro Devices, Inc. (AMD)0-100%
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Through-Silicon Via Formation and Reveal covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to specific follow-up work depending on whether you're clearing a filing or scouting acquisition targets.

Screen the thinly-claimed process chemistry

Electroplating and polishing-composition classes cover a small share of the 884 records relative to the structural H01L core. Run a focused clearance search on reveal-step chemistry before assuming the space is occupied.

Explore white space in Eureka

Track the zero-filing signal through 2026 publications

Several top-10 assignees show zero latest-year filings, which may simply reflect publication lag. Re-run the momentum view once 2025-2026 data has filled in before treating any filer as inactive.

Set up monitoring in Eureka

Map the leader's claim boundaries

With one assignee holding 111 of 884 records, understanding exactly which claim elements it controls — versus where its filings cluster procedurally — is the first step before drafting in adjacent territory.

Review leader filings in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Through-Silicon Via Formation and Reveal covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on TSV formation and reveal patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Through-Silicon Via Formation and Reveal covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Through-Silicon Via Formation and Reveal in depth with Eureka

Go past this page: query the whole through-silicon via formation and reveal corpus yourself, in your own scope.
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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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