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Tunable Diode Laser Gas Analysis Patents: Top Filers & Trends 2026

Tunable Diode Laser Gas Analysis Patents: Top Filers & Trends 2026
https://www.patsnap.com/resources/blog/rd-blog/tunable-diode-laser-gas-analysis-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Gas Detection
Tunable Diode Laser Gas Analysis Patents: Who Leads and Where the Field Is Still Open
  • Concentrated but not locked down. the top 5 assignees hold 26.3% of all 476 records in scope, and the top 10 hold 42.6% — leaving well over half the field to a long tail of single- and few-filing entrants.
  • Filing activity doubled. annual filings rose from 13 in 2021 to 26 in 2024, the field's peak year so far, before the expected post-filing publication lag understates 2025-2026.
  • Optical hardware dominates the claim space. 75.2% of the 476 records sit in G01N material analysis and 29.8% in G01J radiation measurement, while combustion control (F23N, 7.4%) and temperature measurement (G01K, 5.5%) remain comparatively thin.
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476
Published Records
26%
Top-5 Share of All Records
+100%
Filing Growth 2021→2024
US
Leading Jurisdiction

Filing growth compares 2021 (13 records) with 2024 (26) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 476 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··6 min readSourced from Patsnap Eureka
Overview

What this landscape covers

Tunable diode laser gas analysis spans the instruments and methods used to measure gas concentration by tuning a laser across an absorption line and reading the resulting spectrum — line selection, pressure broadening correction, path alignment, dust transmission tolerance, in situ measurement and response speed are the recurring claim themes across this dataset. The 476 records in scope run from 2015 through the current filing year, with the most recent years understated because publication typically lags filing by roughly eighteen months.

The field sits at the intersection of laser physics, optical measurement and industrial process control, which is why classes as different as combustion control and material analysis both carry meaningful shares of the corpus. Reading the assignee concentration alongside the technology composition shows where claim space is already dense and where it is still being defined.

Filing activity and technology composition, 2015-2026
  1. 1SERVOMEX GRP LTD39
  2. 2ZOLO TECHNOLOGIES INC23
  3. 3SOUTHWEST SCIENCES INC23
  4. 4SPECTRASENSORS INC20
  5. 5ONPOINT TECHNOLOGIES LLC20
  6. 6AVISA PHARMA19
  7. 7LAIR LIQUIDE SA POUR LETUDE & LEXPLOITATION DES PROCEDES GEORGES CLAUDE19
  8. 8AIR PROD & CHEM INC15
  9. 9DOW GLOBAL TECHNOLOGIES LLC13
  10. 10LI COR INC12
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Tunable Diode Laser Gas Analysis covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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The Data

Filing trends and technology composition

Two views of the same 476 records: how filing activity has moved year over year, and which IPC subclasses the claims fall into.

Filing trend, 2017-2026

Filings moved from 19 in 2017 to a peak of 26 in 2024, with 2021-2024 alone showing a +100% rise. 2025 and 2026 figures (down to 3 in the latest partial year) reflect publication lag rather than a genuine slowdown.

Filing trend, 2017-202608152330192017201820192020202120222023262024202532026Most recent year is partial — publication lag means later filings are not yet visible.

Technology composition by IPC subclass

G01N (material analysis, 75.2% of records) and G01J (radiation measurement, 29.8%) anchor the field. Because records can carry multiple classes, shares are calculated against the full 476-record base and sum to more than 100%.

Technology composition by IPC subclassG01N · Material analysis & testing35875.2%G01J · Radiation & light measurement14229.8%H01S · Lasers & stimulated emission469.7%F23N · Combustion control357.4%G01K · Temperature measurement265.5%G02B · Optical elements & systems265.5%C01B · Non-metallic elements & inorga…153.2%B01D · Separation processes (filtrati…142.9%Other20442.9%

Shares are the percentage of the 476 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Tunable Diode Laser Gas Analysis covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

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Key Patents

Representative and most-cited filings

Representative filing
US6282213B12001-08-28

US6282213B1 — Tunable diode laser with fast digital line selection

INTERSCIENCE, INC.

Describes a tunable diode laser capable of fast digital line selection across a broad wavelength spectrum with no moving parts, using a micromirror array in place of a mechanical grating within a Littman-Metcalf laser cavity. The design allows arbitrary, simultaneous or sequential line selection and is presented as integrable into any diode laser platform.Filed by Interscience, Inc.; granted 2001-08-28.

US6282213B1 — patent drawing 1US6282213B1 — patent drawing 2
View full filing
Most-cited records in this dataset
#Publication no.Patent titleCitations
1US5317156ADiagnostic tests using near-infrared laser absorption spectroscopy271
2US6064488AMethod and apparatus for in situ gas concentration measurement222
3US20030189711A1Optical heterodyne detection in optical cavity ringdown spectroscopy173
4US6853452B1Passive remote sensor of chemicals149
5US7012696B2Optical heterodyne detection in optical cavity ringdown spectroscopy146
6US20070024860A1Dual laser high precision interferometer145
7US6282213B1Tunable diode laser with fast digital line selection136
8US5963336AChamber effluent monitoring system and semiconductor processing system comprising absorption spectroscopy mea…119
9US6888127B2Method and apparatus for performing rapid isotopic analysis via laser spectroscopy93
10US20030160164A1Method and apparatus for performing rapid isotopic analysis via laser spectroscopy90

Citation counts reflect influence within the searched corpus and favour older filings; they are not a measure of current commercial relevance.

Each row carries its publication number; clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Tunable Diode Laser Gas Analysis covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
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Insights

What the numbers say

Three figures from this dataset matter more than the rest for anyone deciding where to file or partner next.

Concentration
26.3%
of 476 records held by top 5

A leader, then a real gap

The leading assignee holds 39 records against a fifth-place count of 20 and a tenth-place count of 12 — a steep drop after the top handful, not a plateau. The top 10 combined reach 42.6% of all records, meaning most of the field's assignees hold only one or two filings each.

Based on the 100-company ranked list returned by the search.
Momentum
+100%
filing growth, 2021 to 2024

Activity accelerated into 2024

Filings rose from 13 in 2021 to 26 in 2024, the field's peak year. Because publication lags filing by roughly 18 months, the drop shown in 2025-2026 reflects records still working through the pipeline rather than declining interest.

2024 is the most recent year treated as complete.
Technology mix
75.2%
of records touch G01N

Material analysis carries the field

G01N (material analysis and testing) and G01J (radiation and light measurement) between them cover the large majority of records, while combustion control, temperature measurement and optics each sit under 10% — signalling where claim density is lower.

Shares are computed against the full 476-record base; a record may carry several classes.
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Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to tunable diode laser gas analysis, with the prior art for and against each one.

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Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Tunable Diode Laser Gas Analysis covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the gaps sit

Filing activity concentrates around a handful of instrumentation specialists and industrial gas majors, but the ranked list runs 100 names deep with most holding only a few records each.

Leader
39 records
top assignee

An instrumentation specialist out front

The leading assignee's 39 records sit well ahead of fifth place at 20, indicating a sustained, focused filing programme rather than a single burst of activity.

Counted in patent families across the full dataset.
Long tail
57.4%
of records outside the top 10

Most of the field is fragmented

With the top 10 assignees holding only 42.6% of the 476 records, well over half the corpus belongs to smaller filers, research groups and named inventors rather than a handful of majors.

See the full 100-company ranking for detail.
Co-filing
10 pairs
co-assignee relationships

Inventor-led collaboration pairs

The strongest co-assignee pair recurs across 7 records, suggesting sustained inventor partnerships behind some of the more active filing programmes rather than one-off joint applications.

Strongest pairs drawn from the co-assignee network in this dataset.
🔍
Under-claimed branches worth watching
Sub-areas where filing density is comparatively thin relative to the core optical and material-analysis claims.
dust transmission compensationfast response-speed calibrationcombustion-control integration (F23N)in situ path alignment for harsh environmentspressure-broadening correction algorithms
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
Servomex Group Ltd.0
ZOLO TECHNOLOGIES INC0
Spectrasensors Inc.0
Avisa Pharma0
SOUTHWEST SCIENCES INC0
Halliburton Energy Services, Inc. (US)0
L'Air Liquide, Société Anonyme pour l'Étude et l'Exploitation des Procédés Georges Claude0
Air Products and Chemicals, Inc.0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Tunable Diode Laser Gas Analysis covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to specific next steps depending on whether the goal is freedom-to-operate, partnership scouting or white-space filing.

Check freedom-to-operate around core optical claims

With 75.2% of records touching G01N and a dense most-cited cluster around line-selection and cavity-ringdown methods, a targeted claims review before filing in this space is worthwhile.

Explore claims in Eureka →

Track the top assignee's recent filings

A 39-record leader with a sustained programme is worth monitoring directly for signals about where the technology is heading next.

Set up assignee tracking in Eureka →

Scope the under-claimed branches

Combustion-control integration and dust-transmission compensation carry comparatively few records relative to the core optical claims, and may offer more open filing space.

Run a white-space search in Eureka →
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Tunable Diode Laser Gas Analysis covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on this landscape

Answers are grounded in the same dataset. Derived from a Patsnap search on Tunable Diode Laser Gas Analysis covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

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Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

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