Book a demo

WAAM Reliability Patents: Who Leads, Where the Gaps Are 2026

WAAM Reliability Patents: Who Leads, Where the Gaps Are 2026
https://www.patsnap.com/resources/blog/rd-blog/wire-arc-additive-manufacturing-reliability-and-durability-patent-landscape/ · Patsnap · data cut-off 2026-07-31 · downloaded from the live page
Patent Landscape · Additive Manufacturing
Wire Arc Additive Manufacturing Reliability and Durability Patents
  • Filing is still accelerating, not maturing. the trend runs from zero in 2017 to a peak of 12 filings in 2025, with growth still climbing through the midpoint year rather than levelling off.
  • India, not the US or China, is the busiest filing venue. 18 of the tracked records were filed there against 8 in the United States, a split that says more about academic filing activity than about where the commercial technology will be practiced.
  • The most-cited family is a magnesium-alloy WAAM method, not a machine-learning one. CN109623180A leads citations by a wide margin over any process-control or prediction patent in the set, despite reliability being the dataset's search focus.
Get a prior-art report on your approach
28
Published Records
39%
Top-5 Share of All Records
+200%
Filing Growth 2021→2024
IN
Leading Jurisdiction

Filing growth compares 2021 (1 records) with 2024 (3) — a three-year span. 2024 is the most recent year we treat as complete: publication lags filing by roughly 18 months, so 2025 onwards are still filling in and any growth rate that ends there would understate the field. Top-5 share is the combined record count of the five largest assignees divided by all 28 records in scope (CR5), not by the ranked leaders only.

Published byPatsnap Research··8 min readSourced from Patsnap Eureka
Overview

What this landscape covers

This dataset isolates patent families at the intersection of wire arc additive manufacturing (WAAM) and the reliability concerns that determine whether a WAAM part can be certified for structural service: fatigue performance, porosity control, residual stress and mechanical reliability testing. It excludes general WAAM process patents that do not address one of those four failure or qualification themes directly, and it is scoped by IPC classes covering welding and arc processes (B23K9/04), powder-based additive manufacturing (B22F10/85) and materials testing (G01N3).

Twenty-eight families is a small corpus for a technology this actively discussed in the literature, which itself is informative: the reliability-and-durability slice of WAAM patenting is still forming, and the classification spread below shows where the claim activity is actually concentrated versus where it is thin.

Filing activity by year, 2017–2026
  1. 1NORTHEASTERN UNIV CHINA5
  2. 2DELHI TECHNOLOGICAL UNIVERSITY2
  3. 3CHENNAI INSTITUTE OF TECHNOLOGY2
  4. 4UNIV OF SOUTHERN CALIFORNIA1
  5. 5DR BIPLAB HAZRA1
  6. 6HAMILTON SUNDSTRAND CORP1
  7. 7NAT INST OF TECH KARNATAKA1
  8. 8NAGARAGERE CHIKKRAMAIAH SHASHIDHAR1
  9. 9INDIAN INST OF TECH MADRAS1
  10. 10TATA STEEL LTD1
Source: Patsnap Eureka. Assignee ranking and totals. Derived from a Patsnap search on Wire Arc Additive Manufacturing Reliability and Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
The Data

Filing trend and technology composition

Two views of the same 28-family dataset: how filing activity has moved year over year, and which IPC subclasses carry the claim weight.

Filings are climbing, not plateauing

From zero filings in 2017 to a single filing at the 2022 midpoint, the count then rises to a peak of 12 in 2025 before the current partial year. Because publication lags filing by roughly 18 months, the true 2025-2026 filing volume is understated in this chart — the acceleration shown here is a floor, not a ceiling.

Filings are climbing, not plateauing03691202017201820192020202120222023202412202552026Most recent year is partial — publication lag means later filings are not yet visible.

Welding and 3D-printing classes dominate; powder and alloy claims are secondary

Every record in the set carries a B23K welding/arc classification, and 17 of 28 also sit in B33Y (additive manufacturing generally) — expected, since the search is anchored on WAAM. The more informative split is the long tail: B22F (powder metallurgy, 7 records), C22C (alloys, 6) and single-digit counts in B23P, G01N, A61B and B21F show where reliability claims are being attached to adjacent disciplines rather than treated as a distinct category.

Welding and 3D-printing classes dominate; powder and alloy claims are secondaryB23K · Welding, soldering & brazing28100.0%B33Y · Additive manufacturing (3D pri…1760.7%B22F · Powder metallurgy725.0%C22C · Alloys621.4%B23P · Metal working (general)27.1%G01N · Material analysis & testing27.1%A61B · Diagnosis & surgery13.6%B21F · Wire working13.6%Other310.7%

Shares are the percentage of the 28 records in scope. A patent can carry several IPC classes, so the shares add up to more than 100%.

Source: Patsnap Eureka. Filing trend and technology composition. Derived from a Patsnap search on Wire Arc Additive Manufacturing Reliability and Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.

Go deeper on Wire Arc Additive Manufacturing Reliability and Durability with Eureka

This page is one run against one query. Ask Eureka your own question about wire arc additive manufacturing reliability and durability and every answer comes back with the patent numbers behind it.

Try Eureka
Key Patents

The most-cited and most recent filings

Representative Recent Filing
US20250222535A12025-07-10

US20250222535A1 — Wire arc additive manufacturing based multi-layer fabrication/repair of Ti part with equiaxed/hybrid microstructure

HAMILTON SUNDSTRAND CORPORATION

A method for determining build parameters for a wire arc additive manufacture machine (WAAM) is disclosed herein. The method includes receiving, by a processor, a plurality of input parameters for a WAAM process for building a component, calculating a melt pool size for the WAAM process based at least in part on the plurality of input parameters, calculating solidification parameters for a material being used for the WAAM process, determining one or more structural transition points during WAAM process for building the component, the one or more structural transition points indicating an internal microstructure of the component, generating a build file in response to the one or more structural transition points.Filed by Hamilton Sundstrand Corporation, published 2025-07-10 — the dataset's most recent representative filing.

US20250222535A1 — patent drawing 1US20250222535A1 — patent drawing 2
View full filing
Most-cited records in this dataset
#Publication no.Patent titleCitations
1CN109623180A一种镁合金的丝材电弧增材制造方法32
2US20210402506A1Wire and arc additive manufacturing method for magnesium alloy14
3US20210402507A1Wire and arc additive manufacturing method for titanium alloy12
4US20230220526A1Steel Material for Forming Components Using Additive Manufacturing and Use of a Steel Material of This Type8
5US20230158595A1Prediction and control of product shape quality in wire and arc additive manufacturing through machine learni…7
6US11945042B2Wire and arc additive manufacturing method for magnesium alloy1

Citation counts favour older records simply because they have had longer to accumulate them; read this as a signal of influence within the searched corpus, not as a ranking of current technical importance.

Patent titles are shown in the language they were filed in, not translated, so that each record stays verifiable against the original filing — a translated title will not match in Eureka or in any national register. Publication numbers are shown where the record carries one (6 of 6 rows); clicking a row searches Eureka by that number.

Source: Patsnap Eureka. Citation counts and representative records. Derived from a Patsnap search on Wire Arc Additive Manufacturing Reliability and Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Run it yourself

Put your own technology through the same analysis

 
Where to run it
Fastest

Eureka on the web

When you want the answer in the next five minutes.

The agent works the prompt against patents and technical literature, citing every source.

Run your analysis now →
For builders

MCP server & REST API

When it has to run inside your own pipeline.

Patent search, landscape analysis and assignee resolution as MCP tools. Drop them into any agent framework, or call REST directly.

Browse MCP servers →
Insights

What the numbers mean for a filing decision

Four read-outs from the trend, classification and citation data that matter more than the raw counts on their own.

Growth Stage
0 → 12
filings, 2017 to peak year 2025

Still an accelerating field, not a settled one

The midpoint year (2022) shows only a single filing, meaning almost all activity in this dataset has happened in the last few years. That compresses the prior-art window: a filer today is competing against a much smaller body of granted claims than the raw 28-family count suggests once duplicates and pending applications are set aside.

Publication lag means 2025-2026 counts will revise upward.
Filing Geography
18 vs 8
India vs United States receiving-office filings

India carries the filing volume, not the commercial centre of gravity

More than half of the tracked records were filed with the Indian patent office, well ahead of the United States. That pattern is typical of academic and institutional filers building portfolios rather than commercial entities protecting products, and it should temper any assumption that filing volume maps directly to where WAAM parts will be manufactured or certified.

China and WIPO/PCT each register a single filing in this set.
Citation Concentration
32 citations
on the top-cited family, CN109623180A

The most-cited patent is a materials method, not a reliability-testing one

CN109623180A, a magnesium-alloy wire-arc method, out-cites the nearest reliability- or ML-oriented family by more than double. That is a reminder that citation counts here reward age and foundational process claims more than they reward the fatigue- and porosity-specific subject matter this search was built to find.

Machine-learning process-control patents (e.g. US20230158595A1) sit well below it on citations.
Assignee Fragmentation
9 pairs
co-assignee collaborations identified

Collaboration is thin and mostly single-instance

Only nine co-assignee pairs appear across the dataset, and the strongest of them link back to a single individual filer rather than an institution-to-institution partnership. Recent-year momentum is similarly dispersed: no assignee in the tracked list shows more than one filing in the latest year, and several previously active academic filers show a full drop-off.

No assignee currently shows sustained multi-year momentum.
Eureka AI Agent
Looking for what nobody has claimed yet?

Eureka can read the same corpus for gaps instead of for coverage: under-claimed branches adjacent to wire arc additive manufacturing reliability and durability, with the prior art for and against each one.

Find the white space →
Source: Patsnap Eureka. Co-assignee relationships and derived observations. Derived from a Patsnap search on Wire Arc Additive Manufacturing Reliability and Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
Players

Who is filing, and where the field is still open

The assignee base is fragmented across academic institutions and a small number of corporate filers, with no single entity showing sustained year-over-year momentum yet.

Momentum Leaders (Latest Year)
1 filing
each, latest tracked year

Three assignees tied at the top of a shallow field

Tech Innovation in Exploration & Mining Foundation, Swami Vivekananda University and individual filer Sudipta Swain each recorded one filing in the latest year — the maximum seen among tracked assignees. No filer in this dataset has yet built a multi-filing streak in a single year.

A tie at one filing signals an open leaderboard, not a settled hierarchy.
Drop-off
-100% YoY
Delhi Technological University and Chennai Institute of Technology

Some early academic filers have gone quiet

Delhi Technological University and Chennai Institute of Technology both show zero filings in the latest year against prior activity, a full year-over-year drop. That pattern is common among academic portfolios built around a single research grant or thesis cycle rather than an ongoing R&D programme.

Northeastern University (China)also shows zero latest-year filings after prior activity.
Collaboration Pattern
9 pairs
co-assignee combinations

Filing is largely solo, with a few individual-led clusters

The strongest co-assignee links in the dataset all trace to Sudipta Swain paired separately with three other individuals, rather than to a lab-to-lab or company-to-university tie-up. That suggests reliability-focused WAAM patenting here is still driven by individual academic researchers assembling small co-inventor teams.

No corporate-academic co-assignment pair appears among the strongest links.
🔍
Sub-areas with thin claim coverage
Based on the IPC long tail and the narrow four-theme search scope, these branches show little dedicated claim activity relative to core WAAM process patents.
In-process fatigue-life prediction modelsPorosity closure via post-weld hot isostatic pressingResidual-stress relief through deposition-path optimisationMulti-material WAAM interface reliabilityNon-destructive testing integration for WAAM builds
Rank all filers by momentum →
Recent-year filing momentum by assignee
AssigneeRecent yearYoY
TECH INNOVATION IN EXPLORATION & MINING FOUNDATION1
SWAMI VIVEKANANDA UNIV1
SUDIPTA SWAIN1
Northeastern University (China)0
DELHI TECHNOLOGICAL UNIVERSITY0-100%
CHENNAI INSTITUTE OF TECHNOLOGY0-100%
Board of Regents, The University of Texas System0-100%
Tata Steel Limited0
Source: Patsnap Eureka. Assignee-level momentum. Derived from a Patsnap search on Wire Arc Additive Manufacturing Reliability and Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
What's Next

Where to take this analysis

The dataset points to a fragmented, still-accelerating field. These are the next questions worth running before committing a filing or design-around strategy.

Model the design-around space for the top-cited families

CN109623180A and the two Hamilton Sundstrand-adjacent US filings carry the most citation weight in this set. Map their independent claims against your own process parameters before assuming freedom to operate.

Explore claim scope in Eureka

Track the academic-to-corporate handoff

Much of the current filing volume comes from Indian academic institutions with single-year filing bursts. Watch for licensing or assignment activity as these move toward commercial partners.

Set up assignee alerts in Eureka

Re-run the classification split as volume grows

With only 28 families, the B22F and C22C counts could shift meaningfully with a handful of new filings. Revisit the IPC composition once 2025-2026 publications catch up.

Rebuild this search in Eureka
Source: Patsnap Eureka. Forward-looking reading of the same dataset. Derived from a Patsnap search on Wire Arc Additive Manufacturing Reliability and Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP
FAQ

Common questions on WAAM reliability patents

Answers are grounded in the same dataset. Derived from a Patsnap search on Wire Arc Additive Manufacturing Reliability and Durability covering 2015–2026, data cut-off 2026-07-31. Counts reflect published records only and shift as new filings publish.Run this in Eureka MCP

Research Wire Arc Additive Manufacturing Reliability and Durability in depth with Eureka

Go past this page: query the whole wire arc additive manufacturing reliability and durability corpus yourself, in your own scope.
Every answer comes back with patent numbers you can open.

Try Eureka

Disclaimer. This page is generated from Patsnap Eureka data drawn from a limited snapshot of global patent and scientific-literature records, and is provided for general information and reference only.

Patent data carries inherent limitations: recent filings (typically the most recent 18–24 months) are under-counted due to standard publication lag; counts may be reported at either a patent-family or a patent-record basis and are not always directly comparable; classification, applicant-name, and citation data may contain errors, duplicates, or omissions; and the underlying search query defines and constrains the scope shown. As a result, the analysis may be incomplete or inaccurate and may not reflect the full technology landscape.

Nothing on this page constitutes an exhaustive prior-art, novelty, freedom-to-operate, or validity search, nor does it constitute legal, financial, investment, or professional advice, and it should not be relied upon as such. Any patent, commercial, or strategic decision should be verified independently and reviewed with qualified patent, legal, and domain professionals. Patsnap makes no warranties, express or implied, as to the accuracy, completeness, or fitness for any particular purpose of the information presented.

Machine translation. Assignee and organisation names originally recorded in Chinese, Japanese or Korean have been rendered into English by an AI translation step so that the tables stay readable. These renderings are best-effort and may not match a company’s registered English name; the original name is what the underlying patent record carries, and it is what any Eureka query launched from this page uses.

Help us improve this page

Found incorrect or outdated information? Let us know and we'll get it fixed.